Si8900EDB
Vishay Siliconix
www.vishay.com
2 Document Number: 71830
S-50066—Rev. F, 17-Jan-05
SPECIFICATIONS (TJ = 25_C UNLESS OTHERWISE NOTED)
Parameter Symbol Test Condition Min Typ Max Unit
Static
Gate Threshold Voltage VGS(th) VSS = VGS, ID = 1.1 mA 0.45 1.0 V
VSS = 0 V, VGS = "4.5 V "4mA
Gate-Body Leakage IGSS VSS = 0 V, VGS = "12 V "10 mA
Zero Gate Voltage Source Current
VSS = 20 V, VGS = 0 V 1
Zero Gate Voltage Source Current IS1S2 VSS = 20 V, VGS = 0 V, TJ = 85_C 5 mA
On-State Source CurrentaIS(on) VSS = 5 V, VGS = 4.5 V 5 A
VGS = 4.5 V, ISS = 1 A 0.020 0.024
Source1 Source2 On State Resistancea
VGS = 3.7 V, ISS = 1 A 0.022 0.026
Source1—Source2 On-State ResistancearS1S2(on) VGS = 2.5 V, ISS = 1 A 0.026 0.034 W
VGS = 1.8 V, ISS = 1 A0.032 0.040
Forward Transconductanceagfs VSS = 10 V, ISS = 1 A 31 S
Dynamicb
Turn-On Delay Time td(on) 3 5
Rise Time trV
= 10 V, RL = 10 W4.5 7
Turn-Off Delay Time td(off)
,
ISS ^ 1 A, VGEN = 4.5 V, Rg = 6 W55 85 ms
Fall Time tf15 25
Notes
a. Pulse test; pulse width v 300 ms, duty cycle v 2%.
b. Guaranteed by design, not subject to production testing.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
TYPICAL CHARACTERISTICS (25_C UNLESS NOTED)
0.01
100
10,000
Gate Current vs. Gate-Source Voltage
0
4
8
12
16
20
0 3 6 9 12 15
Gate-Current vs. Gate-Source Voltage
VGS − Gate-to-Source Voltage (V)
0.1
1
10
1,000
VGS − Gate-to-Source Voltage (V)
− Gate Current (IGSS mA)
0369 15
TJ = 25_C
TJ = 150_C
− Gate Current (mA)IGSS
IGSS @ 25_C (mA)
12