International Rectifier HEXFET Power MOSFET @ Surface Mount @ Available in Ta Dynamic dv/dt Repetitive Avalanche Rated @ P-Channel Fast Switching @ Ease of Paralleling Description Third Generation HEXFETs from International Rectifier provide the designer with the best combination of fast switching, ruggedized device design, low PD-9.920 IRF9630S pe & Reel Rating Voss = -200V Rps(on) = 0.802 Ip = -6.5A on-resistance and cost-effectiveness. The SMD-220 is a surface mount power package capable of accommodating die sizes up to HEX-4. It provides the highest power capability and the lowest possible on-resistance in any existing surface mount package. The SMD-220 is suitable for high current applications because of its low internal connection resistance and can dissipate up to 2.0W in a typical surface mount application. SMD-220 Absolute Maximum Ratings Parameter Max. Units Ip @ Te = 28C Continuous Drain Current, Vas @ -10 V 6.5 ID @ Tc = 100C | Continuous Drain Current, Ves @ -10 V -4.0 A Ibm Pulsed Drain Current -26 Pp @ Tc =25C | Power Dissipation 74 Ww Po @ Ta= 25C | Power Dissipation (PCB Mount)** 3.0 Linear Derating Factor 0.59 W ro | Linear Derating Factor (PCB Mount)** 0.025 Vas Gate-to-Source Voltage 20 Vv | Eas Single Pulse Avalanche Energy @ 500 mJ lar Avalanche Current 6.4 A Ear Repetitive Avalanche Energy 7A mJ dv/dt Peak Diode Recovery dv/dt_ @ 6.0 - Vins Ty, Tsta Junction and Storage Temperature Range -65 to +150 C Soldering Temperature, for 10 seconds 300 (1.6mm from case) Thermal Resistance Parameter Min. Typ. Max. Units Rac Junction-to-Case 1.7 Roga Junction-to-Ambient (PCB mount)** _ _ 40 C/W Resa Junction-to-Ambient _ _ 62 ** When mounted on 1" square PCB (FR-4 or G-10 Material). For recommended footprint and soldering techniques refer to application note #AN-994, 377IRF9630S Electrical Characteristics @ Ty = 25C (unless otherwise specified) Parameter Min. | Typ. | Max. | Units Test Conditions Viprypss Drain-to-Source Breakdown Voltage -200 | V_| Vas=0V, ip=-250uA AV eryoss/ATy| Breakdown Voltage Temp. Coefficient | -0.24| | VPC | Reference to 25C, Ip=-imA Roston) Static Drain-to-Source On-Resistance _ | 0.80 | Q | Ves=-10V, Ip=-3.9A @ Vesith) Gate Threshold Voltage +2.0 _ -4.0 V__ | Vos=Vas, Ip=-250A Cts Forward Transconductance 2.8 _ _ S| Vos=-50V, Ip=-3.9A @ ; _ | -100 Vps=-200V, Ves=0V Ipss Drain-to-Source Leakage Current 500 HA Vos=-160V, Ves=0V. T= 125C lass Gate-to-Source Forward Leakage _ | -100 nA Veg=-20V Gate-to-Source Reverse Leakage _ _ 100 Vas=20V Qg Total Gate Charge _ _ 29 Ip=-6.5A Qgs Gate-to-Source Charge | | 54 | nC | Vpge-160V Qoa Gate-to-Drain ("Miller") Charge _ _ 15 Vas=-10V See Fig. 6 and 13 @ taon) Turn-On Delay Time _ 12 _ Vpp=-100V t Rise Time _ 27 = ns {p=-6.5A ta(om) Turn-Off Delay Time - 28 _ Re=12Q ti Fall Time 24 _ Rp=15Q See Figure 10 Lo Internal Drain Inductance _ 45 e Ate gene ) nH | from package (es Ls Internal Source Inductance |75/) and center of ay die contact Ciss Input Capacitance | 700 | Ves=0V Coss Output Capacitance | 200| PF | Vps=-25V Crss Reverse Transfer Capacitance _ 40 f=1.0MHz See Figure 5 Source-Drain Ratings and Characteristics Parameter Min. | Typ. | Max. | Units Test Conditions Is Continuous Source Current _ | 65 MOSFET symbol D (Body Diode) A showing the Ism Pulsed Source Current _ _ 26 integral reverse a (Body Diode) p-n junction diode. 8 Vsp Diode Forward Voltage _ _ 6.5 V_ | Ty=25C, Ig=-6.5A, Ves=0V @ tre Reverse Recovery Time | 200 | 300 ; ns | Ty=25C, Ir=-6.5A Qe Reverse Recovery Charge | 19 | 29 | pC | di/dt=100A/s @ ton Forward Turn-On Time Intrinsic turn-on time is neglegible (turn-on is dominated by Ls+Lp) Notes: @ Repetitive rating; pulse width limited by Isps-6.5A, di/dts120A/us, Vooj required las a a 3 tp 0.010 Fig 12a. Unclamped Inductive Test Circuit a a lag Eas, Single Pulse Energy (mJ) Vps 0 25 50 75 100 125 150 Starting Ty, Junction Temperature(C) Fig 12c. Maximum Avalanche Energy Fig 12b. Unclamped Inductive Waveforms Vs. Drain Current Current Regulator sovi> oS | Gas +- Q@an 4 Va Charge Iq . lo Gurrent Sampling Resistors Fig 13a. Basic Gate Charge Waveform Fig 13b. Gate Charge Test Circuit Appendix A: Figure 14, Peak Diode Recovery dv/dt Test Circuit - See page 1506 Appendix B: Package Outline Mechanical Drawing See page 1507 Appendix C: Part Marking Information See page 1515 International Appendix D: Tape & Reel Information - See page 1519 Rectifier 382