DATA SH EET
Product data sheet 2003 Oct 09
DISCRETE SEMICONDUCTORS
PBSS5250T
50 V, 2 A
PNP low VCEsat (BISS) transistor
ag
e
M3D088
2003 Oct 09 2
NXP Semiconductors Product data sheet
50 V, 2 A
PNP low VCEsat (BISS) transistor PBSS5250T
FEATURES
Low collector-emitter saturation volt age VCEsat
High collector current capability: IC and ICM
Higher efficiency leading to less heat generation
Reduced printed-circuit bo ard requirements
Cost effective alternative to MOSFETs in specific
applications.
APPLICATIONS
Power management
DC/DC converters
Supply line switching
Battery charger
LCD backlighting
Peripheral drivers
Driver in low su pply voltage applications (e.g. lamps
and LEDs)
Inductive load driver (e.g. relays, buzzers and motors).
DESCRIPTION
PNP BISS transistor in a SOT23 plastic pa ck age offering
ultra low VCEsat an d RCEsat parameters.
MARKING
Note
1. * = p: Made in Hong Kong.
* = t: Made in Malaysia.
* = W: Made in China.
TYPE NUMBER MARKING CODE(1)
PBSS5250T 3H*
PINNING
PIN DESCRIPTION
1base
2emitter
3collector
handbook, halfpage
21
3
MAM256
Top view
2
3
1
Fig.1 Simplified outline (SOT23 ) and symbo l .
QUICK REFERENCE DATA
SYMBOL PARAMETER MAX. UNIT
VCEO collector-emitter voltage 50 V
ICcollector current (DC) 2 A
ICM peak collector current 3 A
RCEsat equivalent on-resistance 150 mΩ
ORDERING INFORMATION
TYPE NUMBER PACKAGE
NAME DESCRIPTION VERSION
PBSS5250T plastic surface mounted package; 3 leads SOT23
2003 Oct 09 3
NXP Semiconductors Pr oduct data shee t
50 V, 2 A
PNP low VCEsat (BISS) transistor PBSS5250T
LIMITING VALUES
In accordance with the Absolute Max imum Rating System (IEC 60134).
Notes
1. Device mounted o n a FR4 printed-circuit b oard; single-sided copper; tinplated; stand ar d footprint.
2. Device mounted o n a FR 4 printed-circuit board; single-sided copper; tinplate d; mounting pad for collector 1 cm2.
THERMAL CHARACTE RISTICS
Notes
1. Device mounted o n a FR4 printed-circuit b oard; single-sided copper; tinplated; stand ar d footprint.
2. Device mounted o n a FR 4 printed-circuit board; single-sided copper; tinplate d; mounting pad for collector 1 cm2.
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
VCBO collector-base volta ge open emitter 50 V
VCEO collector-emitter voltage open base 50 V
VEBO emitter-base voltage open collector 5 V
ICcollector current (DC) 2 A
ICM peak collector current single peak 3 A
IBbase current (DC) 300 mA
Ptot total power dissipation Tamb 25 °C; note 1 300 mW
Tamb 25 °C; note 2 480 mW
Tjjunction temperature 150 °C
Tamb operating ambient temperature 65 +150 °C
Tstg storage temperature 65 +150 °C
SYMBOL PARAMETER CONDITIONS VALUE UNIT
Rth j-a thermal resistance from junction to ambient in free air; note 1 417 K/W
in free air; note 2 260 K/W
2003 Oct 09 4
NXP Semiconductors Pr oduct data shee t
50 V, 2 A
PNP low VCEsat (BISS) transistor PBSS5250T
CHARACTERISTICS
Tj = 25 °C; unless otherwise specified.
Note
1. Pulse test: tp 300 μs; δ 0.02.
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
ICBO collector cut-off current VCB = 50 V; IE = 0 −−−100 nA
VCB = 50 V; IE = 0; Tj = 150 °C−−−50 μA
IEBO emitter cut-off current VEB = 5 V; IC = 0 −−−100 nA
hFE DC current gain VCE = 2 V; IC = 0.5 A 200
VCE = 2 V; IC = 1 A; note 1 200
VCE = 2 V; IC = 2 A; note 1 130
VCEsat collector-emitter saturation
voltage IC = 0.5 A; IB = 50 mA −−−90 mV
IC = 1 A; IB = 50 mA −−−180 mV
IC = 2 A; IB = 100 mA −−−300 mV
RCEsat equivalent on-resistance IC = 2 A; IB = 200 mA; note 1 −−150 mΩ
VBEsat base-emitt er saturatio n voltage IC = 2 A; IB = 100 mA; note 1 −−−1.1 V
VBEon base-emitter turn-on voltage VCE = 2 V; IC = 1 A; note 1 1.2 −−V
fTtransition frequen c y IC = 100 mA; VCE = 5 V;
f = 100 MHz 100 −−MHz
Cccollector capacitance VCB = 10 V; IE = Ie = 0; f = 1 MHz −−35 pF
2003 Oct 09 5
NXP Semiconductors Pr oduct data shee t
50 V, 2 A
PNP low VCEsat (BISS) transistor PBSS5250T
PACKAGE OUTLINE
UNIT A1
max. bpcDE e1HELpQwv
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
97-02-28
99-09-13
IEC JEDEC EIAJ
mm 0.1 0.48
0.38 0.15
0.09 3.0
2.8 1.4
1.2 0.95
e
1.9 2.5
2.1 0.55
0.45 0.1
0.2
DIMENSIONS (mm are the original dimensions)
0.45
0.15
SOT23 TO-236AB
bp
D
e1
e
A
A1
Lp
Q
detail X
HE
E
wM
vMA
B
AB
0 1 2 mm
scale
A
1.1
0.9
c
X
12
3
Plastic surface mounted package; 3 leads SOT2
3
2003 Oct 09 6
NXP Semiconductors Pr oduct data shee t
50 V, 2 A
PNP low VCEsat (BISS) transistor PBSS5250T
DATA SHEET STATUS
Notes
1. Please consult the most rec en tly issued document before initiating or co mpleting a design.
2. The product s tatus of device(s ) described in this do cument may have changed since this docu ment was published
and may differ in case of multiple devices. The latest product status information is available on th e Internet at
URL http://www.nxp.com.
DOCUMENT
STATUS(1) PRODUCT
STATUS(2) DEFINITION
Objective data sheet Development This document contains data from the objective specification for pro duct
development.
Preliminary data sheet Qualification This document contains data from the preliminary specification.
Product data sheet Production T his document contains the produc t s pecification.
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does not give any representations or warranties,
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published in this doc ument, including without limitation
specifications and product descriptions, at any time and
without notice. This document supersedes and replaces all
information supplied prior to the publication hereo f.
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not designed, au thorized or warran ted to be suitable for
use in medical, military, aircraft, space or life support
equipment, nor in applications where failure or malfunction
of an NXP Semiconductors product can reasonably be
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property or environmental damage. NXP Semiconductors
accepts no liability for inclusion and/or use of NXP
Semiconductors products in such equipment or
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Applications Applications that are described herein for
any of these products are for illustrative purposes only.
NXP Semiconductors makes no representation or
warranty that such applications will be suitable for the
specified use witho ut fu rth e r testing or modification .
Limiting values Stress above one or more limiting
values (as defined in the Absolute Maximum Ratings
System of IEC 60134) may cause permanent damage to
the device. Limiting values are stress ratin gs only and
operation of the device at these or any other conditions
above those given in the Characteristics sections of this
document is not implied. Exposure to limiting values for
extended periods may affect device reliability.
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regulations. Export might require a prior authorization from
national author ities.
Quick refer ence data The Quick reference data is an
extract of th e product data given in the Limiting values an d
Characteristics sections of this document, and as such is
not complete, exhaus tive or legally binding.
NXP Semiconductors
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Customer notification
This data sheet was changed to reflect the new company name NXP Semicon ductors. No change s were
made to the content, except for the legal definitions and disclaimer s.
Printed in The Netherlands R75/01/pp7 Date of release: 2003 Oct 09 Document orde r number: 9397 750 11904