IXYS reserves the right to change limits, test conditions, and dimensions.
IXYS MOSFETs and IGBTs are covered by one or more 4,850,072 4,931,844 5,034,796 5,063,307 5,237,481 5,381,025 6,404,065B1 6,162,665 6,534,343 6,583,505
of the following U.S. patents: 4,835,592 4,881,106 5,017,508 5,049,961 5,187,117 5,486,715 6,306,728B1 6,259,123B1 6,306,728B1 6,683,344
ISOPLUS-227 B
Symbol Test Conditions Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
VDSS VGS = 0 V, ID = 1 mA 500 V
VGS(th) VDS = VGS, ID = 4 mA 2 4 V
IGSS VGS = ±20 VDC, VDS = 0 ±100 nA
IDSS VDS = VDSS TJ = 25°C 100 µA
VGS = 0 V TJ = 125°C2mA
RDS(on) VGS = 10 V, ID = IT44N50Q 0.12 Ω
48N50Q 0.11 Ω
Pulse test, t ≤ 300 µs, duty cycle δ ≤ 2 %
Symbol Test Conditions Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
gfs VDS = 10 V, ID = IT, pulse test 30 36 S
Ciss 8000 pF
Coss VGS = 0 V, VDS = 25 V, f = 1 MHz 930 pF
Crss 220 pF
td(on) 33 ns
trVGS = 10 V, VDS = 0.5 VDSS, ID = IT22 ns
td(off) RG = 1Ω (External) 75 ns
tf10 ns
Qg(on) 190 nC
Qgs VGS = 10 V, VDS = 0.5 VDSS, ID = IT40 nC
Qgd 86 nC
RthJC 0.31 K/W
RthCK 0.07 K/W
Ultra-fast Diode Characteristic Values
(TJ = 25°C, unless otherwise specified)
Symbol Test Conditions min. typ. max.
IRTJ= 25°C; VR= VRRM 200 µA
TJ= 150°C; VR= 0.8VRRM 2.5 mA
VFIF = 60A, VGS = 0 V 2.05 V
Note1 TJ = 150°C 1.4 V
trr II = 1A, di/dt = -200 A/µs, VR = 30 V, TJ = 25°C3550ns
IRM IF= 60A, di/dt = -100 A/µs, VR = 100 V, TJ = 100°C 8.3 A
RthJC 0.7 K/W
RthJK 0.05 K/W
Note: 1. Pulse test, t ≤ 300 µs, duty cycle d ≤ 2 %
2. IXFE44N50 IT = 22A
IXFE48N50 IT = 24A
IXFE44N50QD2 IXFE48N50QD2
IXFE44N50QD3 IXFE48N50QD3
Please note:
For characteristic curves please see
IXFK48N50Q