1N5231BD2A.DA - Semelab Plc.

500mW ZENER DIODES

Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice.

Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However

Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to

verify that datasheets are current before placing an order.

Semelab

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Coventry Road, Lutterworth, Leicestershire, LE17 4JB

Document Number 9024

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Fax +44 (0) 1455 552612

Issue 2

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Page 1 of 4

1N5221BD2A TO 1N5261BD2A

• DLCC2 Hermetic Ceramic Package Designed as a Drop-In

Replacement for “D-5A”/ “A-MELF” Package

• Extensive Voltage Selection (2.4V – 47V)

• Standard Zener Voltage Tolerance of ±5%

•

Regulation Over a Large Operating Current & Temperature Range

• Space Level and High-Reliability Screening Options Available

ABSOLUTE MAXIMUM RATINGS

(TA = 25 C unless otherwise stated)

VZM Reference Voltage See Reference Table

IZM Continuous DC Current See Reference Table

PT Total Power Dissipation at TA = 75 C 500mW

TJ Junction Temperature Range -55 to +175 C

TSTG Storage Temperature Range -65 to +175 C

TSP Maximum Soldering Pad Temperature for 20s 260 C

THERMAL PROPERTIES

Symbol Parameter Max Units

RθJA

(1)

Thermal Resistance Junction to Ambient 300 C/W

(1) PCB = FR4 – 0.0625 Inch (1.59mm), 1 Layer, 1.0-Oz Cu, 0.007 Inch

(1.7mm x 2.76mm

) Pad Size, horizontal, in still air

500mW ZENER DIODES

1N5221BD2A TO 1N5261BD2A

Semelab

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Semelab

Limited

LimitedLimited

Limited

Coventry Road, Lutterworth, Leicestershire, LE17 4JB

Document Number 9024

Telephone +44 (0) 1455 556565

Fax +44 (0) 1455 552612

Issue 2

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Page 2 of 4

ELECTRICAL CHARACTERISTICS

(TA = 25 C unless otherwise stated)

Nominal

Zener

Voltage

Test

Current Maximum Zener Impedance

(1)

Maximum Reverse Leakage

Current Maximum Zener

Voltage

Coefficient

(2)

VZ @ IZT IZT ZZT @ IZK ZZT @ IZK = 250µA IR @VR αVZ

P/N

V mA Ω µA V %/°C

1N5221 2.4 20 30 1200 100 –0.085

1N5222 2.5 20 30 1250 100 –0.085

1N5223 2.7 20 30 1300 75 –0.080

1N5224 2.8 20 30 1400 75 –0.080

1N5225 3.0 20 29 1600 50 –0.075

1N5226 3.3 20 28 1600 25 –0.070

1N5227 3.6 20 24 1700 15 –0.065

1N5228 3.9 20 23 1900 10 –0.060

1N5229 4.3 20 22 2000 5.0

1.0

±0.055

1N5230 4.7 20 19 1900 5.0 ±0.030

1N5231 5.1 20 17 1600 5.0 2.0 ±0.030

1N5232 5.6 20 11 1600 5.0 3.0 +0.038

1N5233 6.0 20 7.0 1600 5.0 3.5 +0.038

1N5234 6.2 20 7.0 1000 5.0 4.0 +0.045

1N5235 6.8 20 5.0 750 3.0 5.0 +0.050

1N5236 7.5 20 6.0 500 3.0 6.0 +0.058

1N5237 8.2 20 8.0 500 3.0 6.5 +0.062

1N5238 8.7 20 8.0 600 3.0 6.5 +0.065

1N5239 9.1 20 10 600 3.0 7.0 +0.068

1N5240 10 20 17 600 3.0 8.0 +0.075

1N5241 11 20 22 600 2.0 8.4 +0.076

1N5242 12 20 30 600 1.0 9.1 +0.077

1N5243 13 9.5 13 600 0.5 9.9 +0.079

1N5244 14 9.0 15 600 0.1 10 +0.082

1N5245 15 8.5 16 600 0.1 11 +0.082

1N5246 16 7.8 17 600 0.1 12 +0.083

1N5247 17 7.4 19 600 0.1 13 +0.084

1N5248 18 7.0 21 600 0.1 14 +0.085

1N5249 19 6.6 23 600 0.1 14 +0.086

1N5250 20 6.2 25 600 0.1 15 +0.086

1N5251 22 5.6 29 600 0.1 17 +0.087

1N5252 24 5.2 33 600 0.1 18 +0.088

1N5253 25 5.0 35 600 0.1 19 +0.089

1N5254 27 4.6 41 600 0.1 21 +0.090

1N5255 28 4.5 44 600 0.1 21 +0.091

1N5256 30 4.2 49 600 0.1 23 +0.091

1N5257 33 3.8 58 700 0.1 25 +0.092

1N5258 36 3.4 70 700 0.1 27 +0.093

1N5259 39 3.2 80 800 0.1 30 +0.094

1N5260 43 3.0 93 900 0.1 33 +0.095

1N5261 47 2.7 105 1000 0.1 36 +0.095

Notes: 1) Zener Impedance is measured to ensure a sharp knee characteristic on the breakdown curve. Derived from 50Hz ac voltage from ac current of 10% rms of IZT (or

IZK) superimposed on DC IZT (or IZK)

2) Temperature Coefficient test conditions:

a. IZT = 7.5mA , T1 = 25°C, T 2 = 125°C (1N5221 through to 1N5242)

b. IZT = Rated IZT, T1 = 25°C, T 2 = 125°C (1N5243 through to 1N5261)

DUT temperature stabilised with constant current for αVZ measurement @ T1,T2

SERIES ELECTRICAL CHARACTERISTICS

(TA = 25 C unless otherwise)

Symbol Parameters Test Conditions Max Units

VF Forward Voltage IF = 200mA 1.5 V

500mW ZENER DIODES

1N5221BD2A TO 1N5261BD2A

Semelab

SemelabSemelab

Semelab

Limited

LimitedLimited

Limited

Coventry Road, Lutterworth, Leicestershire, LE17 4JB

Document Number 9024

Telephone +44 (0) 1455 556565

Fax +44 (0) 1455 552612

Issue 2

Email: sales@semelab-tt.com

Website: http://www.semelab-tt.com

Page 3 of 4

MECHANICAL DATA

* The additional contact provides a connection to the lid in the application. Connecting the metal lid to a known electrical potential stops deep

dielectric discharge in space applications; see the Space Weather link www.semelab.co.uk/dlcc2.html on the Semelab web site. Package variant

to be specified at order.

Other Package Outlines may be available – Contact Semelab Sales to Enquire

DLCC2

Variant

A (D2A)

PAD 1 ANODE

PAD 2 CATHODE

DIMENSION mm Inches

A 5.00 0.10 0.197 0.004

B 2.61 0.10 0.103 0.004

C 1.08 0.10 0.043 0.004

D 1.76 0.10 0.069 0.004

DLCC2

Variant

B (D2B)

PAD 1 ANODE

PAD 2 CATHODE

PAD 3 LID CONTACT TO ANODE*

DIMENSION mm Inches

A 5.00 0.10 0.197 0.004

B 2.61 0.10 0.103 0.004

C 1.08 0.10 0.043 0.004

D 1.76 0.10 0.069 0.004

SOLDER PAD LAYOUT D

DIMENSION mm Inches

A 6.25 0.246

B 1.70 0.067

C 2.67 0.105

DLCC2/ D-5A MELF OVERLAY

500mW ZENER DIODES

1N5221BD2A TO 1N5261BD2A

Semelab

SemelabSemelab

Semelab

Limited

LimitedLimited

Limited

Coventry Road, Lutterworth, Leicestershire, LE17 4JB

Document Number 9024

Telephone +44 (0) 1455 556565

Fax +44 (0) 1455 552612

Issue 2

Email: sales@semelab-tt.com

Website: http://www.semelab-tt.com

Page 4 of 4

SCREENING OPTIONS

Space Level (JQRS/ESA) and High Reliability options are

available in accordance with the High Reliability and

Screening Options Handbook available for download from

the from the TT electronics Semelab web site.

ESA Quality Level Products are based on the testing

procedures specified in the generic ESCC 5000 and in the

corresponding part detail specifications.

Semelabs QR216 and QR217 processing specifications

(JQRS), in conjunction with the companies ISO 9001:2000

approval present a viable alternative to the American MIL-

PRF-19500 space level processing.

QR217 (Space Level Quality Conformance) is based on the

quality conformance inspection requirements of MIL-PRF-

19500 groups A (table V), B (table VIa), C (table VII) and

also ESA / ESCC 5000 (chart F4) lot validation tests.

QR216 (Space Level Screening) is based on the screening

requirements of MIL-PRF-19500 (table IV) and also ESA

/ESCC 5000 (chart F3).

JQRS parts are processed to the device data sheet and

screened to QR216 with conformance testing to Q217

groups A and B in accordance with MIL-STD-750 methods

and procedures.

Additional conformance options are available, for example

Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs.

These are chargeable and must be specified at the order

stage (See Ordering Information). Minimum order

quantities may apply.

Alternative or additional customer specific conformance or

screening requirements would be considered. Contact

Semelab sales with enquires.

MARKING DETAILS

Parts can be laser marked with approximately 7 characters

on two lines and always includes cathode identification.

Typical marking would include part or specification number,

week of seal or serial number subject to available space and

legibility.

Customer specific marking requirements can be arranged at

the time of order.

Example Marking:

ORDERING INFORMATION

Part numbers are built up from Type, Package Variant, and

screening level. The part numbers are extended to include

the additional options as shown below.

Type – See Electrical Characteristics Table

Package Variant – See Mechanical Data

Screening Level – See Screening Options (ESA / JQRS)

Additional Options:

Customer Pre-Cap Visual Inspection .CVP

Customer Buy-Off visit .CVB

Data Pack .DA

Solderability Samples .SS

Scanning Electron Microscopy .SEM

Radiography (X-ray) .XRAY

Total Dose Radiation Test .RAD

MIL-PRF-19500 (QR217)

Group B charge .GRPB

Group B destructive mechanical samples .GBDM (12 pieces)

Group C charge .GRPC

Group C destructive electrical samples .GCDE (12 pieces)

Group C destructive mechanical samples .GCDM (6 pieces)

ESA/ESCC

Lot Validation Testing (subgroup 1) charge .LVT1

LVT1 destructive samples (environmental) .L1DE (15 pieces)

LVT1 destructive samples (mechanical) .L1DM (15 pieces)

Lot Validation Testing (subgroup 2) charge .LVT2

LVT2 endurance samples (electrical) .L2D (15 pieces)

Lot Validation Testing (subgroup 3) charge .LVT3

LVT3 destructive samples (mechanical) .L3D (5 pieces)

Additional Option Notes:

1) All ‘Additional Options’ are chargeable and must be specified at order stage.

2) When Group B,C or LVT is required, additional electrical and mechanical destructive

samples must be ordered

3) All destructive samples are marked the same as other production parts unless

otherwise requested.

Example ordering information:

The following example is for the 1N5245B part with

package variant A, JQRS screening, additional Group C

conformance testing and a Data pack.

Part Numbers:

1N5245BD2A-JQRS

(Include quantity for flight parts)

1N5245BD2A.GRPC

(chargeable conformance option)

1N5245BD2A.GCDE

(charge for destructive parts)

1N5245BD2A.GCDM

(charge for destructive parts)

1N5245BD2A.DA

(charge for Data pack)

Customers with any specific requirements (e.g. marking or

screening) may be supplied with a similar alternative part

number (there is maximum 20 character limit to part

numbers). Contact Semelab sales with enquiries.

High Reliability and Screening Options Handbook link:

http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf