LM7332
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SNOSAV4B –APRIL 2008–REVISED JANUARY 2016
±5-V Electrical Characteristics (continued)
Unless otherwise specified, all limits are ensured for TA= 25°C, V+= +5 V, V−=−5 V, VCM = 0 V, VO= 0 V, and RL> 1 MΩto
0 V.(1)
PARAMETER TEST CONDITIONS MIN (2) TYP (3) MAX (2) UNIT
RL= 10 kΩto 0 V 75 250
VID = 100 mV
At the temperature extremes 300
Output swing
high RL= 2 kΩto 0 V 125 350
VID = 100 mV
At the temperature extremes 400 mV from
VOeither rail
RL= 10 kΩto 0 V 10 250
VID =−100 mV
At the temperature extremes 300
Output swing
low RL= 2 kΩto 0V 30 350
VID =−100 mV
At the temperature extremes 400
Sourcing from V+, VID = 200 mV (6) 90 120
ISC Output short circuit current mA
Sinking to V−, VID =−200 mV (6) 90 100
IOUT Output current VID = ±200 mV, VO= 1 V from rails ±65 mA
No Load, VCM =−4.5 V 1.5 2.4
ISTotal supply current mA
At the temperature extremes 2.6
AV= +1, VI= 8-V step, RL= 1 MΩ,
SR Slew rate(7) 13.2 V/µs
CL= 10 pF
ROUT Close-loop output resistance AV= +1, f = 100 kHz 3 Ω
fuUnity-gain frequency RL= 10 MΩ, CL= 20 pF 7.9 MHz
GBWP Gain bandwidth product f = 50 kHz 19.9 MHz
enInput-referred voltage noise f = 2 kHz 14.7 nV/√HZ
inInput-referred current noise f = 2 kHz 1.3 pA/√HZ
AV= +2, RL= 100 kΩ, f = 1 kHz
THD+N Total harmonic distortion + noise −87 dB
VO= 8 VPP
CT Rej. Crosstalk rejection f = 3 MHz, driver RL= 10 kΩ68 dB
(6) Short-circuit test is a momentary test. Output short circuit duration is infinite for VS≤6 V at room temperature and below. For VS> 6 V,
allowable short circuit duration is 1.5 ms.
(7) Slew rate is the slower of the rising and falling slew rates. Connected as a voltage follower.
6.7 ±15-V Electrical Characteristics
Unless otherwise specified, all limits are ensured for TA= 25°C, V+= +15 V, V−=−15 V, VCM = 0 V, VO= 0 V, and RL> 1 MΩ
to 0 V.(1)
PARAMETER TEST CONDITIONS MIN (2) TYP (3) MAX (2) UNIT
VCM =−14.5 V and VCM = 14.5 V −5 ±2 5
VOS Input offset voltage mV
At the temperature extremes −6 6
Input offset voltage temperature VCM =−14.5 V and VCM = 14.5 V
TC VOS ±2 µV/°C
drift (4)
See (5) −2 ±1 2
IBInput bias current µA
At the temperature extremes −2.5 2.5
(1) Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in
very limited self-heating of the device such that TJ= TA. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where TJ> TA.
(2) All limits are ensured by testing or statistical analysis.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(4) Offset voltage temperature drift determined by dividing the change in VOS at temperature extremes into the total temperature change.
(5) Positive current corresponds to current flowing in the device.
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