Document No. TRH-120S002D
Revise Date 2007/11/20
Thick Film High Voltage
Chip Resistors(for 1206) page number 4 / 10
TA-I TECHNOLOGY CO., LTD
6. Reliability Tests:(As specified in JIS C 5202)
Test Items Reference standard Condition of Test R
R∆Test Limits
Visual examination Checked by visual examination . The marking shall be legible ,
as checked by visual examination
Temperature Coefficient of
Resistance JIS-C5202-5.2 -55 ~ +125 ℃ Refer to paragraph 5
Dielectric Withstanding
Voltage
( Voltage Proof )
JIS-C5202-5.7 500Va. c., voltage , 1 min .
No abnormalities such as
flashover , burning dielectric
breakdown shall appear .
Insulation Resistance JIS-C5202-5.6 100V voltage , 1 min . ≧1G
Solderability JIS-C5202-6.11 245 ±5℃ solder, 2 ±0.5 sec dwell.
Solder : Sn96.5/Ag3/Cu0.5
At least 95% of surface area
of electrode shall be covered with
new solder.
Short Time Overload JIS-C5202-5.5 2.5 X rated voltage, 5s 1% : ±1 % + 0.05Ω
5% : ±2 % + 0.05Ω
Resistance to Soldering Heat JIS-C5202-6.10 260 ±5℃ solder , 10 ±1 sec dwell . 1% : ±0.5 % + 0.05Ω
5% : ±1 % + 0.05Ω
Rapid Change of Temperature JIS-C5202-7.4 -55℃ (30 min. ) / +125 ℃(30 min. )
5 cycles
Load Life JIS-C5202-7.10 1000 hours at rated power , 70℃ ,
1.5hours “ON “, 0.5hour “OFF”
1% : ±1 % + 0.05Ω
5% : ±3 % + 0.05Ω
Solubility resistance JIS-C5202-6.9 Ultrasonic for 1 minute
Solvent : isopropyl alcohol Marking shall be legible.
Resistance to Dry Heat JIS-C5202-7.2 155±5℃ for 96±4Hrs
1% : ±1 % + 0.05Ω
5% : ±3 % + 0.05Ω
Low Temperature Operation MIL-R-55342DR
-Para 4.7.4
At –65 ( +0 / -5 ) ℃ for 1 hr ,
RCWV applied
For 45 ( +5 / -0 ) minutes .
1% : ±0.5 % + 0.05Ω
5% : ±1 % + 0.05Ω
Robustness of Termination
(Bending) JIS-C5202—6.1 3mm deflection
1% : ±0.5 % + 0.05Ω
5% : ±1 % + 0.05Ω
Moisture Resistance Heat
MIL-STD-202F-
MIL-STD-202F-
Method 106F
IEC 60115-1 4.24.2
42 cycles , total 1000 hrs . 1% : ±0.5 % + 0.05Ω
5% : ±2 % + 0.05Ω