SSM3K329R
2011-03-04
1
TOSHIBA Field-Effect Transistor Silicon N-Channel MOS Type
SSM3K329R
Power Management Switch Applications
High-Speed Switching Applications
1.8-V drive
Low ON-resistance: RDS(ON) = 289 m (max) (@VGS = 1.8 V)
: RDS(ON) = 170 m (max) (@VGS = 2.5 V)
: RDS(ON) = 126 m (max) (@VGS = 4.0 V)
Absolute Maximum Ratings (Ta = 25°C)
Characteristic Symbol Rating Unit
Drain-source voltage VDSS 30 V
Gate-source voltage VGSS ±12 V
DC ID (Note 1) 3.5
Drain current
Pulse IDP (Note 1) 7.0
A
PD (Note 2) 1
Power dissipation
t = 10s 2
W
Channel temperature Tch 150 °C
Storage temperature range Tstg 55 to 150 °C
Note: Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are
within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: The channel temperature should not exceed 150°C during use.
Note 2: Mounted on a FR4 board.
(25.4 mm × 25.4 mm × 1.6 mm, Cu Pad: 645 mm2)
Handling Precaution
When handling individual devices that are not yet mounted on a circuit board, make sure that the environment is
protected against electrostatic discharge. Operators should wear antistatic clothing, and containers and other objects that
come into direct contact with devices should be made of antistatic materials.
Thermal resistance Rth (ch-a) and Power dissipation PD vary depending on board material, board area, board thickness
and pad area. When using this device, please take heat dissipation into consideration
Unit: mm
JEDEC
JEITA
TOSHIBA 2-3Z1A
Weight: 11 mg (typ.)
1: Gate
2: Source
3: Drain
SOT-23F
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SSM3K329R
2011-03-04
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Electrical Characteristics (Ta = 25°C)
Characteristic Symbol Test Conditions Min Typ. Max Unit
V (BR) DSS ID = 1 mA, VGS = 0 V 30
Drain-source breakdown voltage
V (BR) DSX ID = 1 mA, VGS = 12 V 18
V
Drain cut-off current IDSS V
DS = 30 V, VGS = 0 V 1 μA
Gate leakage current IGSS V
GS = ± 12 V, VDS = 0 V ±1 μA
Gate threshold voltage Vth V
DS = 3 V, ID = 1 mA 0.4 1.0 V
Forward transfer admittance Yfs V
DS = 3 V, ID = 1.0 A (Note 3) 2.1 4.2 S
ID = 1.0 A, VGS = 4.0 V (Note 3) 96 126
ID = 0.8 A, VGS = 2.5 V (Note 3) 118 170
Drain–source ON-resistance RDS (ON)
ID = 0.5 A, VGS = 1.8 V (Note 3) 158 289
mΩ
Input capacitance Ciss 123
Output capacitance Coss 43
Reverse transfer capacitance Crss
VDS = 15V, VGS = 0 V, f = 1 MHz
18
pF
Total gate charge Qg 1.5
Gate-source charge Qgs1 0.3
Gate-drain charge Qgd
VDS = 15V, ID = 2.0 A
VGS = 4 V 0.6
nC
Turn-on time ton 9.2
Switching time Turn-off time toff
VDD = 15 V, ID = 1.0 A,
VGS = 0 to 2.5 V, RG = 4.7 Ω 6.4 ns
Drain-source forward voltage VDSF I
D = -3.5 A, VGS = 0 V (Note 3)
-0.90
-1.2 V
Note 3: Pulse test
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SSM3K329R
2011-03-04
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Switching Time Test Circuit
Marking Equivalent Circuit
(top view)
Usage Considerations
Let Vth be the voltage applied between gate and source that causes the drain current (ID) to below (1 mA for the
SSM3K329R). Then, for normal switching operation, VGS(on) must be higher than Vth, and VGS(off) must be lower than
Vth. This relationship can be expressed as: VGS(off) < Vth < VGS(on).
Take this into consideration when using the device.
2.5 V
ton t
off
(b) VIN
(c) VOUT
0 V
VDD
VDS (ON) tr t
f
10%
90%
90%
10%
(a) Test Circuit
VDD = 15 V
RG = 4.7 Ω
Duty 1%
VIN: tr, tf < 5 ns
Common Source
Ta = 25°C
0
2.5 V IN OUT
VDD
10 μs
RG
KKH
1 2
3
1 2
3
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Ambient temperature Ta (°C) Ambient temperature Ta (°C)
Vth – Ta
Gate threshold voltage Vth (V)
1.0
0
50 0 15050 100
RDS (ON) – Ta
Drain–source ON-resistance
RDS (ON) (m)
0
50 0 50 150
200
100
400
Drain–source ON-resistance
RDS (ON) (m)
0
Gate–source voltage VGS (V)
4
0
RDS (ON) – VGS
400
200
12
25 °C
Ta = 100 °C
25 °C
0.5
Common Source
VDS = 3 V
ID = 1 mA
Common Source
Pulse test
ID = 0.5 A / VGS = 1.8 V
0.8 A / 2.5 V
300
100
300
100
8
1.0 A / 4.0 V
2 6 10
Drain–source voltage VDS (V)
ID – VDS
Drain current ID (A)
0
6
0 0.2 0.4 0.6
4
10 V
2
4.0 V
VGS = 1.8 V
7
0.8 1.0
2.5 V
Common Source
Ta = 25 °C
Pulse test
5
3
1
Gate–source voltage VGS (V)
ID – VGS
Drain current ID (A)
10
0
1
0.01
0.1
0.001
2.0
25 °C
Ta = 100 °C 25 °C
1.0
RDS (ON) – ID
Drain current ID (A)
Drain–source ON-resistance
RDS (ON) (m)
0 1 25
0
400
200
7
300
100
3 4 6
VGS = 4.0V
2.5 V
Common Source
Ta = 25°C
Pulse test
1.8 V
Common Source
VDS = 3 V
Pulse test
1.5 V
ID =1.0A
Common Source
Pulse test
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SSM3K329R
2011-03-04
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Drain–source voltage VDS (V)
C – VDS
Capacitance C (pF)
1
0.1 1 10 100
10
100
30
50
3
5 Common Source
Ta = 25°C
f = 1 MHz
VGS = 0 V
Drain current ID (A)
Switching time t (ns)
t – ID
1
0.01
100
0.1
1000
1 10
10
tf
ton
tr
Common Source
VDD = 15 V
VGS = 0 to 2.5 V
Ta = 25 °C
RG = 4.7 Ω
toff
Ciss
Coss
Crss
500
300
1000
Drain current ID (A)
Forward transfer admittance
Yfs
(S)
|Yfs| – ID
0.001
10
0.1
0.01 1
1
0.01
0.001
10
0.1
Common Source
VDS = 3 V
Ta = 25°C
Pulse test
Drain current IDR (A)
Drain–source voltage VDS (V)
IDR – VDS
10
0
0.1
1
0.001
0.01
–0.5 –1.0 –1.5
25 °C
Ta =100 °C
25 °C
Common Source
VGS = 0 V
Pulse test
G
D
S
IDR
Gate–source voltage VGS (V)
0 0 2
4
8
10
6
2
VDD = 24 V
4 1 3
Common Source
ID = 2.0 A
Ta = 25°C
VDD = 15 V
Total Gate Charge Qg (nC)
Dynamic Input Characteristic
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2011-03-04
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Pulse width tw (s)
rthtw
Transient thermal impedance rth (°C/W )
0.001 10000.01 0.1 1 100
10
100
1000
1
10
Single pulse
a. Mounted on FR4 board
(25.4 mm × 25.4 mm × 1.6 mm, Cu Pad: 645 mm2)
b. Mounted on FR4 board
(25.4 mm × 25.4 mm × 1.6 mm, Cu Pad: 0.72 mm2×3)
b
a
Ambient temperature Ta (°C)
PD – Ta
Power dissipation PD (mW)
1600
0
400
120100 140
800
160 80 60 40 20 0 -20 -40
a
1200
a: Mounted on FR4 board
(25.4mm × 25.4mm × 1.6 mm , Cu Pad : 645 mm2)
b: Mounted on FR4 board
(25.4mm × 25.4mm × 1.6 mm , Cu Pad : 0.72 mm2 ×3)
b
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SSM3K329R
2011-03-04
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RESTRICTIONS ON PRODUCT USE
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all relevant TOSHIBA information, including without limitation, this document, the specifications, the data sheets and application notes
for Product and the precautions and conditions set forth in the “TOSHIBA Semiconductor Reliability Handbook” and (b) the
instructions for the application with which the Product will be used with or for. Customers are solely responsible for all aspects of their
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