MAX17024
Single Quick-PWM Step-Down
Controller with Dynamic REFIN
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When only using ceramic output capacitors, output
overshoot (VSOAR) typically determines the minimum
output capacitance requirement. Their relatively low
capacitance value may allow significant output over-
shoot when stepping from full-load to no-load condi-
tions, unless designed with a small inductance value
and high switching frequency to minimize the energy
transferred from the inductor to the capacitor during
load-step recovery.
Unstable operation manifests itself in two related but
distinctly different ways: double pulsing and feedback-
loop instability. Double pulsing occurs due to noise on
the output or because the ESR is so low that there is
not enough voltage ramp in the output voltage signal.
This “fools” the error comparator into triggering a new
cycle immediately after the minimum off-time period
has expired. Double pulsing is more annoying than
harmful, resulting in nothing worse than increased out-
put ripple. However, it can indicate the possible pres-
ence of loop instability due to insufficient ESR. Loop
instability can result in oscillations at the output after
line or load steps. Such perturbations are usually
damped, but can cause the output voltage to rise
above or fall below the tolerance limits.
The easiest method for checking stability is to apply a
very fast zero-to-max load transient and carefully
observe the output voltage-ripple envelope for over-
shoot and ringing. It can help to simultaneously monitor
the inductor current with an AC current probe. Do not
allow more than one cycle of ringing after the initial
step-response under/overshoot.
Input Capacitor Selection
The input capacitor must meet the ripple current
requirement (IRMS) imposed by the switching currents.
The IRMS requirements can be determined by the fol-
lowing equation:
The worst-case RMS current requirement occurs when
operating with VIN = 2VOUT. At this point, the above
equation simplifies to IRMS = 0.5 x ILOAD.
For most applications, nontantalum chemistries (ceramic,
aluminum, or OS-CON) are preferred due to their resis-
tance to inrush surge currents typical of systems with a
mechanical switch or connector in series with the input.
If the Quick-PWM controller is operated as the second
stage of a two-stage power-conversion system, tanta-
lum input capacitors are acceptable. In either configu-
ration, choose an input capacitor that exhibits less than
+10°C temperature rise at the RMS input current for
optimal circuit longevity.
Power-MOSFET Selection
Most of the following MOSFET guidelines focus on the
challenge of obtaining high load-current capability
when using high-voltage (> 20V) AC adapters. Low-
current applications usually require less attention.
The high-side MOSFET (NH) must be able to dissipate
the resistive losses plus the switching losses at both
VIN(MIN) and VIN(MAX). Calculate both these sums.
Ideally, the losses at VIN(MIN) should be roughly equal to
losses at VIN(MAX), with lower losses in between. If the
losses at VIN(MIN) are significantly higher than the losses
at VIN(MAX), consider increasing the size of NH(reducing
RDS(ON) but with higher CGATE). Conversely, if the losses
at VIN(MAX) are significantly higher than the losses at
VIN(MIN), consider reducing the size of NH(increasing
RDS(ON) to lower CGATE). If VIN does not vary over a
wide range, the maximum efficiency occurs where the
resistive losses equal the switching losses.
Choose a low-side MOSFET that has the lowest possible
on-resistance (RDS(ON)), comes in a moderate-sized
package (i.e., one or two 8-pin SOs, DPAK, or D2PAK),
and is reasonably priced. Make sure that the DL gate
driver can supply sufficient current to support the gate
charge and the current injected into the parasitic gate-
to-drain capacitor caused by the high-side MOSFET
turning on; otherwise, cross-conduction problems may
occur (see the
MOSFET Gate Drivers
section).
MOSFET Power Dissipation
Worst-case conduction losses occur at the duty factor
extremes. For the high-side MOSFET (NH), the worst-
case power dissipation due to resistance occurs at the
minimum input voltage:
Generally, a small high-side MOSFET is desired to
reduce switching losses at high-input voltages.
However, the RDS(ON) required to stay within package-
power dissipation often limits how small the MOSFET
can be. Again, the optimum occurs when the switching
losses equal the conduction (RDS(ON)) losses. High-
side switching losses do not usually become an issue
until the input is greater than approximately 15V.
Calculating the power dissipation in the high-side MOS-
FET (NH) due to switching losses is difficult since it must
allow for difficult quantifying factors that influence the
turn-on and turn-off times. These factors include the
internal gate resistance, gate charge, threshold voltage,
source inductance, and PCB layout characteristics. The
following switching-loss calculation provides only a very