SPECIFICATION
• Supplier : Samsung electro-mechanics • Samsung P/N : CL21B332KCANNNC
• Product : Multi-layer Ceramic Capacitor • Description : CAP, 3.3㎋, 100V, ±10%, X7R, 0805
CL 21 B 332 K C A N N N C
① ②③ ④ ⑤⑥⑦⑧⑨⑩⑪
①Series Samsung Multi-layer Ceramic Capacitor
②Size 0805 (inch code) L: 2.0 ± 0.1 mm W: ± 0.1 mm
③Dielectric X7R ⑧Inner electrode
④Capacitance 3.3 ㎋Termination
⑤Capacitance ±10 % Plating (Pb Free)
tolerance ⑨Product Normal
⑥Rated Voltage 100 V ⑩Special Reserved for future use
⑦Thickness 0.65 ± 0.1 mm ⑪Packaging Cardboard Type, 7" reel
B. Samsung Reliablility Test and Judgement condition
Capacitance Within specified tolerance 1㎑±10% 1.0±0.2Vrms
Tan δ
(
DF
)
0.025 max.
Insulation 10,000Mohm or 500Mohm
⋅
㎌Rated Voltage 60±5 sec.
Resistance Whichever is Smaller
Appearance No abnormal exterior appearance Microsco
p
e
(
×
10
)
Withstanding No dielectric breakdown or of the rated voltage
Voltage mechanical breakdown
Temperature X7R
Characterisitcs
(
From -55℃ to 125℃, Ca
p
acitance chan
g
e shoud be within ±15%
)
Adhesive Strength No peeling shall be occur on the 500
g
⋅
F, for 10±1 sec.
of Termination terminal electrode
Bending Strength Capacitance change : within ±12.5% Bending to the limit (1mm)
with 1.0mm/sec.
Solderability More than 95% of terminal surface 1) Sn63Pb37 solder
is to be soldered newly 235±5℃, 5±0.5sec.
2) SnAg3.0Cu0.5 solder
245±5℃, 3±0.3sec.
reheatin
: 80~120℃for 10~30sec.
)
Resistance to Capacitance change : within ±7.5% Solder
p
ot : 270±5℃, 10±1sec.
Soldering heat Tan δ, IR : initial s
p
ec.
Performance Test condition
200%
A. Samsung Part Number
Sn 100%
Cu
Ni
1.25
Vibration Test Capacitance change : within ±5% Amplitude : 1.5mm
Tan δ, IR : initial spec. From 10㎐to 55㎐
(
return : 1min.
)
2hours
×
3 direction
(
x,
y
, z
)
Humidity Capacitance change : within ±12.5% 40±2℃, 90~95%RH, 500+12/-0hrs
Tan δ : 0.05 max
IR : 1000Mohm or 50Mohm
⋅
㎌
Whichever is Smaller
Moisture Capacitance change : within ±12.5% With rated voltage
Resistance Tan δ : 0.05 max 40±2℃, 90~95%RH, 500+12/-0hrs
IR : 500Mohm or 25Mohm
⋅
㎌
Whichever is Smaller
High Temperature Capacitance change : within ±12.5% Wit
h
of the rated voltage
Resistance Tan δ : 0.05 max Max. operating temperature
IR : 1000Mohm or 50Mohm
⋅
㎌
Whichever is Smaller 1000+48/-0hrs
Temperature Capacitance change : within ±7.5% 1 cycle condition
Cycling Tan δ, IR : initial spec. Min. operating temperatur
e
→25℃
→Max. operating temperature → 25℃
5 cycle test
C. Recommended Soldering method :
Reflow
(
Reflow Peak Tem
p
erature : 250±5℃, 6sec. Max
)
* For the more detail Specification, Please refer to the Samsung MLCC catalogue.
Performance Test condition
200%