MAX4575/MAX4576/MAX4577
±15kV ESD-Protected, Low-Voltage, Dual, SPST,
CMOS Analog Switches
turns off when the ESD event is finished and normal
operation may be resumed. Also, keep in mind that the
holding current varies significantly with temperature.
The worst case is at +85°C when the holding currents
drop to 70mA. Since this is a typical number to guaran-
tee turn-off of the SCRs under all conditions, the sources
connected to these terminals should be current limited
to not more than half this value. When the SCR is
latched, the voltage across it is about 3V, depending on
the polarity of the pin current. The supply voltages do
not affect the holding current appreciably. The sources
connected to the COM side of the switches do not need
to be current limited since the switches turn off internally
when the corresponding SCR(s) latches.
Even though most of the ESD current flows to GND
through the SCRs, a small portion of it goes into V+.
Therefore, it is a good idea to bypass the V+ with 0.1µF
capacitors directly to the ground plane.
ESD protection can be tested in various ways. Trans-
mitter outputs and receiver inputs are characterized for
protection to the following:
•±15kV using the Human Body Model
•±8kV using the Contact Discharge method speci-
fied in IEC 1000-4-2 (formerly IEC 801-2)
•±15kV using the Air-Gap Discharge method speci-
fied in IEC 1000-4-2 (formerly IEC 801-2).
ESD Test Conditions
Contact Maxim Integrated Products for a reliability
report that documents test setup, methodology, and
results.
Human Body Model
Figure 6 shows the Human Body Model and Figure 7
shows the waveform it generates when discharged into
a low impedance. This model consists of a 100pF
capacitor charged to the ESD voltage of interest, which
can be discharged into the test device through a 1.5kΩ
resistor.
IEC 1000-4-2
The IEC 1000-4-2 standard covers ESD testing and per-
formance of finished equipment; it does not specifically
refer to integrated circuits. The MAX4575/MAX4576/
MAX4577 enable the design of equipment that meets
Level 4 (the highest level) of IEC 1000-4-2, without addi-
tional ESD protection components.
The major difference between tests done using the
Human Body Model and IEC 1000-4-2 is higher peak
current in IEC 1000-4-2. Because series resistance is
lower in the IEC 1000-4-2 ESD test model (Figure 8),
the ESD withstand voltage measured to this standard is
generally lower than that measured using the Human
Body Model. Figure 9 shows the current waveform for
the ±8kV IEC 1000-4-2 Level 4 ESD Contact Discharge
test.
The Air-Gap test involves approaching the device with
a charged probe. The Contact Discharge method con-
nects the probe to the device before the probe is ener-
gized.
Chip Information
TRANSISTOR COUNT: 78
PROCESS: CMOS
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