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DATA SH EET
Product data sheet
Supersedes data of 2003 Feb 20 2003 Apr 04
DISCRETE SEMICONDUCTORS
PMEG2005EB
Low VF MEGA Schottky barrier
diode
M3D319
2003 Apr 04 2
NXP Semiconductors Product data sheet
Low VF MEGA Schottky barrier diode PMEG2005EB
FEATURES
Forward current: 0. 5 A
Reverse voltage: 20 V
Very low forward voltage
Guard ring protected
Ultra small SMD package.
APPLICATIONS
Ultra high-speed switching
Voltage clamping
Protection circuits
Low current re ctification
Low power consumption applications (e.g. handheld
devices).
DESCRIPTION
Planar Maximum Efficiency Ge neral Application (MEGA)
Schottky barrier diode, encapsulated in a SOD523
(SC-79) ultra small SMD plastic package.
PINNING
PIN DESCRIPTION
1cathode
2anode
handbook, halfpage ka
;
Top view MAM403
Fig.1 Simplified outline (SOD523; SC-79) and
symbol.
Marking code: L5.
The marking bar indicates the cathode.
LIMITING VALUES
In accordance with th e Absolute Maximum Ratin g S ystem (IEC 60134).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
VRcontinuous revers e voltage 20 V
IFcontinuous forward current 500 mA
IFRM repetitive peak forward current tp = 1 ms; δ 0.25 3.5 A
IFSM non-repetitive peak forward current t = 8 ms square wave 6 A
Tstg storage temperature 65 +150 °C
Tjjunction temperature 125 °C
Tamb operating ambient temperature 65 +125 °C
2003 Apr 04 3
NXP Semiconductors Pr oduct data shee t
Low VF MEGA Schottky barrier diode PMEG2005EB
ELECTRICAL CHARACTERISTIC S
Tamb = 25 °C; unless otherwise specified.
Note
1. Pulsed test: tp = 300 μs; δ = 0.02.
THERMAL CHARACTE RISTICS
Note
1. Refer to SOD523 (SC-79) standard mounting conditions.
SYMBOL PARAMETER CONDITIONS TYP. MAX. UNIT
VFcontinuous forward v oltage see Fig.2
IF = 0.1 mA 120 180 mV
IF = 1 mA 180 240 mV
IF = 10 mA 245 290 mV
IF = 100 mA 320 380 mV
IF = 500 mA 430 480 mV
IRcontinuous rev ers e current VR = 10 V; see Fig.3; note 1 7 30 μA
Cddiode capacitan ce VR = 1 V; f = 1 MH z; see Fig.4 24 30 pF
SYMBOL PARAMETER CONDITIONS VALUE UNIT
Rth j-a thermal resistance from junction to
ambient note 1 400 K/W
2003 Apr 04 4
NXP Semiconductors Pr oduct data shee t
Low VF MEGA Schottky barrier diode PMEG2005EB
GRAPHICAL DATA
handbook, halfpage
0.50 VF (V)
IF
(mA)
0.1 0.2 0.3 0.4
103
102
101
102
10
1
MHC456
(1) (3)(2)
Fig.2 Forward current as a function of forward
voltage; typical values.
(1) Tamb = 125 °C.
(2) Tamb = 85 °C.
(3) Tamb = 25 °C.
handbook, halfpage
3020100 VR (V)
IR
(μA)
104
103
102
10
1
MHC457
(1)
(2)
(3)
Fig.3 Reverse current as a fun ction of reverse
voltage; typical values.
(1) Tamb = 125 °C.
(2) Tamb = 85 °C.
(3) Tamb = 25 °C.
handbook, halfpage
0VR (V)
Cd
(pF)
510 20
50
0
40
15
30
20
10
MHC458
Fig.4 Diode capacitance as a function of reverse
voltage; typical values.
f = 1 MHz; Tamb = 25 °C.
2003 Apr 04 5
NXP Semiconductors Pr oduct data shee t
Low VF MEGA Schottky barrier diode PMEG2005EB
PACKAGE OUTLINE
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
IEC JEDEC JEITA
SOD523 SC-79 98-11-25
02-12-13
P
lastic surface mounted package; 2 leads SOD52
3
0 0.5 1 mm
scale
D
12
HE
Ebp
A
c
vMA
A
UNIT bpcDEv
mm
AH
E
DIMENSIONS (mm are the original dimensions)
Note
1. The marking bar indicates the cathode.
(1) 0.34
0.26 0.17
0.11 0.1
0.85
0.75
1.25
1.15
0.65
0.58 1.65
1.55
2003 Apr 04 6
NXP Semiconductors Pr oduct data shee t
Low VF MEGA Schottky barrier diode PMEG2005EB
DATA SHEET STATUS
Notes
1. Please consult the mos t recently issued document before initiating or completing a design.
2. The product status of device(s) described in this document may have changed si nce this document was published
and may differ in case of multiple devices. The latest product status information is available on the Internet at
URL http://www.nxp.com.
DOCUMENT
STATUS(1) PRODUCT
STATUS(2) DEFINITION
Objective data sheet Development This document contains data from the objective specification for pro duct
development.
Preliminary data sheet Qualification This document contains data from the preliminary specification.
Product data sheet Production T his document contains the product specification.
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Applications Applications that are described herein for
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NXP Semiconductors makes no representation or
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Limiting values Stress above one or more limiting
values (as defined in the Absolute Maximum Ratings
System of IEC 60134) may cause permanent damage to
the device. Limiting values a re s t ress ratings only and
operation of the device at these or an y other conditions
above those given in the Characteristics sections of this
document is not implied. Exposure to limiting values for
extended periods may affect device reliability.
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Quick refer ence data The Quick reference data is an
extract of th e product data given in the Limiting values an d
Characteristics sections of this docu ment, and as such is
not complete, exhaus tive or legally binding.
NXP Semiconductors
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© NXP B.V. 2009
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Customer notification
This data sheet was changed to reflect the new company name NXP Semiconductors. No changes were
made to the content, except for the legal definitions and disclaimers.
Printed in The Netherlands 613514/02/pp7 Date of release: 2003 Apr 04 Document orde r number: 9397 750 11354