Document Number: 91183 www.vishay.com
S-81275-Rev. A, 16-Jun-08 1
Power MOSFET
IRFIBE20G, SiHFIBE20G
Vishay Siliconix
FEATURES
Isolated Package
High Voltage Isolation = 2.5 kVRMS (t = 60 s;
f = 60 Hz)
Sink to Lead Creepage Distance = 4.8 mm
Dynamic dV/dt Rating
Low Thermal Resistance
Lead (Pb)-free Available
DESCRIPTION
Third generation Power MOSFETs from Vishay provide the
designer with the best combination of fast switching,
ruggedized device design, low on-resistance and
cost-effectiveness.
The TO-220 FULLPAK eliminates the need for additional
insulating hardware in commercial-industrial applications.
The molding compound used provides a high isolation
capability and a low thermal resistance between the tab and
external heatsink. This isolation is equivalent to using a 100
micron mica barrier with standard TO-220 product. The
FULLPAK is mounted to a heatsink using a single clip or by
a single screw fixing.
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
b. VDD = 50 V, starting TJ = 25 °C, L = 172 mH, RG = 25 Ω, IAS = 1.4 A (see fig. 12).
c. ISD 1.8 A, dI/dt 80 A/µs, VDD 600, TJ 150 °C.
d. 1.6 mm from case.
PRODUCT SUMMARY
VDS (V) 800
RDS(on) (Ω)V
GS = 10 V 6.5
Qg (Max.) (nC) 38
Qgs (nC) 5.0
Qgd (nC) 21
Configuration Single
N-Channel MOSFET
G
D
S
S
D
G
TO-220 FULLPAK
Available
RoHS*
COMPLIANT
ORDERING INFORMATION
Package TO-220 FULLPAK
Lead (Pb)-free IRFIBE20GPbF
SiHFIBE20G-E3
SnPb IRFIBE20G
SiHFIBE20G
ABSOLUTE MAXIMUM RATINGS TC = 25 °C, unless otherwise noted
PARAMETER SYMBOL LIMIT UNIT
Drain-Source Voltage VDS 800 V
Gate-Source Voltage VGS ± 20
Continuous Drain Current VGS at 10 V TC = 25 °C ID
1.4
A
TC = 100 °C 0.86
Pulsed Drain CurrentaIDM 5.6
Linear Derating Factor 0.24 W/°C
Single Pulse Avalanche EnergybEAS 180 mJ
Repetitive Avalanche CurrentaIAR 1.4 A
Repetitive Avalanche EnergyaEAR 3.0 mJ
Maximum Power Dissipation TC = 25 °C PD30 W
Peak Diode Recovery dV/dtcdV/dt 2.0 V/ns
Operating Junction and Storage Temperature Range TJ, Tstg - 55 to + 150 °C
Soldering Recommendations (Peak Temperature) for 10 s 300d
Mounting Torque 6-32 or M3 screw 10 lbf · in
1.1 N · m
* Pb containing terminations are not RoHS compliant, exemptions may apply
www.vishay.com Document Number: 91183
2S-81275-Rev. A, 16-Jun-08
IRFIBE20G, SiHFIBE20G
Vishay Siliconix
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
b. Pulse width 300 µs; duty cycle 2 %.
THERMAL RESISTANCE RATINGS
PARAMETER SYMBOL TYP. MAX. UNIT
Maximum Junction-to-Ambient RthJA -65
°C/W
Maximum Junction-to-Case (Drain) RthJC -4.1
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
PARAMETER SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT
Static
Drain-Source Breakdown Voltage VDS VGS = 0 V, ID = 250 µA 800 - - V
VDS Temperature Coefficient ΔVDS/TJ Reference to 25 °C, ID = 1 mA - 0.98 - V/°C
Gate-Source Threshold Voltage VGS(th) VDS = VGS, ID = 250 µA 2.0 - 4.0 V
Gate-Source Leakage IGSS V
GS = ± 20 V - - ± 100 nA
Zero Gate Voltage Drain Current IDSS
VDS = 800 V, VGS = 0 V - - 100 µA
VDS = 640 V, VGS = 0 V, TJ = 125 °C - - 500
Drain-Source On-State Resistance RDS(on) V
GS = 10 V ID = 0.84 Ab--6.5Ω
Forward Transconductance gfs VDS = 10 V, ID = 0.84 Ab1.0 - - S
Dynamic
Input Capacitance Ciss VGS = 0 V,
VDS = 25 V,
f = 1.0 MHz, see fig. 5
- 530 -
pF
Output Capacitance Coss - 150 -
Reverse Transfer Capacitance Crss -90-
Drain to Sink Capacitance C f = 1.0 MHz - 12 -
Total Gate Charge Qg
VGS = 10 V ID = 1.8 A, VDS = 400 V,
see fig. 6 and 13b
--38
nC Gate-Source Charge Qgs --5.0
Gate-Drain Charge Qgd --21
Turn-On Delay Time td(on)
VDD = 400 V, ID = 1.8 A,
RG = 18 Ω, RD= 230 Ω,
see fig. 10b
-8.2-
ns
Rise Time tr -17-
Turn-Off Delay Time td(off) -58-
Fall Time tf -27-
Internal Drain Inductance LD Between lead,
6 mm (0.25") from
package and center of
die contact
-4.5-
nH
Internal Source Inductance LS-7.5-
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current ISMOSFET symbol
showing the
integral reverse
p - n junction diode
--1.4
A
Pulsed Diode Forward CurrentaISM --5.6
Body Diode Voltage VSD TJ = 25 °C, IS = 1.4 A, VGS = 0 Vb--1.4V
Body Diode Reverse Recovery Time trr TJ = 25 °C, IF = 1.8 A, dI/dt = 100 A/µsb- 380 570 ns
Body Diode Reverse Recovery Charge Qrr - 0.94 1.4 µC
Forward Turn-On Time ton Intrinsic turn-on time is negligible (turn-on is dominated by LS and LD)
D
S
G
S
D
G
Document Number: 91183 www.vishay.com
S-81275-Rev. A, 16-Jun-08 3
IRFIBE20G, SiHFIBE20G
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
Fig. 1 - Typical Output Characteristics, TC = 25 °C
Fig. 2 - Typical Output Characteristics, TC = 150 °C
Fig. 3 - Typical Transfer Characteristics
Fig. 4 - Normalized On-Resistance vs. Temperature
www.vishay.com Document Number: 91183
4S-81275-Rev. A, 16-Jun-08
IRFIBE20G, SiHFIBE20G
Vishay Siliconix
Fig. 5 - Typical Capacitance vs. Drain-to-Source Voltage
Fig. 6 - Typical Gate Charge vs. Gate-to-Source Voltage
Fig. 7 - Typical Source-Drain Diode Forward Voltage
Fig. 8 - Maximum Safe Operating Area
Document Number: 91183 www.vishay.com
S-81275-Rev. A, 16-Jun-08 5
IRFIBE20G, SiHFIBE20G
Vishay Siliconix
Fig. 9 - Maximum Drain Current vs. Case Temperature
Fig. 10a - Switching Time Test Circuit
Fig. 10b - Switching Time Waveforms
Fig. 11 - Maximum Effective Transient Thermal Impedance, Junction-to-Case
Fig. 12a - Unclamped Inductive Test Circuit Fig. 12b - Unclamped Inductive Waveforms
Pulse width 1 µs
Duty factor 0.1 %
RD
VGS
RG
D.U.T.
10 V
+
-
VDS
VDD
VDS
90 %
10 %
VGS
td(on) trtd(off) tf
RG
IAS
0.01 Ω
tp
D.U.T
L
VDS
+
-VDD
10 V
Vary tp to obtain
required IAS
I
AS
V
DS
V
DD
V
DS
t
p
www.vishay.com Document Number: 91183
6S-81275-Rev. A, 16-Jun-08
IRFIBE20G, SiHFIBE20G
Vishay Siliconix
Fig. 12c - Maximum Avalanche Energy vs. Drain Current
Fig. 13a - Basic Gate Charge Waveform Fig. 13b - Gate Charge Test Circuit
QGS QGD
QG
V
G
Charge
10 V
D.U.T.
3 mA
VGS
VDS
IGID
0.3 µF
0.2 µF
50 kΩ
12 V
Current regulator
Current sampling resistors
Same type as D.U.T.
+
-
Document Number: 91183 www.vishay.com
S-81275-Rev. A, 16-Jun-08 7
IRFIBE20G, SiHFIBE20G
Vishay Siliconix
Fig.14 - For N-Channel
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see htt p://www.vishay.com/ppg?91183.
P.W.Period
dI/dt
Diode recovery
dV/dt
Ripple 5 %
Body diode forward drop
Re-applied
voltage
Reverse
recovery
current
Body diode forward
current
V
GS
= 10 V*
V
DD
I
SD
Driver gate drive
D.U.T. I
SD
waveform
D.U.T. V
DS
waveform
Inductor current
D = P.W.
Period
+
-
+
+
+
-
-
-
* VGS = 5 V for logic level devices
Peak Diode Recovery dV/dt Test Circuit
VDD
dV/dt controlled by RG
Driver same type as D.U.T.
ISD controlled by duty factor "D"
D.U.T. - device under test
D.U.T. Circuit layout considerations
Low stray inductance
Ground plane
Low leakage inductance
current transformer
RG
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Revision: 08-Feb-17 1Document Number: 91000
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