HIGH SPEED SWITCHING PNP
SILICON BIPOLAR TRANSISTOR
Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice.
Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However
Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to
verify that datasheets are current before placing an order.
Semelab Limited
Semelab LimitedSemelab Limited
Semelab Limited
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Document Number 9422
Telephone +44 (0) 1455 556565
Fax +44 (0) 1455 552612
Issue 3
Email: sales@semelab-tt.com
Website: http://www.semelab-tt.com
Page 1 of 5
2N4209C1A & 2N4209C1B
Hermetic Ceramic Surface Mount Package (SOT23 Compatible)
Silicon Planar Epitaxial PNP Transistor
High Speed low Saturation Switching
Space Level and High-Reliability Screening Options Available
ABSOLUTE MAXIMUM RATINGS
(TA = 25°C unless otherwise stated)
VCBO Collector – Base Voltage -15V
VCEO Collector – Emitter Voltage -15V
VEBO Emitter – Base Voltage -4.5V
IC Continuous Collector Current -50mA
PD Total Power Dissipation at TA = 25°C 360mW
Derate Above 25°C 2.05mW/°C
TJ Junction Temperature Range -65 to +200°C
Tstg Storage Temperature Range -65 to +200°C
THERMAL PROPERTIES
Symbol Parameter Max Units
RθJA Thermal Resistance Junction to Ambient 250 °C/W
RθJSP(IN) Thermal Resistance, Junction To Solder Pads TSP = 25°C 160 °C/W
HIGH SPEED SWITCHING PNP
SILICON BIPOLAR TRANSISTOR
2N4209C1A & 2N4209C1B
Semelab Limited
Semelab LimitedSemelab Limited
Semelab Limited
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Document Number 9422
Telephone +44 (0) 1455 556565
Fax +44 (0) 1455 552612
Issue 3
Email: sales@semelab-tt.com
Website: http://www.semelab-tt.com
Page 2 of 5
ELECTRICAL CHARACTERISTICS
(TA = 25°C unless otherwise stated)
Symbols Parameters Test Conditions Min Typ Max Units
V(BR)CEO
(1)
Collector-Emitter Breakdown Voltage IC = -3mA -15
V
V(BR)CES Collector-Emitter Breakdown Voltage IC = -100µA -15
ICES Collector-Emitter Cut-Off Current VCE = -10V
-10 nA
TA = 125°C
-5.0 µA
IEBO
Emitter Cut-Off Current
VEB = -4.5V
-10 µA
VEB = -3.5V
-10 nA
ICBO Collector Cut-Off Current VCB = -15V IE = 0
-10 µA
hFE
(1)
Forward-current transfer ratio
IC = -1.0mA VCE = -0.5V 35
IC = -10mA VCE = -0.3V 50
120
IC = -10mA
VCE = -1.0V 55
125
TA = -55°C 25
IC = -50mA
VCE = -1.0V 40
VCE(sat)
(1)
Collector-Emitter Saturation Voltage
IC = -1.0mA IB = -0.1mA -0.07 -0.15
V
IC = -10mA IB = -1.0mA -0.12 -0.18
IC = -50mA IB = -5.0mA
-0.29 -0.60
VBE(sat) Base-Emitter Saturation Voltage
IC = -1.0mA IB = -0.1mA -0.80
V
IC = -10mA IB = -1.0mA -0.70 -0.95
IC = -50mA IB = -5.0mA -1.50
DYNAMIC CHARACTERISTICS
| hfe |
Small signal forward current
transfer ratio
IC = -10mA VCE = -10V
8.5
f = 100MHz
Cobo Output Capacitance f = 1.0MHz VCB = -5.0V IE = 0
3.0 pF
Cibo Input Capacitance f = 1.0MHz VBE = 0.5V IC = 0
3.5
ton Turn-On Time VCC = -3V IC = -10mA
15
ns
toff Turn-Off Time
IB = -1.0mA
20
td Turn-On Delay Time
10
tr Rise Time
15
Notes
NotesNotes
Notes
(1) Pulse Width < 380µs, Duty Cycle <2%
HIGH SPEED SWITCHING PNP
SILICON BIPOLAR TRANSISTOR
2N4209C1A & 2N4209C1B
Semelab Limited
Semelab LimitedSemelab Limited
Semelab Limited
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Document Number 9422
Telephone +44 (0) 1455 556565
Fax +44 (0) 1455 552612
Issue 3
Email: sales@semelab-tt.com
Website: http://www.semelab-tt.com
Page 3 of 5
0
0.2
0.4
0.6
0.8
1
1.2
1.4
1.6
1.8
2
0.001 0.01 0.1 1
Voltage (V)
ICCollector Current (mA)
"
""
"ON"
""
"Voltage
VCESAT VBESAT
1
10
100
1000
1 10 100 1000
hFE, DC Current Gain
IC, Collector Current (mA)
DC Current Gain
25°C 75°C 100°C
150°C 200°C -55°C
1
10
0.01 0.1 1 10
Capacitance (pF)
VR, Reverse Voltage (V)
Capacitance
CIBO COBO
1
10
100
1 10 100
Forward Current Transfer Ratio
IC, Collector Current (mA)
Forward Current Transfer Ratio
|hfe|
V
CE
= 1V
VCE = 10V
T
A
= 25°C
T
A
= 25°C
T
A
= 25°C
HIGH SPEED SWITCHING PNP
SILICON BIPOLAR TRANSISTOR
2N4209C1A & 2N4209C1B
Semelab Limited
Semelab LimitedSemelab Limited
Semelab Limited
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Document Number 9422
Telephone +44 (0) 1455 556565
Fax +44 (0) 1455 552612
Issue 3
Email: sales@semelab-tt.com
Website: http://www.semelab-tt.com
Page 4 of 5
MECHANICAL DATA
Dimensions in mm (Inches)
LCC1
Underside View
PACKAGE VARIANT TABLE
Variant Pad 1 Pad 2 Pad 3 Pad 4
C1A Base Emitter Collector No Pad (3-Pins Only)
C1B Base Emitter Collector Lid Contact *
* The additional contact provides a connection to the lid in the application. Connecting the metal lid to a known electrical potential stops deep
dielectric discharge in space applications; see the Space Weather link www.semelab.co.uk/mil/lcc1_4 on the Semelab web site. Package variant to
be specified at order.
2 1
0.51 ± 0.10
(0.02 ± 0.004)
1.91 ± 0.10
(0.075 ± 0.004)
3.05 ± 0.13
(0.12 ± 0.005)
2.54 ± 0.13
(0.10 ± 0.005)
0.76 ± 0.15
(0.03 ± 0.006)
1.40
(0.055)
max.
0.31
(0.012)rad.
3
1.02 ± 0.10
(0.04 ± 0.004)
4
R0.56
(0.022)
R0.31
(0.012)
See
Package
Variant
Table
HIGH SPEED SWITCHING PNP
SILICON BIPOLAR TRANSISTOR
Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice.
Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However
Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to
verify that datasheets are current before placing an order.
Semelab Limited
Semelab LimitedSemelab Limited
Semelab Limited
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Document Number 9422
Telephone +44 (0) 1455 556565
Fax +44 (0) 1455 552612
Issue 3
Email: sales@semelab-tt.com
Website: http://www.semelab-tt.com
Page 5 of 5
SCREENING OPTIONS
Space Level (JQRS/ESA) and High Reliability options are
available in accordance with the High Reliability and
Screening Options Handbook available for download from
the from the TT electronics Semelab web site.
ESA Quality Level Products are based on the testing
procedures specified in the generic ESCC 5000 and in the
corresponding part detail specifications.
Semelabs QR216 and QR217 processing specifications
(JQRS), in conjunction with the companies ISO 9001:2000
approval present a viable alternative to the American MIL-
PRF-19500 space level processing.
QR217 (Space Level Quality Conformance) is based on the
quality conformance inspection requirements of MIL-PRF-
19500 groups A (table V), B (table VIa), C (table VII) and
also ESA / ESCC 5000 (chart F4) lot validation tests.
QR216 (Space Level Screening) is based on the screening
requirements of MIL-PRF-19500 (table IV) and also ESA
/ESCC 5000 (chart F3).
JQRS parts are processed to the device data sheet and
screened to QR216 with conformance testing to Q217
groups A and B in accordance with MIL-STD-750 methods
and procedures.
Additional conformance options are available, for example
Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs.
These are chargeable and must be specified at the order
stage (See Ordering Information). Minimum order
quantities may apply.
Alternative or additional customer specific conformance or
screening requirements would be considered. Contact
Semelab sales with enquires.
MARKING DETAILS
Parts can be marked with approximately 8 characters on
two lines and can include the cathode identification.
Typical marking would include part or specification number,
week of seal or serial number subject to available space and
legibility.
Customer specific marking requirements can be arranged at
the time of order.
Example Marking:
ORDERING INFORMATION
Part numbers are built up from Type, Package Variant, and
screening level. The part numbers are extended to include
the additional options as shown below.
Type – See Electrical Characteristics Table
Package Variant – See Mechanical Data
Screening Level – See Screening Options (ESA / JQRS)
Additional Options:
Customer Pre-Cap Visual Inspection .CVP
Customer Buy-Off visit .CVB
Data Pack .DA
Solderability Samples .SS
Scanning Electron Microscopy .SEM
Radiography (X-ray) .XRAY
Total Dose Radiation Test .RAD
MIL-PRF-19500 (QR217)
Group B charge .GRPB
Group B destructive mechanical samples .GBDM (12 pieces)
Group C charge .GRPC
Group C destructive electrical samples .GCDE (12 pieces)
Group C destructive mechanical samples .GCDM (6 pieces)
ESA/ESCC
Lot Validation Testing (subgroup 1) charge .LVT1
LVT1 destructive samples (environmental) .L1DE (15 pieces)
LVT1 destructive samples (mechanical) .L1DM (15 pieces)
Lot Validation Testing (subgroup 2) charge .LVT2
LVT2 endurance samples (electrical) .L2D (15 pieces)
Lot Validation Testing (subgroup 3) charge .LVT3
LVT3 destructive samples (mechanical) .L3D (5 pieces)
Additional Option Notes:
1) All ‘Additional Options’ are chargeable and must be specified at order stage.
2) When Group B,C or LVT is required, additional electrical and mechanical destructive
samples must be ordered
3) All destructive samples are marked the same as other production parts unless
otherwise requested.
Example ordering information:
The following example is for the 2N4209C1B part with
package variant B, JQRS screening, additional Group C
conformance testing and a Data pack.
Part Numbers:
2N4209C1B-JQRS
(Include quantity for flight parts)
2N4209C1B.GRPC
(chargeable conformance option)
2N4209C1B.GCDE
(charge for destructive parts)
2N4209C1B.GCDM
(charge for destructive parts)
2N4209C1B.DA
(charge for Data pack)
Customers with any specific requirements (e.g. marking or
screening) may be supplied with a similar alternative part
number (there is maximum 20 character limit to part
numbers). Contact Semelab sales with enquiries.
High Reliability and Screening Options Handbook link:
http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf