DATA SH EET
Product data sheet 2003 Nov 07
DISCRETE SEMICONDUCTORS
PMBD7100
High-speed double diode
db
ook, halfpage
M3D088
2003 Nov 07 2
NXP Semiconductors Product data sheet
High-speed double diode PMBD7100
FEATURES
Small plastic SMD package
High switching speed: max. 4 ns
Continuous reverse voltage: max. 100 V
Repetitive peak reverse voltage: max. 100 V
Repetitive peak forward current: max. 450 mA.
APPLICATIONS
High-speed s witching in thick and thin-film circuits.
DESCRIPTION
The PMBD7100 consists of two high-speed switching
diodes with common cathodes , fabric ated in planar
technology, and encapsulated in the small SOT23 SMD
plastic pack ag e.
MARKING
Note
1. * = p: made in Hong Kong.
* = t: made in Malaysia.
* = W: made in China.
PINNING
TYPE NUMBER MARKING CODE(1)
PMBD7100 *3A
PIN DESCRIPTION
1anode (a1)
2anode (a2)
3common connection
handbook, halfpage
21
3
Top view
MAM383
2
1
3
Fig.1 Simplified outline (SOT23 ) and symbo l .
ORDERING INFORMATION
TYPE NUMBER PACKAGE
NAME DESCRIPTION VERSION
PMBD7100 plastic surface mounted package; 3 leads SOT23
2003 Nov 07 3
NXP Semiconductors Pr oduct dat a shee t
High-speed double diode PMBD7100
LIMITING VALUES
In accordance with the A bsolute Maxi mum Rating System (IEC 60134).
Note
1. Device mounted on an FR4 printed-circuit board .
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
Per diode
VRRM repetitive peak reverse voltage 100 V
VRcontinuous revers e voltage 100 V
IFcontinuous forward current single diode loaded; see Fig.2; note 1 215 mA
double diode loaded; see Fig.2; note 1 125 mA
IFRM repetitive peak forward current 450 mA
IFSM non-repetitive peak forward current square wave; Tj = 25 °C prior to surge;
see Fig.4
tp = 1 µs4 A
tp = 1 ms 1 A
tp = 1 s 0.5 A
Ptot total power dissipation Tamb = 25 °C; note 1 250 mW
Tstg storage temperature 65 +150 °C
Tjjunction temperature 150 °C
2003 Nov 07 4
NXP Semiconductors Pr oduct dat a shee t
High-speed double diode PMBD7100
ELECTRICAL CHARACTERISTIC S
Tamb = 25 °C unless otherwise specified.
THERMAL CHARACTE RISTICS
Note
1. Device mounted on an FR4 printed-circuit board .
SYMBOL PARAMETER CONDITIONS MAX. UNIT
Per diode
VFforward voltage see Fig.3
IF = 1 mA 715 mV
IF = 10 mA 855 mV
IF = 50 mA 1 V
IF = 150 mA 1.25 V
IRreverse current see Fig.5
VR = 25 V 30 nA
VR = 100 V 2.5 µA
VR = 25 V; Tj = 150 °C60 µA
VR = 100 V; Tj = 150 °C100 µA
Cddiode capacit an ce VR = 0 V; f = 1 MHz; see Fig.6 1.5 pF
trr reverse recove ry time when switched from IF = 10 mA to
IR = 10 mA; RL = 100 ; measured at
IR = 1 mA; see Fig.7
4ns
Vfr forward recove ry voltage when switched from IF = 10 m A to tr = 20 nA;
see Fig.8 1.75 V
SYMBOL PARAMETER CONDITIONS VALUE UNIT
Rth j-tp thermal resistance from junction to tie-point 360 K/W
Rth j-a thermal resistance from junction to ambient note 1 500 K/W
2003 Nov 07 5
NXP Semiconductors Pr oduct dat a shee t
High-speed double diode PMBD7100
GRAPHICAL DATA
0 200
300
0
100
200
MBD033
100
IF
(mA)
T ( C)
amb o
single diode loaded
double diode loaded
Device mounted on an FR4 printed-circuit board.
Fig.2 Maximum permissible continuous forward
current as a func tion of ambient
temperature.
handbook, halfpage
0 0.5 1.0 2.0
300
0
100
200
1.5
MDB820
250
150
50
IF
(mA)
VF (V)
(1) (2) (3)
(1) Tj = 150 °C; typical values.
(2) Tj = 25 °C; typical values.
(3) Tj = 25 °C; maximum values.
Fig.3 Forward current as a function of
forward voltage.
handbook, full pagewidth
MBG704
10 tp (µs)
1
IFSM
(A)
102
101104
102103
10
1
Fig.4 Maximum permissible non-repetitive peak forwar d current as a function of pulse duration.
Based on square wave currents.
Tj = 25 °C prior to surge.
2003 Nov 07 6
NXP Semiconductors Pr oduct dat a shee t
High-speed double diode PMBD7100
handbook, halfpage
200100500 150
MDB821
102
10
1
10-1
10-2
103
IR
(µA)
Tj (°C)
(1)
(2) (3)
Fig.5 Reverse current as a fun ction of junc tion
temperature.
(1) VR = 100 °C; maximum values.
(2) VR = 100 °C; typical values.
(3) VR = 25 °C; typical values.
handbook, halfpage
0 5 10 15
0.8
0.6
0.2
0
0.4
MDB822
Cd
(pF)
VR (V)
Fig.6 Diode capacitance as a function of reverse
voltage; typical values.
f = 1 MHz; Tj = 25 °C.
2003 Nov 07 7
NXP Semiconductors Pr oduct dat a shee t
High-speed double diode PMBD7100
handbook, full pagewidth
trr
(1)
IFt
output signal
trt
tp
10%
90%
VR
input signal
V = V I x R
RF S
R = 50
SIF
D.U.T.
R = 50
i
SAMPLING
OSCILLOSCOPE
MGA881
Fig.7 Reverse reco very voltage test circuit and waveforms.
(1) IR = 1 mA.
trt
tp
10%
90%
I
input
signal
R = 50
S
I
R = 50
i
OSCILLOSCOPE
1 k 450
D.U.T.
MGA882
Vfr
t
output
signal
V
Fig.8 Forward recovery voltage test circuit and waveforms.
2003 Nov 07 8
NXP Semiconductors Pr oduct dat a shee t
High-speed double diode PMBD7100
PACKAGE OUTLINE
UNIT A1
max. bpcDE e1HELpQwv
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
97-02-28
99-09-13
IEC JEDEC EIAJ
mm 0.1 0.48
0.38 0.15
0.09 3.0
2.8 1.4
1.2 0.95
e
1.9 2.5
2.1 0.55
0.45 0.1
0.2
DIMENSIONS (mm are the original dimensions)
0.45
0.15
SOT23 TO-236AB
bp
D
e1
e
A
A1
Lp
Q
detail X
HE
E
wM
vMA
B
AB
0 1 2 mm
scale
A
1.1
0.9
c
X
12
3
Plastic surface mounted package; 3 leads SOT2
3
2003 Nov 07 9
NXP Semiconductors Pr oduct dat a shee t
High-speed double diode PMBD7100
DATA SHEET STATUS
Notes
1. Please consult the most recently issued document before initiating or completing a design.
2. The product s ta tus of device(s) described in this document may have changed since this docu ment was published
and may differ in case of multiple devices. The latest product status information is available on the Internet at
URL http://www.nxp.com.
DOCUMENT
STATUS(1) PRODUCT
STATUS(2) DEFINITION
Objective data sheet Development This document contains data from the objective specification for pro duct
development.
Preliminary data sheet Qualification This document contains data from the preliminary specification.
Product data sheet Production T his document contains the product specification.
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Applications Applications that are described herein for
any of these products are for illustrative purposes only.
NXP Semiconductors makes no representation or
warranty that such applications will be suitable for the
specified use witho ut fu rth e r testing or modificat ion .
Limiting values Stress above one or more limiting
values (as defined in the Absolute Maximum Ratings
System of IEC 60134) may cause permanent damage to
the device. Limiting values are stress ratin gs only and
operation of the device at these or any other conditions
above those given in the Characteristics sections of this
document is not implied. Exposure to limiting values for
extended periods may affect device reliability.
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Quick refer ence data The Quick reference data is an
extract of th e product data given in the Limiting values and
Characteristics sections of this document, and as such is
not complete, exhaus tive or legally binding.
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Customer notification
This data sheet was changed to reflect the new company name NXP Semicon ductors. No change s were
made to the content, except for the legal definitions and disclaimer s.
Printed in The Netherlands R76/01/pp10 Date of release: 2003 Nov 07 Document orde r number: 9397 750 12001