LMH6624
,
LMH6626
www.ti.com
SNOSA42G –NOVEMBER 2002–REVISED DECEMBER 2014
6.6 Electrical Characteristics ±6 V
Unless otherwise specified, all limits ensured at TA= 25°C, V+= 6 V, V−=−6 V, VCM = 0 V, AV= +20, RF= 500 Ω,
RL= 100 Ω. See (1).
PARAMETER TEST CONDITIONS MIN(2) TYP(3) MAX(2) UNIT
DYNAMIC PERFORMANCE
VO= 400 mVPP (LMH6624) 95
fCL −3dB BW MHz
VO= 400 mVPP (LMH6626) 85
VO= 2 VPP, AV= +20 (LMH6624) 350
VO= 2 VPP, AV= +20 (LMH6626) 320
SR Slew rate(4) V/μs
VO= 2 VPP, AV= +10 (LMH6624) 400
VO= 2 VPP, AV= +10 (LMH6626) 360
trRise time VO= 400 mV Step, 10% to 90% 3.7 ns
tfFall time VO= 400 mV Step, 10% to 90% 3.7 ns
tsSettling time 0.1% VO= 2 VPP (Step) 18 ns
DISTORTION and NOISE RESPONSE
f = 1 MHz (LMH6624) 0.92
enInput referred voltage noise nV/√Hz
f = 1 MHz (LMH6626) 1.0
f = 1 MHz (LMH6624) 2.3
inInput referred current noise pA/√Hz
f = 1 MHz (LMH6626) 1.8
HD2 2nd harmonic distortion fC= 10 MHz, VO= 1 VPP, RL= 100 Ω −63 dBc
HD3 3rd harmonic distortion fC= 10 MHz, VO= 1 VPP, RL= 100 Ω −80 dBc
INPUT CHARACTERISTICS
−0.5 ±0.10 +0.5
Input offset voltage VCM = 0 V mV
VOS -40°C ≤TJ≤125°C −0.7 +0.7
Average drift(5) VCM = 0 V ±0.2 μV/°C
−1.1 0.05 1.1
(LMH6624)
VCM = 0 V -40°C ≤TJ≤125°C −2.5 2.5
Input offset current μA
IOS −2.0 0.1 2.0
(LMH6626)
VCM = 0 V -40°C ≤TJ≤125°C −2.5 2.5
Average drift(5) VCM = 0 V 0.7 nA/°C
13 +20
Input bias current VCM = 0 V μA
IB-40°C ≤TJ≤125°C +25
Average drift(5) VCM = 0 V 12 nA/°C
Common Mode 6.6 MΩ
RIN Input resistance(6) Differential Mode 4.6 kΩ
Common Mode 0.9
CIN Input capacitance(6) pF
Differential Mode 2.0
Input Referred, VCM =−4.5 to +5.25 V 90 95
Common mode rejection
CMRR dB
Input Referred,
ratio -40°C ≤TJ≤125°C 87
VCM =−4.5 to +5.0 V
(1) Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that TJ= TA. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where TJ> TA. Absolute maximum ratings indicate junction temperature limits beyond
which the device may be permanently degraded, either mechanically or electrically.
(2) All limits are specified by testing or statistical analysis.
(3) Typical Values represent the most likely parametric norm.
(4) Slew rate is the slowest of the rising and falling slew rates.
(5) Average drift is determined by dividing the change in parameter at temperature extremes into the total temperature change.
(6) Simulation results.
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