ASJ PTE LTD
4
CR Thick Film Chip Resistors
Type DIMENSIONS
LWHL1L2
CR 10
0.040±0.004 0.020±0.002 0.014±0.002 0.008±0.004 0.010±0.004
(0402/1005) (1.00±0.10) (0.50±0.05) (0.35±0.05) (0.20±0.10) (0.25±0.10)
ºº
CR 16
0.063±0.004 0.031±0.004 0.018±0.004 0.012±0.008 0.012±0.008
(0603/1608) (1.60±0.10) (0.80±0.10) (0.45±0.10) (0.30±0.20) (0.30±0.20)
CR 21
0.079±0.006 0.049±0.004 0.020±0.004 0.016±0.008 0.016±0.008
(0805/2012) (2.00±0.15) (1.25±0.10) (0.50±0.10) (0.40±0.20) (0.40±0.20)
CR 32
0.122±0.004 0.063±0.006 0.022±0.002 0.020±0.010 0.020±0.010
(1206/3216) (3.10±0.10) (1.60±0.15) (0.55±0.05) (0.50±0.25) (0.50±0.25)
CR 40
0.122±0.004 0.098±0.006 0.022±0.002 0.020±0.010 0.016±0.008
(1210/3225) (3.10±0.10) (2.50±0.15) (0.55±0.05) (0.50±0.25) (0.40±0.20)
CR 46∞
0.122±0.004 0.181±0.006 0.022±0.002 0.020±0.010 0.016±0.008
(1218/3246) (3.10±0.10) (4.60±0.15) (0.55±0.05) (0.50±0.25) (0.40±0.20)
CR 50
0.200±0.006 0.098±0.006 0.022±0.002 0.024±0.010 0.016±0.008
(2010/5025) (5.00±0.15) (2.50±0.15) (0.55±0.05) (0.60±0.25) (0.40±0.20)
CR 63
0.250±0.006 0.126±0.006 0.022±0.002 0.024±0.010 0.016±0.008
(2512/6432) (6.30±0.15) (3.20±0.15) (0.55±0.05) (0.60±0.25) (0.40±0.20)
∞ Consult Factory
PERFORMANCE CHARACTERISTICS
Performance Test Test Method Specification
DC Resistance JIS C 5202 5.1 0.5% (For 1206 only) & 1% tol 2% & 5% tol
Voltage Coefficient JIS C 5202 5.3 Method II ≤100 ppm/V ≤100 ppm/V
Shortage Time Overload JIS C 5202 5.5 ±(0.5%+0.05 ohm) ±(1%+0.05 ohm)
Insulation Resistance JIS C 5202 5.6 >10G ohm >10G ohm
Dielectric Withstanding Voltage JIS C 5202 5.7 ±(1%+0.05 ohm) ±(1%+0.05 ohm)
Intermittent Overload JIS C 5202 5.8 ±(5%+0.10 ohm) ±(5%+0.10 ohm)
Noise JIS C 5202 5.9 1-9 ohm : <-10dB (0.32µv/v) 1-9 ohm : <-10dB (0.32µv/v)
10-99 ohm : <-5dB (0.52µv/v) 10-99 ohm : <-5dB (0.52µv/v)
100-999 ohm : <0dB (1.0µv/v) 100-999 ohm : <0dB (1.0µv/v)
1K-9.9K ohm : <10dB (3.2µv/v) 1K-9.9K ohm : <10dB (3.2µv/v)
10K-99.9K ohm : <18dB (5.6µv/v) 10K-99.9K ohm : <18dB (5.6µv/v)
100K-999.9K ohm : <20dB (10µv/v) 100K-999.9K ohm : <20dB (10µv/v)
>1M ohm : <30dB (32µv/v) >1M ohm : <30dB (32µv/v)
Terminal Strength JIS C 5202 6.1
A) Bend Test (applicable for chip size ≤1210) JIS C 5202 6.1.4(1) Method 2 ±(0.5%+0.05 ohm) ±(0.5%+0.05 ohm)
B) Pull Test (applicable for chip size ≥0805) JIS C 5202 6.1 ±(1%+0.05 ohm) ±(1%+0.05 ohm)
C) Push Test (applicable for chip size >0402) JIS C 5202 6.1.4(3) ±(1%+0.05 ohm) ±(1%+0.05 ohm)
Resistance to Soldering Heat JIS C 5202 6.10 ±(0.5%+0.05 ohm) ±(0.5%+0.05 ohm)
Solderability JIS C 5202 6.11 ≥95% coverage ≥95% coverage
Resistance to Solvent JIS C 5202 6.9 ±(1%+0.05 ohm) ±(1%+0.05 ohm)
Low Temperature JIS C 5202 7.1 ±(0.5%+0.05 ohm) ±(1%+0.05 ohm)
Low Temperature with Load JIS C 5202 7.1 ±(0.5%+0.05 ohm) ±(1%+0.05 ohm)
High Temperature JIS C 5202 7.2 ±(1%+0.05 ohm) ±(2%+0.05 ohm)
Terminal Shock (Temperature Cycling) JIS C 5202 7.4 ±(0.5%+0.05 ohm) ±(1%+0.05 ohm)
Resistance to Damp Heat (Humidity) JIS C 5202 7.5 ±(1%+0.10 ohm) ±(1%+0.10 ohm)
Loadlife JIS C 5202 7.10 ±(1%+0.05 ohm) ±(2%+0.05 ohm)
Salt Spray JIS C 5202 7.7 ±(3%+0.10 ohm) ±(3%+0.10 ohm)
DIMENSIONS
Inches
(Millimeters)
L1 L1
H
L2 L2
W
L
183