2009-2014 Microchip Technology Inc. DS20002188D-page 1
MCP621/1S/2/3/4/5/9
Features:
Gain-Bandwidth Product: 20 MHz (typical)
Slew Rate: 30 V/µs
Low Input Offset: ±200 µV (maximum)
Low Input Bias Current: 5 pA (typical)
Noise: 13 nV/Hz, at 1 MHz
Ease-of-Use:
- Unity-Gain Stable
- Rail-to-Rail Output
- Input Range incl. Negative Rail
- No Phase Reversal
Supply Voltage Range: +2.5V to +5.5V
High Output Current: ±70 mA
Supply Current: 2.5 mA/Ch (typical)
Low-Power Mode: 5 µA/Ch
Small Packages: SOT23-5, DFN
Extended Temperature Range: -40°C to +125°C
Typical Applications:
Optical Detector Amplifier
Barcode Scanners
Multi-Pole Active Filter
Driving A/D Converters
Fast Low-Side Current Sensing
Power Amplifier Control Loops
•Consumer Audio
Design Aids:
SPICE Macro Models
•FilterLab
® Software
Microchip Advanced Part Selector (MAPS)
Analog Demonstration and Evaluation Boards
Application Notes
Description:
The Microchip Technology Inc. MCP621/1S/2/3/4/5/9
family of high bandwidth and high slew rate operational
amplifiers features low offset. At power-up, these op
amps are self-calibrated using mCal. Some package
options also provide a Calibration/Chip Select pin
(CAL/CS) that supports a Low-Power mode of
operation, with offset calibration at the time normal
operation is re-started. These amplifiers are optimized
for high speed, low noise and distortion, single-supply
operation with rail-to-rail output and an input that
includes the negative rail.
This family is offered in single (MCP621 and
MCP621S), single with CAL/CS pin (MCP623), dual
(MCP622), dual with CAL/CS pins (MCP625), quad
(MCP624) and quad with CAL/CS pins (MCP629). All
devices are fully specified from -40°C to +125°C.
Typical Application Circuit
Photo Detector
CD
CF
RF
VREF
30 pF
100 k
3pF
ID
100 nA
VOUT
MCP622 VREF
26.1 k
2.61 k
294
270 pF
100 pF
A
B
Detector Amplifier with 350kHz
2nd-order MFB Low pass Filter
High Gain-Bandwidth Op Amp Portfolio
Model Family Channels/Package Gain Bandwidth VOS (max.) IQ/Ch (typ.)
MCP621/1S/2/3/4/5/9 1, 2, 4 20 MHz 0.2 mV 2.5 mA
MCP631/2/3/4/5/9 1, 2, 4 24 MHz 8.0 mV 2.5 mA
MCP651/1S/2/3/4/5/9 1, 2, 4 50 MHz 0.2 mV 6.0 mA
MCP660/1/2/3/4/5/9 1, 2, 3, 4 60 MHz 8.0 mV 6.0 mA
20 MHz, 200 µV Op Amps with mCal
MCP621/1S/2/3/4/5/9
DS20002188D-page 2 2009-2014 Microchip Technology Inc.
Package Types
MCP621
SOIC
MCP622
SOIC
VIN+
VIN
VSS
VDD
VOUT
1
2
3
4
8
7
6
5VCAL
CAL/CSNC
VINA+
VINA
VSS
1
2
3
4
8
7
6
5
VOUTA VDD
VOUTB
VINB
VINB+
MCP625
MSOP
VINA+
VINA
VSS
1
2
3
4
10
9
8
7
VOUTA VDD
VOUTB
VINB
VINB+
CALA/CSA5 6 CALB/CSB
MCP622
3x3 DFN *
MCP625
3x3 DFN *
* Includes Exposed Thermal Pad (EP); see Ta b l e 3 - 1 .
VINA+
VINA
VSS
VOUTB
VINB
1
2
3
4
8
7
6
5VINB+
VDD
VOUTA
EP
9
VSS
VINA+
CALA/CSA
VINB
VINB+
2
3
4
5
9
8
7
6CALB/CSB
VOUTB
VINA
EP
11
110 VDD
VOUTA
2
MCP629
4x4 QFN*
VDD
VINB+
VINA-V
IND+
VSS
VINB-
VINC+
VOUTB
CALBC/CSBC
VOUTC
VINC-
VOUTA
CALAD/CSAD
VOUTD
VIND-
VINA+EP
16
1
15 14 13
3
4
12
11
10
9
5678
17
MCP624
SOIC, TSSOP
VINA+
VINA-
VDD
1
2
3
4
14
13
12
11
VOUTA VOUTD
VIND-
VIND+
VSS
VINB+510 VINC+
VINB-69
VOUTB 7 8 VOUTC
VINC-
MCP621
2x3 TDFN *
VIN+
VIN
VSS
VDD
VOUT
1
2
3
4
8
7
6
5VCAL
CAL/CSNC
EP
9
CAL/CS
VIN+
VOUT
VSS
VIN-
MCP623
SOT-23-6
VDD
1
2
34
5
6
VIN+
VOUT
VSS
VIN-
MCP621S
SOT-23-5
VDD
1
2
34
5
2009-2014 Microchip Technology Inc. DS20002188D-page 3
MCP621/1S/2/3/4/5/9
1.0 ELECTRICAL CHARACTERISTICS
1.1 Absolute Maximum Ratings
VDD –V
SS .......................................................................6.5V
Current at Input Pins ....................................................±2 mA
Analog Inputs (VIN+ and VIN–) †† . VSS 1.0V to VDD +1.0V
All Other Inputs and Outputs ......... VSS 0.3V to VDD +0.3V
Output Short Circuit Current ................................Continuous
Current at Output and Supply Pins ..........................±150 mA
Storage Temperature ...................................-65°C to +150°C
Max. Junction Temperature ........................................+150°C
ESD protection on all pins (HBM, MM)  1 kV, 200V
†Notice: Stresses above those listed under “Absolute
Maximum Ratings” may cause permanent damage to
the device. This is a stress rating only and functional
operation of the device at those or any other
conditions above those indicated in the operational
listings of this specification is not implied. Exposure to
maximum rating conditions for extended periods may
affect device reliability.
†† See Section 4.2.2, Input Voltage and Current
Limits.
1.2 Specifications
TABLE 1-1: DC ELECTRICAL SPECIFICATIONS
Electrical Characteristics: Unless otherwise indicated, TA = +25°C, VDD = +2.5V to +5.5V, VSS = GND,
VCM = VDD/3, VOUT VDD/2, VL = VDD/2, RL = 2 k to VL and CAL/CS =V
SS (refer to Figure 1-2).
Parameters Sym. Min. Typ. Max. Units Conditions
Input Offset
Input Offset Voltage VOS -200 +200 µV After calibration (Note 1)
Input Offset Voltage Trim Step
Size
VOSTRM —37200µV(Note 2)
Input Offset Voltage Drift VOS/TA—±2.0µV/°CT
A= -40°C to +125°C
Power Supply Rejection Ratio PSRR 61 76 dB
Input Current and Impedance
Input Bias Current IB—5pA
Across Temperature IB—100pAT
A= +85°C
Across Temperature IB 1700 5,000 pA TA= +125°C
Input Offset Current IOS —±10pA
Common Mode Input
Impedance
ZCM —10
13||9 ||pF
Differential Input Impedance ZDIFF —10
13||2 ||pF
Common Mode
Common Mode Input Voltage
Range
VCMR VSS 0.3 VDD 1.3 V (Note 3)
Common Mode Rejection Ratio CMRR 65 81 dB VDD = 2.5V, VCM = -0.3 to
1.2V
CMRR 68 84 dB VDD = 5.5V, VCM = -0.3 to
4.2V
Open-Loop Gain
DC Open-Loop Gain
(large signal)
AOL 88 117 dB VDD = 2.5V,
VOUT = 0.3V to 2.2V
AOL 94 126 dB VDD = 5.5V,
VOUT = 0.3V to 5.2V
Note 1: Describes the offset (under the specified conditions) right after power-up, or just after the CAL/CS pin is
toggled. Thus, 1/f noise effects (an apparent wander in VOS; see Figure 2-35) are not included.
2: Increment between adjacent VOS trim points; Figure 2-3 shows how this affects the VOS repeatability.
3: See Figure 2-6 and Figure 2-7 for temperature effects.
4: The ISC specifications are for design guidance only; they are not tested.
MCP621/1S/2/3/4/5/9
DS20002188D-page 4 2009-2014 Microchip Technology Inc.
Output
Maximum Output Voltage Swing VOL, VOH VSS +20 V
DD 20 mV VDD = 2.5V, G = +2,
0.5V Input Overdrive
VOL, VOH VSS +40 V
DD 40 mV VDD = 5.5V, G = +2,
0.5V Input Overdrive
Output Short Circuit Current ISC ±40 ±85 ±130 mA VDD = 2.5V (Note 4)
ISC ±35 ±70 ±110 mA VDD = 5.5V (Note 4)
Calibration Input
Calibration Input Voltage Range VCALRNG VSS +0.1 V
DD –1.4 mV V
CAL pin externally driven
Internal Calibration Voltage VCAL 0.323VDD 0.333VDD 0.343VDD VCAL pin open
Input Impedance ZCAL —100||5k||pF
Power Supply
Supply Voltage VDD 2.5 5.5 V
Quiescent Current per Amplifier IQ1.2 2.5 3.6 mA IO = 0
POR Input Threshold, Low VPRL 1.15 1.40 V
POR Input Threshold, High VPRH 1.40 1.65 V
TABLE 1-2: AC ELECTRICAL SPECIFICATIONS
Electrical Characteristics: Unless otherwise indicated, TA = +25°C, VDD = +2.5V to +5.5V, VSS = GND,
VCM = VDD/2, VOUT VDD/2, VL = VDD/2, RL = 2 k to VL, CL= 50 pF and CAL/CS =V
SS (refer to Figure 1-2).
Parameters Sym. Min. Typ. Max. Units Conditions
AC Response
Gain Bandwidth Product GBWP 20 MHz
Phase Margin PM 60 ° G = +1
Open-Loop Output Impedance ROUT —15—
AC Distortion
Total Harmonic Distortion plus
Noise
THD+N 0.0018 % G = +1, VOUT = 2VP-P
, f = 1 kHz,
VDD = 5.5V, BW = 80 kHz
Step Response
Rise Time, 10% to 90% tr 13 ns G = +1, VOUT = 100 mVP-P
Slew Rate SR 10 V/µs G = +1
Noise
Input Noise Voltage Eni —20—µV
P-P f = 0.1 Hz to 10 Hz
Input Noise Voltage Density eni —13—nV/Hz f = 1 MHz
Input Noise Current Density ini 4—fA/Hz f = 1 kHz
TABLE 1-1: DC ELECTRICAL SPECIFICATIONS (CONTINUED)
Electrical Characteristics: Unless otherwise indicated, TA = +25°C, VDD = +2.5V to +5.5V, VSS = GND,
VCM = VDD/3, VOUT VDD/2, VL = VDD/2, RL = 2 k to VL and CAL/CS =V
SS (refer to Figure 1-2).
Parameters Sym. Min. Typ. Max. Units Conditions
Note 1: Describes the offset (under the specified conditions) right after power-up, or just after the CAL/CS pin is
toggled. Thus, 1/f noise effects (an apparent wander in VOS; see Figure 2-35) are not included.
2: Increment between adjacent VOS trim points; Figure 2-3 shows how this affects the VOS repeatability.
3: See Figure 2-6 and Figure 2-7 for temperature effects.
4: The ISC specifications are for design guidance only; they are not tested.
2009-2014 Microchip Technology Inc. DS20002188D-page 5
MCP621/1S/2/3/4/5/9
TABLE 1-3: DIGITAL ELECTRICAL SPECIFICATIONS
Electrical Characteristics: Unless otherwise indicated, TA = +25°C, VDD = +2.5V to +5.5V, VSS = GND, VCM = VDD/2,
VOUT VDD/2, VL = VDD/2, RL = 2 k to VL, CL= 50 pF and CAL/CS =V
SS (refer to Figure 1-1 and Figure 1-2).
Parameters Sym. Min. Typ. Max. Units Conditions
CAL/CS Low Specifications
CAL/CS Logic Threshold, Low VIL VSS —0.2V
DD V
CAL/CS Input Current, Low ICSL —0—nACAL/CS = 0V
CAL/CS High Specifications
CAL/CS Logic Threshold, High VIH 0.8VDD VDD V
CAL/CS Input Current, High ICSH 0.7 µA CAL/CS = VDD
GND Current ISS -3.5 -1.8 µA Single, CAL/CS = VDD = 2.5V
ISS -8 -4 µA Single, CAL/CS = VDD = 5.5V
ISS -5 -2.5 µA Dual, CAL/CS = VDD = 2.5V
ISS -10 -5 µA Dual, CAL/CS = VDD = 5.5V
CAL/CS Internal Pull-Down
Resistor
RPD —5—M
Amplifier Output Leakage IO(LEAK) 50 nA CAL/CS = VDD, TA = 125°C
POR Dynamic Specifications
VDD Low to Amplifier Off Time
(output goes High Z)
tPOFF 200 ns G = +1 V/V, VL = VSS,
VDD = 2.5V to 0V step to VOUT =0.1
(2.5V)
VDD High to Amplifier On Time
(including calibration)
tPON 100 200 300 ms G = +1 V/V, VL = VSS,
VDD = 0V to 2.5V step to VOUT =0.9
(2.5V)
CAL/CS Dynamic Specifications
CAL/CS Input Hysteresis VHYST 0.25 V
CAL/CS Setup Time
(between CAL/CS edges)
tCSU 1—µsG = +1V/V, V
L = VSS (Notes 2,3,4)
CAL/CS = 0.8VDD to VOUT = 0.1
(VDD/2)
CAL/CS High to Amplifier Off Time
(output goes High Z)
tCOFF 200 ns G = +1 V/V, VL = VSS,
CAL/CS = 0.8VDD to VOUT = 0.1
(VDD/2)
CAL/CS Low to Amplifier On Time
(including calibration)
tCON —3 4ms
G = +1 V/V, VL = VSS, MCP621 and
MCP625, CAL/CS = 0.2VDD to
VOUT =0.9(V
DD/2)
tCON —6 8ms
G = +1 V/V, VL = VSS, MCP629,
CAL/CS = 0.2VDD to
VOUT =0.9(V
DD/2)
Note 1: The MCP622 single, MCP625 dual and MCP629 quad have their CAL/CS inputs internally pulled down to VSS (0V).
2: This time ensures that the internal logic recognizes the edge. However, for the rising edge case, if CAL/CS is raised
before the calibration is complete, the calibration will be aborted and the part will return to Low-Power mode.
3: For the MCP625 dual, there is an additional constraint. CALA/CSA and CALB/CSB can be toggled simultaneously
(within a time much smaller than tCSU) to make both op amps perform the same function simultaneously. If they are
toggled independently, then CALA/CSA (CALB/CSB) cannot be allowed to toggle while op amp B (op amp A) is in
Calibration mode; allow more than the maximum tCON time (4 ms) before the other side is toggled.
4: For the MCP629 quad, there is an additional constraint. CALAD/CSAD and CALBC/CSBC can be toggled simultaneously
(within a time much smaller than tCSU) to make all four op amps perform the same function simultaneously, and the
maximum tCON time is approximately doubled (8 ms). If they are toggled independently, then CALAD/CSAD
(CALBC/CSBC) cannot be allowed to toggle while op amps B and C (op amps A and D) are in Calibration mode; allow
more than the maximum tCON time (8 ms) before the other side is toggled.
MCP621/1S/2/3/4/5/9
DS20002188D-page 6 2009-2014 Microchip Technology Inc.
1.3 Timing Diagram
FIGURE 1-1: Timing Diagram.
TABLE 1-4: TEMPERATURE SPECIFICATIONS
Electrical Characteristics: Unless otherwise indicated, all limits are specified for: VDD = +2.5V to +5.5V,VSS = GND.
Parameters Sym. Min. Typ. Max. Units Conditions
Temperature Ranges
Specified Temperature Range TA-40 +125 °C
Operating Temperature Range TA-40 +125 °C (Note 1)
Storage Temperature Range TA-65 +150 °C
Thermal Package Resistances
Thermal Resistance, 5L-SOT-23 θJA 220.7 °C/W
Thermal Resistance, 6L-SOT-23 θJA 190.5 °C/W
Thermal Resistance, 8L-2x3 TDFN θJA —52.5—°C/W
Thermal Resistance, 8L-3x3 DFN θJA —56.7—°C/W(Note 2)
Thermal Resistance, 8L-SOIC θJA 149.5 °C/W
Thermal Resistance, 10L-3x3 DFN θJA —53.3—°C/W(Note 2)
Thermal Resistance, 10L-MSOP θJA —202—°C/W
Thermal Resistance, 14L-SOIC θJA —95.3°C/W
Thermal Resistance, 14L-TSSOP θJA —100—°C/W
Thermal Resistance, 16L-4x4-QFN θJA —45.7—°C/W(Note 2)
Note 1: Operation must not cause TJ to exceed the Maximum Junction Temperature specification (150°C).
2: Measured on a standard JC51-7, four-layer printed circuit board with ground plane and vias.
High Z
VDD
VOUT
-3 µA (typical)
High Z
ISS
ICS
-3 µA (typical)
-2.5 mA (typical)
VPRH VPRL
tPON tPOFF
On
0nA(typical)
High Z
-3 µA (typical) -2.5 mA (typical)
tCOFF tCON
On
0.7 µA (typical) 0nA(typical)
CAL/CS VIH VIL
tCSU
Note: For the MCP625 dual and the MCP629 quad, there is an additional constraint on toggling the two
CAL/CS pins close together; see the TCON specification in Table 1 -3.
2009-2014 Microchip Technology Inc. DS20002188D-page 7
MCP621/1S/2/3/4/5/9
1.4 Test Circuits
The circuit used for most DC and AC tests is shown in
Figure 1-2. This circuit can independently set VCM and
VOUT
; see Equation 1-1. Note that VCM is not the
circuit’s Common mode voltage ((VP+V
M)/2), and that
VOST includes VOS plus the effects (on the input offset
error, VOST) of temperature, CMRR, PSRR and AOL.
EQUATION 1-1:
FIGURE 1-2: AC and DC Test Circuit for
Most Spe cific ations.
GDM RFRG
=
VCM VPVDD 2
+2
=
VOUT VDD 2
VPVM
VOST 1G
DM
+++=
Where:
GDM = Differential Mode Gain (V/V)
VCM = Op Amp’s Common Mode
Input Voltage
(V)
VOST = Op Amp’s Total Input Offset
Voltage
(mV)
VOST VIN– VIN+
=
VDD
RGRF
VOUT
VM
CB2
CL
RL
VL
CB1
10 k
10 k
RGRF
VDD/2
VP
10 k
10 k
50 pF
2k
2.2 µF100 nF
VIN–
VIN+
CF
6.8 pF
CF
6.8 pF
MCP62X
MCP621/1S/2/3/4/5/9
DS20002188D-page 8 2009-2014 Microchip Technology Inc.
2.0 TYPICAL PERFORMANCE CURVES
Note: Unless otherwise indicated, TA=+25°C, V
DD = +2.5V to 5.5V, VSS = GND, VCM =V
DD/3, VOUT =V
DD/2,
VL=V
DD/2, RL=2kto VL, CL= 50 pF, and CAL/CS =V
SS.
2.1 DC Signal Inputs
FIGURE 2-1: Input Offset Voltage.
FIGURE 2-2: Input Offset Voltage Drift.
FIGURE 2-3: Input Offset Voltage
Repeatability (repeated calibration).
FIGURE 2-4: Input Offset Voltage vs.
Power Supply Voltage.
FIGURE 2-5: Input Offset Voltage vs.
Output Voltage.
FIGURE 2-6: Low Input Common Mode
Voltage Headroom vs. Ambient Temperature.
Note: The graphs and tables provided following this note are a statistical summary based on a limited number of
samples and are provided for informational purposes only. The performance characteristics listed herein
are not tested or guaranteed. In some graphs or tables, the data presented may be outside the specified
operating range (e.g., outside specified power supply range) and therefore outside the warranted range.
0%
2%
4%
6%
8%
10%
12%
14%
16%
18%
20%
22%
-80-60-40-20 0 20406080
Input Offset Voltage (µV)
Percentage of Occurrences
80 Samples
TA = +25°C
VDD = 2.5V and 5.5V
Calibrated at +25°C
0%
2%
4%
6%
8%
10%
12%
14%
16%
18%
20%
22%
24%
-10-8-6-4-20246810
Input Offset Voltage Drift (µV/°C)
Percentage of Occurrences
80 Samples
VDD = 2.5V and 5.5V
TA = -40°C to +125°C
Calibrated at +25°C
0%
5%
10%
15%
20%
25%
30%
35%
40%
45%
50%
-60 -50 -40 -30 -20 -10 0 10 20 30 40 50 60
Input Offset Voltage Calibration Repeatability
(µV)
Percentage of Occurrences
200 Samples
TA = +25°C
VDD = 2.5V and 5.5V
Calibration
Changed
(-1 step)
No Change
(includes noise)
Calibration
Changed
(+1 step)
-700
-600
-500
-400
-300
-200
-100
0
100
200
300
1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 6.5
Power Supply Voltage (V)
Input Offset Voltage (µV)
+125°C
+85°C
+25°C
-40°C
Representative Part
Calibrated at VDD = 6.5V
-50
-40
-30
-20
-10
0
10
20
30
40
50
0.00.51.01.52.02.53.03.54.04.55.05.5
Output Voltage (V)
Input Offset Voltage (µV)
VDD = 2.5V
VDD = 5.5V
Representative Part
-0.5
-0.4
-0.3
-0.2
-0.1
0.0
-50 -25 0 25 50 75 100 125
Ambient Temperature (°C)
Low Input Common
Mode Headroom (V)
VDD = 2.5V
1 Lot
Low (VCMR_L – VSS)
VDD = 5.5V
2009-2014 Microchip Technology Inc. DS20002188D-page 9
MCP621/1S/2/3/4/5/9
Note: Unless otherwise indicated, TA=+25°C, V
DD = +2.5V to 5.5V, VSS = GND, VCM =V
DD/3, VOUT =V
DD/2,
VL=V
DD/2, RL=2kto VL, CL= 50 pF, and CAL/CS =V
SS.
FIGURE 2-7: High Input Common Mod e
Voltage Headroom vs. Ambient Temperature.
FIGURE 2-8: Input Offset Voltage vs.
Common Mode Voltage with VDD =2.5V.
FIGURE 2-9: Input Offset Voltage vs.
Common Mode Voltage with VDD =5.5V.
FIGURE 2-10: CMRR and PSRR vs.
Ambient Temp er atu re.
FIGURE 2-11: DC Open-Loop Gain vs.
Ambient Temp er atu re.
FIGURE 2-12: Input Bias and Offset
Currents vs. Ambient Temperature with
VDD =+5.5V.
1.0
1.1
1.2
1.3
1.4
-50-25 0 255075100125
Ambient Temperature (°C)
High Input Common
Mode Headroom (V)
VDD = 2.5V
VDD = 5.5V
1 Lot
High (VDD – VCMR_H)
-1000
-800
-600
-400
-200
0
200
400
600
800
1000
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
2.0
Input Common Mode Voltage (V)
Input Offset Voltage (µV)
VDD = 2.5V
Representative Part
+125°C
+85°C
+25°C
-40°C
-1000
-800
-600
-400
-200
0
200
400
600
800
1000
-0.5
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
Input Common Mode Voltage (V)
Input Offset Voltage (µV)
VDD = 5.5V
Representative Part
+125°C
+85°C
+25°C
-40°C
60
65
70
75
80
85
90
95
100
105
110
-50 -25 0 25 50 75 100 125
Ambient Temperature (°C)
CMRR, PSRR (dB)
PSRR
CMRR, VDD = 5.5V
CMRR, VDD = 2.5V
100
105
110
115
120
125
130
-50 -25 0 25 50 75 100 125
Ambient Temperature (°C)
DC Open-Loop Gain (dB)
VDD = 5.5V
VDD = 2.5V
1
10
100
1,000
10,000
25 45 65 85 105 125
Ambient Temperature (°C)
Input Bias, Offset Currents
(pA)
VDD = 5.5V
VCM = VCMR_H
| IOS |
IB
MCP621/1S/2/3/4/5/9
DS20002188D-page 10 2009-2014 Microchip Technology Inc.
Note: Unless otherwise indicated, TA=+25°C, V
DD = +2.5V to 5.5V, VSS = GND, VCM =V
DD/3, VOUT =V
DD/2,
VL=V
DD/2, RL=2kto VL, CL= 50 pF, and CAL/CS =V
SS.
FIGURE 2-13: Input Bias and Offset
Currents vs. Common Mode Input Voltage with
TA= +85°C.
FIGURE 2-14: Input Bias and Offset
Currents vs. Common Mode Input Voltage with
TA= +125°C.
FIGURE 2-15: Input Bias Current vs. Input
Voltage (below VSS).
-60
-40
-20
0
20
40
60
80
100
120
-0.5
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
6.0
Common Mode Input Voltage (V)
Input Bias, Offset Currents
(pA)
IB
Representative Part
TA = +85°C
VDD = 5.5V
IOS
-1000
-500
0
500
1000
1500
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5
Common Mode Input Voltage (V)
Input Bias, Offset Currents
(pA)
IB
Representative Part
TA = +125°C
VDD = 5.5V
IOS
1.E-12
1.E-11
1.E-10
1.E-09
1.E-08
1.E-07
1.E-06
1.E-05
1.E-04
1.E-03
-1.0 -0.9 -0.8 -0.7 -0.6 -0.5 -0.4 -0.3 -0.2 -0.1 0.0
Input Voltage (V)
Input Current Magnitude (A)
+125°C
+85°C
+25°C
-40°C
1m
100µ
10µ
100n
10n
1n
100p
10p
1p
2009-2014 Microchip Technology Inc. DS20002188D-page 11
MCP621/1S/2/3/4/5/9
Note: Unless otherwise indicated, TA=+25°C, V
DD = +2.5V to 5.5V, VSS = GND, VCM =V
DD/3, VOUT =V
DD/2,
VL=V
DD/2, RL=2kto VL, CL= 50 pF, and CAL/CS =V
SS.
2.2 Other DC Voltages and Currents
FIGURE 2-16: Ratio of Output Voltage
Headroom to Output Current.
FIGURE 2-17: Output Voltage Headroom
vs. Ambi ent Temperature.
FIGURE 2-18: Output Short-Circuit Current
vs. Power Supply Voltag e.
FIGURE 2-19: Supply Current vs. Power
Supply Voltage.
FIGURE 2-20: Supply Current vs. Common
Mode Input Voltage.
FIGURE 2-21: Power-On Reset Voltages
vs. Ambient Temperature.
0
2
4
6
8
10
12
14
110100
Output Current Magnitude (mA)
Ratio of Output Headroom to
Output Current (mV/mA)
VDD
= 2.5V
VDD
= 5.5V
VDD – VOH
IOUT
VOL – VSS
-IOUT
0
2
4
6
8
10
12
14
16
18
20
-50 -25 0 25 50 75 100 125
Ambient Temperature (°C)
Output Headroom (mV)
VDD
= 5.5V
VOL – V
SS
VDD = 2.5V VDD – V
OH
RL = 2 k
-100
-80
-60
-40
-20
0
20
40
60
80
100
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
6.0
6.5
Power Supply Voltage (V)
Output Short Circuit Current
(mA)
+125°C
+85°C
+25°C
-40°C
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
6.0
6.5
Power Supply Voltage (V)
Supply Current
(mA/amplifier)
+125°C
+85°C
+25°C
-40°C
0.0
0.5
1.0
1.5
2.0
2.5
3.0
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
Common Mode Input Voltage (V)
Supply Current
(mA/amplifier)
VDD = 2.5V
VDD
= 5.5V
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
-50 -25 0 25 50 75 100 125
Ambient Temperature (°C)
POR Trip Voltages (V)
VPRL
VPRH
MCP621/1S/2/3/4/5/9
DS20002188D-page 12 2009-2014 Microchip Technology Inc.
Note: Unless otherwise indicated, TA=+25°C, V
DD = +2.5V to 5.5V, VSS = GND, VCM =V
DD/3, VOUT =V
DD/2,
VL=V
DD/2, RL=2kto VL, CL= 50 pF, and CAL/CS =V
SS.
FIGURE 2-22: Normalized Internal
Calibration Voltage. FIGURE 2-23: VCAL Input Resistance vs .
Temperature.
0%
5%
10%
15%
20%
25%
30%
33.20%
33.24%
33.28%
33.32%
33.36%
33.40%
33.44%
33.48%
33.52%
Normalized Internal Calibration Voltage;
VCAL/VDD
Percentage of Occurrences
144 Samples
VDD = 2.5V and 5.5V
0
20
40
60
80
100
120
140
-50-25 0 255075100125
Ambient Temperature (°C)
Internal V CAL Resistance (k)
2009-2014 Microchip Technology Inc. DS20002188D-page 13
MCP621/1S/2/3/4/5/9
Note: Unless otherwise indicated, TA=+25°C, V
DD = +2.5V to 5.5V, VSS = GND, VCM =V
DD/3, VOUT =V
DD/2,
VL=V
DD/2, RL=2kto VL, CL= 50 pF, and CAL/CS =V
SS.
2.3 Frequency Response
FIGURE 2-24: CMRR and PSRR vs.
Frequency.
FIGURE 2-25: Open-Loop Gain vs.
Frequency.
FIGURE 2-26: Gain Bandwidth Product
and Phase Margin vs. Ambient Temperature.
FIGURE 2-27: Gain Bandwidth Product
and Phase Margin vs. Common Mode Input
Voltage.
FIGURE 2-28: Gain Bandwidth Product
and Phase Margin vs. Output Voltage.
FIGURE 2-29: Closed-Loop Output
Impedance vs. Frequency.
10
20
30
40
50
60
70
80
90
100
1.E+21.E+31.E+41.E+51.E+61.E+7
Frequency (Hz)
CMRR, PSRR (dB)
CMRR
100 1M10k 10M100k1k
PSRR+
PSRR-
-20
0
20
40
60
80
100
120
140
1.E+0 1.E+1 1.E+2 1.E+3 1.E+4 1.E+5 1.E+6 1.E+7 1.E+8
Frequency (Hz)
Open-Loop Gain (dB)
-240
-210
-180
-150
-120
-90
-60
-30
0
Open-Loop Phase (°)
| AOL |
AOL
10 1k 100k 10M1 100 10k 1M 100M
15
20
25
30
35
40
45
-50-250 255075100125
Ambient Temperature (°C)
Gain Bandwidth Product
(MHz)
40
45
50
55
60
65
70
Phase Margin (°)
PM
GBWP
VDD = 5.5V
VDD = 2.5V
15
20
25
30
35
40
45
-0.5
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
6.0
Common Mode Input Voltage (V)
Gain Bandwidth Product
(MHz)
40
45
50
55
60
65
70
Phase Margin (°)
PM
GBWP
VDD = 5.5V
VDD = 2.5V
15
20
25
30
35
40
45
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5
Output Voltage (V)
Gain Bandwidth Product
(MHz)
40
45
50
55
60
65
70
Phase Margin (°)
PM
GBWP
VDD = 5.5V
VDD = 2.5V
0.1
1
10
100
1.0E+03 1.0E+04 1.0E+05 1.0E+06 1.0E+07 1.0E+08
Frequency (Hz)
1k 1M
10M
100M
Open-Loop Output Impedance (
)
10k 100k
G = 101 V/V
G = 11 V/V
G = 1 V/V
MCP621/1S/2/3/4/5/9
DS20002188D-page 14 2009-2014 Microchip Technology Inc.
Note: Unless otherwise indicated, TA=+25°C, V
DD = +2.5V to 5.5V, VSS = GND, VCM =V
DD/3, VOUT =V
DD/2,
VL=V
DD/2, RL=2kto VL, CL= 50 pF, and CAL/CS =V
SS.
FIGURE 2-30: Gain Peaking vs.
Normalized Capacitive Load. FIGURE 2-31: Channel-to-Channel
Separation vs . Frequ enc y.
0
1
2
3
4
5
6
7
8
9
10
1.0E-11 1.0E-10 1.0E-09
Normalized Capacitive Load; CL/GN (F)
Gain Peaking (dB)
10p
100p
1n
GN
= 1 V/
V
GN
= 2 V/
V
GN
4 V/
V
50
60
70
80
90
100
110
120
130
140
150
1.E+03 1.E+04 1.E+05 1.E+06 1.E+07
Frequency (Hz)
Channel-to-Channel
Separation (dB)
1k 10k 100k
RTI
VCM = VDD/2
G = +1 V/V
RS = 0
RS = 1 k
RS = 10 k
RS = 100 k
1M 10M
2009-2014 Microchip Technology Inc. DS20002188D-page 15
MCP621/1S/2/3/4/5/9
Note: Unless otherwise indicated, TA=+25°C, V
DD = +2.5V to 5.5V, VSS = GND, VCM =V
DD/3, VOUT =V
DD/2,
VL=V
DD/2, RL=2kto VL, CL= 50 pF, and CAL/CS =V
SS.
2.4 Input Noise and Distortion
FIGURE 2-32: Input Noise Voltage Density
vs. Frequency.
FIGURE 2-33: Input Noise Voltage Density
vs. Input Common Mode Voltage with f = 100 Hz.
FIGURE 2-34: Input Noise Voltage Density
vs. Input Common Mode Voltage with f = 1 MHz.
FIGURE 2-35: Input Noise plus Offset vs.
Time with 0.1 Hz Filter.
FIGURE 2-36: THD+N vs. Frequency.
1.E+1
1.E+2
1.E+3
1.E+4
1.E-1 1.E+0 1.E+1 1.E+2 1.E+3 1.E+4 1.E+5 1.E+6 1.E+7
Frequency (Hz)
0.1 100 10k 1M
Input Noise Voltage Density (nV/Hz)
11k100k10M10
10n
100n
10µ
0
50
100
150
200
250
300
-0.5
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
6.0
Common Mode Input Voltage (V)
VDD = 5.5V
VDD = 2.5V
Input Noise Voltage Density
(nV/Hz)
f = 100 Hz
0
5
10
15
20
25
30
-0.5
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
Common Mode Input Voltage (V)
VDD
= 5.5V
VDD = 2.5V
Input Noise Voltage Density
(nV/Hz)
f = 1 MHz
-20
-15
-10
-5
0
5
10
15
20
0 5 10 15 20 25 30 35 40 45
Time (min)
Input Offset + Noise;
VOS + eni(t) (µV)
Representative Part
Analog NPBW = 0.1 Hz
Sample Rate = 2 SPS
0.0001
0.001
0.01
0.1
1
1.E+2 1.E+3 1.E+4 1.E+5
Frequency (Hz)
THD + Noise (%)
VDD = 5.0V
VOUT = 2 VP-P
100
1k 10k 100k
BW = 22 Hz to 80 kHz
BW = 22 Hz to > 500 kHz G = 1 V/V
G = 11 V/V
MCP621/1S/2/3/4/5/9
DS20002188D-page 16 2009-2014 Microchip Technology Inc.
Note: Unless otherwise indicated, TA=+25°C, V
DD = +2.5V to 5.5V, VSS = GND, VCM =V
DD/3, VOUT =V
DD/2,
VL=V
DD/2, RL=2kto VL, CL= 50 pF, and CAL/CS =V
SS.
2.5 Time Response
FIGURE 2-37: Non-Inverting Small Signal
Step Respon se .
FIGURE 2-38: Non-Inverting Large Signal
Step Respon se .
FIGURE 2-39: Inverting Small Signal Step
Response.
FIGURE 2-40: Inverting Large Signal Step
Response.
FIGURE 2-41: The MCP621/1S /2/3 /4/5/ 9
Family Shows No Input Phase Reversal with
Overdrive.
FIGURE 2-42: Slew Rate vs. Ambien t
Temperature.
0 20 40 60 80 100 120 140 160 180 200
Time (ns)
Output Voltage (10 mV/div)
VDD = 5.5V
G = 1
VIN VOUT
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0
Time (µs)
Output Voltage (V)
VDD = 5.5V
G = 1
VIN VOUT
0 100 200 300 400 500 600 700 800
Time (ns)
Output Voltage (10 mV/div)
VDD = 5.5V
G = -1
RF = 1 k
VIN
VOUT
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0
Time (µs)
Output Voltage (V)
VDD = 5.5V
G = -1
RF = 1 k
VIN
VOUT
-1
0
1
2
3
4
5
6
7
012345678910
Time (ms)
Input, Output Voltages (V)
VDD = 5.5V
G = 2
V
OUT
VIN
0
2
4
6
8
10
12
14
16
18
20
22
24
-50 -25 0 25 50 75 100 125
Ambient Temperature (°C)
Slew Rate (V/µs)
Falling Edge
Rising
VDD = 2.5V
VDD = 5.5V
2009-2014 Microchip Technology Inc. DS20002188D-page 17
MCP621/1S/2/3/4/5/9
Note: Unless otherwise indicated, TA=+25°C, V
DD = +2.5V to 5.5V, VSS = GND, VCM =V
DD/3, VOUT =V
DD/2,
VL=V
DD/2, RL=2kto VL, CL= 50 pF, and CAL/CS =V
SS.
FIGURE 2-43: Maximum Output Voltage
Swing vs. Frequency.
0.1
1
10
1.E+05 1.E+06 1.E+07 1.E+08
Frequency (Hz)
Maximum Output Voltage
Swing (VP-P)
VDD
= 5.5
V
VDD
= 2.5
100k 1M 10M 100M
MCP621/1S/2/3/4/5/9
DS20002188D-page 18 2009-2014 Microchip Technology Inc.
Note: Unless otherwise indicated, TA=+25°C, V
DD = +2.5V to 5.5V, VSS = GND, VCM =V
DD/3, VOUT =V
DD/2,
VL=V
DD/2, RL=2kto VL, CL= 50 pF, and CAL/CS =V
SS.
2.6 Calibration and Chip Select Response
FIGURE 2-44: CAL/CS Current vs. Power
Supply Voltage.
FIGURE 2-45: CAL/CS Voltage, Output
V oltage and Supply Current (for Side A) vs. Time
with VDD =2.5V.
FIGURE 2-46: CAL/CS Voltage, Output
V oltage and Supply Current (for Side A) vs. Time
with VDD =5.5V.
FIGURE 2-47: CAL/CS Hysteresis vs.
Ambient Temp er atu re.
FIGURE 2-48: CAL/CS Turn-On Time vs.
Ambient Temp er atu re.
FIGURE 2-49: CAL/CS’s P u ll -D own
Resistor (RPD) vs. Ambient Temperature.
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5
Power Supply Voltage (V)
CAL/CS Current (µA)
CAL/CS = VDD
-1
0
1
2
3
4
5
6
7
8
0246810121416
Time (ms)
CAL/CS, V OUT (V)
-12
-10
-8
-6
-4
-2
0
2
4
6
Power Supply Current;
IDD (mA)
VDD = 2.5V
G = 1
VL = 0V
Op Amp
turns on
CAL/CS
Op Amp
turns off
Calibration
starts
IDD
VOUT
-2
0
2
4
6
8
10
12
14
16
0 2 4 6 8 10 12 14 16
Time (ms)
CAL/CS, V OUT (V)
-12
-10
-8
-6
-4
-2
0
2
4
6
Power Supply Current;
IDD (mA)
VDD = 5.5V
G = 1
VL = 0V
Op Amp
turns on
CAL/CS
Op Amp
turns off
Calibration
starts
IDD
VOUT
0.00
0.05
0.10
0.15
0.20
0.25
0.30
0.35
0.40
-50 -25 0 25 50 75 100 125
Ambient Temperature (°C)
CAL/CS Hysteresis (V)
VDD = 2.5V
VDD = 5.5V
0
1
2
3
4
5
6
7
8
-50 -25 0 25 50 75 100 125
Ambient Temperature (°C)
CAL/CS Turn On Time (ms)
0
1
2
3
4
5
6
7
8
-50 -25 0 25 50 75 100 125
Ambient Temperature (°C)
CAL/CS Pull-down Resistor
(M)
Representative Part
2009-2014 Microchip Technology Inc. DS20002188D-page 19
MCP621/1S/2/3/4/5/9
Note: Unless otherwise indicated, TA=+25°C, V
DD = +2.5V to 5.5V, VSS = GND, VCM =V
DD/3, VOUT =V
DD/2,
VL=V
DD/2, RL=2kto VL, CL= 50 pF, and CAL/CS =V
SS.
FIGURE 2-50: Quiescent Current in
Shutdown vs. Power Supply Voltage. FIGURE 2-51: Output Leakage Current vs.
Output Voltage.
-7
-6
-5
-4
-3
-2
-1
0
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
6.0
6.5
Power Supply Voltage (V)
Negative Power Supply
Current; I SS (µA)
CAL/CS = VDD
+125°C
+85°C
+25°C
-40°C
1.E-11
1.E-10
1.E-09
1.E-08
1.E-07
1.E-06
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0
Output Voltage (V)
Output Leakage Current (A)
+25°C
+125°C
+85°C
CAL/CS = VDD = 5.5V
2009-2014 Microchip Technology Inc. DS20002188D-page 20
MCP621/1S/2/3/4/5/9
3.0 PIN DESCRIPTIONS
Descriptions of the pins are listed in Table 3-1.
TABLE 3-1: PIN FUNCTION TABLE
MCP621 MCP621S MCP622 MCP623 MCP624 MCP625 MCP629 Symbol Description
SOIC TDFN SOT-23 SOIC DFN SOT-23 SOIC TSSOP MSOP DFN QFN
22 4 22 4 2 2 22 1V
IN–, VINA Inverting Input (op amp A)
33 3 33 3 3 3 33 2V
IN+, VINA+ Non-inverting Input (op amp A)
7 7 5 8 8 6 4 4 10 10 3 VDD Positive Power Supply
—— 55 5 5 7 7 4 V
INB+ Non-inverting Input (op amp B)
—— 66 66 885 VINB Inverting Input (op amp B)
—— 77 77 996 VOUTB Output (op amp B)
—— 7CALBC/CSBC Calibrate/Chip Select Digital Input
(op amps B and C)
—— 88—— 8VOUTC Output (op amp C)
—— 99—— 9VINC Inverting Input (op amp C)
—— 10 10 —— 10 VINC+ Non-inverting input (op amp C)
44 2 44 21111
44 11 VSS Negative Power Supply
—— 12 12 —— 12 VIND+ Non-inverting input (op amp D)
—— 13 13 —— 13 VINDD Inverting Input (op amp D)
—— 14 14 —— 14 VOUTD Output (op amp D)
—— 15 CALAD/CSAD Calibrate/Chip Select Digital Input
(op amps A and D)
66 1 11 1 1 1 1116 VOUT
, VOUTA Output (op amp A)
9 9 11 17 EP Exposed Thermal Pad (EP);
must be connected to VSS
88 5 55 CAL/CS,
CALA/CSA
Calibrate/Chip Select Digital Input (op amp A)
—— 6 6 CALB/CSBCalibrate/Chip Select Digital Input (op amp B)
55 V
CAL Calibration Common Mode Voltage Input
1 1 NC No Internal Connection
2009-2014 Microchip Technology Inc. DS20002188D-page 21
MCP621/1S/2/3/4/5/9
3.1 Analog Outputs
The analog output pins (VOUT) are low-impedance
voltage sources.
3.2 Analog Inputs
The non-inverting and inverting inputs (VIN+, VIN–, …)
are high-impedance CMOS inputs with low bias
currents.
3.3 Power Supply Pins
The positive power supply (VDD) is 2.5V to 5.5V higher
than the negative power supply (VSS). For normal
operation, the other pins are between VSS and VDD.
Typically, these parts are used in a single (positive)
supply configuration. In this case, VSS is connected to
ground and VDD is connected to the supply. VDD will
need bypass capacitors.
3.4 Calibration Common Mode
Voltage Input
A low-impedance voltage placed at this input (VCAL)
will set the op amps’ Common mode input voltage
during calibration. If this pin is left open, the Common
mode input voltage during calibration is approximately
VDD/3. The internal resistor divider is disconnected
from the supplies whenever the part is not in
calibration.
3.5 Calibrate/Chip Select Digital Input
This input (CAL/CS, …) is a CMOS, Schmitt-triggered
input that affects the Calibration and Low-Power
modes of operation. When this pin goes high, the part
is placed into a Low-Power mode and the output is
High Z. When this pin goes low, a calibration sequence
is started (which corrects VOS). At the end of the cali-
bration sequence, the output becomes low-impedance
and the part resumes normal operation.
An internal POR triggers a calibration event when the
part is powered-on, or when the supply voltage drops
too low. Thus, the MCP622 parts are calibrated, even
though they do not have a CAL/CS pin.
3.6 Exposed Thermal Pad (EP)
There is an internal connection between the Exposed
Thermal Pad (EP) and the VSS pin; they must be
connected to the same potential on the Printed Circuit
Board (PCB).
This pad can be connected to a PCB ground plane to
provide a larger heat sink. This improves the package
thermal resistance (JA).
MCP621/1S/2/3/4/5/9
DS20002188D-page 22 2009-2014 Microchip Technology Inc.
4.0 APPLICATIONS
The MCP621/1S/2/3/4/5/9 family of self-zeroed op
amps is manufactured using Microchip’s state-of-the-
art CMOS process. It is designed for low-cost, low-
power and high-precision applications. Its low supply
voltage, low quiescent current and wide bandwidth
makes the MCP621/1S/2/3/4/5/9 ideal for battery-
powered applications.
4.1 Calibration and Chip Select
These op amps include circuitry for dynamic calibration
of the offset voltage (VOS).
4.1.1 mCal CALIBRATION CIRCUITRY
The internal mCal circuitry, when activated, starts a
delay timer (to wait for the op amp to settle to its new
bias point), then calibrates the input offset voltage
(VOS). The mCal circuitry is triggered at power-up (and
after some power brown-out events) by the internal
POR, and by the memory’s parity detector. The
power-up time, when the mCal circuitry triggers the
calibration sequence, is 200 ms (typical).
4.1.2 CAL/CS PIN
The CAL/CS pin gives the user a means to externally
demand a Low-Power mode of operation, then to
calibrate VOS. Using the CAL/CS pin makes it possible
to correct VOS as it drifts over time (1/f noise and aging;
see Figure 2-35) and across temperature.
The CAL/CS pin performs two functions: it places the
op amp(s) in a Low-Power mode when it is held high,
and starts a calibration event (correction of VOS) after a
rising edge.
While in the Low-Power mode, the quiescent current is
quite small (ISS = -3 µA, typical). The output is also in a
High Z state.
During the calibration event, the quiescent current is
near, but smaller than, the specified quiescent current
(2.5 mA, typical). The output continues in the High Z
state, and the inputs are disconnected from the
external circuit, to prevent internal signals from
affecting circuit operation. The op amp inputs are
internally connected to a Common mode voltage buffer
and feedback resistors. The offset is corrected (using a
digital state machine, logic and memory), and the
calibration constants are stored in memory.
Once the calibration event is completed, the amplifier is
reconnected to the external circuitry. The turn-on time,
when calibration is started with the CAL/CS pin, is 5 ms
(typical).
There is an internal 5 M pull-down resistor tied to the
CAL/CS pin. If the CAL/CS pin is left floating, the
amplifier operates normally.
For the MCP625 dual and the MCP629 quad, there is
an additional constraint on toggling the two CAL/CS
pins close together; see the tCON specification in
Table 1-3. If the two pins are toggled simultaneously, or
if they are toggled separately with an adequate delay
between them (greater than tCON), then the CAL/CS
inputs are accepted as valid. If one of the two pins
toggles, while the other pin’s calibration routine is in
progress, then an invalid input occurs and the result is
unpredictable.
4.1.3 INTERNAL POR
This part includes an internal Power-on Reset (POR) to
protect the internal calibration memory cells. The POR
monitors the power supply voltage (VDD). When the
POR detects a low VDD event, it places the part into the
Low-Power mode of operation. When the POR detects
a normal VDD event, it starts a delay counter, then
triggers a calibration event. The additional delay gives
a total POR turn-on time of 200 ms (typical); this is also
the power-up time (since the POR is triggered at power
up).
4.1.4 PARITY DETECTOR
A parity error detector monitors the memory contents
for any corruption. In the rare event that a parity error is
detected (e.g., corruption from an alpha particle), a
POR event is automatically triggered. This will cause
the input offset voltage to be recorrected, and the op
amp will not return to normal operation for a period of
time (the POR turn-on time, tPON).
4.1.5 CALIBRATION INPUT PIN
A VCAL pin is available in some options (e.g., the single
MCP621) for those applications that need the
calibration to occur at an internally driven Common
mode voltage other than VDD/3.
Figure 4-1 shows the reference circuit that internally
sets the op amp’s Common mode reference voltage
(VCM_INT) during calibration (the resistors are
disconnected from the supplies at other times). The
5k resistor provides overcurrent protection for the
buffer.
FIGURE 4-1: Common-Mode Reference’s
Input Circuitry.
To op amp during
VCAL BUFFER
5k
300 k
150 k
VSS
VDD calibration
VCM_INT
2009-2014 Microchip Technology Inc. DS20002188D-page 23
MCP621/1S/2/3/4/5/9
When the VCAL pin is left open, the internal resistor
divider generates a VCM_INT of approximately VDD/3,
which is near the center of the input Common mode
voltage range. It is recommended that an external
capacitor from VCAL to ground be added to improve
noise immunity.
When the VCAL pin is driven by an external voltage
source, which is within its specified range, the op amp
will have its input offset voltage calibrated at that
Common mode input voltage. Make sure that VCAL is
within its specified range.
It is possible to use an external resistor voltage divider
to modify VCM_INT
; see Figure 4-2. The internal circuitry
at the VCAL pin looks like 100 k tied to VDD/3. The
parallel equivalent of R1 and R2 should be much
smaller than 100 k to minimize differences in match-
ing and temperature drift between the internal and
external resistors. Again, make sure that VCAL is within
its specified range.
FIGURE 4-2: Setting VCM with External
Resistors.
For instance, a design goal to set VCM_INT =0.1V when
VDD = 2.5V could be met with: R1=24.3k,
R2=1.00k and C1= 100 nF. This will keep VCAL
within its range for any VDD, and should be close
enough to 0V for ground-based applications.
4.2 Input
4.2.1 PHASE REVERSAL
The input devices are designed to not exhibit phase
inversion when the input pins exceed the supply
voltages. Figure 2-41 shows an input voltage
exceeding both supplies with no phase inversion.
4.2.2 INPUT VOLTAGE AND CURRENT
LIMITS
The ESD protection on the inputs can be depicted as
shown in Figure 4-3. This structure was chosen to
protect the input transistors, and to minimize input bias
current (IB). The input ESD diodes clamp the inputs
when they try to go more than one diode drop below
VSS. They also clamp any voltages that go too far
above VDD; their breakdown voltage is high enough to
allow normal operation, and low enough to bypass
quick ESD events within the specified limits.
FIGURE 4-3: Simplified Analog Input ESD
Structures.
In order to prevent damage and/or improper operation
of these amplifiers, the circuit must limit the currents
(and voltages) at the input pins (see Section 1.1
“Absolute Maximum Ratings †”). Figure 4-4 shows
the recommended approach to protecting these inputs.
The internal ESD diodes prevent the input pins (VIN+
and VIN–) from going too far below ground, and the
resistors R1 and R2 limit the possible current drawn out
of the input pins. Diodes D1 and D2 prevent the input
pins (VIN+ and VIN–) from going too far above VDD, and
dump any currents onto VDD. When implemented as
shown, resistors R1 and R2 also limit the current
through D1 and D2.
FIGURE 4-4: Protecting the Analog
Inputs.
It is also possible to connect the diodes to the left of the
resistor R1 and R2. In this case, the currents through
the diodes D1 and D2 need to be limited by some other
mechanism. The resistors then serve as in-rush current
limiters; the DC current into the input pins (VIN+ and
VIN–) should be very small.
R1
R2
VSS
VDD
VCAL
C1
MCP62X
Bond
Pad
Bond
Pad
Bond
Pad
VDD
VIN+
VSS
Input
Stage
Bond
Pad VIN
V1
R1
VDD
D1
R1>VSS (minimum ex pected V1)
2mA
VOUT
R2>VSS (minimum ex pected V2)
2mA
V2
R2
D2
MCP62X
MCP621/1S/2/3/4/5/9
DS20002188D-page 24 2009-2014 Microchip Technology Inc.
A significant amount of current can flow out of the
inputs (through the ESD diodes) when the Common
mode voltage (VCM) is below ground (VSS); see
Figure 2-15. Applications that are high-impedance may
need to limit the usable voltage range.
4.2.3 NORMAL OPERATION
The input stage of the MCP621/1S/2/3/4/5/9 op amps
use a differential PMOS input stage. It operates at low
Common mode input voltage (VCM), with VCM up to
VDD 1.3V and down to VSS 0.3V. The input offset
voltage (VOS) is measured at VCM =V
SS –0.3V and
VDD 1.3V to ensure proper operation. See Figure 2-6
and Figure 2-7 for temperature effects.
When operating at very low non-inverting gains, the
output voltage is limited at the top by the VCM range
(< VDD –1.3V); see Figure 4-5.
FIGURE 4-5: Unity Gain Voltage
Limitations for Linear Operation.
4.3 Rail-to-Rail Output
4.3.1 MAXIMUM OUTPUT VOLTAGE
The Maximum Output Voltage (see Figure 2-16 and
Figure 2-17) describes the output range for a given
load. For instance, the output voltage swings to within
40 mV of the negative rail with a 2 k load tied to
VDD/2.
4.3.2 OUTPUT CURRENT
Figure 4-6 shows the possible combinations of output
voltage (VOUT) and output current (IOUT). IOUT is
positive when it flows out of the op amp into the
external circuit.
FIGURE 4-6: Output Current.
4.3.2.1 Power Dissipation
Since the output short-circuit current (ISC) is specified
at ±70 mA (typical), these op amps are capable of both
delivering and dissipating significant power.
Two common loads, and their impact on the op amp’s
power dissipation, will be discussed.
Figure 4-7 shows a resistive load (RL) with a DC output
voltage (VOUT). VL is RL’s ground point, VSS is usually
ground (0V) and IOUT is the output current. The input
currents are assumed to be negligible.
FIGURE 4-7: Diagram for Resistive Load
Power Calculations.
The DC currents are:
EQUATION 4-1:
The DC op amp power is:
EQUATION 4-2:
The maximum op amp power, for resistive loads at DC,
occurs when VOUT is halfway between VDD and VL, or
halfway between VSS and VL:
EQUATION 4-3:
VIN
VDD
VOUT
VSS V
IN V
OUT VDD 1.3V
MCP62X
-0.5
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
6.0
-80
-60
-40
-20
0
20
40
60
80
IOUT (mA)
VOUT (V)
RL = 10
RL = 100
RL = 2 k
VOH Limited
VOL Limited
-ISC Limited
+ISC Limited
(VDD = 5.5V)
VDD
VOUT
RL
VL
IDD
ISS
IOUT
VSS
MCP62X
IOUT VOUT VL
RL
--------------------------=
IDD IQmax 0 IOUT
,+
ISS IQmin 0 IOUT
,+
Where:
IQ= Quiescent supply current for one op
amp (mA/amplifier)
VOUT = A DC value (V)
POA IDD VDD VOUT
ISS VSS VOUT
+=
max POA
IDD VDD VSS
=
max2VDD VL
VLVSS

4RL
------------------------------------------------------------------+
2009-2014 Microchip Technology Inc. DS20002188D-page 25
MCP621/1S/2/3/4/5/9
Figure 4-7 shows a capacitive load (CL), which is
driven by a sine wave with DC offset. The capacitive
load causes the op amp to output higher currents at
higher frequencies. Because the output rectifies IOUT
,
the op amp’s dissipated power increases (even though
the capacitor does not dissipate power).
FIGURE 4-8: Diagram for Capacitive Load
Power Calculations.
The output voltage is assumed to be:
EQUATION 4-4:
The op amp’s currents are:
EQUATION 4-5:
The op amp’s instantaneous power, average power
and peak power are:
EQUATION 4-6:
The power dissipated in a package depends on the
powers dissipated by each op amp in that package:
EQUATION 4-7:
The maximum ambient-to-junction temperature rise
(TJA) and junction temperature (TJ) can be calculated
using the maximum expected package power (PPKG),
ambient temperature (TA) and the package thermal
resistance (JA) found in Table 1-4:
EQUATION 4-8:
The worst-case power derating for the op amps in a
particular package can be easily calculated:
EQUATION 4-9:
Several techniques are available to reduce TJA for a
given package:
Reduce JA
- Use another package
- Improve the PCB layout (ground plane, etc.)
- Add heat sinks and air flow
Reduce max (PPKG)
- Increase RL
- Decrease CL
- Limit IOUT using RISO (see Figure 4-9)
- Decrease VDD
CL
VDD
VOUT
IDD
ISS
IOUT
VSS
MCP62X
VOUT VDC VAC
tsin+=
Where:
VDC = DC offset (V)
VAC = Peak output swing (VPK)
= Radian frequency (2f) (rad/s)
IOUT CLdVOUT
dt
-----------------
VAC
CL
tcos==
IDD IQmax 0 IOUT
,+
ISS IQmin 0 IOUT
,+
Where:
IQ= Quiescent supply current for one op
amp (mA/amplifier)
POA IDD VDD VOUT
ISS VSS VOUT
+=
ave POA
 VDD VSS
IQ4VAC fCL
------------------------+


=
max POA
 VDD VSS
IQ2VAC fCL
+=
PPKG POA
k1=
n
=
Where:
n = Number of op amps in package (1 or 2)
TJA PPKG
JA
=
TJTA
TJA
+=
PPKG TJmax TA
JA
--------------------------
Where:
TJmax = Absolute maximum junction
temperature (°C)
TA= Ambient temperature (°C)
MCP621/1S/2/3/4/5/9
DS20002188D-page 26 2009-2014 Microchip Technology Inc.
4.4 Improving Stability
4.4.1 CAPACITIVE LOADS
Driving large capacitive loads can cause stability
problems for voltage feedback op amps. As the load
capacitance increases, the feedback loop’s phase
margin decreases and the closed-loop bandwidth is
reduced. This produces gain peaking in the frequency
response, with overshoot and ringing in the step
response. See Figure 2-30. A unity gain buffer (G = +1)
is the most sensitive to capacitive loads, though all
gains show the same general behavior.
When driving large capacitive loads with these op
amps (e.g., > 10 pF when G = +1), a small series
resistor at the output (RISO in Figure 4-9) improves the
feedback loop’s phase margin (stability) by making the
output load resistive at higher frequencies. The
bandwidth will be generally lower than the bandwidth
with no capacitive load.
FIGURE 4-9: Output Resistor, RISO
Stabilizes Large Capacitive Loads.
Figure 4-10 gives recommended RISO values for
different capacitive loads and gains. The x-axis is the
normalized load capacitance (CL/GN), where GN is the
circuit’s noise gain. For non-inverting gains, GN and the
Signal Gain are equal. For inverting gains, GN is
1+|Signal Gain| (e.g., -1 V/V gives GN=+2V/V).
FIGURE 4-10: Recommended RISO Values
for Capacitive Loads.
After selecting RISO, double check the resulting fre-
quency response peaking and step response over-
shoot. Modify RISO’s value until the response is
reasonable. Bench evaluation and simulations with the
MCP621/1S/2/3/4/5/9 SPICE macro model are helpful.
4.4.2 GAIN PEAKING
Figure 4-11 shows an op amp circuit that represents
non-inverting amplifiers (VM is a DC voltage and VP is
the input) or inverting amplifiers (VP is a DC voltage
and VM is the input). The capacitances CN and CG
represent the total capacitance at the input pins; they
include the op amp’s Common mode input capacitance
(CCM), board parasitic capacitance and any capacitor
placed in parallel.
FIGURE 4-11: Amplifier with Parasitic
Capacitance.
CG acts in parallel with RG (except for a gain of +1 V/V),
which causes an increase in gain at high frequencies.
CG also reduces the phase margin of the feedback
loop, which becomes less stable. This effect can be
reduced by either reducing CG or RF
.
CN and RN form a low-pass filter that affects the signal
at VP
. This filter has a single real pole at 1/(2RNCN).
The largest value of RF that should be used depends
on noise gain (see GN in Section 4.4.1 “Capacitive
Loads”) and CG
. Figure 4-12 shows the maximum
recommended RF for several CG values.
FIGURE 4-12: Maximum Recommended
RF vs. Gain.
Figures 2-37 and 2-38 show the small signal and large
signal step responses at G = +1 V/V. The unity gain
buffer usually has RF=0 and RG open.
Figures 2-39 and 2-40 show the small signal and large
signal step responses at G = -1 V/V. Since the noise
gain is 2 V/V and CG10 pF, the resistors were
chosen to be RF=R
G=1k and RN=500.
RISO
VOUT
CL
RGRF
RNMCP62X
1
10
100
1,000
1.E-12 1.E-11 1.E-10 1.E-09 1.E-08
Normalized Capacitance; CL/GN (F)
Recommended RISO ()
GN = +1
GN +2
1p 100p 1n 10n10p
VP
RF
VOUT
RN
CN
VM
RGCG
MCP62X
1.E+02
1.E+03
1.E+04
1.E+05
110100
Noise Gain; GN (V/V)
Maximum Recommended RF
()
GN > +1 V/V
100
10k
100k
1k
CG
= 10 pF
CG
= 32 pF
CG
= 100 pF
CG
= 320 pF
CG
= 1 nF
2009-2014 Microchip Technology Inc. DS20002188D-page 27
MCP621/1S/2/3/4/5/9
It is also possible to add a capacitor (CF) in parallel with
RF to compensate for the destabilizing effect of CG
.
This makes it possible to use larger values of RF
.
The conditions for stability are summarized in
Equation 4-10.
EQUATION 4-10:
4.5 Power Supply
With this family of operational amplifiers, the power
supply pin (VDD for single supply) should have a local
bypass capacitor (i.e., 0.01 µF to 0.1 µF) within 2 mm
for good high-frequency performance. Surface mount,
multilayer ceramic capacitors, or their equivalent,
should be used.
These op amps require a bulk capacitor (i.e., 2.2 µF or
larger) within 50 mm to provide large, slow currents.
Tantalum capacitors, or their equivalent, may be a good
choice. This bulk capacitor can be shared with other
nearby analog parts as long as crosstalk through the
supplies does not prove to be a problem.
4.6 High Speed PCB Layout
These op amps are fast enough that a little extra care
in the PCB (Printed Circuit Board) layout can make a
significant difference in performance. Good PC board
layout techniques will help you achieve the
performance shown in the specifications and Typical
Performance Curves; it will also help you minimize
EMC (Electro-Magnetic Compatibility) issues.
Use a solid ground plane. Connect the bypass local
capacitor(s) to this plane with minimal length traces.
This cuts down inductive and capacitive crosstalk.
Separate digital from analog, low-speed from high-
speed, and low-power from high-power. This will
reduce interference.
Keep sensitive traces short and straight. Separate
them from interfering components and traces. This is
especially important for high-frequency (low rise time)
signals.
Sometimes, it helps to place guard traces next to victim
traces. They should be on both sides of the victim
trace, and as close as possible. Connect guard traces
to ground plane at both ends, and in the middle for long
traces.
Use coax cables, or low-inductance wiring, to route the
signal and power to and from the PCB. Mutual and self-
inductance of power wires is often a cause of crosstalk
and unusual behavior.
4.7 Typical Applications
4.7.1 POWER DRIVER WITH HIGH GAIN
Figure 4-13 shows a power driver with high gain
(1 + R2/R1). The MCP621/1S/2/3/4/5/9 op amp’s short-
circuit current makes it possible to drive significant
loads. The calibrated input offset voltage supports
accurate response at high gains. R3 should be small,
and equal to R1||R2, in order to minimize the bias
current induced offset.
FIGURE 4-13: Power Driver.
4.7.2 OPTICAL DETECTOR AMPLIFIER
Figure 4-14 shows a transimpedance amplifier, using
the MCP621 op amp, in a photo detector circuit. The
photo detector is a capacitive current source. The op
amp’s input Common mode capacitance (9 pF, typical)
and Differential capacitance (2 pF, typical) act in paral-
lel with CD. RF provides enough gain to produce 10 mV
at VOUT. CF stabilizes the gain and limits
the transimpedance bandwidth to about 0.51 MHz.
RF’s parasitic capacitance (e.g., 0.15 pF for a
0603 SMD) acts in parallel with CF
.
FIGURE 4-14: Transimpedance Amplifier
for an Optical Detector.
fFfGBWP 2GN2

, GN1 GN2
<
We need:
GN1 1R
FRG
+=
GN2 1C
GCF
+=
fF12
RFCF

=
fZfFGN1 GN2
=
Given:
fFfGBWP 4GN1

, GN1 GN2
>
R1R2
VIN
VDD/2 VOUT
R3RL
MCP62X
Photo
Detector
CD
CF
RF
VDD/2
30pF
100 k
3pF
ID
100 nA
VOUT
MCP621
MCP621/1S/2/3/4/5/9
DS20002188D-page 28 2009-2014 Microchip Technology Inc.
4.7.3 H-BRIDGE DRIVER
Figure 4-15 shows the MCP622 dual op amp used as
a H-bridge driver. The load could be a speaker or a DC
motor.
FIGURE 4-15: H-Bridge Driver.
This circuit automatically makes the noise gains (GN)
equal, when the gains are set properly, so that the
frequency responses match well (in magnitude and in
phase). Equation 4-11 shows how to calculate RGT and
RGB so that both op amps have the same DC gains;
GDM needs to be selected first.
EQUATION 4-11:
Equation 4-12 gives the resulting Common mode and
Differential mode output voltages.
EQUATION 4-12:
RF
RF
VIN
VOT
RF
RGB
VOB
VDD/2
RGT RL
½ MCP622
½ MCP622
GDM VOT VOB
VIN VDD 2
------------- ----------- -------- 2 V /V
RGT RF
GDM 2
1
---------------------------------=
RGB RF
GDM 2
-------------------=
VOT V+ OB
2
--------------------------- VDD
2
-----------=
VOT VOB GDM VIN VDD
2
-----------


=
2009-2014 Microchip Technology Inc. DS20002188D-page 29
MCP621/1S/2/3/4/5/9
5.0 DESIGN AIDS
Microchip provides the basic design aids needed for
the MCP621/1S/2/3/4/5/9 family of op amps.
5.1 SPICE Macro Model
The latest SPICE macro model for the
MCP621/1S/2/3/4/5/9 op amps is available on the
Microchip web site at www.microchip.com. This model
is intended to be an initial design tool that works well in
the op amp’s linear region of operation over the
temperature range. See the model file for information
on its capabilities.
Bench testing is a very important part of any design and
cannot be replaced with simulations. Also, simulation
results using this macro model need to be validated by
comparing them to the data sheet specifications and
characteristic curves.
5.2 FilterLab® Software
Microchip’s FilterLab® software is an innovative
software tool that simplifies analog active filter (using
op amps) design. Available at no cost from the
Microchip web site at www.microchip.com/filterlab, the
Filter-Lab design tool provides full schematic diagrams
of the filter circuit with component values. It also
outputs the filter circuit in SPICE format, which can be
used with the macro model to simulate actual filter
performance.
5.3 Microchip Advanced Part Selector
(MAPS)
MAPS is a software tool that helps efficiently identify
Microchip devices that fit a particular design
requirement. Available at no cost from the Microchip
web site at www.microchip.com/maps, the MAPS is an
overall selection tool for Microchip’s product portfolio
that includes Analog, Memory, MCUs and DSCs. Using
this tool, a customer can define a filter to sort features
for a parametric search of devices and export
side-by-side technical comparison reports. Helpful links
are also provided for data sheets, purchase and
sampling of Microchip parts.
5.4 Analog Demonstration and
Evaluation Boards
Microchip offers a broad spectrum of Analog
Demonstration and Evaluation Boards that are
designed to help customers achieve faster time to
market. For a complete listing of these boards and their
corresponding user’s guides and technical information,
visit the Microchip web site at
www.microchip.com/analog tools.
Some boards that are especially useful are:
MCP6XXX Amplifier Evaluation Board 1
MCP6XXX Amplifier Evaluation Board 2
MCP6XXX Amplifier Evaluation Board 3
MCP6XXX Amplifier Evaluation Board 4
Active Filter Demo Board Kit
8-Pin SOIC/MSOP/TSSOP/DIP Evaluation Board,
P/N SOIC8EV
5.5 Application Notes
The following Microchip Application Notes are
available on the Microchip web site at www.microchip.
com/appnotes and are recommended as supplemental
reference resources.
ADN003: “Select the Right Operational Amplifier
for your Filtering Circuits” (DS21821)
AN722: “Operational Amplifier Topologies and DC
Specifications” (DS00722)
AN723: “Operational Amplifier AC Specifications
and Applications” (DS00723)
AN884: “Driving Cap acitive L oads With Op Amps”
(DS00884)
AN990: “Analog Sensor Conditioning Circuits –
An Overview (DS00990)
AN1177: “Op Amp Precision Design: DC Errors
(DS01177)
AN1228: “Op Amp Precision Design: Random
Noise” (DS01228)
AN1332: “Current Sensing Circuit Concepts and
Fundamentals” (DS01332)
Some of these application notes, and others, are listed
in the design guide:
“Signal Chain Design Guide” (DS21825)
MCP621/1S/2/3/4/5/9
DS20002188D-page 30 2009-2014 Microchip Technology Inc.
6.0 PACKAGING INFORMATION
6.1 Package Marking Information
Legend: XX...X Customer-specific information
Y Year code (last digit of calendar year)
YY Year code (last 2 digits of calendar year)
WW Week code (week of January 1 is week ‘01’)
NNN Alphanumeric traceability code
Pb-free JEDEC® designator for Matte Tin (Sn)
*This package is Pb-free. The Pb-free JEDEC designator ( )
can be found on the outer packaging for this package.
Note: In the event the full Microchip part number cannot be marked on one line, it will
be carried over to the next line, thus limiting the number of available
characters for customer-specific information.
3
e
3
e
Device Code
MCP622T-E/MF DABL
Note: Applies to 8-Lead 3x3 DFN
Example:
5-Lead SOT-23 (MCP621S)
8-Lead TDFN (2 x 3) (MCP621) Example:
8-Lead DFN (3x3) (MCP622) Example
6-Lead SOT-23 ( MCP623)Example
XXNN
YU25
XXNN
JB25
AAY
129
25
DABL
1129
256
2009-2014 Microchip Technology Inc. DS20002188D-page 31
MCP621/1S/2/3/4/5/9
Package Marking Information (Continued)
14-Lead SOIC (.150”) (MCP624) Example
14-Lead TSSOP (MCP624)
10-Lead DFN (3x3) (MCP625)
10-Lead MSOP (MCP625) Example:
Device Code
MCP625T-E/MF BAFA
Note: Applies to 10-Lead 3x3 DFN
8-Lead SOIC (150 mil) (MCP621, MCP622) Example:
Example
Example
NNN
MCP621E
SN ^^1129
256
3
e
BAFA
1129
256
625EUN
129256
MCP624
E/SL ^^
1129256
3
e
YYWW
NNN
XXXXXXXX
624E/ST
1129
256
16-Lead QFN (4x4) (MCP629) Example
PIN 1 PIN 1
629
E/ML ^^
129256
3
e
MCP621/1S/2/3/4/5/9
DS20002188D-page 32 2009-2014 Microchip Technology Inc.


 
 
 
 

 
   

 
  
  
   
   
  
   
  
  
   
  
  
  
φ
N
b
E
E1
D
123
e
e1
A
A1
A2 c
L
L1
   
2009-2014 Microchip Technology Inc. DS20002188D-page 33
MCP621/1S/2/3/4/5/9
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
MCP621/1S/2/3/4/5/9
DS20002188D-page 34 2009-2014 Microchip Technology Inc.
6-Lead Plastic Small Outline Transistor (CHY) [SOT-23]
Notes:
1. Dimensions D and E1 do not include mold flash or protrusions. Mold flash or protrusions shall not exceed 0.127 mm per side.
2. Dimensioning and tolerancing per ASME Y14.5M.
BSC: Basic Dimension. Theoretically exact value shown without tolerances.
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
Units MILLIMETERS
Dimension Limits MIN NOM MAX
Number of Pins N 6
Pitch e 0.95 BSC
Outside Lead Pitch e1 1.90 BSC
Overall Height A 0.90 1.45
Molded Package Thickness A2 0.89 1.30
Standoff A1 0.00 0.15
Overall Width E 2.20 3.20
Molded Package Width E1 1.30 1.80
Overall Length D 2.70 3.10
Foot Length L 0.10 0.60
Footprint L1 0.35 0.80
Foot Angle I 30°
Lead Thickness c 0.08 0.26
Lead Width b 0.20 0.51
b
E
4
N
E1
PIN 1 ID BY
LASER MARK
D
123
e
e1
A
A1
A2 c
L
L1
φ
Microchip Technology Drawing C04-028B
2009-2014 Microchip Technology Inc. DS20002188D-page 35
MCP621/1S/2/3/4/5/9
6-Lead Plastic Small Outline Transistor (CHY) [SOT-23]
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
MCP621/1S/2/3/4/5/9
DS20002188D-page 36 2009-2014 Microchip Technology Inc.
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
2009-2014 Microchip Technology Inc. DS20002188D-page 37
MCP621/1S/2/3/4/5/9
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
MCP621/1S/2/3/4/5/9
DS20002188D-page 38 2009-2014 Microchip Technology Inc.
!"#$%&'**+,./0!"
 

2009-2014 Microchip Technology Inc. DS20002188D-page 39
MCP621/1S/2/3/4/5/9
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
MCP621/1S/2/3/4/5/9
DS20002188D-page 40 2009-2014 Microchip Technology Inc.
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
2009-2014 Microchip Technology Inc. DS20002188D-page 41
MCP621/1S/2/3/4/5/9
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
MCP621/1S/2/3/4/5/9
DS20002188D-page 42 2009-2014 Microchip Technology Inc.
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
2009-2014 Microchip Technology Inc. DS20002188D-page 43
MCP621/1S/2/3/4/5/9
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
MCP621/1S/2/3/4/5/9
DS20002188D-page 44 2009-2014 Microchip Technology Inc.
'1#,4+/057
 

2009-2014 Microchip Technology Inc. DS20002188D-page 45
MCP621/1S/2/3/4/5/9
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
MCP621/1S/2/3/4/5/9
DS20002188D-page 46 2009-2014 Microchip Technology Inc.
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
2009-2014 Microchip Technology Inc. DS20002188D-page 47
MCP621/1S/2/3/4/5/9
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
MCP621/1S/2/3/4/5/9
DS20002188D-page 48 2009-2014 Microchip Technology Inc.
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
UN
2009-2014 Microchip Technology Inc. DS20002188D-page 49
MCP621/1S/2/3/4/5/9
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
UN
MCP621/1S/2/3/4/5/9
DS20002188D-page 50 2009-2014 Microchip Technology Inc.
10-Lead Plastic Micro Small Outline Package (UN) [MSOP]
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
2009-2014 Microchip Technology Inc. DS20002188D-page 51
MCP621/1S/2/3/4/5/9
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
MCP621/1S/2/3/4/5/9
DS20002188D-page 52 2009-2014 Microchip Technology Inc.
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
2009-2014 Microchip Technology Inc. DS20002188D-page 53
MCP621/1S/2/3/4/5/9
 

MCP621/1S/2/3/4/5/9
DS20002188D-page 54 2009-2014 Microchip Technology Inc.
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
2009-2014 Microchip Technology Inc. DS20002188D-page 55
MCP621/1S/2/3/4/5/9
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
MCP621/1S/2/3/4/5/9
DS20002188D-page 56 2009-2014 Microchip Technology Inc.
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
2009-2014 Microchip Technology Inc. DS20002188D-page 57
MCP621/1S/2/3/4/5/9
89;"#$%&'<*<*+,4/0;"

 
 
 
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
 
   
 
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 
    
   
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 
D
E
N
2
1
EXPOSED
PAD
D2
E2
2
1
e
b
K
N
NOTE 1
A3
A1
A
L
TOP VIEW BOTTOM VIEW
   
MCP621/1S/2/3/4/5/9
DS20002188D-page 58 2009-2014 Microchip Technology Inc.
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
2009-2014 Microchip Technology Inc. DS20002188D-page 59
MCP621/1S/2/3/4/5/9
APPENDIX A: REVISION HISTORY
Revision D (July 2014)
The following is the list of modifications:
1. Updated the title of the document.
2. Added the High Gain-Bandwidth Op Amp
Portfolio table and updated all sections on
page 1.
Revision C (August 2011)
The following is the list of modifications:
1. Added the MCP621S and MCP623 amplifiers to
the product family and the related information
throughout the document.
2. Added the 2x3 TDFN (8L) package option for
MCP621, SOT-23 (5L) package for MCP621S
and SOT-23 (6L) package option for MCP623
and the related information throughout the
document.
3. Updated Section 6.0 “Packaging Informa-
tion” with markings for the new additions.
Added the corresponding SOT-23 (5L), SOT-23
(6L) and 2x3 TDFN (8L) package options and
related information.
4. Updated table description and examples in
Product Identification System.
Revision B (June 2011)
The following is the list of modifications:
1. Added the MCP624 and MCP629 amplifiers to
the product family and the related information
throughout the document.
2. Added the corresponding SOIC (14L), TSSOP
(14L) and QFN (16L) package options and
related information.
Revision A (June 2009)
Original Release of this Document.
MCP621/1S/2/3/4/5/9
DS20002188D-page 60 2009-2014 Microchip Technology Inc.
PRODUCT IDENTIFICATION SYSTEM
To order or obtain information, e.g., on pricing or delivery, refer to the factory or the listed sales office.
Device: MCP621: Single Op Amp
MCP621T: Single Op Amp (Tape and Reel)
(SOIC)
MCP621S: Single Op Amp (SOT-23)
MCP622: Dual Op Amp
MCP622T: Dual Op Amp (Tape and Reel)
(DFN and SOIC)
MCP623T: Single Op Amp (Tape and Reel) (SOT-23)
MCP624: Quad Op Amp
MCP624T: Quad Op Amp (Tape and Reel)
(TSSOP and SOIC)
MCP625: Dual Op Amp
MCP625T: Dual Op Amp (Tape and Reel)
(DFN and MSOP)
MCP629: Quad Op Amp
MCP629T: Quad Op Amp (Tape and Reel)
(QFN)
Temperature
Range:
E = -40°C to +125°C
Package: CHY = Plastic Small Outline (SOT-23), 6-lead
MF = Plastic Dual Flat, No Lead (3x3 DFN),
8-lead, 10-lead
ML = Plastic Quad Flat, No Lead Package (4x4 QFN),
(4x4x0.9 mm), 16-lead
MNY = Plastic Dual Flat, No Lead (2x3 TDFN),
8-lead
OT = Plastic Small Outline (SOT-23), 5-lead
SN = Plastic Small Outline, (3.90 mm), 8-lead
ST = Plastic Thin Shrink Small Outline, (4.4 mm TSSOP),
14-lead
SL = Plastic Small Outline, Narrow, (3.90 mm SOIC),
14-lead
UN = Plastic Micro Small Outline, (MSOP), 10-lead
* Y = Nickel palladium gold manufacturing designator.
Only available on the TDFN package.
Examples:
a) MCP621T-E/SN: Tape and Reel,
Extended temperature,
8LD SOIC package
b) MCP621T-E/MNY: Tape and Reel,
Extended temperature,
8LD TDFN package
c) MCP621ST-E/OT: Tape and Reel,
Extended temperature,
5LD SOT-23 package
d) MCP622T-E/MF: Tape and Reel,
Extended temperature,
8LD DFN package
e) MCP622T-E/SN: Tape and Reel,
Extended temperature,
8LD SOIC package
f) MCP623T-E/CHY: Tape and Reel,
Extended temperature,
6LD SOT-23 package
g) MCP624T-E/SL: Tape and Reel,
Extended temperature,
14LD SOIC package
h) MCP624T-E/ST: Tape and Reel,
Extended temperature,
14LD TSSOP package
i) MCP625T-E/MF: Tape and Reel,
Extended temperature,
10LD DFN package
j) MCP625T-E/UN: Tape and Reel,
Extended temperature,
10LD MSOP package
k) MCP629T-E/ML: Tape and Reel,
Extended temperature,
16LD QFN package
PART NO. -X /XX
PackageTemperature
Range
Device
2009-2014 Microchip Technology Inc. DS20002188D-page 61
Information contained in this publication regarding device
applications and the like is provided only for your convenience
and may be superseded by updates. It is your responsibility to
ensure that your application meets with your specifications.
MICROCHIP MAKES NO REPRESENTATIONS OR
WARRANTIES OF ANY KIND WHETHER EXPRESS OR
IMPLIED, WRITTEN OR ORAL, STATUTORY OR
OTHERWISE, RELATED TO THE INFORMATION,
INCLUDING BUT NOT LIMITED TO ITS CONDITION,
QUALITY, PERFORMANCE, MERCHANTABILITY OR
FITNESS FOR PURPOSE. Microchip disclaims all liability
arising from this information and its use. Use of Microchip
devices in life support and/or safety applications is entirely at
the buyer’s risk, and the buyer agrees to defend, indemnify and
hold harmless Microchip from any and all damages, claims,
suits, or expenses resulting from such use. No licenses are
conveyed, implicitly or otherwise, under any Microchip
intellectual property rights.
Trademarks
The Microchip name and logo, the Microchip logo, dsPIC,
FlashFlex, flexPWR, JukeBlox, KEELOQ, KEELOQ logo, Kleer,
LANCheck, MediaLB, MOST, MOST logo, MPLAB,
OptoLyzer, PIC, PICSTART, PIC32 logo, RightTouch, SpyNIC,
SST, SST Logo, SuperFlash and UNI/O are registered
trademarks of Microchip Technology Incorporated in the
U.S.A. and other countries.
The Embedded Control Solutions Company and mTouch are
registered trademarks of Microchip Technology Incorporated
in the U.S.A.
Analog-for-the-Digital Age, BodyCom, chipKIT, chipKIT logo,
CodeGuard, dsPICDEM, dsPICDEM.net, ECAN, In-Circuit
Serial Programming, ICSP, Inter-Chip Connectivity, KleerNet,
KleerNet logo, MiWi, MPASM, MPF, MPLAB Certified logo,
MPLIB, MPLINK, MultiTRAK, NetDetach, Omniscient Code
Generation, PICDEM, PICDEM.net, PICkit, PICtail,
RightTouch logo, REAL ICE, SQI, Serial Quad I/O, Total
Endurance, TSHARC, USBCheck, VariSense, ViewSpan,
WiperLock, Wireless DNA, and ZENA are trademarks of
Microchip Technology Incorporated in the U.S.A. and other
countries.
SQTP is a service mark of Microchip Technology Incorporated
in the U.S.A.
Silicon Storage Technology is a registered trademark of
Microchip Technology Inc. in other countries.
GestIC is a registered trademarks of Microchip Technology
Germany II GmbH & Co. KG, a subsidiary of Microchip
Technology Inc., in other countries.
All other trademarks mentioned herein are property of their
respective companies.
© 2009-2014, Microchip Technology Incorporated, Printed in
the U.S.A., All Rights Reserved.
ISBN: 978-1-63276-381-5
Note the following details of the code protection feature on Microchip devices:
Microchip products meet the specification contained in their particular Microchip Data Sheet.
Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the
intended manner and under normal conditions.
There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our
knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data
Sheets. Most likely, the person doing so is engaged in theft of intellectual property.
Microchip is willing to work with the customer who is concerned about the integrity of their code.
Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not
mean that we are guaranteeing the product as “unbreakable.
Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our
products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts
allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act.
Microchip received ISO/TS-16949:2009 certification for its worldwide
headquarters, design and wafer fabrication facilities in Chandler and
Tempe, Arizona; Gresham, Oregon and design centers in California
and India. The Company’s quality system processes and procedures
are for its PIC® MCUs and dsPIC® DSCs, KEELOQ® code hopping
devices, Serial EEPROMs, microperiph erals, nonvolatile memory and
analog products. In addition, Microchip’s quality system for the design
and manufacture of development systems is ISO 9001:2000 certified.
QUALITY MANAGEMENT S
YSTEM
CERTIFIED BY DNV
== ISO/TS 16949 ==
DS20002188D-page 62 2009-2014 Microchip Technology Inc.
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