IXYS Reserves The Right to Change Limits, Test Conditions, and Dimensions.
IXTF1N250
IXYS MOSFETs and IGBTs are covered 4,835,592 4,931,844 5,049,961 5,237,481 6,162,665 6,404,065 B1 6,683,344 6,727,585 7,005,734 B2 7,157,338B2
by one or moreof the following U.S. patents: 4,850,072 5,017,508 5,063,307 5,381,025 6,259,123 B1 6,534,343 6,710,405 B2 6,759,692 7,063,975 B2
4,881,106 5,034,796 5,187,117 5,486,715 6,306,728 B1 6,583,505 6,710,463 6,771,478 B2 7,071,537
Symbol Test Conditions Characteristic Values
(TJ = 25°C, Unless Otherwise Specified) Min. Typ. Max.
gfs VDS = 50V, ID = 0.5 • ID25, Note 1 1.0 1.8 mS
Ciss 1660 pF
Coss VGS = 0V, VDS = 25V, f = 1MHz 77 pF
Crss 23 pF
td(on) 69 ns
tr 25 ns
td(off) 132 ns
tf 39 ns
Qg(on) 41 nC
Qgs VGS = 10V, VDS = 600V, ID = 0.5 • ID25 8 nC
Qgd 16 nC
RthJC 1.13 °C/W
RthCS 0.21 °C/W
Source-Drain Diode
Symbol Test Conditions Characteristic Values
(TJ = 25°C, Unless Otherwise Specified) Min. Typ. Max.
ISVGS = 0V 1.5 A
ISM Repetitive, pulse width limited by TJM 6 A
VSD IF = 1A, VGS = 0V, Note 1 1.5 V
trr IF = 1A, -di/dt = 100A/µs, VR = 200V 2.5 µs
Resistive Switching Times
VGS = 10V, VDS = 0.5 • VDSS, ID = ID25
RG = 5Ω (External)
ISOPLUS i4-PakTM (HV) Outline
Pin 1 = Gate
Pin 2 = Source
Pin 3 = Drain
Tab 4 = Isolated
ADVANCE TECHNICAL INFORMATION
The product presented herein is under development. The Technical Specifications offered are derived
from a subjective evaluation of the design, based upon prior knowledge and experience, and constitute a
"considered reflection" of the anticipated result. IXYS reserves the right to change limits, test
conditions, and dimensions without notice.
Notes 1. Pulse test, t ≤ 300µs, duty cycle, d ≤ 2%.
2. Device must be heatsunk for high-temp IDSS
measurement to avoid thermal runaway.