HEXFET® Power MOSFET
PD -95037B
lAdavanced Process Technology
lUltra Low On-Resistance
lDual N-Channel MOSFET
lSurface Mount
lAvailable in Tape & Reel
lDynamic dv/dt Rating
lFast Switching
lLead-Free
Description
The SO-8 has been modified through a customized
leadframe for enhanced thermal characteristics and
dual-die capability making it ideal in a variety of power
applications. With these improvements, multiple
devices can be used in an application with dramatically
reduced board space. The package is designed for
vapor phase, infra red, or wave soldering techniques.
Power dissipation of greater than 0.8W is possible in
a typical PCB mount application.
IRF7103PbF
D1
D1
D2
D2
G1
S2
G2
S1
Top View
8
1
2
3
45
6
7
VDSS = 50V
RDS(on) = 0.130
ID = 3.0A
02/09/10
Parameter Min. Typ. Max. Units
RθJA Maximum Junction-to-Ambient   62.5 °C/W
Parameter Max. Units
ID @ TA = 25°C Continuous Drain Current, VGS @ 10V 3.0
ID @ TA = 70°C Continuous Drain Current, VGS @ 10V 2.3
IDM Pulsed Drain Current 10
PD @TA = 25°C Power Dissipation 2.0
Linear Derating Factor 0.016 W/°C
VGS Gate-to-Source Voltage ± 20 V
dv/dt Peak Diode Recovery dv/dt 4.5 V/nS
TJ, TSTG Junction and Storage Temperature Range -55 to + 150
Absolute Maximum Ratings
A
Thermal Resistance Ratings
W
°C
SO-8
IRF7103PbF
Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage 50   V VGS = 0V, ID = 250µA
V(BR)DSS/TJBreakdown Voltage Temp. Coefficient  0.049  V/°C Reference to 25°C, ID = 1mA
 0.11 0.13 VGS = 10V, ID = 3.0A
 0.16 0.20 VGS = 4.5V, ID = 1.5A
VGS(th) Gate Threshold Voltage 1.0  3.0 V VDS = VGS, ID = 250µA
gfs Forward Transconductance  3.8  S VDS = 15V, ID = 3.0A
  2.0 VDS = 40V, VGS = 0V
  25 VDS = 40V, VGS = 0V, TJ = 55 °C
Gate-to-Source Forward Leakage   100 VGS = 20V
Gate-to-Source Reverse Leakage   -100 VGS = - 20V
QgTotal Gate Charge  12 30 ID = 2.0A
Qgs Gate-to-Source Charge  1.2  nC VDS = 25V
Qgd Gate-to-Drain ("Miller") Charge  3.5  VGS = 10V
td(on) Turn-On Delay Time  9.0 20 VDD = 25V
trRise Time  8.0 20 ID = 1.0A
td(off) Turn-Off Delay Time  45 70 RG = 6.0
tfFall Time  25 50 RD = 25
Between lead,6mm(0.25in.)
from package and center
of die contact
Ciss Input Capacitance  290  VGS = 0V
Coss Output Capacitance  140  pF VDS = 25V
Crss Reverse Transfer Capacitance  37  = 1.0MHz
Parameter Min. Typ. Max. Units Conditions
ISContinuous Source Current MOSFET symbol
(Body Diode) showing the
ISM Pulsed Source Current integral reverse
(Body Diode) p-n junction diode.
VSD Diode Forward Voltage   1.2 V TJ = 25°C, IS = 1.5A, VGS = 0V
trr Reverse Recovery Time  70 100 ns TJ = 25°C, IF = 1.5A
Qrr Reverse RecoveryCharge  110 170 nC di/dt = 100A/µs
ton Forward Turn-On Time
Source-Drain Ratings and Characteristics
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
  12
  2.0
A
S
D
G
IGSS
IDSS Drain-to-Source Leakage Current
LSInternal Source Inductance  6.0 
LDInternal Drain Inductance  4.0 
nH
ns
nA
µA
RDS(ON) Static Drain-to-Source On-Resistance
S
D
G
Notes:
Repetitive rating; pulse width limited by
max. junction temperature.
ISD 1.8A, di/dt 90A/µs, VDD V(BR)DSS,
TJ 150°C
Pulse width 300µs; duty cycle 2%.
Surface mounted on FR-4 board, t 10sec.
IRF7103PbF
IRF7103PbF
C,
IRF7103PbF
Fig 10a. Switching Time Test Circuit
+
-
VDS
90%
10%
VGS
t
d(on)
t
r
t
d(off)
t
f
VDS
10V
Pulse Width 1 µs
Duty Factor ≤ 0.1 %
Fig 10b. Switching Time Waveforms
RD
VGS
VDD
RG
D.U.T.
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient
0.1
1
10
100
0.0001 0.001 0.01 0.1 1 10 100
Notes:
1. Duty factor D = t / t
2. Peak T = P x Z + T
1 2
JDM thJA A
P
t
t
DM
1
2
t , Rectangular Pulse Duration (sec)
Thermal Response (Z )
1
thJA
0.01
0.02
0.05
0.10
0.20
D = 0.50
SINGLE PULSE
(THERMAL RESPONSE)
TA, Ambient Temperature (°C)
Fig 9. Maximum Drain Current Vs.
Ambient Temperature
IRF7103PbF
Fig 12a. Basic Gate Charge Waveform Fig 12b. Gate Charge Test Circuit
D.U.T. V
DS
I
D
I
G
3mA
V
GS
.3µF
50K
.2µF
12V
Current Regulator
Same Type as D.U.T.
Current Sampling Resistors
+
-
QG
QGS QGD
VG
Charge
10V
IRF7103PbF
P.W. Period
di/dt
Diode Recovery
dv/dt
Ripple 5%
Body Diode Forward Drop
Re-Applied
Voltage
Reverse
Recovery
Current
Body Diode Forward
Current
V
GS
=10V
V
DD
I
SD
Driver Gate Drive
D.U.T. I
SD
Waveform
D.U.T. V
DS
Waveform
Inductor Curent
D = P. W .
Period
+
-
+
+
+
-
-
-
Fig 13. For N-Channel HEXFETS
* VGS = 5V for Logic Level Devices
Peak Diode Recovery dv/dt Test Circuit
RG
VDD
dv/dt controlled by RG
Driver same type as D.U.T.
ISD controlled by Duty Factor "D"
D.U.T. - Device Under Test
D.U.T Circuit Layout Considerations
Low Stray Inductance
Ground Plane
Low Leakage Inductance
Current Transformer
*
IRF7103PbF
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/
SO-8 Package Outline(Mosfet & Fetky)
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Dimensions are shown in milimeters (inches)
SO-8 Part Marking Information
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IRF7103PbF
Data and specifications subject to change without notice.
This product has been designed and qualified for the Consumer market.
Qualifications Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.02/2010
330.00
(12.992)
MAX.
14.40 ( .566 )
12.40 ( .488 )
NOTES :
1. CONTROLLING DIMENSION : MILLIMETER.
2. OUTLINE CONFORMS TO EIA-481 & EIA-541.
FEED DIRECTION
TERMINAL NUMBER 1
12.3 ( .484 )
11.7 ( .461 )
8.1 ( .318 )
7.9 ( .312 )
NOTES:
1. CONTROLLING DIMENSION : MILLIMETER.
2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS(INCHES).
3. OUTLINE CONFORMS TO EIA-481 & EIA-541.
SO-8 Tape and Reel (Dimensions are shown in milimeters (inches))