100370 Low Power Universal Demultiplexer/Decoder General Description The 100370 universal demultiplexer/decoder functions as either a dual 1-of-4 decoder or as a single 1-of-8 decoder, depending on the signal applied to the Mode Control (M) input. In the dual mode, each half has a pair of active-LOW Enable (E) inputs. Pin assignments for the E inputs are such that in the 1-of-8 mode they can easily be tied together in pairs to provide two active-LOW enables (E1a to E1b, E2a to E2b). Signals applied to auxiliary inputs Ha, Hb and Hc determine whether the outputs are active HIGH or active LOW. In the dual 1-of-4 mode the Address inputs are A0a, A1a and A0b, A1b with A2a unused (i.e., left open, tied to VEE or with LOW signal applied). In the 1-of-8 mode, the Address inputs are A0a, A1a, A2a with A0b and A1b LOW or open. All inputs have 50 kX pulldown resistors. Features Y Y Y Y 35% power reduction of the 100170 2000V ESD protection Pin/function compatible with 100170 Voltage compensated operating range e b4.2V to b 5.7V Logic Symbols Single 1-of-8 Application Dual 1-of-4 Application Pin Names Ana, Anb Ena, Enb M Ha Hb Hc TL/F/10649-1 TL/F/10649 - 4 Z0 -Z7 Zna, Znb Description Address Inputs Enable Inputs Mode Control Input Z0 -Z3 (Z0a -Z3a) Polarity Select Input Z4 -Z7 (Z0b -Z3b) Polarity Select Input Common Polarity Select Input Single 1-of-8 Data Outputs Dual 1-of-4 Data Outputs Connection Diagrams 24-Pin DIP 28-Pin PCC 24-Pin Quad Cerpak TL/F/10649 - 3 TL/F/10649-2 C1995 National Semiconductor Corporation TL/F/10649 TL/F/10649 - 5 RRD-B30M105/Printed in U. S. A. 100370 Low Power Universal Demultiplexer/Decoder June 1992 Logic Diagram Note: (Zn) for 1-of-4 applications. TL/F/10649 - 6 Truth Tables Dual 1-of-4 Mode (M e A2a e Hc e LOW) Active HIGH Outputs (Ha and Hb Inputs HIGH) Inputs Active LOW Outputs (Ha and Hb Inputs LOW) E1a E1b E2a E2b A1a A1b A0a A0b Z0a Z0b Z1a Z1b Z2a Z2b Z3a Z3b Z0a Z0b Z1a Z1b Z2a Z2b Z3a Z3b H X X H X X X X L L L L L L L L H H H H H H H H L L L L L L L L L L H H L H L H H L L L L H L L L L H L L L L H L H H H H L H H H H L H H H H L Single 1-of-8 Mode (M e HIGH; A0b e A1b e Ha e Hb e LOW) Active HIGH Outputs* (Hc Input HIGH) Inputs E1 E2 A2a A1a A0a Z0 Z1 Z2 Z3 Z4 Z5 Z6 Z7 H X X H X X X X X X L L L L L L L L L L L L L L L L L L L L L L L L L L L L L L H H L H L H H L L L L H L L L L H L L L L H L L L L L L L L L L L L L L L L L L L L L L L L H H H H L L H H L H L H L L L L L L L L L L L L L L L L H L L L L H L L L L H L L L L H H e HIGH Voltage Level L e LOW Voltage Level X e Don't Care *for Hc e LOW, output states are complemented E1 e E1a and E1b wired; E2 e E22a and E2b wired 2 Absolute Maximum Ratings Recommended Operating Conditions Above which the useful life may be impaired. (Note 1) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications. b 65 C to a 150 C Storage Temperature (TSTG) Maximum Junction Temperature (TJ) Ceramic Plastic VEE Pin Potential to Ground Pin Input Voltage (DC) Output Current (DC Output HIGH) ESD (Note 2) Case Temperature (TC) Commercial Industrial Military 0 C to a 85 C b 40 C to a 85 C b 55 C to a 125 C Supply Voltage (VEE) a 175 C a 150 C b 5.7V to b 4.2V b 7.0V to a 0.5V VEE to a 0.5V b 50 mA t 2000V Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: ESD testing conforms to MIL-STD-883, Method 3015. Commercial Version DC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND, TC e 0 C to a 85 C (Note 3) Parameter Min Typ Max Units VOH Symbol Output HIGH Voltage b 1025 b 955 b 870 mV VOL Output LOW Voltage b 1830 b 1705 b 1620 mV VOHC Output HIGH Voltage b 1035 Loading with 50X to b2.0V Loading with 50X to b2.0V VOLC Output LOW Voltage mV VIN e VIH (Min) or VIL (Max) VIH Input HIGH Voltage b 1165 b 870 mV Guaranteed HIGH Signal for All Inputs VIL Input LOW Voltage b 1830 b 1475 mV Guaranteed LOW Signal for All Inputs IIL Input LOW Current 0.50 mA VIN e VIL (Min) IIH Input HIGH Current 240 mA VIN e VIH (Max) IEE Power Supply Current b 50 mA Inputs Open b 95 mV Conditions VIN e VIH (Max) or VIL (Min) b 1610 Note 3: The specified limits represent the ``worst case'' value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are chosen to guarantee operation under ``worst case'' conditions. 3 Commercial Version (Continued) Ceramic Dual-In-Line Package AC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND Symbol Parameter TC e 0 C TC e a 25 C TC e a 85 C Min Max Min Max Min Max Units tPLH tPHL Propagation Delay Ena, Enb to Output 0.75 1.85 0.75 1.85 0.85 2.05 ns tPLH tPHL Propagation Delay Ana, Anb to Output 0.75 2.20 0.75 2.20 0.75 2.30 ns tPLH tPHL Propagation Delay Ha, Hb, Hc to Output 0.75 2.20 0.75 2.20 0.75 2.20 ns tPLH tPHL Propagation Delay M to Output 1.10 2.70 1.10 2.70 1.10 3.00 ns tTLH tTHL Transition Time 20% to 80%, 80% to 20% 0.40 1.30 0.40 1.30 0.40 1.30 ns Conditions Figures 1 and 2 PCC and Cerpak AC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND Symbol Parameter TC e 0 C TC e a 25 C TC e a 85 C Min Max Min Max Min Max Units tPLH tPHL Propagation Delay Ena, Enb to Output 0.75 1.65 0.75 1.65 0.85 1.85 ns tPLH tPHL Propagation Delay Ana, Anb to Output 0.75 2.00 0.75 2.00 0.75 2.10 ns tPLH tPHL Propagation Delay Ha, Hb, Hc to Output 0.75 2.00 0.75 2.00 0.75 2.00 ns tPLH tPHL Propagation Delay M to Output 1.10 2.50 1.10 2.50 1.10 2.80 ns tTLH tTHL Transition Time 20% to 80%, 80% to 20% 0.40 1.20 0.40 1.20 0.40 1.20 ns 4 Conditions Figures 1 and 2 Industrial Version PCC DC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND, TC e b40 C to a 85 C (Note 3) Symbol TC e b40 C Parameter TC e 0 C to a 85 C Min Typ Min Max Units VOH Output HIGH Voltage b 1085 b 870 b 1025 b 870 mV VOL Output LOW Voltage b 1830 b 1575 b 1830 b 1620 mV VOHC Output HIGH Voltage b 1095 VOLC Output LOW Voltage b 1610 mV VIH Input HIGH Voltage VIL Input LOW Voltage IIL Input LOW Current IIH Input HIGH Current IEE Power Supply Current b 1035 b 1565 mV Conditions VIN e VIH (Max) or VIL (Min) Loading with 50X to b2.0V VIN e VIH (Min) or VIL (Max) Loading with 50X to b2.0V b 1170 b 870 b 1165 b 870 mV Guaranteed HIGH Signal for All Inputs b 1830 b 1480 b 1830 b 1475 mV Guaranteed LOW Signal for All Inputs 0.50 0.50 300 b 95 b 50 b 95 mA VIN e VIL (Min) 240 mA VIN e VIH (Max) b 50 mA Inputs Open Note 3: The specified limits represent the ``worst case'' value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are chosen to guarantee operation under ``worst case'' conditions. PCC AC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND Symbol Parameter TC e b40 C TC e a 25 C TC e a 85 C Min Max Min Max Min Max Units tPLH tPHL Propagation Delay Ena, Enb to Output 0.75 1.65 0.75 1.65 0.85 1.85 ns tPLH tPHL Propagation Delay Ana, Anb to Output 0.65 2.00 0.75 2.00 0.75 2.10 ns tPLH tPHL Propagation Delay Ha, Hb, Hc to Output 0.70 2.00 0.75 2.00 0.75 2.00 ns tPLH tPHL Propagation Delay M to Output 1.10 2.50 1.10 2.50 1.10 2.80 ns tTLH tTHL Transition Time 20% to 80%, 80% to 20% 0.40 1.30 0.40 1.20 0.40 1.20 ns 5 Conditions Figures 1 and 2 Military VersionPreliminary DC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND, TC e b55 C to a 125 C Symbol VOH VOL VOHC VOLC Parameter Output HIGH Voltage Output LOW Voltage Output HIGH Voltage Min Max Units TC b 1025 b 870 mV 0 C to a 125 C b 1085 b 870 mV b 55 C b 1830 b 1620 mV 0 C to a 125 C b 1830 b 1555 mV b 55 C VIN e VIH (Max) or VIL (Min) Loading with 50X to b2.0V 1, 2, 3 VIN e VIH (Min) or VIL (Max) Loading with 50X to b2.0V 1, 2, 3 0 C to mV b 1085 mV b 55 C b 1610 mV 0 C to a 125 C b 1555 mV b 55 C b 1165 b 870 mV b 55 C to a 125 C Guaranteed HIGH Signal for All Inputs 1, 2, 3, 4 b 1830 b 1475 mV b 55 C to a 125 C Guaranteed LOW Signal for All Inputs 1, 2, 3, 4 mA b 55 C to a 125 C VEE e b4.2V VIN e VIL (Min) 1, 2, 3 Output LOW Voltage a 125 C Input HIGH Voltage VIL Input LOW Voltage IIL Input LOW Current IIH Input HIGH Current Hc, A0a, A1a, A2a All Others 310 250 Hc, A0a, A1a, A2a All Others 465 350 mA b 55 C b 70 mA b 55 C to a 125 C Power Supply Current Notes b 1035 VIH IEE Conditions 0.50 b 110 0 C to mA a 125 C VEE e b5.7V VIN e VIH (Max) 1, 2, 3 Inputs Open 1, 2, 3 Note 1: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals b 55 C, then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides ``cold start'' specs which can be considered a worst case condition at cold temperatures. Note 2: Screen tested 100% on each device at b 55 C, a 25 C, and a 125 C, Subgroups 1, 2, 3, 7, and 8. Note 3: Sample tested (Method 5005, Table I) on each manufactured lot at b 55 C, a 25 C, and a 125 C, Subgroups A1, 2, 3, 7, and 8. Note 4: Guaranteed by applying specific input condition and testing VOH/VOL. 6 Military VersionPreliminary (Continued) AC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND Symbol Parameter TC e b55 C TC e a 25 C TC e a 125 C Min Max Min Max Min Max Units tPLH tPHL Propagation Delay Ena, Enb to Output 0.90 2.30 0.90 2.20 0.90 2.30 ns tPLH tPHL Propagation Delay Ana, Anb to Output 1.00 2.80 1.00 2.70 1.00 2.90 ns tPLH tPHL Propagation Delay Ha, Hb, Hc to Output 1.00 3.00 1.00 2.90 1.00 3.00 ns tPLH tPHL Propagation Delay M to Output 1.50 3.90 1.60 3.80 1.60 3.90 ns tTLH tTHL Transition Time 20% to 80%, 80% to 20% 0.45 1.70 0.45 1.70 0.45 1.80 ns Conditions Notes 1, 2, 3 Figures 1 and 2 4 Note 1: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals b 55 C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides ``cold start'' specs which can be considered a worst case condition at cold temperatures. Note 2: Screen tested 100% on each device at a 25 C, temperature only, Subgroup A9. Note 3: Sample tested (Method 5005, Table I) on each Mfg. lot at a 25 C, Subgroup A9, and at a 125 C, and b 55 C Temp., Subgroups A10 and A11. Note 4: Not tested at a 25 C, a 125 C and b 55 C Temperature (design characterization data). Test Circuit TL/F/10649 - 7 FIGURE 1. AC Test Circuit Notes: VCC, VCCA e a 2V, VEE e b 2.5V L1 and L2 e equal length 50X impedance lines RT e 50X terminator internal to scope Decoupling 0.1 mF from GND to VCC and VEE All unused outputs are loaded with 50X to GND CL e Fixture and stray capacitance s 3 pF Pin numbers shown are for flatpak; for DIP see logic symbol 7 Switching Waveforms TL/F/10649 - 8 FIGURE 2. Propagation Delay and Transition Times Ordering Information The device number is used to form part of a simplified purchasing code where a package type and temperature range are defined as follows: 100370 D Device Number (basic) C QB Special Variations QB e Military grade device with enivronmental and burn-in processing Package Code D e Ceramic DIP F e Quad Cerpak Q e Plastic Leaded Chip Carrier (PCC) Temperature Range C e Commercial (0 C to a 85 C) I e Industrial (b40 C to a 85 C) (PCC Only) M e Military (b55 C to a 125 C) 8 Physical Dimensions inches (millimeters) 24-Lead Ceramic Dual-In-Line Package (D) NS Package Number J24E 28-Lead Plastic Chip Carrier (Q) NS Package Number V28A 9 Physical Dimensions inches (millimeters) (Continued) 24-Lead Ceramic Flatpak (F) NS Package Number W24B LIFE SUPPORT POLICY NATIONAL'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform, when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. National Semiconductor Corporation 1111 West Bardin Road Arlington, TX 76017 Tel: 1(800) 272-9959 Fax: 1(800) 737-7018 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. 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