ATTINY10-TSHR - Atmel

Features

•High Pe rformance, Low Power AVR® 8-Bit Microcontroller

•Advanced RISC Architecture

– 54 Powerful Instructions – Most Single Clock Cycle Execution

– 16 x 8 General Purpose Working Registers

– Fully Static Operation

– Up to 12 MIPS Throughput at 12 MHz

•Non-volatile Program and Data Memories

– 512/1024 Bytes of In-System Programmable Flash Program Memory

– 32 Bytes Internal SRAM

– Flash Write/Erase Cycles: 10,000

– Data Retention: 20 Years at 85oC / 100 Years at 25oC

•Peripheral Features

–QTouch

® Library Support for Capacitive Touch Sensing (1 Channel)

– One 16-bit Timer/Counter with Prescaler and Two PWM Channels

– Programmable Watchdog Timer with Separate On-chip Oscillator

– 4-channel, 8-bit Analog to Digital Converte r (ATtiny5/10, only)

– On-chip Analog Comparator

•Special Microcontroller Features

– In-System Programmable (at 5V, only)

– External and Internal Interrupt Sources

– Low Power Idle, ADC Noise Reduction, and Power-down Modes

– Enhanced Power-on Reset Circuit

– Programmable Supply Voltage Level Monitor with Interrupt and Reset

– Internal Calibrated Oscillator

•I/O and Packages

– Four Programmable I/O Lines

– 6-pin SOT and 8-pad UDFN

•Operating Voltage:

– 1.8 – 5.5V

•Programming Voltage:

–5V

•Speed Grade

– 0 – 4 MHz @ 1.8 – 5.5V

– 0 – 8 MHz @ 2.7 – 5.5V

– 0 – 12 MHz @ 4.5 – 5.5V

•Industrial and Extended Temper ature Ranges

•Low Power Consumption

– Active Mode:

• 200µA at 1MHz and 1.8V

–Idle Mode:

• 25µA at 1MHz and 1.8V

– Power-down Mode:

• < 0.1µA at 1.8V

8-bit

Microcontroller

with 512/1024

Bytes In-System

Programmable

Flash

ATtiny4/5/9/10

Summary

Rev. 8127ES–AVR–11/11

28127ES–AVR–11/11

ATtiny4/5/9/10

1. Pin Configurations

Figure 1-1. Pinout of ATtiny4/5/9/10

1.1 Pin Description

1.1.1 VCC Supply voltage.

1.1.2 GND Ground.

1.1.3 Port B (PB3..PB0)

This is a 4-bit, bi-directional I/O port with internal pull-up resistors, in dividually selectable for

each bit. The output buffers have symmetrical drive characteristics, with both high sink a nd

source capability. As inputs, the port pins that are externally pulled low will source current if pull-

up resistors are acti vated. Port pins are tr i-stated when a reset condit ion beco mes active , even if

the clock is not running.

The port also serves the functions of various special features of the ATtiny4/5/9/10, as listed on

page 37.

1.1.4 RESET Reset input. A low level on this pin for longer than the minimum pulse length will gen erate a

reset, even if the clock is not r unning and pr ovided the reset pin has not be en disabled . The min-

imum pulse length is given in Table 16-4 on page 120. Shorter pulses are not guaranteed to

generate a reset.

The reset pin can also be used as a (weak) I/O pin.

(PCINT0/TPIDATA/OC0A/ADC0/AIN0) PB0

GND

(PCINT1/TPICLK/CLKI/ICP0/OC0B/ADC1/AIN1) PB1

PB3 (RESET/PCINT3/ADC3)

VCC

PB2 (T0/CLKO/PCINT2/INT0/ADC2)

SOT-23

(PCINT1/TPICLK/CLKI/ICP0/OC0B/ADC1/AIN1) PB1

GND

PB2 (T0/CLKO/PCINT2/INT0/ADC2)

VCC

PB3 (RESET/PCINT3/ADC3)

PB0 (AIN0/ADC0/OC0A/TPIDATA/PCINT0)

UDFN

8127ES–AVR–11/11

ATtiny4/5/9/10

2. Overview ATtiny4/5/9/10 are low-power CMOS 8-bit microcontrollers based on the compact AVR

enhanced RISC architecture. By executing powerful instructions in a single clock cycle, the

ATtiny4/5/9/10 achieve throughputs approaching 1 MIPS per MHz, allowing the system designer

to optimize power consumption versus processing speed.

Figure 2-1. Block Diagram

The AVR core combines a rich instruction set with 16 general purpose working registers and

system registers. All registe rs are dire ctly co nnected to th e Arit hmetic Lo gic Unit (ALU), allowing

two independent registers to be accessed in one single instruction executed in one clock cycle.

The resulting architecture is compact and code efficient while achieving throughputs up to ten

times faster than conventional CISC microcontrollers.

STACK

POINTER

SRAM

PROGRAM

COUNTER

PROGRAMMING

LOGIC

ISP

INTERFACE

INTERNAL

OSCILLATOR

WATCHDOG

TIMER

RESET FLAG

MCU STATUS

TIMER/

COUNTER0

CALIBRATED

OSCILLATOR

TIMING AND

CONTROL

INTERRUPT

UNIT

ANALOG

COMPARATOR ADC

GENERAL

PURPOSE

REGISTERS

ALU

STATUS

PROGRAM

FLASH

INSTRUCTION

DECODER

CONTROL

LINES

RESET

DATA REGISTER

PORT B DIRECTION

REG. PORT B

DRIVERS

PORT B

GND

PB3:0

8-BIT DATA BUS

48127ES–AVR–11/11

ATtiny4/5/9/10

The ATtiny4/5/9/10 provide the following features: 512/1024 byte of In-System Programmable

Flash, 32 bytes of SRAM, four general purpose I/O lines, 16 general purpose working registers,

a 16-bit timer/counter with two PWM channels, internal and external interrupts, a programmable

watchdog timer with internal oscillator, an internal calibrated os cillator, and four software select-

able power saving modes. ATtiny5/10 are also equippe d with a four-channel, 8-bit Analog to

Digital Converter (ADC).

Idle mode stops the CPU while allowing the SRAM, timer/counte r, ADC (A Ttiny5/1 0, only) , ana-

log comparator, and interrupt system to continue functioning. ADC Noise Reduction mode

minimizes switc hing noise during ADC conversions by stopping the CPU and all I/O modules

except the ADC. In Power-down mode registers keep their contents and all chip functions are

disabled until the next interrupt or hardware reset. In Standby mode, the oscillator is running

while the rest of the device is sleeping, allowing very fast start-up combined with low power

consumption.

The device is manufactu red using Atmel’s hig h densit y non-vo latile mem ory te chnology. The o n-

chip, in-system prog rammable Flash a llows program memory t o be re-prog rammed in-syst em by

a convention al, non -vo la tile m em o ry pr og ra m m er .

The ATtiny4/5/9/10 AVR are supported by a suite of program and system development tools,

including macr o as se mb le rs an d ev alu at i on kits.

2.1 Comparison of ATtiny4, ATtiny5, ATtiny9 and ATtiny10

A comparison of the devices is shown in Table 2-1.

Table 2-1. Differences between ATtiny4, ATtiny5, ATtiny9 and ATtiny10

Device Flash ADC Signature

ATtiny4 512 bytes No 0x1E 0x8F 0x0A

ATtiny5 512 bytes Yes 0x1E 0x8F 0x09

ATtiny9 1024 bytes No 0x1E 0x90 0x08

ATtiny10 1024 bytes Yes 0x1E 0x90 0x03

8127ES–AVR–11/11

ATtiny4/5/9/10

3. General Information

3.1 Resources A comprehensive set of drivers, app lication no tes, da ta sheets and de script ions on develo pment

tools are available for download at http://www.atmel.com/avr.

3.2 Code Examples

This documentatio n contains simple co de examples that br iefly sh ow how to u se various parts of

the device. These code examp les assume that the part specific header file is included b efore

compilation. Be aware that not all C compiler vendors include bit definitions in the header files

and interrupt ha ndlin g in C is com piler d epe nd ent. Please con firm wit h the C com piler d ocume n-

tation for more details.

3.3 Capacitive Touch Sensing

Atmel QTouch Library provides a simple to use solution for touch sensitive interfaces on Atmel

AVR microcontrollers. The QTouch Library includes support for QTouch® and QMatrix® acquisi-

tion methods.

Touch sensing is easily added to any application by linking the QTouch Library and using the

Application Progra mming In terface (API ) of the libra ry to defi ne the touch ch annels and sensors.

The application then calls the API to retrieve channel information and determine the state of the

touch sensor.

The QTouch Library is free and can be downloaded from the Atmel website. For more informa-

tion and details of implementation, refer to the QTouch Library User Guide – also available from

the Atmel website.

3.4 Data Retention

Reliability Qualification results show that the projected data retention failure rate is much less

than 1 PPM over 20 years at 85°C or 100 years at 25°C.

68127ES–AVR–11/11

ATtiny4/5/9/10

4. Register Summary

Address Name Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 Page

0x3F SREG I T H S V N Z C Page 12

0x3E SPH Stack Pointer High Byte Page 12

0x3D SPL Stack Pointer Low Byte Page 12

0x3C CCP CPU Change Protection Byte Page 12

0x3B RSTFLR – – – –WDRF– EXTRF PORF Page 35

0x3A SMCR – – – – SM2 SM1 SM0 SE Page 25

0x39 OSCCAL Oscillator Calibration Byte Page 21

0x38 Reserved – – – – – – – –

0x37 CLKMSR – – – – – – CLKMS 1 CLKMS0 Page 21

0x36 CLKPSR – – – – CLKPS3 CLKPS2 CLKPS1 CLKPS0 Page 22

0x35 PRR – – – – – – PRADC PRTIM0 Page 26

0x34 VLMCSR VLMF VLMIE – – – VLM2 VLM1 VLM0 Page 34

0x33 NVMCMD –– NVM Comman Page 116

0x32 NVMCSR NVMBSY – – – – – – – Page 116

0x31 WDTCSR WDIF WDIE WDP3 – WDE WDP2 WDP1 WDP0 Page 32

0x30 Reserved – – – – – – – –

0x2F GTCCR TSM –––––– PSR Page 80

0x2E TCCR0A COM0A1 COM0A0 COM0B1 COM0B0 –– WGM01 WGM00 Page 74

0x2D TCCR0B ICNC0 ICES0 – WGM03 W GM 02 CS02 CS01 CS00 Page 76

0x2C TCCR0C FOC0A FOC0B – – – – – – Page 77

0x2B TIMSK0 ––ICIE0–– OCIE0B OCIE0A T OIE0 Page 79

0x2A TIFR0 ––ICF0–– OCF0B OCF0A TOV0 Page 80

0x29 TCNT0H Timer/Counter0 – Counter Register High Byte Page 78

0x28 TCNT0L Timer/Counter0 – Counter Register Low Byte Page 78

0x27 OCR0AH Timer/Counter0 – Compare Register A High Byte Page 78

0x26 OCR0AL Timer/Counter0 – Compare Register A Low Byte Page 78

0x25 OCR0BH Timer/Counter0 – Compare Register B High Byte Page 78

0x24 OCR0BL Timer/Counter0 – Compare Register B Low Byte Page 78

0x23 ICR0H Timer/Coun ter 0 - Inp ut Ca pture Register High Byte Page 79

0x22 ICR0L Timer/Counter0 - Input Capture Register Low Byte Page 79

0x21 Reserved – – – – – – – –

0x20 Reserved – – – – – – – –

0x1F ACSR ACD – ACO ACI ACIE ACIC ACIS1 ACIS0 Page 82

0x1E Reserved – – – – – – – –

0x1D ADCSRA ADEN ADSC ADATE ADIF ADIE ADPS2 ADP S1 ADPS0 Page 94

0x1C ADCSRB – – – – – ADTS2 ADTS1 ADTS 0 Page 95

0x1B ADMUX – – – – – – MUX1 MUX0 Page 94

0x1A Reserved – – – – – – – –

0x19 ADCL ADC Conversion Result Page 96

0x18 Reserved – – – – – – – –

0x17 DIDR0 – – – – ADC3D ADC2D ADC1D ADC0D Page 83, Page 96

0x16 Reserved – – – – – – – –

0x15 EICRA – – – – – – ISC01 ISC00 Page 38

0x14 EIFR – – – – – – – INTF0 Page 39

0x13 EIMSK – – – – – – – INT0 Page 39

0x12 PCICR – – – – – – – PCIE0 Page 40

0x11 PCIFR – – – – – – – PCIF0 Page 40

0x10 PCMSK – – – – PCINT3 PCINT2 PCINT1 PCINT0 Page 40

0x0F Reserved – – – – – – – –

0x0E Reserved – – – – – – – –

0x0D Reserved – – – – – – – –

0x0C PORTCR – – – – – – BBMB – Page 51

0x0B Reserved – – – – – – – –

0x0A Reserved – – – – – – – –

0x09 Reserved – – – – – – – –

0x08 Reserved – – – – – – – –

0x07 Reserved – – – – – – – –

0x06 Reserved – – – – – – – –

0x05 Reserved – – – – – – – –

0x04 Reserved – – – – – – – –

0x03 PUEB – – – – PUEB 3 PUEB2 PUEB1 PUEB0 Page 51

0x02 PORTB – – – – PORTB3 PORTB2 PORTB1 PORTB0 Page 52

0x01 DDRB – – – – DDRB3 DDRB2 DDRB1 DDRB0 Page 52

0x00 PINB – – – – PINB3 PINB2 PINB1 PINB0 Page 52

8127ES–AVR–11/11

ATtiny4/5/9/10

Note: 1. For compatibili ty with future devices, reserved bits should be written to zero if accessed. Reserved I/O memory addresses

should never be written.

2. I/O Registers within the address range 0x00 - 0x1F are directly bit-accessible using the SBI and CBI instructions. In these

registers, the value of single bits can be checked by using the SBIS and SBIC instructions.

3. Some of the Status Flags are cleared by writing a logical one to them. Note that, unlike most other AVRs, the CBI and SBI

instructions will only operation the specified bit, and can therefore be used on registers containing such Status Flags. The

CBI and SBI instructions work with registers 0x00 to 0x1F only.

4. The ADC is available in ATtiny5/10, only.

88127ES–AVR–11/11

ATtiny4/5/9/10

5. Instruction Set Summary

Mnemonics Operands Description Operation Flags #Clocks

ARITHMETIC AND LOGIC INSTRUCTIONS

ADD Rd, Rr Add without Carry Rd ← Rd + Rr Z,C,N,V,S,H 1

ADC Rd, Rr Ad d with Carry Rd ← Rd + Rr + C Z,C,N,V,S,H 1

SUB Rd, Rr Subtract without Carry Rd ← Rd - Rr Z,C,N,V,S,H 1

SUBI Rd, K Subtract Immediate Rd ← Rd - K Z,C,N,V,S,H 1

SBC Rd, Rr Subtract with Carry Rd ← Rd - Rr - C Z,C,N,V,S,H 1

SBCI Rd, K Subtract Immediate with Carry Rd ← Rd - K - C Z,C,N,V,S,H 1

AND Rd, Rr Logical AND Rd ← Rd • Rr Z,N,V,S 1

ANDI Rd, K Logical AND with Immediate Rd ← Rd • K Z,N,V,S 1

OR Rd, Rr Logical OR Rd ← Rd v Rr Z,N,V,S 1

ORI Rd, K Logical OR with Immediate Rd ← Rd v K Z,N,V,S 1

EOR Rd, Rr Exclusive OR Rd ← Rd ⊕ Rr Z,N,V,S 1

COM Rd One’s Complement Rd ← $FF − Rd Z,C,N,V,S 1

NEG Rd Two’s Complement Rd ← $00 − Rd Z,C,N,V,S,H 1

SBR Rd,K Set Bit(s) in Register Rd ← Rd v K Z,N,V,S 1

CBR Rd,K Clear Bit(s) in Register Rd ← Rd • ($FFh - K) Z,N,V,S 1

INC Rd Increment Rd ← Rd + 1 Z,N,V,S 1

DEC Rd Decrement Rd ← Rd − 1 Z,N,V,S 1

TST Rd Test for Zero or Minus Rd ← Rd • Rd Z,N,V,S 1

CLR Rd Clear Register Rd ← Rd ⊕ Rd Z,N,V,S 1

SER Rd Set Register Rd ← $FF None 1

BRANCH INSTRUCTIONS

RJMP k Relative Jump PC ← PC + k + 1 None 2

IJMP Indirect Jump to (Z) PC(15:0) ← Z, PC(21: 16) ← 0None2

RCALL k Relative Subrout i ne Call PC ← PC + k + 1 None 3/4

ICALL Indirect Call to (Z) PC(15:0) ← Z, PC(21:16) ← 0None3/4

RET Subroutine Return PC ← STACK None 4/5

RETI Interrupt Return PC ← STACK I 4/5

CPSE Rd,Rr Compare, Skip if Equal if (Rd = Rr) PC ← PC + 2 or 3 None 1/2/3

CP Rd,Rr Compare Rd − Rr Z, C,N,V,S,H 1

CPC Rd,Rr Compare with Carry Rd − Rr − C Z, C,N,V,S,H 1

CPI Rd,K Compare with Immediate Rd − K Z, C,N,V,S,H 1

SBRC Rr, b Skip if Bit in Register Cleared if (Rr(b)=0) PC ← PC + 2 or 3 None 1/2/3

SBRS Rr, b Skip if Bit in Register is Set if (Rr(b)=1) PC ← PC + 2 or 3 None 1/2/3

SBIC A, b Skip if Bit in I/O Register Cleared if (I/O(A,b)=0) PC ← PC + 2 or 3 None 1/2/3

SBIS A, b Skip if Bit in I/O Register is Set if (I/O(A,b)=1) PC ← PC + 2 or 3 None 1/2/3

BRBS s, k Branch if Status Flag Set if (SREG(s ) = 1) then PC ←PC+k + 1 None 1/2

BRBC s, k Branch if Sta tus Flag Cleare d if (SREG(s) = 0) then PC←PC+k + 1 None 1/2

BREQ k Branch if Equal if (Z = 1) then PC ← PC + k + 1 None 1/2

BRNE k Branch if Not Equal if (Z = 0) then PC ← PC + k + 1 None 1/2

BRCS k Branch if Carry Set if (C = 1) then PC ← PC + k + 1 None 1/2

BRCC k Branch if Carry Cleared if (C = 0) then PC ← PC + k + 1 None 1/2

BRSH k Branch if Same or Higher if (C = 0) then PC ← PC + k + 1 None 1/2

BRLO k Branch if Lower if (C = 1) then PC ← PC + k + 1 None 1/2

BRMI k Branch if Minus if (N = 1) then PC ← PC + k + 1 None 1/2

BRPL k Branch if Plus if (N = 0) then PC ← PC + k + 1 None 1/2

BRGE k Branch if Greater or Equal, Signed if (N ⊕ V= 0) then PC ← PC + k + 1 None 1/2

BRLT k Branch if Less Than Zero, Signed if (N ⊕ V= 1) then PC ← PC + k + 1 None 1/2

BRHS k Branch if Half Carry Flag Set if (H = 1) then PC ← PC + k + 1 None 1/2

BRHC k Branch if Half Carry Flag Cleared if (H = 0) then PC ← PC + k + 1 None 1/2

BRTS k Branch if T Flag Set if (T = 1) then PC ← PC + k + 1 None 1/2

BRTC k Branch if T Flag Cleared if (T = 0) then PC ← PC + k + 1 None 1/2

BRVS k Branch if Overflow Flag is Set if (V = 1) then PC ← PC + k + 1 None 1/2

BRVC k Branch if Overflow Flag is Cleared if (V = 0) then PC ← PC + k + 1 None 1/2

BRIE k Branch if Interrupt Enabled if ( I = 1) then PC ← PC + k + 1 None 1/2

BRID k Branch if Interrupt Disabled if ( I = 0) then PC ← PC + k + 1 None 1/2

BIT AND BIT-TEST INSTRUCTIONS

LSL Rd Logical Shift Left Rd(n+1) ← Rd(n), Rd(0) ← 0 Z,C,N,V,H 1

LSR Rd Logical Shift Right Rd(n) ← Rd(n+1), Rd(7) ← 0 Z,C,N,V 1

ROL Rd Rotate Left Through Carry Rd(0)←C,Rd(n+1)← Rd(n),C←Rd(7) Z,C,N,V,H 1

ROR Rd Rotate Right Through Carry Rd(7)←C,Rd(n)← Rd(n+1) ,C←Rd(0) Z,C,N,V 1

ASR Rd Arithmetic Shift Right Rd(n) ← Rd(n+1), n=0..6 Z,C,N,V 1

SWAP Rd Swap Nibbles Rd(3..0)←Rd(7..4),Rd(7..4)←Rd(3..0) None 1

BSET s Flag Set SREG(s) ← 1 SREG(s) 1

8127ES–AVR–11/11

ATtiny4/5/9/10

BCLR s Flag Clear SREG(s) ← 0 SREG(s) 1

SBI A, b Set Bit in I/O Register I/O(A, b) ← 1None1

CBI A, b Clear Bit in I/O Register I/O(A, b) ← 0None1

BST Rr, b Bit Store from Register to T T ← Rr(b) T 1

BLD Rd, b Bit load from T to Register Rd(b) ← TNone1

SEC Set Carry C ← 1C1

CLC Clear Carry C ← 0 C 1

SEN Set Negative Flag N ← 1N1

CLN Clear Negative Flag N ← 0 N 1

SEZ Set Zero Flag Z ← 1Z1

CLZ Clear Zero Flag Z ← 0 Z 1

SEI Global Interrupt Enable I ← 1I1

CLI Global Interrupt Disable I ← 0 I 1

SES Set Signed Test Flag S ← 1S1

CLS Clear Signed Test Flag S ← 0 S 1

SEV Set Two’s Complement Overflow. V ← 1V1

CLV Clear Two’s Complement Overflow V ← 0 V 1

SET Set T in SREG T ← 1T1

CLT Clear T in SREG T ← 0 T 1

SEH Set Half Carry Flag in SREG H ← 1H1

CLH Clear Half Carry Flag in SREG H ← 0 H 1

DATA TRANSFER INSTRUCTIONS

MOV Rd, Rr Copy Register Rd ← Rr None 1

LDI Rd, K Load Immediate Rd ← KNone1

LD Rd, X Load Indirect Rd ← (X) None 1/2

LD Rd, X+ Load Indirect and Post-Increment Rd ← (X), X ← X + 1 None 2

LD Rd, - X Load Indirect and Pre-Decrement X ← X - 1, Rd ← (X) None 2/3

LD Rd, Y Load Indirect Rd ← (Y) None 1/2

LD Rd, Y+ Load Indirect and Post-Increment Rd ← (Y), Y ← Y + 1 None 2

LD Rd, - Y Load Indirect and Pre-Decrement Y ← Y - 1, Rd ← (Y) None 2/3

LD Rd, Z Load Indirect Rd ← (Z) None 1/2

LD Rd, Z+ Load Indirect and Post-Increment Rd ← (Z), Z ← Z+1 None 2

LD Rd, -Z Load Indirect and Pre-Decrement Z ← Z - 1, Rd ← (Z) None 2/3

LDS Rd, k Store Direct from SRAM Rd ← (k) None 1

ST X, Rr Store Indirect (X) ← Rr None 1

ST X+, Rr Store Indirect and Post -In c rem en t (X) ← Rr, X ← X + 1 None 1

ST - X, Rr Store Indirect and Pre-Decrement X ← X - 1, (X) ← Rr None 2

ST Y, Rr Store Indirect (Y) ← Rr None 1

ST Y+, Rr Store Indirect and Post-Increment (Y) ← Rr, Y ← Y + 1 None 1

ST - Y, Rr Store Indirect and Pre-Decrement Y ← Y - 1, (Y) ← Rr None 2

ST Z, Rr Store Indir e ct (Z) ← Rr None 1

ST Z+, Rr Store Indirect and Post-Increment. (Z) ← Rr, Z ← Z + 1 None 1

ST -Z, Rr Store Indirect and Pre-Decrement Z ← Z - 1, (Z) ← Rr None 2

STS k, Rr Store Direct to SRAM (k) ← Rr None 1

IN Rd, A In from I/O Location Rd ← I/O (A) None 1

OUT A, Rr Out to I/O Location I/O (A) ← Rr None 1

PUSH Rr Push Register on Stack STACK ← Rr None 2

POP Rd Pop Register from Stack Rd ← STACK None 2

MCU CONTROL INSTRUCTIONS

BREAK Break (see specific descr. for Break) None 1

NOP No Operation None 1

SLEEP Sleep (see specific descr. for Sleep) None 1

WDR Watchdog Reset (see specific descr. for WDR) None 1

Mnemonics Operands Description Operation Flags #Clocks

10 8127ES–AVR–11/11

ATtiny4/5/9/10

6. Ordering Information

Notes: 1. For speed vs. supply voltage, see section 16.3 “Speed” on page 118.

2. All packages are Pb-free, halide-free and fully green and they comply with the European directive for Restriction of Hazard-

ous Substances (RoHS). NiPdAu finish.

3. Tape and reel.

4. Can also be supplied in wafer form. Contact your local Atmel sales office for ordering inf o rmation and minimum quantities.

5. Top/bottomside markings:

– Topside: T4x (x stands for “die revision”)

– Bottomside: zHzzz [H stands for (-40°C to 85°C)], z8zzz [8 stands for (-40°C to 125°C)]

6. Topside marking: – 1st Line: T4

– 2nd Line: xx

– 3rd Line: xxx

7. For typical and Electrical characteristics for this device please consult Appendix A, ATtiny4/5/9/10 Specification at 125°C.

6.1 ATtiny4

Supply Voltage Speed (1) Temperature Package (2) Ordering Code (3)

1.8 – 5.5V 12 MHz Industrial

(-40°C to 85°C) (4) 6ST1 ATtiny4-TSHR (5)

8MA4 ATtiny4-MAHR (6)

10 MHz Extended

(-40°C to 125°C) (7) 6ST1 ATtiny4-TS8R (5)

Package Type

6ST1 6-lead, 2.90 x 1.60 mm Plastic Small Outline Package (SOT23)

8MA4 8-pad, 2 x 2 x 0.6 mm Plastic Ultra Thin Dual Flat No Lead (UDFN)

8127ES–AVR–11/11

ATtiny4/5/9/10

Notes: 1. For speed vs. supply voltage, see section 16.3 “Speed” on page 118.

2. All packages are Pb-free, halide-free and fully green and they comply with the European directive for Restriction of Hazard-

ous Substances (RoHS). NiPdAu finish.

3. Tape and reel.

4. Can also be supplied in wafer form. Contact your local Atmel sales office for ordering inf o rmation and minimum quantities.

5. Top/bottomside markings:

– Topside: T5x (x stands for “die revision”)

– Bottomside: zHzzz [H stands for (-40°C to 85°C)], z8zzz [8 stands for (-40°C to 125°C)]

6. Topside marking: – 1st Line: T5

– 2nd Line: xx

– 3rd Line: xxx

7. For typical and Electrical characteristics for this device please consult Appendix A, ATtiny4/5/9/10 Specification at 125°C.

6.2 ATtiny5

Supply Voltage Speed (1) Temperature Package (2) Ordering Code (3)

1.8 – 5.5V 12 MHz Industrial

(-40°C to 85°C) (4) 6ST1 ATtiny5-TSHR (5)

8MA4 ATtiny5-MAHR (6)

10 MHz Extended

(-40°C to 125°C) (7) 6ST1 ATtiny5-TS8R (5)

Package Type

6ST1 6-lead, 2.90 x 1.60 mm Plastic Small Outline Package (SOT23)

8MA4 8-pad, 2 x 2 x 0.6 mm Plastic Ultra Thin Dual Flat No Lead (UDFN)

12 8127ES–AVR–11/11

ATtiny4/5/9/10

Notes: 1. For speed vs. supply voltage, see section 16.3 “Speed” on page 118.

2. All packages are Pb-free, halide-free and fully green and they comply with the European directive for Restriction of Hazard-

ous Substances (RoHS). NiPdAu finish.

3. Tape and reel.

4. Can also be supplied in wafer form. Contact your local Atmel sales office for ordering inf o rmation and minimum quantities.

5. Top/bottomside markings:

– Topside: T9x (x stands for “die revision”)

– Bottomside: zHzzz [H stands for (-40°C to 85°C)], z8zzz [8 stands for (-40°C to 125°C)]

6. Topside marking: – 1st Line: T9

– 2nd Line: xx

– 3rd Line: xxx

7. For typical and Electrical characteristics for this device please consult Appendix A, ATtiny4/5/9/10 Specification at 125°C.

6.3 ATtiny9

Supply Voltage Speed (1) Temperature Package (2) Ordering Code (3)

1.8 – 5.5V 12 MHz Industrial

(-40°C to 85°C) (4) 6ST1 ATtiny9-TSHR (5)

8MA4 ATtiny9-MAHR (6)

10 MHz Extended

(-40°C to 125°C) (7) 6ST1 ATtiny9-TS8R (5)

Package Type

6ST1 6-lead, 2.90 x 1.60 mm Plastic Small Outline Package (SOT23)

8MA4 8-pad, 2 x 2 x 0.6 mm Plastic Ultra Thin Dual Flat No Lead (UDFN)

8127ES–AVR–11/11

ATtiny4/5/9/10

Notes: 1. For speed vs. supply voltage, see section 16.3 “Speed” on page 118.

2. All packages are Pb-free, halide-free and fully green and they comply with the European directive for Restriction of Hazard-

ous Substances (RoHS). NiPdAu finish.

3. Tape and reel.

4. Can also be supplied in wafer form. Contact your local Atmel sales office for ordering inf o rmation and minimum quantities.

5. Top/bottomside markings:

– Topside: T10x (x stands for “die revision”)

– Bottomside: zHzzz [H stands for (-40°C to 85°C)], z8zzz [8 stands for (-40°C to 125°C)]

6. Topside marking: – 1st Line: T10

– 2nd Line: xx

– 3rd Line: xxx

7. For typical and Electrical characteristics for this device please consult Appendix A, ATtiny4/5/9/10 Specification at 125°C.

6.4 ATtiny10

Supply Voltage Speed (1) Temperature Package (2) Ordering Code (3)

1.8 – 5.5V 12 MHz Industrial

(-40°C to 85°C) (4) 6ST1 ATtiny10-TSHR (5)

8MA4 ATtiny10-MAHR (6)

10 MHz Extended

(-40°C to 125°C) (7) 6ST1 ATtiny10-TS8R (5)

Package Type

6ST1 6-lead, 2.90 x 1.60 mm Plastic Small Outline Package (SOT23)

8MA4 8-pad, 2 x 2 x 0.6 mm Plastic Ultra Thin Dual Flat No Lead (UDFN)

14 8127ES–AVR–11/11

ATtiny4/5/9/10

7. Packaging Information

7.1 6ST1

TITLE DRAWING NO. GPC REV.

Package Drawing Contact:

packagedrawings@atmel.com 6ST1TAQ A

6ST1, 6-lead, 2.90 x 1.60 mm Plastic Small Outline

Package (SOT23)

MAX NOTE

SYMBOL MIN NOM

COMMON DIMENSIONS

(Unit of Measure = mm)

A – – 1.45

A1 0 – 0.15

A2 0.90 – 1.30

D 2.80 2.90 3.00 2

E 2.60 2.80 3.00

E1 1.50 1.60 1.75

L 0.30 0.45 0.55

e 0.95 BSC

b 0.30 – 0.50 3

c 0.09 – 0.20

θ 0° – 8°

Notes: 1. This package is compliant with JEDEC specication MO-178 Variation AB

2. Dimension D does not include mold Flash, protrusions or gate burrs.

Mold Flash, protrustion or gate burrs shall not exceed 0.25 mm per end.

3. Dimension b does not include dambar protrusion. Allowable dambar

protrusion shall not cause the lead width to exceed the maximum

b dimension by more than 0.08 mm

4. Die is facing down after trim/form.

6/30/08

Side View

E E1

A2 A

A1 C

0.10

0.25

A2 A

A1 C

0.10

SEE VIEW B

SEATING PLANE

Pin #1 ID

T op View

View B

View A-A

8127ES–AVR–11/11

ATtiny4/5/9/10

7.2 8MA4

TITLE DRAWING NO.GPC REV.

Package Drawing Contact:

packagedrawings@atmel.com 8MA4YAG A

8PAD, 2x2x0.6 mm body, 0.5 mm pitch,

0.9x1.5 mm exposed pad, Saw singulated

Thermally enhanced plastic ultra thin dual flat

no lead package (UDFN/USON)

12/17/09

COMMON DIMENSIONS

(Unit of Measure = mm)

SYMBOL MIN NOM MAX NOTE

A – – 0.60

A1 0.00 – 0.05

b 0.20 – 0.30

D 1.95 2.00 2.05

D2 1.40 1.50 1.60

E 1.95 2.00 2.05

E2 0.80 0.90 1.00

e – 0.50 –

L 0.20 0.30 0.40

K 0.20 – –

TOP VIEW

BOTTOM VIEW

Note: 1. ALL DIMENSIONS ARE IN mm. ANGLES IN DEGREES.

2. COPLANARITY APPLIES TO THE EXPOSED PAD AS WELL AS THE

TERMINALS COPLANARITY SHALL NOT EXCEED 0.05 mm.

3. WARPAGE SHALL NOT EXCEED 0.05 mm.

4. REFER JEDEC MO-236/MO-252

Pin 1 ID

1 2 3 4

8 7 6 5

0.05

SIDE VIEW

0.05 c

C0.2

16 8127ES–AVR–11/11

ATtiny4/5/9/10

8. Errata The revision letters in this section refer to the revision of the corresponding ATtiny4/5/9/10

device.

8.1 ATtiny4

8.1.1 Rev. E •Programming Lock Bits

1. Programming Lock Bits

Programming Lock Bits to a lock mode equal or lower than the current causes one word of

Flash to be corrupted. The location of the corruption is random.

Problem Fix / Workaround

When programming Lock Bits, make sure lock mode is not set to present, or lower levels.

8.1.2 Rev. D •ESD HBM (ESD STM 5.1) level ±1000V

•Programmin g Lock Bits

1. ESD HBM (ESD STM 5.1) le vel ±1000V

The device meets ESD HBM (ESD STM 5.1) level ±1000V .

Problem Fix / Workaround

Always use proper ESD protection measures (Class 1C) when handling integrated circuits

before and durin g asse m bly.

2. Programming Lock Bits

Programming Lock Bits to a lock mode equal or lower than the current causes one word of

Flash to be corrupted. The location of the corruption is random.

Problem Fix / Workaround

When programming Lock Bits, make sure lock mode is not set to present, or lower levels.

8.1.3 Rev. A – C Not sampled.

8.2 ATtiny5

8.2.1 Rev. E •Programming Lock Bits

1. Programming Lock Bits

Programming Lock Bits to a lock mode equal or lower than the current causes one word of

Flash to be corrupted. The location of the corruption is random.

Problem Fix / Workaround

When programming Lock Bits, make sure lock mode is not set to present, or lower levels.

8127ES–AVR–11/11

ATtiny4/5/9/10

8.2.2 Rev. D •ESD HBM (ESD STM 5.1) level ±1000V

•Programmin g Lock Bits

1. ESD HBM (ESD STM 5.1) le vel ±1000V

The device meets ESD HBM (ESD STM 5.1) level ±1000V .

Problem Fix / Workaround

Always use proper ESD protection measures (Class 1C) when handling integrated circuits

before and durin g asse m bly.

2. Programming Lock Bits

Programming Lock Bits to a lock mode equal or lower than the current causes one word of

Flash to be corrupted. The location of the corruption is random.

Problem Fix / Workaround

When programming Lock Bits, make sure lock mode is not set to present, or lower levels.

8.2.3 Rev. A – C Not sampled.

8.3 ATtiny9

8.3.1 Rev. E •Programming Lock Bits

1. Programming Lock Bits

Programming Lock Bits to a lock mode equal or lower than the current causes one word of

Flash to be corrupted. The location of the corruption is random.

Problem Fix / Workaround

When programming Lock Bits, make sure lock mode is not set to present, or lower levels.

8.3.2 Rev. D •ESD HBM (ESD STM 5.1) level ±1000V

•Programmin g Lock Bits

1. ESD HBM (ESD STM 5.1) le vel ±1000V

The device meets ESD HBM (ESD STM 5.1) level ±1000V .

Problem Fix / Workaround

Always use proper ESD protection measures (Class 1C) when handling integrated circuits

before and durin g asse m bly.

2. Programming Lock Bits

Programming Lock Bits to a lock mode equal or lower than the current causes one word of

Flash to be corrupted. The location of the corruption is random.

Problem Fix / Workaround

When programming Lock Bits, make sure lock mode is not set to present, or lower levels.

18 8127ES–AVR–11/11

ATtiny4/5/9/10

8.3.3 Rev. A – C Not sampled.

8.4 ATtiny10

8.4.1 Rev. E •Programming Lock Bits

1. Programming Lock Bits

Programming Lock Bits to a lock mode equal or lower than the current causes one word of

Flash to be corrupted. The location of the corruption is random.

Problem Fix / Workaround

When programming Lock Bits, make sure lock mode is not set to present, or lower levels.

8.4.2 Rev. C – D •ESD HBM (ESD STM 5.1) level ±1000V

•Programmin g Lock Bits

1. ESD HBM (ESD STM 5.1) le vel ±1000V

The device meets ESD HBM (ESD STM 5.1) level ±1000V .

Problem Fix / Workaround

Always use proper ESD protection measures (Class 1C) when handling integrated circuits

before and durin g asse m bly.

2. Programming Lock Bits

Programming Lock Bits to a lock mode equal or lower than the current causes one word of

Flash to be corrupted. The location of the corruption is random.

Problem Fix / Workaround

When programming Lock Bits, make sure lock mode is not set to present, or lower levels.

8.4.3 Rev. A – B Not sampled.

8127ES–AVR–11/11

ATtiny4/5/9/10

9. Datasheet Revision History

9.1 Rev. 8127E – 11/11

1. Updated:

– Device status from Preliminary to Final

– Ordering information on page 154, page 155, page 156, and page 157

9.2 Rev. 8127D – 02/10

1. Added UDFN package in “Features” on page 1, “Pin Configurations” on pag e 2, “Order-

ing Information” on page 154, and in “Packaging Information” on page 158

2. Updated Figure 8-2 and Figure 8-3 in Section 8.2.1 “Pow e r-on Rese t” on page 28

3. Updated Section 8.2.3 “External Reset” on page 29

4. Updated Figures 17-36 and 17-51 in “Typical Characteristics”

5. Updated notes in Section 20. “Ordering Information” on pages 154- 157

6. Added device Rev. E in Section 22. “Errata” on page 160

9.3 Rev. 8127C – 10/09

1. Updated values and notes:

–Table 16-1 in Section 16.2 “DC Characteristics” on page 117

–Table 16-3 in Section 16.4 “Clock Characteristics” on page 119

–Table 16-6 in Section 16.5.2 “VCC Level Monitor” on page 12 0

–Table 16-9 in Section 16.8 “Serial Programming Characteristics” on page 122

2. Updated Figure 16-1 in Section 16.3 “Speed” on page 118

3. Added Typical Charact eristics Figure 17-36 in Section 17.8 “Analog Comparator Offset”

on page 141. Also, updated some other plots in Typical Characteristics.

4. Added topside and bottomside marking notes in Section 20. “Ordering Information” on

page 154, up to page 157

5. Added ESD errata, see Section 22. “Errata” on page 160

6. Added Lock bits re-programming errata, see Section 22. “Errata” on page 160

9.4 Rev. 8127B – 08/09

1. Updated document template

2. Expanded document to also cover devices ATtin y4, ATtiny5 and ATtiny9

3. Added section:

–“Comparison of ATtiny4, ATtiny5, ATtiny9 and ATtiny10” on page 4

4. Updated sections:

–“ADC Clock – clkADC” on page 18

–“Starting from Idle / ADC Noise Reduction / Standby Mode” on page 20

–“ADC Noise Reduction Mode” on page 24

–“Analog to Digital Converter” on page 25

–“SMCR – Sleep Mode Control Register” on page 25

–“PRR – Power Reduction Register” on page 26

–“Alternate Functions of Port B” on page 49

20 8127ES–AVR–11/11

ATtiny4/5/9/10

–“Overview” on page 84

–“Physical Layer of Tiny Programming Interface” on page 97

–“Overview” on page 108

–“ADC Characteristics (ATtiny5/10, only)” on page 121

–“Supply Current of I/O Modules” on page 123

–“Register Summary” on page 150

–“Ordering Infor mation” on page 154

5. Added figure:

–“Using an External Programmer for In-System Programming via TPI” on page 98

6. Updated figure:

–“Data Memory Map (Byte Addressing)” on page 15

7. Added table:

–“Number of Words and Pages in the Flash (ATtiny4/5)” on page 110

8. Updated tables:

–“Active Clock Domains and Wake-up Sources in Different Sleep Modes” on page 23

–“Reset and Interrupt Vectors” on page 36

–“Number of Words and Pages in the Flash (ATtiny9/10)” on page 110

–“Signature codes” on page 111

9.5 Rev. 8127A – 04/09

1. Initial revision

8127ES–AVR–11/11

ATtiny4/5/9/10

8127ES–AVR–11/11

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