
SN54HCT14, SN74HCT14
HEX SCHMITT-TRIGGER INVERTERS
SCLS225C – JULY 1995 – REVISED FEBRUARY 2000
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
D
Inputs Are TTL-Voltage Compatible
D
Package Options Include Plastic
Small-Outline (D), Shrink Small-Outline
(DB), Thin Very Small-Outline (DGV), Thin
Shrink Small-Outline (PW), and Ceramic
Flat (W) Packages, Ceramic Chip Carriers
(FK), and Standard Plastic (N) and Ceramic
(J) DIPs
description
The ’HCT14 devices contain six independent
inverters. The devices perform the Boolean
function Y = A in positive logic.
The SN54HCT14 is characterized for operation
over the full military temperature range of –55°C
to 125°C. The SN74HCT14 is characterized for
operation from –40°C to 85°C.
FUNCTION TABLE
(each inverter)
INPUT
AOUTPUT
Y
H L
L H
logic symbol†
1
1A 3
2A
1Y
2
5
3A 9
4A
2Y
4
11
5A 13
6A
3Y
6
4Y
8
5Y
10
6Y
12
†This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, DB, DGV, J, N, PW, and W packages.
logic diagram (positive logic)
AY
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1Y
2A
2Y
3A
3Y
GND
VCC
6A
6Y
5A
5Y
4A
4Y
SN54HCT14 ...J OR W PACKAGE
SN74HCT14 . . . D, DB, DGV, N, OR PW PACKAGE
(TOP VIEW)
3212019
910111213
4
5
6
7
8
18
17
16
15
14
6Y
NC
5A
NC
5Y
2A
NC
2Y
NC
3A
1Y
1A
NC
4Y
4A V
6A
3Y
GND
NC
SN54HCT14 . . . FK PACKAGE
(TOP VIEW)
CC
NC – No internal connection
Copyright 2000, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.