2Motorola Bipolar Power Transistor Device Data
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*ELECTRICAL CHARACTERISTICS (TC = 25
_
C unless otherwise noted)
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Collector–Emitter Sustaining Voltage 2N5655
(IC = 100 mAdc (inductive), L = 50 mH) 2N5656
2N5657
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Collector–Emitter Breakdown Voltage 2N5655
(IC = 1.0 mAdc, IB = 0) 2N5656
2N5657
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Collector Cutoff Current
(VCE = 150 Vdc, IB = 0) 2N5655
(VCE = 200 Vdc, IB = 0) 2N5656
(VCE = 250 Vdc, IB = 0) 2N5657
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Collector Cutoff Current
(VCE = 250 Vdc, VEB(off) = 1.5 Vdc) 2N5655
(VCE = 300 Vdc, VEB(off) = 1.5 Vdc) 2N5656
(VCE = 350 Vdc, VEB(off) = 1.5 Vdc) 2N5657
(VCE = 150 Vdc, VEB(off) = 1.5 Vdc, TC = 100
_
C) 2N5655
(VCE = 200 Vdc, VEB(off) = 1.5 Vdc, TC = 100
_
C) 2N5656
(VCE = 250 Vdc, VEB(off) = 1.5 Vdc, TC = 100
_
C) 2N5657
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Collector Cutoff Current
(VCB = 275 Vdc, IE = 0) 2N5655
(VCB = 325 Vdc, IE = 0) 2N5656
(VCB = 375 Vdc, IE = 0) 2N5657
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Emitter Cutoff Current (VEB = 6.0 Vdc, IC = 0)
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DC Current Gain (1)
(IC = 50 mAdc, VCE = 10 Vdc)
(IC = 100 mAdc, VCE = 10 Vdc)
(IC = 250 mAdc, VCE = 10 Vdc)
(IC = 500 mAdc, VCE = 10 Vdc)
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Collector–Emitter Saturation Voltage (1)
(IC = 100 mAdc, IB = 10 mAdc)
(IC = 250 mAdc, IB = 25 mAdc)
(IC = 500 mAdc, IB = 100 mAdc)
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Base–Emitter Voltage (1) (IC = 100 mAdc, VCE = 10 Vdc)
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Current–Gain — Bandwidth Product (2) (IC = 50 mAdc, VCE = 10 Vdc, f = 10 MHz)
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Output Capacitance (VCB = 10 Vdc, IE = 0, f = 100 kHz)
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Small–Signal Current Gain (IC = 100 mAdc, VCE = 10 Vdc, f = 1.0 kHz)
—
*Indicates JEDEC Registered Data for 2N5655 Series.
(1) Pulse Test: Pulse Width
v
300 µs, Duty Cycle
v
2.0%.
(2) fT is defined as the frequency at which |hfe| extrapolates to unity.
1.0
20
Figure 3. Active–Region Safe Operating Area
VCE, COLLECTOR–EMITTER VOLTAGE (VOLTS)
0.5
0.2
0.1
0.01 30 40 60 100 200 300 400 600
Second Breakdown Limit
Thermal Limit @ TC = 25
°
C
Bonding Wire Limit
IC, COLLECTOR CURRENT (AMP)
Curves apply below rated VCEO
TJ = 150
°
C
dc 1.0 ms
0.05
0.02
10
µ
s
2N5655
2N5656
2N5657
500
µ
s
There are two limitations on the power handling ability of a
transistor: average junction temperature and second break-
down. Safe operating area curves indicate IC – VCE limits of
the transistor that must be observed for reliable operation;
i.e., the transistor must not be subjected to greater dissipa-
tion than the curves indicate.
The data of Figure 3 is based on TJ(pk) = 150
_
C; TC is
variable depending on conditions. Second breakdown pulse
limits are valid for duty cycles to 10% provided TJ(pk)
v
150
_
C. At high case temperatures, thermal limitations will
reduce the power that can be handled to values less than the
limitations imposed by second breakdown.