7
Parameter Symbol Typ. Units Conditions Fig. Note
IHYS 1.2 mA IHYS = ITH+ - ITH-
Hysteresis 1
VHYS 1.1 V VHYS = VTH+ - VTH-
Input Clamp Voltage VILC -0.76 V VILC = V2 - V3; V3 = GND;
IIN = -10 mA
Bridge Diode VD1,2 0.62 IIN = 3 mA (see schematic)
Forward Voltage VD3,4 0.73
Input-Output Resistance RI-O 1012 ΩVI-O = 500 Vdc 9
Input-Output Capacitance CI-O 2.0 pF f = 1 MHz, VI-O = 0 Vdc
Input Capacitance CIN 50 pF f = 1 MHz; VIN = 0 V,
Pins 2 & 3, Pins 1 & 4 Open
Output Rise Time tr10 µs7
(10-90%)
Output Fall Time tf0.5 µs7
(90-10%)
Typical Characteristics All typical values are at TA = 25°C, VCC = 5 V, unless otherwise specified.
Notes:
1. Maximum operating frequency is
defined when output waveform (Pin 6)
attains only 90% of VCC with RL = 1.8
kΩ, CL = 15 pF using a 5 V square
wave input signal.
2. Measured at a point 1.6 mm below
seating plane.
3. Current into/out of any single lead.
4. Surge input current duration is 3 ms at
120 Hz pulse repetition rate. Transient
input current duration is 10 µs at
120 Hz pulse repetition rate. Note that
maximum input power, PIN, must be
observed.
5. Derate linearly above 100°C free-air
temperature at a rate of 4.26 mW/°C.
Maximum input power dissipation of
195 mW allows an input IC junction
temperature of 150°C at an ambient
temperature of TA = 125°C with a
typical thermal resistance from
junction to ambient of θJAi = 235°C/W.
The typical thermal resistance from
junction to case is equal to 170°C/W.
Excessive PIN and TJ may result in
device degradation.
6. The 1.8 kΩ load represents 1 TTL unit
load of 1.6 mA and the 4.7 kΩ pull-up
resistor.
7. Logic low output level at Pin 6 occurs
under the conditions of VIN ≥ VTH+ as
well as the range of VIN > VTH – once
VIN has exceeded VTH+. Logic high
output level at Pin 6 occurs under the
conditions of VIN ≤ VTH- as well as the
range of VIN < VTH+ once VIN has
decreased below VTH-.
8. The ac voltage is instantaneous
voltage.
9. Device considered a two terminal
device: Pins 1, 2, 3, 4 connected
together, Pins 5, 6, 7 8 connected
together.
10. This is a momentary withstand test,
not an operating condition.
11. The tPHL propagation delay is
measured from the 2.5 V level of the
leading edge of a 5.0 V input pulse (1
µs rise time) to the 1.5 V level on the
leading edge of the output pulse (see
Figure 7).
12. The tPLH propagation delay is
measured from the 2.5 V level of the
trailing edge of a 5.0 V input pulse (1
µs fall time) to the 1.5 V level on the
trailing edge of the output pulse (see
Figure 7).
13. Common mode transient immunity in
Logic High level is the maximum
tolerable dVCM/dt of the common mode
voltage, VCM, to ensure that the output
will remain in a Logic High state (i.e.,
VO > 2.0 V). Common mode transient
immunity in Logic Low level is the
maximum tolerable dVCM/dt of the
common mode voltage, VCM, to ensure
that the output will remain in a Logic
Low state (i.e., VO < 0.8 V). See
Figure 8.
14. In applications where dVCM/dt may
exceed 50,000 V/µs (such as static
discharge), a series resistor, RCC,
should be included to protect the
detector IC from destructively high
surge currents. The recommended
value for RCC is 240 Ω per volt of
allowable drop in VCC (between Pin 8
and VCC) with a minimum value of
240 Ω.
15. D1 and D2 are Schottky diodes; D3
and D4 are zener diodes.
16. Standard parts receive 100% testing at
25°C (Subgroups 1 and 9). SMD,
Class H and Class K parts receive
100% testing at 25, 125, and -55°C
(Subgroups 1 and 9, 2 and 10 ,3 and
11, respectively.)
17. Parameters shall be tested as part of
device initial characterization and after
process changes. Parameters shall be
guaranteed to the limits specified for
all lots not specifically tested.