DATA SH EET
Product data sheet
Supersedes data of 1996 May 03
1999 Apr 22
DISCRETE SEMICONDUCTORS
PRLL5817; PRLL5818; PRLL5819
Schottky barrier diodes
alfpage
M3D121
1999 Apr 22 2
NXP Semiconductors Product data sheet
Schottky barrier diodes PRLL5817; PRLL5818;
PRLL5819
FEATURES
Low switching losses
Fast recovery time
Guard ring protected
Hermetically se aled glass SMD
package.
APPLICATIONS
Low power, switched-mode power
supplies
Rectifying
Polarity protection.
DESCRIPTION
The PRLL5817 to PRLL5819 types
are Schottky barrier diodes fabricated
in planar technology, and
encapsulated in SOD87 hermetically
sealed glass SMD packages
incorporating ImplotecTM(1)
technology.
(1) Implotec is a trademark of Philips.
MARKING
TYPE NUMBER MARKING CODE
PRLL5817 9
PRLL5818 9
PRLL5819 9
Fig.1 Simplified outline (SOD87) and symbol.
handbook, halfpage
MAM190
ka
1999 Apr 22 3
NXP Semiconductors Pr oduct data shee t
Schottky barrier diodes PRLL5817; PRLL5818;
PRLL5819
LIMITING VALUES
In accordance with the Absolute Maximum Ratin g S ystem (IEC 134).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
VRcontinuous revers e voltage
PRLL5817 20 V
PRLL5818 30 V
PRLL5819 40 V
VRSM non-repetitive pea k re verse voltage
PRLL5817 24 V
PRLL5818 36 V
PRLL5819 48 V
VRRM repetitive peak reverse voltage
PRLL5817 20 V
PRLL5818 30 V
PRLL5819 40 V
VRWM crest working reverse voltage
PRLL5817 20 V
PRLL5818 30 V
PRLL5819 40 V
IF(AV) average forward current Tamb = 60 °C1 A
IFSM non-repetitive peak forward current t = 10 ms half sine wave;
Tj = Tj max prior to surge: VR = 0 25 A
Tstg storage temperature 65 +175 °C
Tjjunction temperature 125 °C
1999 Apr 22 4
NXP Semiconductors Pr oduct data shee t
Schottky barrier diodes PRLL5817; PRLL5818;
PRLL5819
ELECTRICAL CHARACTERISTIC S
Tamb = 25 °C unless otherwise specified.
Note
1. Pulse test: tp = 300 μs; δ = 0.02.
THERMAL CHARACTE RISTICS
Note
1. Refer to SOD87 standard mounting conditions.
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
VFforward voltage see Fig.2
PRLL5817 IF = 0.1 A −−320 mV
IF = 1 A −−450 mV
IF = 3 A −−750 mV
VFforward voltage see Fig.2
PRLL5818 IF = 0.1 A −−330 mV
IF = 1 A −−550 mV
IF = 3 A −−875 mV
VFforward voltage see Fig.2
PRLL5819 IF = 0.1 A −−340 mV
IF = 1 A −−600 mV
IF = 3 A −−900 mV
IRreverse current VR = VRRMmax; note 1 0.5 1mA
VR = VRRMmax; Tj = 100 °C 510 mA
Cddiode capacitan ce VR = 4 V; f = 1 MHz
PRLL5817 70 pF
PRLL5818 50 pF
PRLL5819 50 pF
SYMBOL PARAMETER CONDITIONS VALUE UNIT
Rth j-a thermal resistance from junction to ambient note 1 150 K/W
1999 Apr 22 5
NXP Semiconductors Pr oduct data shee t
Schottky barrier diodes PRLL5817; PRLL5818;
PRLL5819
GRAPHICAL DATA
handbook, halfpage
01
5
0
1
MBE634
2
3
4
0.5 VF (V)
IF
(A) Tj = 125 oC25 oC
Fig.2 Typical forward voltage .
Fig.3 PRLL817. Maximum values steady state forw ard power dissipation as a fun ction of the av erage forward
current; a = IF(RMS)/IF(AV).
2
1
00 0.5 1.5
MBE642
1
(W)
0.5
P
F(AV)
IF(AV) (A)
a = 3 2.5 1.57 1.42 1
2
1999 Apr 22 6
NXP Semiconductors Pr oduct data shee t
Schottky barrier diodes PRLL5817; PRLL5818;
PRLL5819
Fig.4 PRLL5818. Maximum values steady state for ward power dissipation as a function of the avera ge forward
current; a = IF(RMS)/IF(AV).
2
1
00 0.5 1.5
MBE641
1
(W)
0.5
P
F(AV)
IF(AV) (A)
a = 3 2.5 1.57 1.42 12
Fig.5 PRLL5819. Maximum values steady state for ward power dissipation as a function of the avera ge forward
current; a = IF(RMS)/IF(AV).
2
1
00 0.5 1.5
MBE643
1
(W)
0.5
P
F(AV)
IF(AV) (A)
a = 3 2.5 1.57 1.42 12
1999 Apr 22 7
NXP Semiconductors Pr oduct data shee t
Schottky barrier diodes PRLL5817; PRLL5818;
PRLL5819
Fig.6 PRLL5817. Maximum permissible junction
temperature as a function of reverse voltage;
device mounted; refer to SOD87 standard
mounting conditions.
02
0
200
0
MBE635
100
10 VR (V)
Tj
(
oC) VRWM
VR
δ = 0.2
δ = 0.5
Fig.7 PRLL5817. Reverse power dissipation as a
function of revers e voltage (max. values);
device mounted; refer to SOD87 standard
mounting conditions.
02
0
0.1
0
MBE640
0.05
PR
10 VR (V)
(
W)
VRWM
VRδ = 0.5 δ = 0.2
Fig.8 PRLL5818. Maximum permissible junction
temperature as a function of reverse voltage;
device mounted; refer to SOD87 standard
mounting conditions.
04
0
200
0
MBE636
100
20 VR (V)
Tj
(
oC) VRWM
VR
δ = 0.2
δ = 0.5
Fig.9 PRLL5818. Reverse power dissipation as a
function of revers e voltage (max. values);
device mounted; refer to SOD87 standard
mounting conditions.
04
0
0.1
0
MBE638
0.05
PR
20 VR (V)
(
W)
VRWM
VRδ = 0.5 δ = 0.2
1999 Apr 22 8
NXP Semiconductors Pr oduct data shee t
Schottky barrier diodes PRLL5817; PRLL5818;
PRLL5819
Fig.10 PRLL5819. Maximum permissible junction
temperature as a function of reverse voltage;
device mounted; refer to SOD87 standard
mounting conditions.
02
0
200
0
MBE637
100
10 VR (V)
Tj
(
oC) VRWM
VR
δ = 0.2
δ = 0.5
Fig.11 PRLL5819 . Reverse power di ssipation as a
function of revers e voltage (max. values);
device mounted; refer to SOD87 standard
mounting conditions.
04
0
0.1
0
MBE639
0.05
PR
20 VR (V)
(
W)
VRWM
VRδ = 0.5 δ = 0.2
1999 Apr 22 9
NXP Semiconductors Pr oduct data shee t
Schottky barrier diodes PRLL5817; PRLL5818;
PRLL5819
PACKAGE OUTLINE
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
IEC JEDEC EIAJ
SOD87 100H03 99-03-31
99-06-04
Hermetically sealed glass surface mounted package;
ImplotecTM(1) technology; 2 connectors SOD8
7
UNIT D
mm 2.1
2.0 2.0
1.8 3.7
3.3 0.3
D1 HL
DIMENSIONS (mm are the original dimensions) H
DD1
LL
(2)
0 1 2 mm
scale
Notes
1. Implotec is a trademark of Philips.
2. The marking indicates the cathode.
ka
1999 Apr 22 10
NXP Semiconductors Product data sheet
Schottky barrier diodes PRLL5817; PRLL5818;
PRLL5819
DATA SHEET STATUS
Notes
1. Please consult the most recently issued document befor e initiating or co mpleting a design.
2. The product s ta tus of device(s) described in this do cument may have ch anged since this docu ment was published
and may differ in case of multiple devices. The latest product status information is available on th e Internet at
URL http://www.nxp.com.
DOCUMENT
STATUS(1) PRODUCT
STATUS(2) DEFINITION
Objective data sheet Development This document contains data from the objective specification for pro duct
development.
Preliminary data sheet Qualification This document contains data from the preliminary specification.
Product data sheet Production T his document contains the produc t specification.
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Limiting values Stress above one or more limiting
values (as defined in the Absolute Maximum Ratings
System of IEC 60134) may cause permanent damage to
the device. Limiting values are stress ratings only and
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above those given in the Characteristics sections of this
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Printed in The Netherlands 115002/00/02/pp11 Date of release: 1999 Apr 22 Document orde r number: 9397 750 05474