MII100-12A3
-di /dt = A/µs
T = °C
V
CES
V1200
collector emitter voltage
collector emitter saturation voltage
T = 25°C
collector current A
135
A
C
VJ
Symbol Definition
Ratings
typ. max.min.Conditions Unit
90
V
V
CE(sat)
total power dissipation 560 W
collector emitter leakage current
6.5 V
turn-on delay time 100 ns
t
reverse bias safe operating area
A
V
GES
V±20
V
GEM
max. transient gate emitter voltage
T = °C
C
V
P
tot
gate emitter threshold voltage
RBSOA
150
±30
T = °C
T = °C
VJ
V
max. DC gate voltage
I
C25
I
C
T = 25°C
VJ
I = A; V = 15 V
CGE
T = 25°C
VJ
V
GE(th)
I
CES
I = mA; V = V
CGECE
V = V ; V = 0 V
CE CES GE
I
GES
T = 25°C
VJ
gate emitter leakage current V = ±20 V
GE
2.7
2.7
5.54.5
mA
7.5 mA
5
300
G(on)
total gate charge V = V; V = 15 V; I = A
CE
Q
GE C
350 nC
t
t
t
E
E
d(on)
r
d(off)
f
on
off
50 ns
650 ns
50 ns
12.1 mJ
10.5 mJ
current rise time
turn-off delay time
current fall time
turn-on energy per pulse
turn-off energy per pulse
inductive load
V = V; I = A
V = ±15 V; R = Ω
CE C
GE G
V = ±15 V; R = Ω
GE G
V = V
CEmax
1200
short circuit safe operating area
µs
SCSOA
10T = °C
VJ
V = V; V = ±15 V
CE GE
short circuit duration
t
short circuit current
I
SC
SC
R = Ω; non-repetitive
G
270 A
R
thJC
thermal resistance junction to case 0.22 K/W
V
RRM
V1200
max. repetitive reverse voltage T = 25°C
VJ
T = 25°C
forward current A
150
A
C
95T = °C
C
I
F25
I
F
T = 25°C
forward voltage V
2.50
V
VJ
1.70T = 125°C
VJ
V
F
I = A
F
T = 25°C
reverse current mA
1
mA
VJ
1.5T = 125°C
VJ
I
RR RRM
T = 125°C
VJ
Q
I
t
rr
RM
rr
7µC
62 A
200 ns
reverse recovery charge
max. reverse recovery current
reverse recovery time
V =
I = A; V = 0 V
F
FGE
E
rec
1.2 mJ
reverse recovery energy
R
R
thJC
thermal resistance junction to case 0.45 K/W
V = V
T = 25°C
C
T = 25°C
VJ
T = °C
VJ
VJ
75
3
75
75
75
75
15
15
15
600
1200
600
600
I
CM
2.2
R
thCH
thermal resistance case to heatsink 0.22 K/W
R
thCH
thermal resistance case to heatsink 0.45 K/W
IGBT
Diode
600 V
V = V
CEmax
1200
80
80
80
80
125
125
125
125
125
nA
IXYS reserves the right to change limits, conditions and dimensions. 20131206aData according to IEC 60747and per semiconductor unless otherwise specified
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