Product
Folder
Order
Now
Technical
Documents
Tools &
Software
Support &
Community
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
LF356-MIL
SNOSD55 JUNE 2017
LF356-MIL JFET Input Operational Amplifier
1
1 Features
1 Advantages
Replace Expensive Hybrid and Module FET
Op Amps
Rugged JFETs Allow Blow-Out Free Handling
Compared With MOSFET Input Devices
Excellent for Low Noise Applications Using
Either High or Low Source Impedance—Very
Low 1/f Corner
Offset Adjust Does Not Degrade Drift or
Common-Mode Rejection as in Most
Monolithic Amplifiers
New Output Stage Allows Use of Large
Capacitive Loads (5,000 pF) Without Stability
Problems
Internal Compensation and Large Differential
Input Voltage Capability
Common Features
Low Input Bias Current: 30 pA
Low Input Offset Current: 3 pA
High Input Impedance: 1012 Ω
Low Input Noise Current: 0.01 pA/Hz
High Common-Mode Rejection Ratio: 100 dB
Large DC Voltage Gain: 106 dB
Uncommon Features
Extremely Fast Settling Time to 0.01%: 1.5 μs
Fast Slew Rate: 12 V/µs
Wide Gain Bandwidth: 5 MHz
Low Input Noise Voltage: 12 nV/Hz
2 Applications
Precision High-Speed Integrators
Fast D/A and A/D Converters
High Impedance Buffers
Wideband, Low Noise, Low Drift Amplifiers
Logarithmic Amplifiers
Photocell Amplifiers
Sample and Hold Circuits
3 Description
The LF356-MIL device are the first monolithic JFET
input operational amplifiers to incorporate well-
matched, high-voltage JFETs on the same chip with
standard bipolar transistors (BI-FET™ Technology).
These amplifiers feature low input bias and offset
currents/low offset voltage and offset voltage drift,
coupled with offset adjust, which does not degrade
drift or common-mode rejection. The devices are also
designed for high slew rate, wide bandwidth,
extremely fast settling time, low voltage and current
noise and a low 1/f noise corner.
Device Information(1)
PART NUMBER PACKAGE BODY SIZE (NOM)
LF356-MIL SOIC (8) 4.90 mm × 3.91 mm
TO-CAN (8) 9.08 mm × 9.08 mm
PDIP (8) 9.81 mm × 6.35 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
Simplified Schematic
3 pF in LF357 series
2
LF356-MIL
SNOSD55 JUNE 2017
www.ti.com
Product Folder Links: LF356-MIL
Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated
Table of Contents
1 Features.................................................................. 1
2 Applications ........................................................... 1
3 Description............................................................. 1
4 Revision History..................................................... 2
5 Pin Configuration and Functions......................... 3
6 Specifications......................................................... 3
6.1 Absolute Maximum Ratings ...................................... 3
6.2 ESD Ratings.............................................................. 4
6.3 Recommended Operating Conditions....................... 4
6.4 Thermal Information.................................................. 4
6.5 AC Electrical Characteristics, TA= TJ= 25°C, VS=
±15 V.......................................................................... 4
6.6 DC Electrical Characteristics, TA= TJ= 25°C, VS=
±15 V.......................................................................... 4
6.7 DC Electrical Characteristics .................................... 5
6.8 Power Dissipation Ratings........................................ 5
6.9 Typical Characteristics.............................................. 6
7 Detailed Description............................................ 10
7.1 Overview................................................................. 10
7.2 Functional Block Diagram....................................... 11
7.3 Feature Description................................................. 12
7.4 Device Functional Modes........................................ 12
8 Application and Implementation ........................ 13
8.1 Application Information............................................ 13
8.2 Typical Application.................................................. 14
8.3 System Examples ................................................... 15
9 Power Supply Recommendations...................... 22
10 Layout................................................................... 22
10.1 Layout Guidelines ................................................. 22
10.2 Layout Example .................................................... 23
11 Device and Documentation Support................. 24
11.1 Receiving Notification of Documentation Updates 24
11.2 Community Resources.......................................... 24
11.3 Trademarks........................................................... 24
11.4 Electrostatic Discharge Caution............................ 24
11.5 Glossary................................................................ 24
12 Mechanical, Packaging, and Orderable
Information........................................................... 24
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
DATE REVISION NOTES
June 2017 * Initial release.
3
LF356-MIL
www.ti.com
SNOSD55 JUNE 2017
Product Folder Links: LF356-MIL
Submit Documentation FeedbackCopyright © 2017, Texas Instruments Incorporated
5 Pin Configuration and Functions
LMC Package
8-Pin TO-99
Top View
Available per JM38510/11401 or
JM38510/11402
D or P Package
8-Pin SOIC or PDIP
Top View
Pin Functions
PIN I/O DESCRIPTION
NAME NO.
BALANCE 1, 5 I Balance for input offset voltage
+INPUT 3 I Noninverting input
–INPUT 2 I Inverting input
NC 8 No connection
OUTPUT 6 O Output
V+ 7 Positive power supply
V– 4 Negative power supply
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The maximum power dissipation for these devices must be derated at elevated temperatures and is dictated by TJMAX,θJA, and the
ambient temperature, TA. The maximum available power dissipation at any temperature is PD= (TJMAX TA) / θJA or the 25°C PdMAX,
whichever is less.
(3) If Military/Aerospace specified devices are required, contact the TI Sales Office/Distributors for availability and specifications.
(4) Unless otherwise specified the absolute maximum negative input voltage is equal to the negative power supply voltage.
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1)(2)(3)
MIN MAX UNIT
Supply voltage ±18 V
Differential input voltage ±30 V
Input voltage(4) ±16 V
Output short circuit duration Continuous
TJMAX
LMC package 115 °CP package 100
D package 100
Soldering
information
(lead temp.)
TO-99 package Soldering (10 sec.) 300
°C
PDIP package Soldering (10 sec.) 260
SOIC package Vapor phase (60 sec.) 215
Infrared (15 sec.) 220
Storage temperature, Tstg 65 150 °C
4
LF356-MIL
SNOSD55 JUNE 2017
www.ti.com
Product Folder Links: LF356-MIL
Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) 100 pF discharged through 1.5-kΩresistor
6.2 ESD Ratings VALUE UNIT
V(ESD) Electrostatic discharge Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)(2) ±1000 V
6.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted) MIN NOM MAX UNIT
Supply voltage, VS±15 V
TA0 TA70 °C
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
6.4 Thermal Information
THERMAL METRIC(1) LF356-MIL
UNITD (SOIC) P (PDIP)
8 PINS 8 PINS
RθJA Junction-to-ambient thermal resistance 112.5 55.2 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 58.8 44.5 °C/W
RθJB Junction-to-board thermal resistance 52.8 32.4 °C/W
ψJT Junction-to-top characterization parameter 12.8 21.7 °C/W
ψJB Junction-to-board characterization parameter 52.3 32.3 °C/W
(1) Settling time is defined here, for a unity gain inverter connection using 2-kΩresistors for the LF15x. It is the time required for the error
voltage (the voltage at the inverting input pin on the amplifier) to settle to within 0.01% of its final value from the time a 10-V step input is
applied to the inverter. For the LF357, AV=5, the feedback resistor from output to input is 2 kΩand the output step is 10 V (See
Settling Time Test Circuit).
6.5 AC Electrical Characteristics, TA= TJ= 25°C, VS= ±15 V
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
SR Slew Rate AV= 1 12 V/μs
GBW Gain Bandwidth
Product 5 MHz
tsSettling Time to
0.01%(1) 1.5 μs
enEquivalent Input
Noise Voltage RS= 100 Ωf = 100 Hz 15 nV/Hz
f = 1000 Hz 12 nV/Hz
inEquivalent Input
Current Noise f = 100 Hz 0.01 pA/Hz
f = 1000 Hz 0.01 pA/Hz
CIN Input
Capacitance 3 pF
6.6 DC Electrical Characteristics, TA= TJ= 25°C, VS= ±15 V
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Supply current 5 10 mA
5
LF356-MIL
www.ti.com
SNOSD55 JUNE 2017
Product Folder Links: LF356-MIL
Submit Documentation FeedbackCopyright © 2017, Texas Instruments Incorporated
(1) Unless otherwise stated, these test conditions apply:
Supply Voltage, VSVS= ±15 V
TA0°C TA+70°C
THIGH +70°C
and VOS, IBand IOS are measured at VCM = 0.
(2) The Temperature Coefficient of the adjusted input offset voltage changes only a small amount (0.5 μV/°C typically) for each mV of
adjustment from its original unadjusted value. Common-mode rejection and open-loop voltage gain are also unaffected by offset
adjustment.
(3) The input bias currents are junction leakage currents which approximately double for every 10°C increase in the junction temperature,
TJ. Due to limited production test time, the input bias currents measured are correlated to junction temperature. In normal operation the
junction temperature rises above the ambient temperature as a result of internal power dissipation, Pd. TJ= TA+θJA Pd where θJA is the
thermal resistance from junction to ambient. Use of a heat sink is recommended if input bias current is to be kept to a minimum.
(1) Supply Voltage Rejection is measured for both supply magnitudes increasing or decreasing simultaneously, in accordance with common
practice.
6.7 DC Electrical Characteristics
See (1)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
VOS Input offset voltage RS= 50 ΩTA= 25°C 3 10 mV
Over temperature 13
ΔVOS/ΔTAverage TC of input
offset voltage RS= 50 Ω5μV/°C
ΔTC/ΔVOS Change in average TC with
VOS adjust RS= 50 Ω(2) 0.5 μV/°C
per mV
IOS Input offset current TJ= 25°C(1) (3) 3 50 pA
TJTHIGH 2 nA
IBInput bias current TJ= 25°C(1) (3) 30 200 pA
TJTHIGH 8 nA
RIN Input resistance TJ= 25°C 1012 Ω
AVOL Large signal voltage gain VS= ±15 V,
VO= ±10 V,
RL= 2 kΩ
TA= 25°C 25 200 V/mV
Over temperature 15
VOOutput voltage swing VS= ±15 V, RL= 10 kΩ±12 ±13 V
VS= ±15 V, RL= 2 kΩ±10 ±12
VCM Input common-mode
voltage range VS= ±15 V VCM, High 10 15.1 V
VCM, Low 12 –10
CMRR Common-mode rejection ratio 80 100 dB
PSRR Supply voltage rejection
ratio(1) 80 100 dB
(1) The maximum power dissipation for these devices must be derated at elevated temperatures and is dictated by TJMAX,θJA, and the
ambient temperature, TA. The maximum available power dissipation at any temperature is PD= (TJMAX TA) / θJA or the 25°C PdMAX,
whichever is less.
(2) Maximum power dissipation is defined by the package characteristics. Operating the part near the maximum power dissipation may
cause the part to operate outside specified limits.
6.8 Power Dissipation Ratings MIN MAX UNIT
Power Dissipation at
TA= 25°C (1) (2)
LMC Package (Still Air) 400
mW
LMC Package
(400 LF/Min Air Flow) 1000
P Package 670
D Package 380
6
LF356-MIL
SNOSD55 JUNE 2017
www.ti.com
Product Folder Links: LF356-MIL
Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated
6.9 Typical Characteristics
6.9.1 Typical AC Performance Characteristics
Figure 1. Gain Bandwidth Figure 2. Gain Bandwidth
Figure 3. Normalized Slew Rate Figure 4. Output Impedance
Figure 5. Output Impedance Figure 6. LF155 Small Signal Pulse Response, AV= +1
7
LF356-MIL
www.ti.com
SNOSD55 JUNE 2017
Product Folder Links: LF356-MIL
Submit Documentation FeedbackCopyright © 2017, Texas Instruments Incorporated
Typical AC Performance Characteristics (continued)
Figure 7. LF156 Small Signal Pulse Response, AV= +1 Figure 8. LF155 Large Signal Pulse Response, AV= +1
Figure 9. LF156 Large Signal Puls Response, AV= +1 Figure 10. Inverter Settling Time
Figure 11. Inverter Settling Time Figure 12. Open-Loop Frequency Response
8
LF356-MIL
SNOSD55 JUNE 2017
www.ti.com
Product Folder Links: LF356-MIL
Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated
Typical AC Performance Characteristics (continued)
Figure 13. Bode Plot Figure 14. Bode Plot
Figure 15. Bode Plot Figure 16. Common-Mode Rejection Ratio
Figure 17. Power Supply Rejection Ratio Figure 18. Power Supply Rejection Ratio
9
LF356-MIL
www.ti.com
SNOSD55 JUNE 2017
Product Folder Links: LF356-MIL
Submit Documentation FeedbackCopyright © 2017, Texas Instruments Incorporated
Typical AC Performance Characteristics (continued)
Figure 19. Undistorted Output Voltage Swing Figure 20. Equivalent Input Noise Voltage
Figure 21. Equivalent Input Noise Voltage (Expanded Scale)
10
LF356-MIL
SNOSD55 JUNE 2017
www.ti.com
Product Folder Links: LF356-MIL
Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated
7 Detailed Description
7.1 Overview
These are the first monolithic JFET input operational amplifiers to incorporate well matched, high voltage JFETs
on the same chip with standard bipolar transistors (BI-FET Technology). These amplifiers feature low input bias
and offset currents, as well as low offset voltage and offset voltage drift, coupled with offset adjust which does
not degrade drift or common-mode rejection. These devices can replace expensive hybrid and module FET
operational amplifiers. Designed for low voltage and current noise and a low 1/f noise corner, these devices are
excellent for low noise applications using either high or low source impedance.
LF356-MIL
www.ti.com
SNOSD55 JUNE 2017
11
Product Folder Links: LF356-MIL
Submit Documentation FeedbackCopyright © 2017, Texas Instruments Incorporated
7.2 Functional Block Diagram
*C = 3 pF in LF357 series.
Figure 22. Detailed Schematic
12
LF356-MIL
SNOSD55 JUNE 2017
www.ti.com
Product Folder Links: LF356-MIL
Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated
7.3 Feature Description
7.3.1 Large Differential Input Voltage
These are operational amplifiers with JFET input devices. These JFETs have large reverse breakdown voltages
from gate to source and drain eliminating the need for clamps across the inputs. Therefore large differential input
voltages can easily be accommodated without a large increase in input current. The maximum differential input
voltage is independent of the supply voltages. However, neither of the input voltages should be allowed to
exceed the negative supply as this will cause large currents to flow which can result in a destroyed unit.
7.3.2 Large Common-Mode Input Voltage
These amplifiers will operate with the common-mode input voltage equal to the positive supply. In fact, the
common-mode voltage can exceed the positive supply by approximately 100 mV independent of supply voltage
and over the full operating temperature range. The positive supply can therefore be used as a reference on an
input as, for example, in a supply current monitor and/or limiter.
7.4 Device Functional Modes
The LF356-MIL has a single functional mode and operates according to the conditions listed in the
Recommended Operating Conditions.
13
LF356-MIL
www.ti.com
SNOSD55 JUNE 2017
Product Folder Links: LF356-MIL
Submit Documentation FeedbackCopyright © 2017, Texas Instruments Incorporated
8 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
8.1 Application Information
These are op amps with JFET input devices. These JFETs have large reverse breakdown voltages from gate to
source and drain eliminating the need for clamps across the inputs. Therefore large differential input voltages can
easily be accommodated without a large increase in input current. The maximum differential input voltage is
independent of the supply voltages. However, neither of the input voltages should be allowed to exceed the
negative supply as this will cause large currents to flow which can result in a destroyed unit.
Exceeding the negative common-mode limit on either input will force the output to a high state, potentially
causing a reversal of phase to the output. Exceeding the negative common-mode limit on both inputs will force
the amplifier output to a high state. In neither case does a latch occur since raising the input back within the
common-mode range again puts the input stage and thus the amplifier in a normal operating mode.
Exceeding the positive common-mode limit on a single input will not change the phase of the output however, if
both inputs exceed the limit, the output of the amplifier will be forced to a high state.
These amplifiers will operate with the common-mode input voltage equal to the positive supply. In fact, the
common-mode voltage can exceed the positive supply by approximately 100 mV independent of supply voltage
and over the full operating temperature range. The positive supply can therefore be used as a reference on an
input as, for example, in a supply current monitor and/or limiter.
Precautions should be taken to ensure that the power supply for the integrated circuit never becomes reversed in
polarity or that the unit is not inadvertently installed backwards in a socket as an unlimited current surge through
the resulting forward diode within the IC could cause fusing of the internal conductors and result in a destroyed
unit.
All of the bias currents in these amplifiers are set by FET current sources. The drain currents for the amplifiers
are therefore essentially independent of supply voltage.
As with most amplifiers, care should be taken with lead dress, component placement and supply decoupling in
order to ensure stability. For example, resistors from the output to an input should be placed with the body close
to the input to minimize pick-up and maximize the frequency of the feedback pole by minimizing the capacitance
from the input to ground.
A feedback pole is created when the feedback around any amplifier is resistive. The parallel resistance and
capacitance from the input of the device (usually the inverting input) to AC ground set the frequency of the pole.
In many instances the frequency of this pole is much greater than the expected 3-dB frequency of the closed
loop gain and consequently there is negligible effect on stability margin. However, if the feedback pole is less
than approximately six times the expected 3-dB frequency a lead capacitor should be placed from the output to
the input of the op amp. The value of the added capacitor should be such that the RC time constant of this
capacitor and the resistance it parallels is greater than or equal to the original feedback pole time constant.
14
LF356-MIL
SNOSD55 JUNE 2017
www.ti.com
Product Folder Links: LF356-MIL
Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated
8.2 Typical Application
Figure 23. Settling Time Test Circuit
8.2.1 Design Requirements
Settling time is tested with the LF35x connected as unity gain inverter and LF357 connected for AV=5
8.2.2 Detailed Design Procedure
Connect the circuit components as shown in Figure 23. In particular, use FET to isolate the probe capacitance.
Apply a 10-V step function to the input.
Use an oscilloscope to probe the circuit as shown in Figure 23.
8.2.3 Application Curve
Figure 24. Large Signal Inverter Output, VOUT (from Settling Time Circuit)
15
LF356-MIL
www.ti.com
SNOSD55 JUNE 2017
Product Folder Links: LF356-MIL
Submit Documentation FeedbackCopyright © 2017, Texas Instruments Incorporated
8.3 System Examples
Figure 25. Fast Logarithmic Converter
Dynamic range: 100 μAIi1 mA (5 decades), |VO| = 1 V/decade
Transient response: 3 μs for ΔIi= 1 decade
C1, C2, R2, R3: added dynamic compensation
VOS adjust the LF156 to minimize quiescent error
RT: Tel Labs type Q81 + 0.3%/°C
(1)
16
LF356-MIL
SNOSD55 JUNE 2017
www.ti.com
Product Folder Links: LF356-MIL
Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated
System Examples (continued)
Figure 26. 8-Bit D/A Converter With Symmetrical Offset Binary Operation
R1, R2 should be matched within ±0.05%
Full-scale response time: 3 μs
Table 1. Bit Illustration of the 8-Bit D/A Converter
EOB1 B2 B3 B4 B5 B6 B7 B8 COMMENTS
+9.920 1 1 1 1 1 1 1 1 Positive Full-Scale
+0.040 1 0 0 0 0 0 0 0 (+) Zero-Scale
0.040 0 1 1 1 1 1 1 1 () Zero-Scale
9.920 0 0 0 0 0 0 0 0 Negative Full-Scale
Figure 27. Wide BW Low Noise, Low Drift Amplifier
(2)
17
LF356-MIL
www.ti.com
SNOSD55 JUNE 2017
Product Folder Links: LF356-MIL
Submit Documentation FeedbackCopyright © 2017, Texas Instruments Incorporated
Parasitic input capacitance C1 (3 pF for LF155, LF156 and LF357 plus any additional layout capacitance)
interacts with feedback elements and creates undesirable high frequency pole. To compensate add C2 such that:
R2 C2 R1 C1.
Figure 28. Boosting the LF156 With a Current Amplifier
IOUT(MAX) 150 mA (will drive RL100 Ω)
(3)
No additional phase shift added by the current amplifier
Figure 29. Decades VCO
18
LF356-MIL
SNOSD55 JUNE 2017
www.ti.com
Product Folder Links: LF356-MIL
Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated
R1, R4 matched. Linearity 0.1% over 2 decades.
(4)
Figure 30. Isolating Large Capacitive Loads
Overshoot 6%
ts10 μs
When driving large CL, the VOUT slew rate determined by CLand IOUT(MAX):
(5)
19
LF356-MIL
www.ti.com
SNOSD55 JUNE 2017
Product Folder Links: LF356-MIL
Submit Documentation FeedbackCopyright © 2017, Texas Instruments Incorporated
Figure 31. Fast Sample and Hold
Both amplifiers (A1, A2) have feedback loops individually closed with stable responses (overshoot negligible)
Acquisition time TA, estimated by:
(6)
LF156 develops full Sroutput capability for VIN 1 V
Addition of SW2 improves accuracy by putting the voltage drop across SW1 inside the feedback loop
Overall accuracy of system determined by the accuracy of both amplifiers, A1 and A2
20
LF356-MIL
SNOSD55 JUNE 2017
www.ti.com
Product Folder Links: LF356-MIL
Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated
Figure 32. High Accuracy Sample and Hold
By closing the loop through A2, the VOUT accuracy will be determined uniquely by A1.
No VOS adjust required for A2.
TAcan be estimated by same considerations as previously but, because of the added
propagation delay in the feedback loop (A2) the overshoot is not negligible.
Overall system slower than fast sample and hold
R1, CC: additional compensation
Use LF156 for
Fast settling time
Low VOS
Figure 33. VOS Adjustment
VOS is adjusted with a 25-k potentiometer
The potentiometer wiper is connected to V+
For potentiometers with temperature coefficient of 100 ppm/°C or less the additional drift with adjust
is 0.5 μV/°C/mV of adjustment
Typical overall drift: 5 μV/°C ±(0.5 μV/°C/mV of adj.)
21
LF356-MIL
www.ti.com
SNOSD55 JUNE 2017
Product Folder Links: LF356-MIL
Submit Documentation FeedbackCopyright © 2017, Texas Instruments Incorporated
Figure 34. Driving Capacitive Loads
*LF15x R = 5k, LF357 R = 1.25 k
Due to a unique output stage design, these amplifiers have the ability to drive large capacitive loads and still
maintain stability. CL(MAX) 0.01 μF.
Overshoot 20%, Settling time (ts)5μs
22
LF356-MIL
SNOSD55 JUNE 2017
www.ti.com
Product Folder Links: LF356-MIL
Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated
9 Power Supply Recommendations
See the Recommended Operating Conditions for the minimum and maximum values for the supply input voltage
and operating junction temperature.
10 Layout
10.1 Layout Guidelines
10.1.1 Printed-Circuit-Board Layout For High-Impedance Work
It is generally recognized that any circuit which must operate with less than 1000 pA of leakage current requires
special layout of the PCB. When one wishes to take advantage of the low input bias current of the LF356-MIL,
typically less than 30 pA, it is essential to have an excellent layout. Fortunately, the techniques of obtaining low
leakages are quite simple. First, the user must not ignore the surface leakage of the PCB, even though it may
sometimes appear acceptably low, because under conditions of high humidity or dust or contamination, the
surface leakage will be appreciable.
To minimize the effect of any surface leakage, lay out a ring of foil completely surrounding the inputs of the
LF356-MIL and the terminals of capacitors, diodes, conductors, resistors, relay terminals, and so forth, connected
to the inputs of the op amp, as in Figure 39. To have a significant effect, guard rings must be placed on both the
top and bottom of the PCB. This PC foil must then be connected to a voltage that is at the same voltage as the
amplifier inputs, because no leakage current can flow between two points at the same potential. For example, a
PCB trace-to-pad resistance of 10 TΩ, which is normally considered a very large resistance, could leak 5 pA if
the trace were a 5-V bus adjacent to the pad of the input. If a guard ring is used and held close to the potential of
the amplifier inputs, it will significantly reduce this leakage current.
Figure 35. Inverting Amplifier
Figure 36. Noninverting Amplifier
23
LF356-MIL
www.ti.com
SNOSD55 JUNE 2017
Product Folder Links: LF356-MIL
Submit Documentation FeedbackCopyright © 2017, Texas Instruments Incorporated
Layout Guidelines (continued)
Figure 37. Typical Connections Of Guard Rings
The designer should be aware that when it is inappropriate to lay out a PCB for the sake of just a few circuits,
there is another technique which is even better than a guard ring on a PCB: Do not insert the input pin of the
amplifier into the board at all, but bend it up in the air and use only air as an insulator. Air is an excellent
insulator. In this case you may have to forego some of the advantages of PCB construction, but the advantages
are sometimes well worth the effort of using point-to-point up-in-the-air wiring. See Figure 38.
(Input pins are lifted out of PCB and soldered directly to components. All other pins connected to PCB).
Figure 38. Air Wiring
Another potential source of leakage that might be overlooked is the device package. When the LF356-MIL is
manufactured, the device is always handled with conductive finger cots. This is to assure that salts and skin oils
do not cause leakage paths on the surface of the package. We recommend that these same precautions be
adhered to, during all phases of inspection, test and assembly.
10.2 Layout Example
Figure 39. Examples Of Guard
Ring In PCB Layout
24
LF356-MIL
SNOSD55 JUNE 2017
www.ti.com
Product Folder Links: LF356-MIL
Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated
11 Device and Documentation Support
11.1 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
11.2 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
11.3 Trademarks
BI-FET, E2E are trademarks of Texas Instruments.
All other trademarks are the property of their respective owners.
11.4 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
11.5 Glossary
SLYZ022 TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
12 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
PACKAGE OPTION ADDENDUM
www.ti.com 10-Dec-2020
Addendum-Page 1
PACKAGING INFORMATION
Orderable Device Status
(1)
Package Type Package
Drawing Pins Package
Qty Eco Plan
(2)
Lead finish/
Ball material
(6)
MSL Peak Temp
(3)
Op Temp (°C) Device Marking
(4/5)
Samples
LF356 MWC ACTIVE WAFERSALE YS 0 1 RoHS & Green Call TI Level-1-NA-UNLIM -40 to 85
LF356H ACTIVE TO-99 LMC 8 500 Non-RoHS &
Non-Green Call TI Call TI 0 to 70 ( LF356H, LF356H)
LF356H/NOPB ACTIVE TO-99 LMC 8 500 RoHS & Green Call TI Level-1-NA-UNLIM 0 to 70 ( LF356H, LF356H)
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6) Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
PACKAGE OPTION ADDENDUM
www.ti.com 10-Dec-2020
Addendum-Page 2
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
IMPORTANT NOTICE AND DISCLAIMER
TI PROVIDES TECHNICAL AND RELIABILITY DATA (INCLUDING DATASHEETS), DESIGN RESOURCES (INCLUDING REFERENCE
DESIGNS), APPLICATION OR OTHER DESIGN ADVICE, WEB TOOLS, SAFETY INFORMATION, AND OTHER RESOURCES “AS IS”
AND WITH ALL FAULTS, AND DISCLAIMS ALL WARRANTIES, EXPRESS AND IMPLIED, INCLUDING WITHOUT LIMITATION ANY
IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE OR NON-INFRINGEMENT OF THIRD
PARTY INTELLECTUAL PROPERTY RIGHTS.
These resources are intended for skilled developers designing with TI products. You are solely responsible for (1) selecting the appropriate
TI products for your application, (2) designing, validating and testing your application, and (3) ensuring your application meets applicable
standards, and any other safety, security, or other requirements. These resources are subject to change without notice. TI grants you
permission to use these resources only for development of an application that uses the TI products described in the resource. Other
reproduction and display of these resources is prohibited. No license is granted to any other TI intellectual property right or to any third
party intellectual property right. TI disclaims responsibility for, and you will fully indemnify TI and its representatives against, any claims,
damages, costs, losses, and liabilities arising out of your use of these resources.
TI’s products are provided subject to TI’s Terms of Sale (www.ti.com/legal/termsofsale.html) or other applicable terms available either on
ti.com or provided in conjunction with such TI products. TI’s provision of these resources does not expand or otherwise alter TI’s applicable
warranties or warranty disclaimers for TI products.
Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265
Copyright © 2020, Texas Instruments Incorporated