IXA40RG1200DHGLB
tentative
-di /dt = A/µs
T = 125°C
V
CES
V1200
collector emitter voltage
collector emitter saturation voltage
T = 25°C
collect or current A
61
A
C
VJ
Symbol Definition
Ratings
typ. max.min.Conditions Unit
43
V
V
CE(sat)
total power dissipation 215 W
collector emitter leakage current
6.5 V
turn-on delay time 70 ns
t
reverse bias safe operating area
A
V
GES
V±20
V
GEM
max. transient co l l e c to r ga te voltage
T = °C
C
V
P
tot
gate emitter threshold voltage
RBSOA
105
±30
T = 125°C
T = 125°C
VJ
V
max. DC gate voltage
I
C25
I
C
T = 25°C
VJ
I = A; V = 15 V
CGE
T = 25°C
VJ
V
GE(th)
I
CES
I = mA; V = V
CGECE
V = V ; V = 0 V
CE CES GE
I
GES
T = 25°C
VJ
gate emitter leakage current V = ±20 V
GE
2.1
2.1
5.95.4
mA
0.1 mA
0.1
nA
500
G(on)
total gate charge V = V; V = 15 V; I = A
CE
Q
GE C
107 nC
t
t
t
E
E
d(on)
r
d(off)
f
on
off
40 ns
250 ns
100 ns
3.8 mJ
4.1 mJ
current rise time
turn-off delay time
current fall time
turn-on energy per pulse
turn-off energy per pulse
inductive load
V = V; I = A
V = ±15 V; R = Ω
CE C
GE G
V = ±15 V; R = Ω
GE G
V = V
CEmax
1200
short circuit safe operating area
µs
SCSOA
10T = 125°C
VJ
V = V; V = ±15 V
CE GE
short circuit duration
t
short circuit current
I
SC
SC
R = Ω; non-repetitive
G
140 A
R
thJC
thermal resistance junction to case 0.58 K/W
V
RRM
V1200
max. repetitive rev ers e voltage T = 25°C
VJ
T = 25°C
forward current A
48
A
C
32T = °C
C
I
F25
I
F
T = 25°C
forward voltage V
2.20
V
VJ
1.90T = 125°C
VJ
V
F
I = A
F
T = 25°C
reverse current mA
0.03
mA
VJ
0.15T = 125°C
VJ
I
RR RRM
T = 125°C
VJ
Q
I
t
rr
RM
rr
3.5 µC
30 A
350 ns
reverse recovery charge
max. reverse recovery current
reverse recovery time
V =
I = A; V = 0 V
F
FGE
E
rec
0.9 mJ
reverse recovery energy
R
R
thJC
thermal resistance junction to case 1K/W
V = V
T = 25°C
C
T = 25°C
VJ
T = 125°C
VJ
VJ
35
1.5
35
35
30
30
27
27
27
600
900
600
600
I
CM
1.8
R
thCH
thermal resistance case to heatsink 0.17 K/W
R
thCH
thermal resistance case to heatsink 0.3 K/W
Boost IGBT
Boost Diode BD
600 V
V = V
CEmax
1200
80
80
80
80
IXYS reserves the right to change limits, conditions and dimensions. 20120618Data according to IEC 60747and per semiconductor unless otherwise specified
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