2 Motorola Thyristor Device Data
THERMAL CHARACTERISTICS
Characteristic Symbol Max Unit
Thermal Resistance, Junction to Case RθJC 2°C/W
Thermal Resistance, Case to Sink RθCS 2.2 (typ) °C/W
Thermal Resistance, Junction to Ambient RθJA 60 °C/W
ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted.)
Characteristic Symbol Min Typ Max Unit
Peak Blocking Current (Either Direction) TJ = 25°C
(VD = Rated VDRM, TJ = 125°C, Gate Open) IDRM —
——
—10
2µA
mA
Peak On-State Voltage (Either Direction)
(ITM = 21 A Peak; Pulse Width = 1 to 2 ms, Duty Cycle
p
2%) VTM —1.3 1.6 Volts
Gate Trigger Current (Continuous dc)
(Main Terminal Voltage = 12 Vdc, RL = 100 Ohms)
MT2(+), G(+)
MT2(+), G(–)
MT2(–), G(–)
MT2(–), G(+)
IGT
—
—
—
—
—
—
—
—
50
50
50
75
mA
Gate Trigger Voltage (Continuous dc)
(Main Terminal Voltage = 12 Vdc, RL = 100 Ohms)
MT2(+), G(+)
MT2(+), G(–)
MT2(–), G(–)
MT2(–), G(+)
(Main Terminal Voltage = Rated VDRM, RL = 10 kΩ, TJ = +110°C)
MT2(+), G(+); MT2(–), G(–); MT2(+), G(–);
MT2(–), G(+)
VGT
—
—
—
—
0.2
0.2
0.9
0.9
1.1
1.4
—
—
2
2
2
2.5
—
—
Volts
Holding Current (Either Direction)
(Main Terminal Voltage = 12 Vdc, Gate Open,
Initiating Current = 200 mA)
IH— 6 40 mA
Turn-On Time
(VD = Rated VDRM, ITM = 17 A, IGT = 120 mA,
Rise T ime = 0.1 µs, Pulse Width = 2 µs)
tgt —1.5 — µs
Critical Rate of Rise of Commutation Voltage
(VD = Rated VDRM, ITM = 21 A, Commutating di/dt = 7.6 A/ms,
Gate Unenergized, TC = 80°C)
dv/dt(c) — 5 — V/µs
MT2(+)
QUADRANT II QUADRANT I
QUADRANT III QUADRANT IV
MT2(–)
G(–) G(+)
MT2(+), G(–) MT2(+), G(+)
MT2(–), G(–) MT2(–), G(+)
T rigger devices are recommended for gating on T riacs. They provide:
1. Consistent predictable turn–on points.
2. Simplified circuitry.
3. Fast turn–on time for cooler, more efficient and reliable operation.
ELECTRICAL CHARACTERISTICS of RECOMMENDED
BIDIRECTIONAL SWITCHES
QUADRANT DEFINITIONS
Part Number
Usage General
MBS4992MBS4991
VS
IS
VS1–VS2
Temperature
Coefficient
6–10 V 7.5–9 V
350 µA Max 120 µA Max
0.5 V Max 0.2 V Max
0.02%/°C T yp
1. Ratings apply for open gate conditions. Thyristor devices shall not be tested with a constant current source for blocking capability such that the
voltage applied exceeds the rated blocking voltage.