SL3S1205_15 UCODE 8/8m Rev. 3.4 -- 31 January 2020 398434 1 Product data sheet COMPANY PUBLIC General description The UCODE 8 and UCODE 8m ICs are the latest NXP products of the UCODE family. UCODE 8/8m offers high performance and features for use in the most demanding RFID tagging applications. Particularly well suited for inventory management applications, like e.g Retail and Fashion, with its great RF performance for any given form factor, UCODE 8/8m enables long read distance and fast inventory of dense RFID tag population. With its broadband design, it offers the possibility to manufacture true global RFID label with great performance over worldwide regulations. The device also provides a Self Adjust Feature, a Product Status Flag for Electronic Article Surveillance (EAS) application, pre-serialized 96-bit EPC, Brand Identifier and the EPC Gen2v2 compliant Untraceable command. SL3S1205_15 NXP Semiconductors UCODE 8/8m 2 Features and benefits 2.1 Key features * Read sensitivity -23 dBm * Write sensitivity -18 dBm * Innovative functionality - Self Adjust - Memory Safeguard - Brand Identifier - Untraceable - Pre-serialization for 96-bit EPC - Integrated Product Status Flag (PSF) * Compatible with single-slit antenna * Up to 128-bit EPC * 96-bit Unique Tag Identifier (TID) factory locked, including 48-bit unique serial number * EPC Gen2v2 2.1.1 Memory * * * * * * * * * SL3S1205_15 Product data sheet COMPANY PUBLIC 128-bit/96-bit (UCODE 8/UCODE 8m) of EPC memory Supports pre-serialization for 96-bit EPC 96-bit Tag IDentifier (TID) factory locked 48-bit unique serial number factory-encoded into TID 0-bit/32-bit (UCODE 8/UCODE 8m) User Memory 32-bit kill password to permanently disable the tag 32-bit access password Wide operating temperature range: -40 C up to +85 C Minimum 100k write cycle endurance All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 2 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 2.2 Supported features * All mandatory commands of EPC global specification V.2.0.1 are implemented including: - Lock or permalock - Kill Command * The following optional commands are implemented in conformance with the EPC specification: - Access - BlockWrite (2 words, 32-bit) - Untraceable * Product Status Flag bit: enables the UHF RFID tag to be used as EAS (Electronic Article Surveillance) tag without the need for a back-end database. * Self Adjust for automated tag performance optimization * Memory Safeguard: enables countermeasures, like parity and margin checks as well as automated error correction, to ensure integrity of customer data. * Brand Identifier: enables product authentication verification All supported features of UCODE 8/8m can be activated using standard EPCglobal READ / WRITE / ACCESS / SELECT commands. No custom commands are needed to take advantage of all the features. SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 3 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 3 Applications 3.1 Target market * Retail - Brick and mortar - e-commerce - omnichannel * Supply chain management * Shipping services * Airline luggage tracking * Laundry services 3.2 Applications * * * * * * High accurate and fast inventory management, enabling omnichannel retail processes Tracking along the supply chain from source to store High-speed store checkout process, bringing convenience to the customer Loss prevention Brand Protection After sales operations: Return and Warranty management Outside the applications mentioned above, please contact NXP Semiconductors for support. SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 4 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 4 Ordering information Table 1.Ordering information Type number Package Name IC type Description SL3S1205FUD/HA Wafer UCODE 8 Die on sawn 8" 120 m wafer 10 m Polyimide spacer not applicable with Large Pads SL3S1215FUD/HA Wafer UCODE 8m Die on sawn 8" 120 m wafer 10 m Polyimide spacer not applicable with Large Pads SL3S1205FUD2/HA Wafer UCODE 8 Die on sawn 12" 120 m wafer 10 m Polyimide spacer with Large Pads not applicable SL3S1215FUD2/HA Wafer UCODE 8m Die on sawn 12" 120 m wafer 10 m Polyimide spacer with Large Pads not applicable SL3S1205FUD2/KP Wafer UCODE 8 Die on sawn 12" 120 m wafer no Polyimide spacer with Fast Cure (FC) Bumps not applicable SL3S1215FUD2/KP Wafer UCODE 8m Die on sawn 12" 120 m wafer no Polyimide spacer with Fast Cure (FC) Bumps not applicable SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 Version (c) NXP B.V. 2020. All rights reserved. 5 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 5 Block diagram The UCODE 8/8m IC consists of three major blocks: * Analog Interface * Digital Control * EEPROM The analog part provides stable supply voltage and demodulates data received from the reader which is then processed by the digital part. Further, the modulation transistor of the analog part transmits data back to the reader. The digital section includes the state machines, processes the protocol and handles communication with the EEPROM, which contains the EPC and the user data. ANALOG RF INTERFACE DIGITAL CONTROL EEPROM VREG VDD RF1 DEMOD RECT antenna data in MOD data out RF2 Adjust ANTICOLLISION READWRITE CONTROL ACCESS CONTROL MEMORY EEPROM INTERFACE CONTROL Memory Safeguard CONTROL RF INTERFACE CONTROL R/W SEQUENCER CHARGE PUMP aaa-027138 Figure 1.Block diagram of UCODE 8/8m IC SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 6 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 6 Pinning information SL312x5 trademark RF2 RF1 TP1 TP2 aaa-027143 Figure 2.Pinning bare die, Large Pads SL312x5 trademark RF2 RF1 TP1 TP2 aaa-036662 Figure 3.Pinning bare die, FC Bumps 6.1 Pin description Table 2.Pin description bare die SL3S1205_15 Product data sheet COMPANY PUBLIC Symbol Description TP1 test pad 1 RF1 antenna connector 1 TP2 test pad 2 RF2 antenna connector 2 All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 7 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 7 Wafer layout (12) (1) RF2 RF1 (9) (3) (5) (8) TP1 (2) (7) TP2 (6) Y (11) X (10) (13) (4) not to scale! aaa-027144 1. Die to Die distance (metal sealring - metal sealring) 19 m, (X-scribe line width: 15 m) 2. Die to Die distance (metal sealring - metal sealring) 19 m, (Y-scribe line width: 15 m) 3. Chip step, Y-length: 490 m 4. Chip step, X-length: 480 m 5. Bump to bump distance X (RF1 - RF2): 115 m 6. Distance bump to metal sealring Y: 21.5 m 7. Bump size (TP1, TP2) Y: 100 m 8. Bump to bump distance Y (RF1 - TP2, RF2 - TP1): 50 m 9. Bump size (RF1, RF2) Y: 278 m 10. Distance bump to metal sealring X: 21.5 m 11. Bump size (TP1, TP2) X: 134.2 m 12. Bump size (RF1, RF2) X: 151.5 m 13. Distance bump to metal sealring X: 441.5 m Remark: TP1 and TP2 are electrically disconnected after dicing Figure 4.UCODE 8/8m, 8" wafer layout, Large Pads SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 8 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m (12) (1) RF2 RF1 (9) (3) (5) (8) TP1 (2) (7) TP2 (6) Y (11) X (10) (13) (4) not to scale! aaa-027144 1. Die to Die distance (metal sealring - metal sealring) 39 m, (X-scribe line width: 35 m) 2. Die to Die distance (metal sealring - metal sealring) 39 m, (Y-scribe line width: 35 m) 3. Chip step, Y-length: 510 m 4. Chip step, X-length: 500 m 5. Bump to bump distance X (RF1 - RF2): 115 m 6. Distance bump to metal sealring Y: 21.5 m 7. Bump size (TP1, TP2) Y: 100 m 8. Bump to bump distance Y (RF1 - TP2, RF2 - TP1): 50 m 9. Bump size (RF1, RF2) Y: 278 m 10. Distance bump to metal sealring X: 21.5 m 11. Bump size (TP1, TP2) X: 134.2 m 12. Bump size (RF1, RF2) X: 151.5 m 13. Distance bump to metal sealring X: 441.5 m Remark: TP1 and TP2 are electrically disconnected after dicing Figure 5. UCODE 8/8m, 12" wafer layout, Large Pads SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 9 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m (1) RF2 RF1 (5) Y (6) (4) X (7) TP1 TP2 (8) (2) (3) not to scale! 1. 2. 3. 4. 5. 6. 7. 8. aaa-036663 Die to Die distance (metal sealring - metal sealring) 39 m, (X-scribe line width: 35 m) Die to Die distance (metal sealring - metal sealring) 39 m, (Y-scribe line width: 35 m) Chip step, Y-length: 510 m Chip step, X-length: 500 m Bump to bump distance X (RF1 - RF2): 378 m Bump to bump distance Y (RF1 - TP2): 388 m Distance bump to metal sealring X: 40.3 m Distance bump to metal sealring Y: 40.3 m Bump size X x Y : 60 m x 60 m Remark: TP1 and TP2 are electrically disconnected after dicing Figure 6. UCODE 8/8m, 12" wafer layout, FC Bumps SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 10 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 8 Mechanical specification The UCODE 8 wafers are available in 120 m thickness. For Large Gold Pads the 120 m thick wafer is enhanced with 10 m Polyimide spacer resulting in less coupling between the antenna and the active circuit, leaving a larger process window for assembly. Delivery options with Fast Cure (FC) come with higher and harder bumps to reduce the assembly capacitance which eliminates the need for the Polyimide spacer, hereby enabling faster curing of the glue. 8.1 Wafer specification 8.1.1 8 inch Wafer with Large Pads See "Data sheet - Delivery type description - General specification for 8" wafer on UVtape with electronic fail die marking, BU-S&C document number: 1093**" Table 3.8 inch specification with Large Pads Wafer Designation each wafer is scribed with batch number and wafer number Diameter 200 mm (8") unsawn- 205 mm typical sawn on foil Thickness 120 m 15 m Number of pads 4 Pad location non-diagonal / placed in chip corners Process CMOS 0.14 m Batch size 25 wafers Net printed dies per wafer 120794 Wafer backside Material Si Treatment ground and stress release Roughness Ra max. 0.5 m, Rt max. 5 m Chip dimensions 2 Die size excluding scribe 0.465 mm x 0.475 mm = 0.22 mm Scribe line width: x-dimension = 15 m y-dimension = 15 m Passivation on front Type Sandwich structure Material PE-Nitride (on top) Thickness 1.75 m total thickness of passivation Polyimide spacer 10 m 2 m Au pads SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 11 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m Pad material > 99.9 % pure Au Pad hardness 35 - 80 HV 0.005 Pad shear strength > 70 MPa Pad height 3 m Pad height uniformity - within a die max. 2 m - within a wafer max. 4 m Pad flatness max. 3 m Pad size - RF1, RF2 (max. details see wafer layout) 151.5 m x 278 m - TP1, TP2 (max. details see wafer layout) 134.2 m x 100 m Pad size variation 5 m 8.1.2 12 inch Wafer with Large Pads See "Data sheet - Delivery type description - General specification for 12" wafer on UVtape with electronic fail die marking, BU-S&C document number: 1862**" Table 4.12 inch specification with Large Pads Wafer Designation each wafer is scribed with batch number and wafer number Diameter 300 mm (12") unsawn Thickness 120 m 15 m Number of pads 4 Pad location non-diagonal / placed in chip corners Process CMOS 0.14 m Batch size 25 wafers Net printed dies per wafer 258934 Wafer backside Material Si Treatment ground and stress release Roughness Ra max. 0.5 m, Rt max. 5 m Chip dimensions 2 Die size excluding scribe 0.465 mm x 0.475 mm = 0.22 mm Scribe line width: x-dimension = 35 m y-dimension = 35 m Passivation on front SL3S1205_15 Product data sheet COMPANY PUBLIC Type Sandwich structure Material PE-Nitride (on top) All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 12 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m Thickness 1.75 m total thickness of passivation Polyimide spacer 10 m 2 m Au pads Pad material > 99.9 % pure Au Pad hardness 35 - 80 HV 0.005 Pad shear strength > 70 MPa Pad height 3 m Pad height uniformity - within a die max. 2 m - within a wafer max. 4 m Pad flatness max. 3 m Pad size - RF1, RF2 (max. details see wafer layout) 151.5 m x 278 m - TP1, TP2 (max. details see wafer layout) 134.2 m x 100 m Pad size variation 5 m 8.1.3 12 inch Wafer with FC bumps See "Data sheet - Delivery type description - General specification for 12" wafer on UVtape with electronic fail die marking, BU-S&C document number: 1862**" Table 5.12 inch specification with Large Pads Wafer Designation each wafer is scribed with batch number and wafer number Diameter 300 mm (12") unsawn Thickness 120 m 15 m Number of pads 4 Pad location non-diagonal / placed in chip corners Process CMOS 0.14 m Batch size 25 wafers Net printed dies per wafer 258934 Wafer backside Material Si Treatment ground and stress release Roughness Ra max. 0.5 m, Rt max. 5 m Chip dimensions 2 Die size excluding scribe 0.465 mm x 0.475 mm = 0.22 mm Scribe line width: x-dimension = 35 m y-dimension = 35 m SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 13 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m Passivation on front Type Sandwich structure Material PE-Nitride (on top) Thickness 1.75 m total thickness of passivation FC bumps Bump material Cu, Ni, Au (21/2/0.5m) Bump shear strength > 70MPa Bump height 23.5 m Bump height uniformity - within a die max. 2 m - within a wafer max. 4 m Bump size X x Y 60 m x 60 m Bump size variation 3 m 8.1.4 Fail die identification No ink dots are applied to the wafer. Electronic wafer mapping (SECS II format) covers the electrical test results and additionally the results of mechanical/visual inspection. See "Data sheet - Delivery type description - General specification for 8" wafer on UVtape with electronic fail die marking, BU-S&C document number: 1093**" See "Data sheet - Delivery type description - General specification for 12" wafer on UVtape with electronic fail die marking, BU-S&C document number: 1862**" 8.1.5 Map file distribution See "Data sheet - Delivery type description - General specification for 8" wafer on UVtape with electronic fail die marking, BU-S&C document number: 1093**" See "Data sheet - Delivery type description - General specification for 12" wafer on UVtape with electronic fail die marking, BU-S&C document number: 1862**" SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 14 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 9 Functional description 9.1 Air interface standards TM The UCODE 8/8m fully supports all parts of the "EPC Radio-Frequency Identity Protocols Generation-2 UHF RFID, Specification for RFID Air Interface, Protocol for Communications at 860 MHz to 960 MHz, Version 2.0.1". 9.2 Power transfer The interrogator provides an RF field that powers the tag, equipped with a UCODE 8/8m. The antenna transforms the impedance of free space to the chip input impedance in order to get the maximum power for the UCODE 8/8m on the tag. The RF field, which is oscillating on the operating frequency provided by the interrogator, is rectified to provide a smoothed DC voltage to the analog and digital modules of the IC. The antenna that is attached to the chip may use a DC connection between the two antenna pads. Therefore the UCODE 8/8m also enables loop antenna design. 9.3 Data transfer 9.3.1 Interrogator to tag Link An interrogator transmits information to the UCODE 8/8m by modulating an UHF RF signal. The UCODE 8/8m receives both information and operating energy from this RF signal. Tags are passive, meaning that they receive all of their operating energy from the interrogator's RF waveform. An interrogator is using a fixed modulation and data rate for the duration of at least one inventory round. It communicates to the UCODE 8/8m by modulating an RF carrier. For further details, refer to "Interrogator-to-tag (R=>T) communications" 9.3.2 Tag to interrogator Link Upon transmitting a valid command, an interrogator receives information from a UCODE 8/8m tag by transmitting an unmodulated RF carrier and listening for a backscattered reply. The UCODE 8/8m backscatters by switching the reflection coefficient of its antenna between two states in accordance with the data being sent. For further details, refer to "Tag-to-Interrogator (T=>R) communications" The UCODE 8/8m communicates information by backscatter-modulating the amplitude and/or phase of the RF carrier. Interrogators shall be capable of demodulating either demodulation type. The encoding format, selected in response to interrogator commands, is either FM0 baseband or Miller-modulated subcarrier. SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 15 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 9.4 Supported commands The UCODE 8/8m supports all mandatory EPCglobal V2.0.1 commands including * KILL command * PERMALOCK or LOCK command In addition the UCODE8/8m supports the following optional commands: * ACCESS * Block Write (32 bit) on even addresses * Untraceable 9.5 UCODE 8/8m memory The UCODE 8/8m memory is implemented according to EPCglobal V2.0.1: Table 6.UCODE 8 memory sections Name Size Bank Reserved memory (32-bit Access and 32 bit Kill password) 64 bit 00b EPC (excluding 16 bit CRC-16 and 16-bit PC) 128 bit 01b UCODE 8 Configuration Word 16 bit 01b TID (including permalocked unique 48-bit serial number) 96 bit 10b Name Size Bank Reserved memory (32-bit Access and 32 bit Kill password) 64 bit 00b EPC (excluding 16 bit CRC-16 and 16-bit PC) 96 bit 01b UCODE 8 Configuration Word 16 bit 01b TID (including permalocked unique 48-bit serial number) 96 bit 10b User Memory 32 bit 11b Table 7.UCODE 8m memory sections The logical address of all memory banks begins at zero (00h). In addition to the four memory banks, one configuration word to handle the UCODE 8/8m specific features is available at EPC bank 01 address bit-200h. The configuration word is described in detail in Section 9.6.1 The TID complies to the GS1 EPC Tag Data Standard. See "EPC Tag Data Standard, Release 1.10" SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 16 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 9.5.1 UCODE 8/8m overall memory map Table 8.UCODE 8 overall memory map Bank Address Type Content Initial Remark Bank 00 00h to 1Fh reserved Kill password all 00h unlocked memory 20h to 3Fh reserved Access password all 00h unlocked memory 00h to 0Fh EPC CRC-16: refer to "EPC Global Gen2v2" 10h to 14h EPC EPC length 00110b unlocked memory 15h EPC UMI 0b hardwired to 0 16h EPC XPC indicator 0b hardwired to 0 17h to 1Fh EPC numbering system indicator 00h unlocked memory unlocked memory Bank 01 EPC Bank 01 Config Word Bank 10 TID 20h to 9Fh EPC EPC [1] 200h EPC EPC check 0b indicator bit 201h EPC EPC correction 0b indicator bit 202h EPC EPC NOK 0b indicator bit 203h EPC EPC+TID 0b action bit [2] 204h EPC Brand Identifier 0b action bit [2] 205h EPC Self Adjust Cap 1 0b indicator bit 206h EPC Self Adjust Cap 0 0b indicator bit 207h EPC Self Adjust disable 0b permanent bit 208h EPC RFU 0b locked memory 209h EPC max. backscatter strength 1b permanent bit 20Ah EPC RFU 0b locked memory 20Bh EPC RFU 0b locked memory 20Ch EPC RFU 0b locked memory 20Dh EPC RFU 0b locked memory 20Eh EPC RFU 0b locked memory 20Fh EPC PSF flag 0b permanent bit 00h to 07h TID allocation class identifier 1110 0010b locked memory 08h to 13h TID tag mask designer identifier 1000 0000 0110b locked memory 14h [1] [2] [3] [4] [5] memory mapped calculated CRC TID config word indicator 1b [4] [3] [3] [3] locked memory [5] 15h to 1Fh TID tag model number TMNR locked memory 20h to 2Fh TID XTID header 2000h locked memory 30h to 5Fh TID serial number SNR locked memory HEX E280 6894 0000 nnnn nnnn nnnn 0000 0000 where n are the nibbles of the SNR from the TID Action bits: meant to trigger a feature upon a SELECT command on the related bit ref feature control mechanism, see Section 9.6.1 Permanent bit: permanently stored bits in the memory; Read/Writeable according to EPC bank lock status, see Section 9.6.1 Indicates the existence of a Configuration Word at the end of the EPC number See Figure 7 SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 17 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m Table 9.UCODE 8m overall memory map Bank Address Type Content Initial Remark Bank 00 00h to 1Fh reserved Kill password all 00h unlocked memory 20h to 3Fh reserved Access password all 00h unlocked memory 00h to 0Fh EPC CRC-16: refer to "EPC Global Gen2v2" 10h to 14h EPC EPC length 00110b unlocked memory 15h EPC UMI 1b hardwired to 1 16h EPC XPC indicator 0b hardwired to 0 17h to 1Fh EPC numbering system indicator 00h unlocked memory unlocked memory Bank 01 EPC Bank 01 Config Word Bank 10 TID memory mapped calculated CRC 20h to 7Fh EPC EPC [1] 200h EPC EPC check 0b indicator bit 201h EPC EPC correction 0b indicator bit 202h EPC EPC NOK 0b indicator bit 203h EPC EPC+TID 0b action bit [2] 204h EPC Brand Identifier 0b action bit [2] 205h EPC Self Adjust Cap 1 0b indicator bit 206h EPC Self Adjust Cap 0 0b indicator bit 207h EPC Self Adjust disable 0b permanent bit 208h EPC RFU 0b locked memory 209h EPC max. backscatter strength 1b permanent bit 20Ah EPC RFU 0b locked memory 20Bh EPC RFU 0b locked memory 20Ch EPC User Memory check 0b indicator bit 20Dh EPC User Memory correction 0b indicator bit 20Eh EPC User Memory NOK 0b indicator bit 20Fh EPC PSF flag 0b permanent bit 00h to 07h TID allocation class identifier 1110 0010b locked memory 08h to 13h TID tag mask designer identifier 1000 0000 0110b locked memory 14h TID config word indicator 1b [4] [3] [3] [3] locked memory [5] 15h to 1Fh TID tag model number TMNR locked memory 20h to 2Fh TID XTID header 2000h locked memory 30h to 5Fh TID serial number SNR locked memory Bank 11 00h to 1Fh User Memory UM User Memory all 00h unlocked memory [1] [2] [3] [4] [5] HEX E280 6994 0000 nnnn nnnn nnnn where n are the nibbles of the SNR from the TID Action bits: meant to trigger a feature upon a SELECT command on the related bit ref feature control mechanism, see Section 9.6.1 Permanent bit: permanently stored bits in the memory; Read/Writeable according to EPC bank lock status, see Section 9.6.1 Indicates the existence of a Configuration Word at the end of the EPC number See Figure 7 SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 18 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 9.5.2 UCODE 8/8m TID memory details Model Number First 48 bit of TID memory Class ID Mask Designer ID UCODE 8 E28068942000 E2h 806h 1b 0001b 0010100b 2000h UCODE 8m E28069942000 E2h 806h 1b 0011b 0010100b 2000h Addresses Config Word Indicator 00h Sub Version Version Nr. (Silicon) Nr. XTID Header 5Fh TID MS Byte MSBit Bit Address 00h LS Byte LSBit 07h 08h Class Identifier Bits 7 MSBit E2h (EAN.UCC) 13h 14h Mask-Designer Identifier 0 11 0 806h (NXP; with XTID) Address Bits 14h 1Fh 20h 2Fh 30h Model Number 11 XTID 0 894h (UCODE 8) 994h (UCODE 8m) 15 2000h (indication of 48bit unique SNR) 18h 19h C. W. I. 0 Sub Version Number 3 0001b 1b 0011b 5Fh Serial Number 0 47 000000000000h to FFFFFFFFFFFFh 0 1Fh Model Number 0 6 1b LSBit 0 0010100b (UCODE 8) 0010100b (UCODE 8m) aaa-027137 Figure 7.UCODE 8/8m TID memory structure SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 19 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 9.6 Supported features The UCODE 8/8m is equipped with a number of additional features. They are implemented in such a way that standard EPCglobal READ / WRITE / ACCESS / SELECT commands can be used to operate these features. The Configuration Word, as mentioned in the memory map, describes the additional features at address 200h of the EPC memory. Bit 14h of the TID indicates the existence of a Configuration Word. This flag enables the selection of configuration word enhanced transponders in mixed tag populations. 9.6.1 UCODE 8/8m features control mechanism The different features of the UCODE 8/8m can be activated / de-activated by addressing or changing the content of the corresponding bit in the configuration word at address 200h in the EPC memory bank (see Table 10). The de-activation of the action bit features will only happen after chip reset. Table 10.Configuration word UCODE 8/8m Indicator bit Action bit Permanent bit Indicator bit EPC Check EPC Corr EPC NOK EPC+TID Brand Identifier Self Adjust Cap 1 Self Adjust Cap 0 Self Adjust disable 0 1 2 3 4 5 6 7 Table 11.Configuration word UCODE 8/8m ... continued Locked Permanent memory bit Locked memory Permanent bit Indicator bit RFU max.backsca RFU tter strength RFU User Memory User Memory User Memory PSF bit Check Corr NOK 8 9 11 12 10 13 14 15 The configuration word contains 3 different type of bits: * Action bits: meant to trigger a feature upon a SELECT command on the related bit: EPC+TID Brand Identifier * Permanent bits: permanently stored bits in the memory Self Adjust disable Max. Backscatter Strength PSF Alarm bit * Indicator bits: cannot be changed by command EPC Check/Corr/NOK User Memory Check/Corr/NOK Self Adjust Cap0/Cap1 The activation or the de-activation of the feature behind the permanent bits happens only when attempting to write a "1" value to the related bit (value toggling) - writing "0" value has no effect. If the feature is activated, the related bit will be read with a "1" value and, if SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 20 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m de-activated, with a "0" value. The permanent bits can only be toggled by using standard EPC WRITE (not a BlockWrite) if the EPC bank is unlocked or within the SECURED state if the EPC is locked. If the EPC is permalocked, they cannot be changed. Action bits will trigger a certain action only if the pointer of the SELECT command exactly matches the action-bit address (i.e. 203h or 204h), if the length=1 and if mask=1b (no multiple triggers of actions possible within one single SELECT command). If the truncate bit in the SELECT command is set to "1", the SELECT will be ignored. A SELECT on action bits will not change the digital state of the chip. The action bits can be triggered regardless if the EPC memory is unlocked, locked or permalocked. SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 21 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 9.6.2 Memory Safeguard 9.6.2.1 Description The Memory Safeguard of UCODE 8/8m consist of three different countermeasures which ensure integrity of the stored data: ECC (Error correction code): The implemented ECC is applied on the EPC- and User-Memory. With this feature, a single bit failure in the memory is detected and corrected automatically. In case of 2 bit fail, an indication is given. EPC Memory: The config word bit 200h (EPC check) indicates, if the EPC check is active ("1"). In case a single bit was corrected this will be indicated by the bit 201h (EPC Corr). Should a 2-bit failure occur bit 202h (EPC NOK) will be activated ("1"). In this case, no error correction will be applied and the EPC memory content readout will provide the actual content. User Memory: The config word bit 20Ch (User Memory check) indicates if the User Memory check is active ("1"). In case a single bit was corrected this will be indicated by the bit 20Dh (User Memory Corr). Should a 2-bit failure occur, bit 20Eh (User Memory NOK) will be activated ("1"). In this case, no error correction will be applied and the User Memory content readout will provide the actual content. This feature will be activated in case a Lock operation is applied on the according memory bank. If there is a password lock and a change of the memory content in the secured state, the ECC will be not re-calculated and the feature is disabled. To re-enable the ECC functionality also in this condition, an unlock and re-lock is required. Parity check: A parity check on the TID is implemented to offer the possibility to identify a change in the TID. The parity bit (Even parity) will be calculated and locked in the manufacturing process. For a check, the TID content needs to be read out and parity checked. Margin Check The implemented margin check is acting on the EPC-, Reserved- and User-Memory. During performing a Lock operation on the targeted memory bank the IC checks for sufficient programming margin of the memory cell and only responds after a successful check. In case of insufficient margin an error code will be responded and the Lock not completed. A re-check on already locked memory banks requires an unlock and re-lock command. SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 22 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 9.6.3 Self Adjust 9.6.3.1 Description The UCODE 8/8m has an automatic mechanism implemented which adjusts the chip sensitivity to a maximum in the operated environment. This adjustment will be performed at startup and selects between three different input capacitance values. The feature is enabled by default, but can also be deactivated by the config word bit 207h (Self Adjust disable). In case of deactivation, the center capacitance is used. The indicator bits 205h (Self Adjust Cap 1) and 206h (Self Adjust Cap 0) give information which capacitor is active ("1"). The startup is performed with the lowest value which is center capacitance minus Cap 0 (60 fF) and is then adjusted up to center capacitance plus Cap 1 (100 fF). 9.6.4 Brand Identifier 9.6.4.1 Description This new feature allows brand owners to implement a product originality check option for their products. The customer dedicated unique 16-bit brand identifier is programmed during manufacturing process by NXP and therefore unalterable stored in the memory. A SELECT command on bit 204h (Brand identifier) in the configuration word triggers the UCODE8/8m to respond in the inventory round with PC + EPC + Brand Identifier + CRC. In order to prevent manipulation, the Brand Identifier is scrambled with the RN16 and not sent in plain. The implemented scrambling is performed by bitwise XOR operation of the 16-bit Brand Identifier and the RN16. At the reader, the Brand identifier can be descrambled and the originality check completed. The PC value is adjusted accordingly for UCODE 8/8m. A SELECT on the Brand Identifier bit always gives a Tag matching. The usage of this feature requires an update on the reader firmware with the Brand Identifier check routine. Default value of the UCODE 8/8m Brand Identifier is "AAAAh". Customer-specific Brand Identifiers can be requested by a dedicated product ordering code. For details, contact your NXP sales representative. The Brand Identifier feature cannot be used in combination with the EPC+TID feature. SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 23 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 9.6.5 EPC+TID 9.6.5.1 Description This feature enables the read out the EPC+TID memory content in a faster way compared to a standard readout sequence. A SELECT on the config word bit 203h (EPC+TID) will trigger the UCODE 8/8m to reply with the EPC+TID after receiving the ACK command during the inventory round. In case only the TID should be replied by this feature, the EPC length in the PC needs to be set to "0". 9.6.6 Product Status Flag (PSF) 9.6.6.1 Description The PSF bit can be used for easy EAS (Electronic Article Surveillance) implementations or as general-purpose check flag. In order to detect tags with activated PSF, a SELECT command on bit 20Fh (PSF Bit) in the configuration word is required. In the following inventory round, only PSF enabled chips reply their EPC number. 9.6.7 Backscatter strength reduction The UCODE 8/8m features two levels of backscatter strengths. Per default, maximum backscatter is enabled in order to enable maximum read rates. A deactivation of this feature can be done by clearing bit 209h (max. backscatter strength) in the configuration word, which reduces the backscatter strength if needed. 9.6.8 Pre-serialization of the 96-bit EPC 9.6.8.1 Description UCODE 8/8m are delivered with a pre-serialized content of the 96-bit EPC, which is the initial EPC length settings of UCODE 8/8m. The EPC content is identical to the TID content except of the 16-bit XTID content which is set to 16-bit 0's. TID Class Identifier Bits 7 Bits 7 Class Identifier serialized EPC Mask-Designer Identifier 0 11 0 Model Number 11 Mask-Designer Identifier 0 11 0 XTID 0 15 0 15 Model Number 11 Serial Number 0 47 0000 0000 0000 0000 0 Serial Number 0 47 0 aaa-027142 Figure 8.Pre-serialization of 96-bit EPC SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 24 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 9.6.9 Single-slit antenna solution 9.6.9.1 Description In UCODE 8/8m, the test pads TP1 and TP2 are electrically disconnected and therefore can be safely short-circuited to the RF pads (RF1, RF2) (see figure below). Single-slit antenna enables easier assembly and antenna design. In addition to the standard antenna assembly, the related increased input capacitance (see Table 16) can be used for optimization for different antenna design. standard assembly RF2 RF1 TP1 TP2 supporting pads aaa-027139 Figure 9.Standard antenna design versus single-slit antenna single-slit assembly RF2 RF1 TP1 TP2 aaa-027351 Figure 10.Single-slit assembly SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 25 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 9.6.10 Large Pads 9.6.10.1 Description The large gold pads introduced in UCODE 8/8m enable more robust and reliable assembly. The new pad design allows not only more freedom in the placement accuracy (see "Rotation tolerant pad design" ). It also brings advantages in high-speed assembly due to the dual axis glue spacer (see "Dual axis glue spacer" ). RF1 RF2 TP2 TP1 RF2 RF1 TP1 TP2 RF2 TP1 RF1 T P2 aaa-027141 Figure 11.Rotation tolerant pad design RF2 RF1 TP1 TP2 aaa-027140 Figure 12.Dual axis glue spacer SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 26 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 9.6.11 FC Bumps 9.6.11.1 Description Delivery options with FC come with higher and harder bumps and no Polyimide spacer. Due to elimination of the PI spacer a better heat transfer between thermode, IC, antenna and glue can be achieved. As a result faster curing of the glue is enabled. The bump structure (see Table 12) is required to decrease the spread of the assembly capacitance. Table 12.FC Bump structure SL3S1205_15 Product data sheet COMPANY PUBLIC Material typ. height Bump top Gold 0.5 m Bump center Nickel 2 m Bump bottom Copper 21 m All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 27 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 9.6.12 Custom commands The Untraceable function allows the UCODE 8/8m to hide the complete or parts of the EPC, TID and/or user memory. In addition, the read range can be completely or temporarily reduced. This command can only be executed from the secured state. Memory parts which are set untraceable are acting as non-existing in the Open state. EPC-field: Specifies the number of words of the EPC memory which the UCODE 8/8m back scatters. A change of this field therefore also changes the L bit in the Protocol Control (PC) word. TID-field: Hide some ("01") hides the TID memory from address 20h (included) onwards. Range-field: In case of activated range toggling, the read range reduction toggles from the actual value to the second (e.g. when actual state is normal it toggles to reduced). In case of power loss the chip reverts to its prior state. UCODE 8/8m does not support the U bit and therefore ignores this value. Table 13.Untraceable command No. of bits Command RFU U EPC TID User Range RN CRC 16 2 1 6 2 1 2 16 16 00 do not care MSB:"0": show memory above EPC "1": hide memory above EPC 5 LSBs: new EPC length "00": hide none "0": "00": normal "01": hide some view "01": toggle "1": hide "10": hide all "10": reduced "11": RFU "11": RFU Description 1110 0010 0000 0000 handle CRC-16 Table 14.Untraceable command-response table Starting State Condition Response Next State ready all - ready arbitrate, reply, acknowledged all - arbitrate open all - open secured executable backscatter header when done secured killed all - killed In case of access to the memory that is set to untraceable, the error condition "memory overrun" is returned. For further details, refer to "EPC Global Gen2v2" SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 28 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 10 Limiting values Table 15.Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to [1] [2] RFN. Symbol Parameter Conditions Min Max Unit -55 +125 C -40 +85 C - 2 kV - 100 mW Bare die limitations Tstg storage temperature Tamb ambient temperature VESD electrostatic discharge voltage Human body model [3] [4] Pad limitations Pi [1] [2] [3] [4] input power maximum power dissipation, RF1/RF2 pad Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any conditions other than those described in the Operating Conditions and Electrical Characteristics section of this specification is not implied. This product includes circuitry specifically designed for the protection of its internal devices from the damaging effects of excessive static charge. Nonetheless, it is suggested that conventional precautions be taken to avoid applying greater than the rated maxima. For ESD measurement, the die chip has been mounted into a CDIP20 package. HBM: ANSI/ESDA/JEDEC JS-001 CAUTION This device is sensitive to ElectroStatic Discharge (ESD). Observe precautions for handling electrostatic sensitive devices. Such precautions are described in the ANSI/ESD S20.20, IEC/ST 61340-5, JESD625-A or equivalent standards. SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 29 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 11 Characteristics 11.1 UCODE 8/8m bare die characteristics Table 16.UCODE 8/8m RF interface characteristics (RF1, RF2) Symbol Parameter fi input frequency Pi(min) Pi(min) t 16bit Ci Conditions minimum input power minimum input power encoding speed chip input capacitance, Large Pads Z chip impedance, Large Pads Max Unit 840 - 960 MHz READ sensitivity - - 22.9 - dBm reduced operating range [4] - +1 - dBm WRITE sensitivity [4] - -17.8 - dBm 16-bit [5] - 0.7 - ms 32-bit (block write) [5] - 1.2 - ms parallel [2] [6] [7] - 0.69 - pF 866 MHz [2] [6] [7] - 15-j265 - 915 MHz [2] [6] [7] - 14-j252 - 953 MHz [2] [6] [7] - 13-j242 - - 19-j234 Z typical assembled impedance, Large Pads (see Figure 9) 915 MHz Z typical assembled impedance in case of single-slit antenna assembly, Large Pads (see Figure 10) 915 MHz [8] [10] Ci chip input capacitance, FC Bumps parallel [2] [6] [7] 866 MHz [2] [6] [7] 915 MHz [2] [6] [7] 953 MHz [2] [6] [7] 915 MHz [8] [10] chip impedance, FC Bumps Typ [1] [2] [3] [8] [9] [7] Z Min Z typical assembled impedance in case of single-slit antenna assembly, FC Bumps [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] Power to process a QUERY command Measured with a 50 source impedance directly on the chip Results in approximately -23 dBm tag sensitivity with a 2.15 dBi gain antenna Tag sensitivity on a 2.15 dBi gain antenna When the memory content is "0000...". At minimum operating power at center capacitor of Self Adjust The antenna shall be matched to this impedance Assuming 50ff additional assembly capacitance Assuming 220ff additional assembly+test pad capacitance 13-j191 - - 0.635 - pF - 17-j288 - - 15-j274 - - 14-j263 - 15-j203 - [7] [7] Table 17.UCODE 8/8m memory characteristics Symbol Parameter Conditions Min Typ Max Unit Tamb 55 C 20 - - year 100k - - cycle EEPROM characteristics SL3S1205_15 Product data sheet COMPANY PUBLIC tret retention time Nendu(W) write endurance All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 30 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 12 Packing information 12.1 Wafer See "Data sheet - Delivery type description - General specification for 8" wafer on UVtape with electronic fail die marking, BU-S&C document number: 1093**" See "Data sheet - Delivery type description - General specification for 12" wafer on UVtape with electronic fail die marking, BU-S&C document number: 1862**" SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 31 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 13 Abbreviations Table 18.Abbreviations SL3S1205_15 Product data sheet COMPANY PUBLIC Acronym Description CRC Cyclic Redundancy Check CW Continuous Wave DSB-ASK Double Side Band-Amplitude Shift Keying DC Direct Current EAS Electronic Article Surveillance EEPROM Electrically Erasable Programmable Read Only Memory EPC Electronic Product Code (containing Header, Domain Manager, Object Class and Serial Number) FM0 Bi phase space modulation G2 Generation 2 IC Integrated Circuit PIE Pulse Interval Encoding PSF Product Status Flag RF Radio Frequency UHF Ultra High Frequency SECS Semi Equipment Communication Standard TID Tag IDentifier All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 32 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 14 References 1. EPCglobal: EPC Radio-Frequency Identity Protocols Class-1 Generation-2 UHF RFID Protocol for Communications at 860 MHz - 960 MHz, Version 2.0.1 (April 2015) 2. EPCglobal: EPC Tag Data Standard, Release 1.10 (March 2017) 3. Data sheet - Delivery type description - General specification for 8" wafer on UV-tape with electronic fail die marking, BU-S&C document number: 1093** 4. Data sheet - Delivery type description - General specification for 12" wafer on UV1 tape with electronic fail die marking, BU-S&C document number: 1862** 1 ** ... document version number SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 33 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 15 Revision history Table 19.Revision history Document ID Release date Data sheet status Change notice Supersedes SL3S1205_15 v. 3.4 20200131 Product data sheet - SL3S1205_15 v. 3.3 Modifications: * Introduction of 12 inch FC Bumps SL3S1205_15 v. 3.3 20191028 - SL3S1205_15 v. 3.2 Modifications: * Section 8.1.2 "12 inch Wafer with Large Pads": number of PGDW changed into 258934 SL3S1205_15 v. 3.2 20181119 Modifications: * * * * * SL3S1205_15 v. 3.1 20170630 Modifications: * Wording: "Auto Adjust" replaced with "Self Adjust" SL3S1205_15 v. 3.0 20170703 398420 398410 SL3S1205_15 Product data sheet COMPANY PUBLIC Product data sheet Product data sheet - SL3S1205_15 v. 3.1 Introduction of 12 inch wafer delivery Figure 4 "UCODE 8/8m, 8" wafer layout, Large Pads" updated Editorial changes in Table 8 "UCODE 8 overall memory map" Editorial changes in Table 9 "UCODE 8m overall memory map" Section 9.6.4 "Brand Identifier" updated Product data sheet - SL3S1205_15 v. 3.0 Product data sheet - 398420 20170531 Preliminary data sheet - 398410 20160919 Objective data sheet - - All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 34 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m 16 Legal information 16.1 Data sheet status Document status [1][2] Product status [3] Definition Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification. [1] [2] [3] Please consult the most recently issued document before initiating or completing a design. The term 'short data sheet' is explained in section "Definitions". The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. notice. This document supersedes and replaces all information supplied prior to the publication hereof. 16.2 Definitions Draft -- The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet -- A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. Product specification -- The information and data provided in a Product data sheet shall define the specification of the product as agreed between NXP Semiconductors and its customer, unless NXP Semiconductors and customer have explicitly agreed otherwise in writing. In no event however, shall an agreement be valid in which the NXP Semiconductors product is deemed to offer functions and qualities beyond those described in the Product data sheet. 16.3 Disclaimers Limited warranty and liability -- Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP Semiconductors takes no responsibility for the content in this document if provided by an information source outside of NXP Semiconductors. In no event shall NXP Semiconductors be liable for any indirect, incidental, punitive, special or consequential damages (including - without limitation - lost profits, lost savings, business interruption, costs related to the removal or replacement of any products or rework charges) whether or not such damages are based on tort (including negligence), warranty, breach of contract or any other legal theory. Notwithstanding any damages that customer might incur for any reason whatsoever, NXP Semiconductors' aggregate and cumulative liability towards customer for the products described herein shall be limited in accordance with the Terms and conditions of commercial sale of NXP Semiconductors. Right to make changes -- NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without SL3S1205_15 Product data sheet COMPANY PUBLIC Suitability for use -- NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in life support, life-critical or safety-critical systems or equipment, nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors and its suppliers accept no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer's own risk. Applications -- Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Customers are responsible for the design and operation of their applications and products using NXP Semiconductors products, and NXP Semiconductors accepts no liability for any assistance with applications or customer product design. It is customer's sole responsibility to determine whether the NXP Semiconductors product is suitable and fit for the customer's applications and products planned, as well as for the planned application and use of customer's third party customer(s). Customers should provide appropriate design and operating safeguards to minimize the risks associated with their applications and products. NXP Semiconductors does not accept any liability related to any default, damage, costs or problem which is based on any weakness or default in the customer's applications or products, or the application or use by customer's third party customer(s). Customer is responsible for doing all necessary testing for the customer's applications and products using NXP Semiconductors products in order to avoid a default of the applications and the products or of the application or use by customer's third party customer(s). NXP does not accept any liability in this respect. Limiting values -- Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) will cause permanent damage to the device. Limiting values are stress ratings only and (proper) operation of the device at these or any other conditions above those given in the Recommended operating conditions section (if present) or the Characteristics sections of this document is not warranted. Constant or repeated exposure to limiting values will permanently and irreversibly affect the quality and reliability of the device. Terms and conditions of commercial sale -- NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, unless otherwise agreed in a valid written individual agreement. In case an individual agreement is concluded only the terms and conditions of the respective agreement shall apply. NXP Semiconductors hereby expressly objects to applying the customer's general terms and conditions with regard to the purchase of NXP Semiconductors products by customer. All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 35 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m No offer to sell or license -- Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. risk, and (c) customer fully indemnifies NXP Semiconductors for any liability, damages or failed product claims resulting from customer design and use of the product for automotive applications beyond NXP Semiconductors' standard warranty and NXP Semiconductors' product specifications. Quick reference data -- The Quick reference data is an extract of the product data given in the Limiting values and Characteristics sections of this document, and as such is not complete, exhaustive or legally binding. Translations -- A non-English (translated) version of a document is for reference only. The English version shall prevail in case of any discrepancy between the translated and English versions. Export control -- This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from competent authorities. Security -- While NXP Semiconductors has implemented advanced security features, all products may be subject to unidentified vulnerabilities. Customers are responsible for the design and operation of their applications and products to reduce the effect of these vulnerabilities on customer's applications and products, and NXP Semiconductors accepts no liability for any vulnerability that is discovered. Customers should implement appropriate design and operating safeguards to minimize the risks associated with their applications and products. Non-automotive qualified products -- Unless this data sheet expressly states that this specific NXP Semiconductors product is automotive qualified, the product is not suitable for automotive use. It is neither qualified nor tested in accordance with automotive testing or application requirements. NXP Semiconductors accepts no liability for inclusion and/or use of nonautomotive qualified products in automotive equipment or applications. In the event that customer uses the product for design-in and use in automotive applications to automotive specifications and standards, customer (a) shall use the product without NXP Semiconductors' warranty of the product for such automotive applications, use and specifications, and (b) whenever customer uses the product for automotive applications beyond NXP Semiconductors' specifications such use shall be solely at customer's own 16.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. UCODE -- is a trademark of NXP B.V. SL3S1205_15 Product data sheet COMPANY PUBLIC All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 36 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m Tables Tab. 1. Tab. 2. Tab. 3. Tab. 4. Tab. 5. Tab. 6. Tab. 7. Tab. 8. Tab. 9. Tab. 10. Ordering information ..........................................5 Pin description bare die .................................... 7 8 inch specification with Large Pads ............... 11 12 inch specification with Large Pads ............. 12 12 inch specification with Large Pads ............. 13 UCODE 8 memory sections ............................ 16 UCODE 8m memory sections ......................... 16 UCODE 8 overall memory map .......................17 UCODE 8m overall memory map ....................18 Configuration word UCODE 8/8m ................... 20 SL3S1205_15 Product data sheet COMPANY PUBLIC Tab. 11. Tab. 12. Tab. 13. Tab. 14. Tab. 15. Tab. 16. Tab. 17. Tab. 18. Tab. 19. Configuration word UCODE 8/8m ... continued ......................................................... 20 FC Bump structure ..........................................27 Untraceable command .................................... 28 Untraceable command-response table ............28 Limiting values ................................................ 29 UCODE 8/8m RF interface characteristics (RF1, RF2) ...................................................... 30 UCODE 8/8m memory characteristics .............30 Abbreviations ...................................................32 Revision history ...............................................34 All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 37 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m Figures Fig. 1. Fig. 2. Fig. 3. Fig. 4. Fig. 5. Fig. 6. Fig. 7. Block diagram of UCODE 8/8m IC ....................6 Pinning bare die, Large Pads ............................7 Pinning bare die, FC Bumps ............................. 7 UCODE 8/8m, 8" wafer layout, Large Pads .......8 UCODE 8/8m, 12" wafer layout, Large Pads .....9 UCODE 8/8m, 12" wafer layout, FC Bumps .... 10 UCODE 8/8m TID memory structure ...............19 SL3S1205_15 Product data sheet COMPANY PUBLIC Fig. 8. Fig. 9. Fig. 10. Fig. 11. Fig. 12. Pre-serialization of 96-bit EPC ........................ 24 Standard antenna design versus single-slit antenna ............................................................25 Single-slit assembly .........................................25 Rotation tolerant pad design ........................... 26 Dual axis glue spacer ..................................... 26 All information provided in this document is subject to legal disclaimers. Rev. 3.4 -- 31 January 2020 398434 (c) NXP B.V. 2020. All rights reserved. 38 / 39 SL3S1205_15 NXP Semiconductors UCODE 8/8m Contents 1 General description ............................................ 1 2 Features and benefits .........................................2 2.1 Key features ...................................................... 2 2.1.1 Memory .............................................................. 2 2.2 Supported features ............................................ 3 3 Applications .........................................................4 3.1 Target market .................................................... 4 3.2 Applications ........................................................4 4 Ordering information .......................................... 5 5 Block diagram ..................................................... 6 6 Pinning information ............................................ 7 6.1 Pin description ................................................... 7 7 Wafer layout ........................................................ 8 8 Mechanical specification .................................. 11 8.1 Wafer specification .......................................... 11 8.1.1 8 inch Wafer with Large Pads ......................... 11 8.1.2 12 inch Wafer with Large Pads ....................... 12 8.1.3 12 inch Wafer with FC bumps ......................... 13 8.1.4 Fail die identification ........................................ 14 8.1.5 Map file distribution ......................................... 14 9 Functional description ......................................15 9.1 Air interface standards .....................................15 9.2 Power transfer ................................................. 15 9.3 Data transfer ....................................................15 9.3.1 Interrogator to tag Link .................................... 15 9.3.2 Tag to interrogator Link ................................... 15 9.4 Supported commands ......................................16 9.5 UCODE 8/8m memory .....................................16 9.5.1 UCODE 8/8m overall memory map ................. 17 9.5.2 UCODE 8/8m TID memory details ...................19 9.6 Supported features .......................................... 20 9.6.1 UCODE 8/8m features control mechanism ...... 20 9.6.2 Memory Safeguard .......................................... 22 9.6.2.1 Description ....................................................... 22 9.6.3 Self Adjust ....................................................... 23 9.6.3.1 Description ....................................................... 23 9.6.4 Brand Identifier ................................................ 23 9.6.4.1 Description ....................................................... 23 9.6.5 EPC+TID ..........................................................24 9.6.5.1 Description ....................................................... 24 9.6.6 Product Status Flag (PSF) ...............................24 9.6.6.1 Description ....................................................... 24 9.6.7 Backscatter strength reduction ........................ 24 9.6.8 Pre-serialization of the 96-bit EPC ...................24 9.6.8.1 Description ....................................................... 24 9.6.9 Single-slit antenna solution ..............................25 9.6.9.1 Description ....................................................... 25 9.6.10 Large Pads ...................................................... 26 9.6.10.1 Description ....................................................... 26 9.6.11 FC Bumps ........................................................27 9.6.11.1 Description ....................................................... 27 9.6.12 Custom commands ..........................................28 10 Limiting values .................................................. 29 11 11.1 12 12.1 13 14 15 16 Characteristics .................................................. 30 UCODE 8/8m bare die characteristics ............. 30 Packing information ..........................................31 Wafer ............................................................... 31 Abbreviations .................................................... 32 References ......................................................... 33 Revision history ................................................ 34 Legal information .............................................. 35 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section 'Legal information'. (c) NXP B.V. 2020. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com Date of release: 31 January 2020 Document number: 398434