HD74HC Series Common Information
September 2000
Customer Service Division
Semiconductor & Integrated Circuits
Hitachi, Ltd.
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Outline of Hitachi High-Speed CMOS Logic
1
Outline of Hitachi High-Speed CMOS Logic
Features of High-Speed CMOS Logic
Hitachi’s HS-CMOS logics–the HD74HC series–and the HCT series based on the EIA/JEDEC
specification. Their specification are shown in the Maximum Ratings and the Electrical Characteristics
Tables. The HS-CMOS has the characteristics of both standard CMOS logic series and LS-TTL series.
The features of this logic are:
High-Speed equivalent to the LS-TTL’s
Capable of driving 10LS-TTL loads
(Capable of driving 15LS-TTL loads in bus drivers)
Maximum input current of ± 1 µA at 6 V power supply
Wide supply voltage range: HC series 2 to 6 V
HCT series 4.5 to 5.5 V
Wide noise margin
VCC assurance of Electrical Characteristics at 2.0, 4.5 and 6.0 V
Low Static Power Consumption 1/2 of EIA/JEDEC
Type Name of High-Speed CMOS Logic
The JEDEC has divided the HS-CMOS’s into two types: HC and HCT. The HC type has the CMOS logic
level for inputs and outputs with buffers. The HCT type has the TTL logic level for inputs and the outputs
have buffers.
The industry-standarized maximum ratings and recommended operating range are shown below. Limits for
the static characteristics are shown below (right): Table 1 is in the industry-standard and Table 2 is the
Hitachi specifications.
The Hitachi specifications is used throughout this data book. Additional specification are shown in the
individual data sheets. Switching characteristics are specified under the following conditions:
Input pulse voltage: + VCC
Load capacitance: 50 pF
Input pulse rise/fall time: 6 ns
Switching times measured from 50% point of input voltage to 50% point of output voltage
Three different supply voltages: 2.0, 4.5 and 6.0 V
Outline of Hitachi High-Speed CMOS Logic
2
Input Levels of Each Series Type (VCC = 5 V)
Input level
Type VIH VIL Remarks
HC series 3.5 V 1.5 V
HCT series 2.0 V 0.8 V TTL logic level for inputs
Type Name of HS-CMOS Logic
Package Code
(P : Plastic DIP,FP:Small outline package (EIAJ TYPE),
RP : Small outline package (JEDEC TYPE))
Individual device code
2 or 3-digit:same pin connection and function
with its corresponding device
in LS-TTL
4–digit:same pin connection and function
with the 14000B series CMOS)
Type code (HC,HCT)
HD74
Absolute Maximum Ratings (Voltages Referenced to GND)
Item Symbol Rating Unit
Supply voltage VCC –0.5 to +7 V
I/O voltage VIN, VOUT –0.5 to VCC +0.5 V
I/O diode current IIK, IOK ±20 mA
Output current IO±25 mA
VCC, GND current ICC, IGND ±50 mA
Power dissipation PT500 mW
Storage temperature Range Tstg –65 to +150 ˚C
Additional specification values are shown on the individual data sheets.
Outline of Hitachi High-Speed CMOS Logic
3
Recommended Operating Range
HD74HC
Item Symbol Rating Unit Condition
Supply voltage VCC 2 to 6 V
I/O voltage VIN, VOUT 0 to VCC V
Operating temperature Ta –40 to +85 ˚C
Input rise/fall time tr, tf 0 to 1000 ns VCC = 2.0 V
0 to 500 VCC = 4.5 V
0 to 400 VCC = 6.0 V
HD74HCT
Item Symbol Rating Unit Condition
Supply voltage VCC 4.5 to 5.5 V
I/O voltage VIN, VOUT 0 to VCC V
Operating temperature Ta –40 to +85 ˚C
Input rise/fall time tr, tf 0 to 1000 ns VCC = 2.0 V
0 to 500 VCC = 4.5 V
0 to 400 VCC = 6.0 V
HD74HC14, HC132
Item Symbol Rating Unit Condition
Input rise/fall time tr, tf 0 to unlimited ns VCC = 2.0 V
0 to unlimited VCC = 4.5 V
0 to unlimited VCC = 6.0 V
HD74HC123A, HC221, HC423A
Item Symbol Rating Unit Condition
A, B Input rise/fall time tr, tf 0 to unlimited ns VCC = 2.0 V
0 to unlimited VCC = 4.5 V
0 to unlimited VCC = 6.0 V
CLR Input rise/fall time tr, tf 0 to 1000 ns VCC = 2.0 V
0 to 500 VCC = 4.5 V
0 to 400 VCC = 6.0 V
Outline of Hitachi High-Speed CMOS Logic
4
HD74HC4538
Item Symbol Rating Unit Condition
A, B Input rise/fall time tr, tf 0 to unlimited ns VCC = 2.0 V
0 to unlimited VCC = 4.5 V
0 to unlimited VCC = 6.0 V
CD Input rise/fall time tr, tf 0 to 1000 ns VCC = 2.0 V
0 to 500 VCC = 4.5 V
0 to 400 VCC = 6.0 V
HD74HC540, HC541
Item Symbol Rating Unit Condition
A Input rise/fall time tr, tf 0 to unlimited ns VCC = 2.0 V
0 to unlimited VCC = 4.5 V
0 to unlimited VCC = 6.0 V
G Input rise/fall time tr, tf 0 to 1000 ns VCC = 2.0 V
0 to 500 VCC = 4.5 V
0 to 400 VCC = 6.0 V
Outline of Hitachi High-Speed CMOS Logic
5
Table 1 EIA/JEDEC Format for High-Speed CMOS Specifications
Limits
+25˚C –40 to
+85˚C
Parameters Symbol VCC(V) min max min max Unit Test Conditions
Input voltage HC Series VIH 2.0 1.5 1.5 V
4.5 3.15 3.15
6.0 4.2 4.2
HCT Series 4.5 to
5.5 2.0 2.0
HC Series VIL 2.0 0.3 0.3 V
4.5 0.9 0.9
6.0 1.2 1.2
HCT Series 4.5 to
5.5 0.8 0.8
Output HC Standard VOH 2.0 1.9 1.9 V Vin = VIH or VIL Iout = –20 µA
voltage Series type 4.5 4.4 4.4
6.0 5.9 5.9
4.5 3.98 3.84 Iout = –4.0 mA
6.0 5.48 5.34 Iout = –5.2 mA
Bus driver 2.0 1.9 1.9 Vin = VIH or VIL Iout = –20 µA
type 4.5 4.4 4.4
6.0 5.9 5.9
4.5 3.98 3.84 Iout = –6.0 mA
6.0 5.48 5.34 Iout = –7.8 mA
HCT Standard 4.5 4.4 4.4 Vin = VIH or VIL Iout = –20 µA
Series type 4.5 3.98 3.84 Iout = –4.0 mA
Bus driver 4.5 4.4 4.4 Vin = VIH or VIL Iout = –20 µA
type 4.5 3.98 3.84 Iout = –6.0 mA
HC Standard VOL 2.0 0.1 0.1 V Vin = VIH or VIL Iout = 20 µA
Series type 4.5 0.1 0.1
6.0 0.1 0.1
4.5 0.26 0.33 Iout = 4.0 mA
6.0 0.26 0.33 Iout = 5.2 mA
Bus driver 2.0 0.1 0.1 Vin = VIH or VIL Iout = 20 µA
type 4.5 0.1 0.1
6.0 0.1 0.1
Outline of Hitachi High-Speed CMOS Logic
6
Limits
+25˚C –40 to
+85˚C
Parameters Symbol VCC(V) min max min max Unit Test Conditions
Output HC Bus driver 4.5 0.26 0.33 V Vin = VIH or VIL Iout = 6.0 mA
voltage Series type 6.0 0.26 0.33 Iout = 7.8 mA
HCT Standard 4.5 0.1 0.1 Vin = VIH or VIL Iout = 20 µA
Series type 4.5 0.26 0.33 Iout = 4.0 mA
Bus driver 4.5 0.1 0.1 Vin = VIH or VIL Iout = 20 µA
type 4.5 0.26 0.33 Iout = 6.0 mA
Input leakage HC Series II6.0 ±0.1 ±1.0 µA Vin = VCC or GND
current HCT Series 5.5 ±0.1 ±1.0
Analog switch off- HC Series IS(off) 6.0 ±0.1 ±1.0 µA Vin = VIH or VIL
state current HCT Series 5.5 ±0.1 ±1.0 |VS| = VCC or VCC – VEE
3-state output off- HC Series IOZ 6.0 ±0.5 ±5.0 µA Vin = VIH or VIL
state current HCT Series 5.5 ±0.5 ±5.0 Vout = VCC or GND
Quiescent HC SSI ICC 6.0 2.0 20 µA Vin = VCC or GND
supply Series FF 6.0 4.0 40 Iout = 0 µA
current MSI 6.0 8.0 80
HCT SSI 5.5 2.0 20
Series FF 5.5 4.0 40
MSI 5.5 8.0 80
Outline of Hitachi High-Speed CMOS Logic
7
Table 2 Hitachi High-Speed CMOS Series Specifications
Limits
+25˚C –40 to
+85˚C
Parameters Symbol VCC(V) min max min max Uni t Test Conditions
Input voltage HC Series VIH 2.0 1.5 1.5 V
4.5 3.15 3.15
6.0 4.2 4.2
HCT Series 4.5 to
5.5 2.0 2.0
HC Series VIL 2.0 0.5 0.5 V
4.5 1.35 1.35
6.0 1.8 1.8
HCT Series 4.5 to
5.5 0.8 0.8
Output HC Standard VOH 2.0 1.9 1.9 V Vin = VIH or VIL IOH = –20 µA
voltage Series type 4.5 4.4 4.4
6.0 5.9 5.9
4.5 4.18 4.13 IOH = –4.0 mA
6.0 5.68 5.63 IOH = –5.2 mA
Bus driver 2.0 1.9 1.9 Vin = VIH or VIL IOH = –20 µA
type 4.5 4.4 4.4
6.0 5.9 5.9
4.5 4.18 4.13 IOH = –6.0 mA
6.0 5.68 5.63 IOH = –7.8 mA
HCT Standard 4.5 4.4 4.4 Vin = VIH or VIL IOH = –20 µA
Series type 4.5 4.18 4.13 IOH = –4.0 mA
Bus driver 4.5 4.4 4.4 Vin = VIH or VIL IOH = –20 µA
type 4.5 4.18 4.13 IOH = –6.0 mA
HC Standard VOL 2.0 0.1 0.1 V Vin = VIH or VIL IOL = 20 µA
Series type 4.5 0.1 0.1
6.0 0.1 0.1
4.5 0.26 0.33 V Vin = VIH or VIL IOL = 4.0 mA
6.0 0.26 0.33 IOL = 5.2 mA
Bus driver 2.0 0.1 0.1 Vin = VIH or VIL IOL = 20 µA
type 4.5 0.1 0.1
6.0 0.1 0.1
Outline of Hitachi High-Speed CMOS Logic
8
Limits
+25˚C –40 to
+85˚C
Parameters Symbol VCC(V) min max min max Uni t Test Conditions
Output HC Bus driver VOL 4.5 0.26 0.33 V Vin = VIH or VIL IOL = 6.0 mA
voltage Series type 6.0 0.26 0.33 IOL = 7.8 mA
HCT Standard 4.5 0.1 0.1 Vin = VIH or VIL IOL = 20 µA
Series type 4.5 0.26 0.33 IOL = 4.0 mA
Bus driver 4.5 0.1 0.1 Vin = VIH or VIL IOL = 20 µA
type 4.5 0.26 0.33 IOL = 6.0 mA
Input leakage HC Series II6.0 ±0.1 ±1.0 µA Vin = VCC or GND
current HCT Series 5.5 ±0.1 ±1.0
Analog Switch HC Series IS(off) 6.0 ±0.1 ±1.0 µA Vin = VIH or VIL
Off-state Current HCT Series 5.5 ±0.1 ±1.0 |VS| = VCC or VCC – VEE
3-state output Off- HC Series IOZ 6.0 ±0.5 ±5.0 µA Vin = VIH or VIL
state Current HCT Series 5.5 ±0.5 ±5.0 Vout = VCC or GND
Quiescent HC SSI ICC 6.0 1.0 10 µA Vin = VCC or GND
Supply Series FF 6.0 2.0 20 Iout = 0 µA
Current MSI 6.0 4.0 40
HCT SSI 5.5 1.0 10
Series FF 5.5 2.0 20
MSI 5.5 4.0 40
Outline of Hitachi High-Speed CMOS Logic
9
Symbols and Terms Defined for HD74HC Series
1. Explanation of Symbols Used in Electrical Characteristics and Recommended Operating
Conditions
1.1 DC characteristics
Symbol Term Description
VIH “H” level input voltage “H” level input voltage to ensure that a logic element
operates under some constraint.
VIL “L” level input voltage “L” level input voltage to ensure that a logic element
operates under some constraint.
VOL “L” level output voltage Output voltage in effect when, under the input condition for
bringing the output Low, the rated output current is allowed
to flow to the output terminal.
VOH “H” level output voltage Output voltage in effect when, under the input condition for
bringing the output High, the rated output current is allowed
to flow to the output terminal.
VT+Forward input threshold voltage Input voltage in effect when the operation of a logic element
varies as the input is allowed to go up from a voltage level
lower than the forward input threshold voltage VT-.
VT-Reverse input threshold voltage Input voltage in effect when the operation of a logic element
varies as the input is allowed to go up from a voltage level
lower than the reverse input threshold voltage VT+.
VHHysteresis voltage Differnce between forward input threshold voltage VT+ and
reverse threshold voltage VT-.
IOH “H” level output current Output current that flows out when, under the condition for
bringing the output High, the rated output voltage VOUT is
applied to the output terminal.
IOL “L” level output current Output current that flows out when, under the condition for
bringing the output High, the rated output voltage V
OU
T is
applied to the output terminal.
IIN Input leakage current Input current that flows in when the rated maximum input
voltage is applied to the input terminal.
IIH “H” level input current Input current that flows in when the rated “H” level voltage is
applied to the input.
IIL “L” level input current Input current that flows out when the rated “L” level voltage
is applied to the input.
IOZ Off-state output current (high
impedance) Current that flows to the 3-state output of an element under
the input condition for briging the output to High impedance.
Is(off) Analog switch off-state current Current that flows to the analog switch of an element under
the input condition for bringing the switch to off-state.
ICC Quiescent supply current Current that flows to the supply terminal (V
CC
) under the
rated input condition.
Outline of Hitachi High-Speed CMOS Logic
10
1.2 AC characteristics
Symbol Term Description
fmax Maximum clock frequency Maximum clock frequency that maintains the stable changes in
output logic level in the rated sequence under the I/O condition
allowing clock pulses to change the output state.
tTLH Rise (transient) time Rated time from “L” level to “H” level of a waveform during the
defined transient period changing from “L” level to “H” level.
tTHL Fall (transient) time Rated time from “H” level to “L” level of a waveform during the
defined transient period changing from “H” level to “L” level.
tPLH Output rise propagation delay
time Delay time between the rated voltage levels of an I/O voltage
waveform under a defined load condition, with the output
changing from “L” level to “H” level.
tPHL Output fall propagation delay
time Delay time between the rated voltage levels of an I/O voltage
waveform under a defined load condition, with the output
changing from “H” level to “L” level.
tHZ 3-state output disable time (“H”
level) Delay time between the rated voltage levels of an I/O voltage
waveform under a defined load condition, with the 3-state
output changing from “H” level to the high impedance state.
tLZ 3-state output disable time (“L”
level) Delay time between the rated voltatge levels of an I/O voltage
waveform under a defined load condition, with the 3-state
output changing from “L” level to the high impedance state
tZH 3-state output enable time (“H”
level) Delay time between the rated voltage levels of an I/O voltage
waveform under a defined load condition, with the 3-state
output changing from the high impedance state to “H” level.
tZL 3-state output enable time (“L”
level) Delay time between the rated voltage levels of an I/O voltage
waveform under a defined load condition, with the 3-state
output changing from the high impedance state to “L” level.
twPulse width Duration of time between the rated levels from a leading edge
to a trailing edge of a pulse waveform.
thHold time Time in which to hold date at the specified input terminal after
a change at another related input terminal (e.g., clock input).
tsu Setup time Time in which to set up and keep data at the specified input
terminal before a change at another related input terminal
(e.g., clock input).
trm Removal time Time period between the time when data at the specified input
terminal is released and the time when another related input
terminal (e.g., clock input) can be changed.
Cin Input capacitance Capacitance between GND terminal and an input terminal to
which 0 V is applied.
Outline of Hitachi High-Speed CMOS Logic
11
2. Explanation of Symbols Used in Function Table
Symbol Description
H High level (in steady state; noted "H" or “H” level in sentences)
L Low level (in steady state; noted "L" or “L” level in sentences)
Transition from L level to H level
Transition from H level to L level
X Either H or L
Z 3-state output off (high impedance)
a·····h Input level of steady state for each of inputs A-H
Q0Q level immediately before the indicated input condition is established
Q0Complement of Q
QnQ level immediately before the latest active change ( or ) occurs
Single H level pulse
Single L level pulse
TOGGLE Each output is changed to the complement of the preceding state by an active input
change ( or )
Measuring Method of AC Characteristics
Loading Circuit
Output Output Output
Measuring
point Measuring
point
Measuring
point
VCC
CL
S1
RL
RL
VCC
RL
CL
CL
(a) CMOS output (b) Open drain output (c) 3-state output
Notes: 1. CL includes the floating capacitance of probe and jig.
2. RL = 1 k (except for a particular specification)
Outline of Hitachi High-Speed CMOS Logic
12
Waveforms (Mutual relationship of waveforms)
Pulse Width (TW)
74HC Series
VCC
VCC
tr = 6ns tf = 6ns
tf = 6ns tr = 6ns
90% 90%
90% 90%
50% 50%
10% 10%
50% 50%
10% 10%
tw
tw
GND
GND
H-level Pulse
L-level Pulse
74HCT Series
3.0V
3.0V
tr = 6ns tf = 6ns
tf = 6ns tr = 6ns
2.7V 2.7V
2.7V 2.7V
1.3V 1.3V
0.3V 0.3V
1.3V 1.3V
0.3V 0.3V
tw
tw
GND
GND
H-level Pulse
L-level Pulse
Outline of Hitachi High-Speed CMOS Logic
13
Setup Time and Hold Time
74HC Series
50%
50%
90%
10%
50%
50%
50%
trVCC
GND
VOH
VOL
VOH
VOL
tsu th
tsu th
Clock or Latch
Enable Input *1
Positive
Data
Input
Negative
Data
Input
74HCT Series
1.3V
1.3V
90%
10%
1.3V
1.3V
1.3V
tr3.0V
GND
3.0V
GND
3.0V
GND
tsu th
tsu th
Clock or Latch
Enable Input *1
Positive
Data
Input
Negative
Data
Input
Note: Waveform for negative edge sensitive circuits will be inverted.
Outline of Hitachi High-Speed CMOS Logic
14
Removal Time
74HC Series
50%
90%
90%
50%
10%
50%
10%
10%
90% tr
VCC
GND
VCC
GND
VCC
GND
Clock
Input *1
Active Low
Clear or
Enable
Active
High Clear or
Enable
tf
trem
tr
trem
74HCT Series
1.3V
90%
90%
1.3V
10%
1.3V
10%
10%
90% tr
3.0V
GND
3.0V
GND
3.0V
GND
Clock
Input *1
Active Low
Clear or
Enable
Active
High Clear or
Enable
tf
trem
tr
Note: Waveform for negative edge sensitive circuits will be inverted.
Outline of Hitachi High-Speed CMOS Logic
15
Waveforms (Mutual relationship of waveforms)
Propagation Delay Time, Output Rise Time and Output Fall time
74HC Series
90%
50%
10%
90%
50%
10%
90%
90% 90%
50%
50% 50%
10%
90%
50%
10%
10% 10%
tr = 6ns tf = 6ns
tTLH
tTLH
tTHL
tTHL
tPHL
tPLH
tPLH
tPHL
VCC
GND
VOH
VOL
VOH
VOL
Input
Same-phase Output
Inverse-phase Output
Outline of Hitachi High-Speed CMOS Logic
16
74 HCT Series
90%
1.3V
10%
2.7V
1.3V
0.3V
90%
90% 90%
1.3V
1.3V 1.3V
10%
2.7V
1.3V
0.3V
10% 10%
tr = 6ns tf = 6ns
tTLH
tTLH
tTHL
tTHL
tPHL
tPLH
tPLH
tPHL
3.0V
GND
VOH
VOL
VOH
VOL
Input
Same-phase Output
Inverse-phase Output
Outline of Hitachi High-Speed CMOS Logic
17
Waveforms (Mutual relationship of waveforms)
Three-state Output, Enable Time and Disable Time
74HC Series
10%
10%
50%
90%
10%
50%
90%
90%
tLZ
tHZ
S1 : VCC
S1 : VCC
S1 : GNDS1 : GND
tZL
tZH 50%
50%
tf = 6ns tr = 6ns
Output Control
(L-level Enable)
Waveform 1
Waveform 2
VCC
GND
VOH
VOL
VOH
VOL
74HCT Series
10%
0.3V
1.3V
2.7V
0.3V
1.3V
2.7V
90%
tLZ
tHZ
S1 : VCC
S1 : VCC
S1 : GND
S1 : GND
tZL
tZH 1.3V
1.3V
tf = 6ns tr = 6ns
Output Control
(L-level Enable)
Waveform 1
Waveform 2
3.0V
GND
VOH
VOL
VOH
VOL
Notes: 1. Waveform 1 is an output under the internal condition like “L” except for the output disabled by the
output control.
2. Waveform 2 is an output under the internal condition like “H” except for the output disabled by the
output control.
Precautions in System Design
18
Precautions in System Design
In the system design, the problems to be considered are described in the following items:
1. Transfer Characteristics
Since the transfer characteristics of gate circuit varies with the number of working inputs, care must be
taken to the noise margin. In the multiple input NOR gate, the P channel MOS is connected to VCC in
series and the N channel MOS is connected to GND in parallel. In the NAND gate, the connection is
reverse. The output voltage VOUT in the transition area becomes a value obtained by distributing the supply
voltage at a split ratio according to the ON resistance of P channel MOS and N channel MOS. In the
multiple input NOR and NAND gates, the fall of transfer characteristic, that is, VIN(voltage noise margin)
that enters in the transition area changes according to the number of inputs as shown in Figure 1.
Number of inputs
1234
Vin
Vout
Number of inputs
1234
Vin
Vout
Figure 1
As seen from the above, it becomes clear that:
In the NOR gate, “0” level noise margin VNL decreases, and “1” level noise margin VNH increases
according to the number of working inputs.
In the NAND gate, the noise margins are fully reversed.
Precautions in System Design
19
2. Output Impedance
The output impedance of CMOS logic gate is influenced by the circuit configuration, the number of
working inputs, logical state and supply voltage. There are two regions of output impedance depending on
the operation:
Constant impedance area in which P and N channel MOS’ operate in the nonsaturated state.
Constant current area in which P and N channel MOS’ operate in the pinch-off state.
In designing a system including an interface circuit, the above must be considered.
3. Output Short-Circuit
Because no protective circuitry is provided to limit the output current, an output inadvertently shorted to
VCC or GND on the HS-CMOS logic IC is limited to the current value determined by the pinch-off effect of
the P-channel MOS and N-channel MOS for the output. Notice that such output short-circuit current, if
allowed to flow for a long time, could result in increased power dissipation or in a melted wire due to
excessive current density through metalization or other performance failures. For operating stability and
reliability, the maximum output current should remain within the maximum rating.
4. Unused Inputs
As shown in Figure 2, unused inputs must be:
(1) Directly connected to VCC for NAND gate circuits.
(2) Directly connected to GND for NOR gate circuits.
(3) Connected to VCC or GND through a proper resistor (10 kor 100 k.).
This is required because the extremely high input impedance of CMOS logic makes it subject to noise.
This noise causes the output logic level to be unstable. Furthermore, in some cases, if a gate is not used or
a flip-flop is not used, both p-channel MOS and n-channel MOS may conduct, causing ICC to flow.
VCC VCC VCC
100 k
100 kGND
GND
Vout
Vout
Vin
Vin
Figure 2 Examples of Handling Unused Inputs
Precautions in System Design
20
5. Input Impedance
Since all the input protective diodes are biased reversely in the ordinary operations, the input impedance of
CMOS logic IC is extremely high. When converted into a leak current, it is about several tens (pA) at a
temperature of 25˚C or about one (nA) even at 100˚C. Thus, the matching for operating the CMOS logic
IC has only to be considered at a voltage level. In the actual interface to other IC’s, however, remember
that fan-out is limited according to a capacitance value because inputs measured in capacity.
6. Parallel Connection of Gate Circuits
If it is necessary to increase source or sinking current, the same type gate circuits can be connected in
parallel as shown in Figure 3.
IOS0
IOS0
IOS1
IOS1
IOS1
IOS1
Increase of
source current Increase of
sinking current Increase of
sinking current
Figure 3 Examples of Parallel Connection
The switching speed improved at the same time. The source and sinking current capacities also increase in
proportion to the number of inputs.
7. Wired OR Connection
The wired OR connection is unrecommendable and shall not be used in CMOS logic IC’s. The reason is
that if the two gate outputs are connected with A = B = 0 and C = D = 1 as shown in Figure 4, the output
voltage is a value with which the supply voltage is divided by each of the resistance values of active P and
N channel MOS’, on an about half level (VCC - GND).
A
B
C
D
Y
Figure 4 Wired OR Connection
Precautions in System Design
21
8. Input Capacitance
In the CMOS logic IC, there is capacitance between the input and the GND. In addition to the major
capacitance between the gate and the substrate, the capacitance of package, leads and input protection
circuit are also included. The change input capacitance depending on the input voltage results mainly from
the capacitance between the gate and the substrate. This input capacitance has an advantage of temporarily
storing date in it by opening/closing the transmission gate. On the other hand, however, remember that the
input capacitance may slow down switching speed of mutually connected gate and also may increase the
power dissipation. The input capacitance is usually about 5 (pF) as specified in the standard.
9. Output Capacitance
The whole output capacitance of CMOS logic IC is the sum of the drain capacitance of output MOS and the
external load capacitance. It may be considered that the former is about 10 (pF) per output. The
propagation delay time increases linealy in proportion to the increase of external load capacitance as
described previously. The power dissipation also increases according to it. Especially, be careful in
attaching a large capacity of around 1 (1µF) outside.
The peak current at the gate transition, as described previously, is limited by the output characteristics of P
and N channel MOS’. In the buffer circuit, the peak current may increase (to 100 mA or more).
Pay sufficient attention to the fact that the rise of temperature in the chip may cause metal migration on the
metal wiring layer. If the peak current for gate circuit is set to about 50 mA and the one for buffer circuit is
set to about 100 mA, no consideration is required.
Precautions in System Design
22
10. Features of 3-state Output Circuit
In a system that requires bus configuration, the 3-state output element is brought from the necessity to place
unnecessary circuits in the high output impedance state through control input to operate necessary circuit
selectively when tow or more circuit is connected to one bus line. Figure 5 shows the typical 3-state
circuit. When the Disable input of control terminal is at “1” level, the output is at low impedance by the
switch operation. When at “0” level, the output is at extremely high impedance of 104 (M) at a room
temperature. Remember that the number of 3-state elements connectable to one bus line is limited by the
switching speed and supply voltage.
Disable
In
VCC
Out
GND
Figure 5 3-state Output Circuit
Precautions in System Design
23
11. Static Power Dissipation
In the CMOS logic IC, the P channel MOS and N channel MOS are mutually connected each other.
Therefore, either P channel or N channel is cut off in the input potential level static state. There is no path
in which the current from the power supply flows. Actually, the reverse bias leak current in all the P-N
junction in the chip including parasitic P-N junction flows only. The supply current in this state is referred
to as static current consumption, and the power dissipation as static power dissipation. The static current
consumption is a total of leak currents, and its values are extremely small as listed in Table 1. Thus, the
static current consumption is almost proportional to the supply voltage and increases exponentially in
proportion to temperature.
Table 1
Static Current Consumption ICC(max)
Type VCC +25˚C –40 to +85˚C
HC series SSI 6.0 V 1.0 µA 10 µA
FF 2.0 µA 20 µA
MSI 4.0 µA 40 µA
HCT series SSI 5.5 V 1.0 µA 10 µA
FF 2.0 µA 20 µA
MSI 4.0 µA 40 µA
12. Dynamic Power Dissipation
Assuming that the square pulse waves (tr = tf = 0) as shown in Figure 7 are applied to the input of the
inverter shown in Figure 6, the output steps from “0” level to “1” level in response to the input fall from
“1” level to “0” level.
VCC
Vout
Vin
CL
GND
ICC(P)
ICC(N)
Figure 6 Inveter circuit
Precautions in System Design
24
T
Vin
Vout
ICC(P)
ICC(N)
Figure 7 Operating Voltage and current of inverter circuit
Actually, VOUT is not converted into square waveforms. The reason is that the sum total CL of the outputs
such as external load capacitance and drain capacitance are inverted by charging them from 0 to VCC. For
charging, supply current ICC(P) flows through the active P channel MOS from VCC. Contrary to this, when
the input goes from “0” level to “1” level, CL discharges and ICC(N) flows into GND through the N channel
MOS. The supply current caused by the charge/discharge is dynamic current dissipation, and the power
dissipation is dynamic power dissipation. If the average power dissipation is taken as PT, it is obtained
theoritically as follows:
The power dissipation when ICC(P) flows into the P channel MOS in Figure 6 is ICC(P) (VCC - VOUT). If an
average is taken by the one cycle of input pulse, the average power dissipation PTP of P channel MOS is:
P = 1/T I (V - V ) dtTP CC(P) CC OUT
0
T
ICC(P) = CL · d(VCC - VOUT)/dt
In the same manner, the average power dissipation of N channel MOS is:
P = 1/T I (V - GND) dtTN CC(N) OUT
0
T
ICC(N) = CL · d(VOUT - GND)/dt
Thus, the average dynamic power dissipation PT is:
PT = PTP + PTN
= 1/T · CL · VCC2
= f · CL · VCC2
f : Input pulse frequency
It is clear that the dynamic power dissipation varies with the frequency, load capacitance and supply
voltage.
Figure 8 shows the aspect.
Precautions in System Design
25
Power Dissipation PT (mW)
Operating frequency f (Hz)
1 k 10 k 100 k 1 M 10 M 100 M
0.0001
0.001
0.01
0.1
1.0
10
100
CL = 150 pF
CL = 50 pF
CL = 15 pF
CL = OPEN
Figure 8 Power Dissipation VS. Operating Frequency
This relation shows a case where the square wave input with tr = tf = 0 is assumed. In an actual case, the
input pulse is considered a trapezoidal waveform. Thus, remember that the transition state in which both P
channel MOS and N channel MOS are simultaneously activate and DC current flows from VCC into GND
during this time. If input is used at an intermediate level, such as crystal oscillator circuit and a linear
amplifier, and if the circuits such as a differentiation circuit, an integration circuit and an oscillation circuit
process gentle waveforms, pay attention to the increase of power dissipation.
13. Caution of Supply Voltage
To decouple noises, the capacitance of 0.01 to 0.1 (µF) should be attached externally between VCC and
GND.
14. Caution of Fan-out
The number of fan-outs of CMOS logic IC is virtually unlimited in terms of DC. The reason is that the
input current is the P-N junction leak current of input protection circuit at most and its value is actually
approximate to 0 because the input is connected to the gate electrodes and insulated from the substrate.
Therefore, the number of fan-outs is not a problem in terms of DC. In AC, there is a slightly different
circumstance. Since the input has a capacity of about 5 (pF), the output capacitance increases if the input is
connected to the output. If the input capacitance is taken as 5 (pF), for example, the whole load
capacitance CL (pF) at the time the number of fan-outs is n and load capacitance is CO (pF) is:
CL = 5 • n + CO (pF)
On the other hand, the propagation delay time increases in proportion to the output load capacitance CL.
The operating speed decreases according to the number of inputs (fan-outs) connected to the output.
Therefore, remember that the number of fan-outs is fairly limited if a high-speed operation is required.
Precautions in System Design
26
15. Cautions on Actual Operation
(1) The rise time and fall time of input waveforms should be 500 ns or less. Since the voltage gain is very
high near the threshold, the slightest ripples on the input voltage may cause the output to produce a
corresponding waveform, making the output operation unstable.
(2) The power line should be sufficiently filtered for the device. The input threshold voltage of the IC
varies with the supply voltage. A ripple on the power line may change the input threshold, causing the
same malfunction as noted in (1) above.
(3) Beware of a ringing (waveform distortion). Because the switching from “1” level to “0” level on vice
versa is very fast, the load capacitance plus the wiring inductance may cause a ringing. Care should be
taken to arrange the circuit configuration, PCB layout and wiring appropriately.
Application Note
27
Application Note
1. Input Protection Circuit
An Si-gate process is applied to Hitachi’s high-speed CMOS logic ICs.They have a thinner gate oxide
compared to conventional Al-gate CMOS logic ICs and are composed into finer patterns.
Therefore, an input protection circuit is necessary for the gate to be protected from surges at the input pins.
Since Al-gate CMOS logic ICs use a diffusion resistor as the input protection resistor (as shown in Figure
1a), input over-current flows directly to the power supply and the destruction of the protection diode may
occur.
On the other hand, using polysilicone as its input protection resistor (shown in Figure 1b), high-speed
CMOS logic ICs take the role of a current limiter to counter input over voltage.
GND
Poly-Si
resistor
Input
Input
VCC
GND
VCC
GND
GND
P well
P well
(a) Al-gate CMOS logic
(b) Si-gate CMOS logic
N+diffusion
resistor
N+
P+diffusion
resistor P+diffusion
resistor
P+
Poly-Si
resistor
Input Internal logic circuit
Input Internal logic circuit
N+diffusion
resistor
Internal
logic
circuit
Internal
logic
circuit
N sub VCC
N sub VCC
Figure 1 Input Protection Deevice and Equivalent Circuit
Application Note
28
2. Electric Static Discharge Immunity (ESD Immunity)
ESD immunity is evaluated by the capacitor discharge method shown in the test circuit of Figure 2. The
capacitor is 200 pF, accounting for the electrostatic capacitance of human bodies. Figure 3 shows an
example of ESD immunity of integrated circuits for each products series.
The ESD for high-speed CMOS logic is over ±200 V, which is the same level or better than LS-TTL.
C = 200 pF
Test Pin
GND
Figure 2 ESD Immunity Test Circuit
0 200 400100 300 500
Applied voltage (V)
1
2
10
20
30
40
50
60
70
80
90
95
3
4
5
Accumulated failure rate
HD74HC/HCT Series (HS-CMOS)
HD74S Series (S-TTL)
HD74LS Series (LS-TTL)
HD14000B Series (CMOS Logic)
HD17000 Series (industrial linear)
8-bit microcomputer (CMOS)
256k DRAM (NMOS)
Figure 3 ESD Immunity for Each Series
Application Note
29
3. Latch-Up
3.1 Latch-up
Latch-up is an inevitable phenomenon occurring from the basical structure of CMOS logic ICs.
Since CMOS has PMOS and NMOS on one chip, NPN and PNP transistors are made. These two types of
transistors are combined into a PNPN structure, in which a parasitic thyristor is formed (see Figure 4).
If excessive noise is applied to the input or output pins when the IC is operating, the parasitic thyristor will
turn on and the abnormal current will flow through the power supply pin to ground.
If the power supply is turned off, the IC will be restored to its normal state, however, the internal AI wiring
of the IC may melt thus causing the IC to be destroyed.
There are countermeasures to prevent latch-up as listed below
(1) Separate PMOS from NMOS.
(2) Shut down electrical paths between PNP and NPN transistors which form parasitic thyristors by its
layout pattern.
(3) Isolate each MOS transistor with an insulator to prevent the formation of parasitic thyristors.
Hitachi’s high-speed CMOS logic utilizes method (2)
VCC
VCC
In
Out
N-sub
(a) Parasitic PNP, NPN transistor (b) Equivalent circuit
R1
R1
R2
Q1Q2Q2
Q1
γB2
γB1
P+P+P+
N+N+
P+
Figure 4 Parasitic Thyristor
Application Note
30
3.2 Latch-Up immunity
Latch-up immunity is evaluated by the test circuit shown in Figure 5.
Table 1 lists the test results of latch-up immunity of Hitachi’s high-speed CMOS logic.
The starting voltage of high-speed CMOS logic is over ±300 V which causes almost no problems for
practical use.
A
All other input
pins are conne-
cted to either
VCC or GND.
Test pin
VCC
GND
C = 200pF
VCC = 7V
ICC
Figure 5 Latch-Up Immunity Test Circuit
Table 1 Latch-Up Starting Voltage Test Results
Latch-up starting voltage
Positive Over 300 V
Negative Over 300 V
Measured samples
HD74HC00
HD74HC02
HD74HC04
HD74HC08
HD74HC14
HD74HC32
HD74HC74
Application Note
31
HD74HC138
HD74HC139
HD74HC157
HD74HC158
HD74HC175
HD74HC273
HD74HC373
HD74HC533
5 pieces per type
4. Electrical Characteristics
4.1 DC characteristics
(1) Logic threshold voltage (VTH)
The Logic threshold voltage (VTH) of Hitachi’s high-speed CMOS logic ICs (HD74HC Series) is at half
the level of VCC in order to set up the widest noise margin possible.
(2) Output current characteristics
Hitachi’s high-speed CMOS logic ICs have symmetrical characteristics between IOH and IOL. Thus, the
balance between tPLH and tPHL is mostly kept even when connecting with a comparatively large load
capacitance.
Figures 7 and 8 show the output current characteristics.
Application Note
32
0
2
4
6
246
Input voltage VIN (V)
Output voltage VOUT (V)
VCC = 6 V
VCC = 4.5 V
VCC = 2 V
Figure 6 Output Voltage vs Input Voltage
0246
Low output voltage VOL (V)
20
40
60
80
100
120
Low output current IOL (mA)
VCC = 6 V
4.5 V
2 V
(b) Standard output (HD74HC00)
0246
Low output voltage VOL (V)
20
40
60
80
100
120
Low output current IOL (mA)
VCC = 6 V
4.5 V
2 V
(b) Bus driver output (HD74HC244)
Figure 7 Output Current vs Voltage (Low Level)
Application Note
33
0642
High output voltage VOH (V)
–100
–80
–60
–20
0
–40
High output voltage IOH (mA)
VCC = 2 V
4.5 V
6 V
(a) Standard output (HD74HC00)
0642
High output voltage VOH (V)
(b) Bus driver output (HD74HC244)
–100
–80
–60
–20
0
–40
High output voltage IOH (mA)
VCC = 2 V
4.5 V
6 V
Figure 8 Output Current vs Voltage (High Level)
4.2 AC characteristics
tPLH and tPHL of Hitachi’s high-speed CMOS logic ICs are set up to be about the same to simplify system
timing design.
(1) Propagation delay time, output rise and fall time vs supply voltage characteristics.
0246
Supply voltage VCC (V)
5
10
20
50 Ta = 25°C
CL = 50 pF
Propagation delay time tPLH, tPHL (ns)
tPLH
tPHL
(a) Standard output (HD74HC00)
0246
Supply voltage VCC (V)
5
Ta = 25°C
CL = 50 pF
5
10
20
50
Propagation delay time tPLH, tPHL (ns)
tPHL
tPLH
(b) Bus driver output (HD74HC244)
Figure 9 Propagation Delay Time vs Supply Voltage
Application Note
34
Ta = 25°C
CL = 50 pF
0246
Supply voltage VCC (V)
2
5
10
20
Output rise and fall time tTLH, tTHL (ns)
tTHL
tTLH
Ta = 25°C
CL = 50 pF
0246
Supply voltage VCC (V)
2
5
10
20
Output rise and fall time tTLH, tTHL (ns)
tTHL
tTLH
Figure 10 Output Rise and Fall Time vs Supply Voltage
(2) Propagation delay time, output rise and fall time vs load capacitance characteristics.
0 50 200100 150
Load capacitance CL (pF)
5
10
15
20 VCC = 4.5 V
Ta = 25°C
Propagation delay time tPLH, tPHL (ns)
tPHL
tPLH
(a) Standard output (HD74HC00)
0 50 200100 150
Load capacitance CL (pF)
5
10
15
20 VCC = 4.5 V
Ta = 25°C
Propagation delay time tPLH, tPHL (ns)
tPHL
tPLH
(b) Bus driver output (HD74HC244)
Figure 11 Propagation Delay Time vs Load Capacitance
Application Note
35
5
10
15
20
25 VCC = 4.5 V
Ta = 25°C
0 50 200100 150
Load capacitance CL (pF)
Output rise and fall time tTLH, tTHL (ns)
tTHL
tTLH
5
10
15
20
25 VCC = 4.5 V
Ta = 25°C
0 50 200100 150
Load capacitance CL (pF)
Output rise and fall time tTLH, tTHL (ns)
tTHL
tTLH
(b) Bus driver output (HD74HC244)
(a) Standard output (HD74HC00)
Figure 12 Output Rise and Fall Time vs Load Capacitance
Application Note
36
5. Power Dissipation
5.1 Calculating the power dissipation
The power dissipation PT of high-speed CMOS logic can be calculated by (1). From this equation, the
power dissipation depends on the load capacitance, frequency and supply voltage.
PT = (CL + CPD)· f · VCC2 (1)
Figure 13 shows examples of the operating frequency with the power supply current.
0101.0
Operating frequency f (MHz)
0.01
0.1
1.0
LS-TTL HD74LS74
Power supply current (per circuit) (mA)
High-speed CMOS logic HD74HC74
C
L
= 50 pF
C
L
= 0 pF
CL = 50 pF
CL = 0 pF
Figure 13 Operating Frequency vs Power Supply Current
Application Note
37
5.2 Power dissipation capacitance
Power dissipation capacitance (Cpd) can be calculated by the following equations,
PT1 = CPD · VCC2 · f1 = ICC1 · VCC (2)
PT2 = CPD · VCC2 · f2 = ICC2 · VCC (3)
therefore,
C= P–P
V(ff)
=I–I
V(ff)
PD T2 T1
CC221
CC2CC1
CC 2 1
(4)
then,
ICC1 : Supply current at frequency f1
ICC2 : Supply current at frequency f2
Table 2 lists the power dissipation capacitance of Hitachi’s high-speed CMOS logic.
Furthermore, the power dissipation capacitance differs according to the input conditions.
Table 3 shows typical examples.
Table 2 Power Dissipation Capacitance of High-Speed CMOS
Function Product part no. Note 1 Power dissipation capacitance typ. (pF)
Gate HD74HC00 * 27
HD74HC04 * 24
Flip-Flop D-type HD74HC74 * 41
J-K-type HD74HC76 * 49
COMPARATOR HD74HC85 P 48
DECORDER HD74HC138 P 90
COUNTER HD74HC161 P 57
BUFFER HD74HC240 * 42
MULTIPLEXER HD74HC258 P 78
LATCH HD74HC373 P 57
Notes: 1. *:Per circuit; P:Per package.
2. Measurement circuit is shown in figure 14.
Application Note
38
VCC
VCC
Y
AA
P.G. Y
P.G. A
HD74HC00 HD74HC04
VCC
P.G.1
P.G.2
A
PR
CLR
CK
D
Q
Q
fPG1
fPG2
fPG2=1/2PG1
HD74HC74
VCC
P.G.
A
J
CK
CLR
Q
Q
HD74HC76
PR
VCC VCC
A
A = B
A
P.G.
A < B
A < B
A > B
A > B
A = B
Other
Inputs
P.G.
G1
A
B
C
Y0
Y1
Y2
Y3
Y4
Y5
Y6
Y7
G2A
G2B
HD74HC85 HD74HC138
A
B
Figure 14 Measurement Circuits for Dynamic Power Supply Current
Application Note
39
A
VCC
VCC
Y
A
P.G. P.G.
EP
ET
CLR
LD QA
QB
QC
QD
Carry
CK
A
B
C
D
G
A
HD74HC161 HD74HC240
VCC VCC
AA
P.G.
1B
S
Other
Inputs
1Y
2Y
3Y
4Y P.G.
1Q
2Q
3Q
4Q
5Q
6Q
7Q
8Q
1D
2D
3D
4D
5D
6D
7D
8D
OC
EG
HD74HC258 HD74HC373
Measurement conditions
Ta = 25°C
VCC = 6V
f1 = 1MHz
f2 = 5MHz
duty = 50%
tr = tf = 6ns
trtr
90%
10% 10%
90%
Figure 14 Measurement Circuits for Dynamic Power Supply Current (cont)
Application Note
40
Table 3 Power Dissipation Capacitance by Input Conditions
Product part no. Input conditions Power dissipation capacitance (pF)
HD74HC00 Single input
VCC
A
P.G. A
B
27
Double input
VCC
A
P.G. A
B
27
HD74HC161 Counting operation VCC
A
P.G.
EP
ET
CLR
LD QA
QB
QC
QD
Carry
CK
A
B
C
D
57
Preset operation
VCC
A
P.G.1
P.G.2
EP
ET
CLR QA
QB
QC
QD
Carry
CK
A
B
C
D
LD
113
Application Note
41
6. Decoupling
CMOS logic ICs have current spikes when switching. These spikes are produced by the repeated charging
and discharging of the output capacitance when charging the output level from low to high or high to low.
Because of the current spikes the potentials of VCC and GND change, and large current spikes flow when
switching. Therefore ringing is produced at the output. (See Figure 15 a.)
To prevent this, decoupling capacitors must be provided externally between VCC and GND.
This is proven to be useful in instantly absorbing the current and ringing at the output as shown in Figure
15 b.
Output voltage
waveform
VCC current
waveform
GND current
waveform
(a) No decoupling capacitor (b) Decoupling capacitor (0.1 µF)
Vertical
Horizontal 20 mA/div
100 ns/div
Vertical
Horizontal 2 V/div
100 ns/div
GND
0
0
Figure 15 HD74HC00 Spike Current Waveform
7. Precautions on Board Design
High-speed CMOS logic has different electrical characteristics, such as switching speed and output current
drivability, from the conventional standard logics (Al-gate CMOS, LS-TTL). The system design requires
an application technique for high-speed CMOS logic.
Here an interfacing technique between high-speed CMOS logic and LS-TTL will be explained.
7.1 Transmission line reflection
(1) Analysis of transmission signals by the Bergeron diagram The Bergeron diagram is commonly used for
the analysis of transmission signals in high-speed digital systems.
Figure 17 is the analysis result of an actual transmission model which is shown in Figure 16.
Application Note
42
As for the analysis conditions, Z0 = 125 considering the standard system board, and the wiring length (l)
is 1.5 m.
The output impedance of the HD74HC04, which operates as a driver becomes the IOH - VOH characteristic
curve when the output is high, and the input impedance of the HD74LS04 which operates as a receiver
becomes the IIH - VIH characteristic curve.
On the other hand, when the output level of the HD74HC04 is low, the output impedance becomes the IOL -
VOL characteristic curve and the input impedance becomes the IF - VF characteristic curve.
The drawing of load line Z0 as these input/output impedance curves enables the reflection of the
transmission signal to be analyzed.
The intersection coordinates in Figure 17 shows the voltage and current values at the drive end of 2T (T
being the propagation delay from the driver end to the receiver end) intervals when the coordinates are even
numbers (2T, 4T) or zero, or the voltage and current values at the receiver end when the coordinates are
odd numbers (T, 3T, 5T).
Figure 18 shows the analysis result of the voltage waveform at the receiver end.
Application Note
43
0
–VP1
–VP2
+VP2
+VP1
Voltage (V)
time t
(b) Receiver waveform model
Driver Receiver
HD74LS04
HD74HC240
Z0
l
: 1.5 m
: 125
50
(a) Digiral signal transmission model circuit
l
Z0
Note: The model circuit above (Figure 16a) is used for analysis when the high-speed CMOS logic
HD74HC240 is connected as a driver, and the LS-TTL HD74LS04 as a receiver
The waveform model for overshoot and undershoot at the receiver end is shown in Figure 16b.
Figure 16 Digital Signal Transmission
Application Note
44
V (V)
8
7
6
3
2
1
–1
–2
–100 –80 –60 –40 40 60 80 100
20
2T
3T
3T
3T
4T
2T
0
5T
4
5
T
HD74LS04
IF – VF
characteristics
HD74HC240
IOL – VOL
characteristics
HD74HC240
IOH – VOH
characteristics
Z0 load line
I (mA)
l
Z0
Ta
: 1.5 m
: 125
: 25°C
–20
Figure 17 Bergeron Diagram Analysis of the Transmission Model
500
8
7
6
5
4
3
2
1
0
–1
Voltage (V)
+VP2
0 100 200 300
Time t (ns)
400 600 700 800
Figure 18 Analysis Results of the Waveform at the Receiver End
(2) An example for measuring the reflection on the transmission line Figure 19 shows the measured results
of the reflection of the transmission line using three types of transmission line media such as 1) coaxial
cable (Z0 = 50 ), 2) twisted pair cable (Z0 = 120 ), and 3) single lead wire (Z0 = 150 to 200 ).
Figure 19 shows that the drivers and receivers operate normally with a wiring length of up to 2 m.
However, careful precautions should be taken when considering impedance in practical system designing.
Application Note
45
Transmission
line
midium
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Receiver
HD74HC240
Driver
HD74HC240 Receiver
HD74HC240
Driver
HD74HC240
Coaxial cable
(
l
= 2m)
Twisted pair cable
(
l
= 2m)
Single lead wire
(
l
= 2m)
PG
50
Waveform Waveform Waveform
Waveform , ,
Vertical
Horizontal 5 V/div
100 ns/div
HD74HC240
HD74LS04
Receiver
Driver
HD74HC240 Wiring length l = 2 m
Driving pulse
for all inputs
( )
CL = 50 pF
R
L
= 1 k
VCC
Measurement conditions
VCC = 5 V
Ta = 25°C
f = 1 MHz
duty = 50%
tr = tf = 6 ns
Note:The load circuit shown on the
right is used when the HD74LS04 is
used as a receiver.
Figure 19 Reflection Ringing Waveforms (Driver: HD74HC240)
Application Note
46
7.2 Crosstalk
Crosstalk is the capacitative coupling of signals from one line to another.
Figure 20 shows an example of crosstalk noise levels using a twisted pair cable.
Figure 20 also shows that the wiring length beyond 1 m causes malfunction.
Careful precautions should be taken especially when the spacing between circuits is narrow.
Application Note
47
Waveform
Waveform3
Waveform2
Driver and receiver : HD74HC240
Wiring length l
PG
50
C
L
= 50 pF
C
L
= 50 pF
Vin
Measurement conditions
V
CC
= 5 V
Ta = 25°C
f = 1 MHz
duty = 50%
t
r
= t
f
= 6 ns
Waveform
Vertical
Horizontal 5 V/div
100 ns/div
Waveform ,
Vertical
Horizontal 2 V/div
100 ns/div
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Waveform
GND
Wiring
lenght
l = 2m
l = 1m
l
= 0.5m
Vin = Low Vin = High
Figure 20 Crosstalk Noise Waveform (Driver: HD74HC240)
Application Note
48
8. Multivibrator
The output pulse width (twq) of a multivibrator is determined by the external capacitance (cext) and external
resistor (Rext), and calculated by the equation twq = K · Rext · Cext.
The value of constant K determines the part number according to the JEDEC committee as listed in Table
4.
Hitachi has 4 types of high-speed CMOS logic, HD74HC123A, 221, 423A, 4538.
Constant K changes from the values of Table 4 when Cext is less than 0.01 µF.
Figure 21 and 22 graph the output pulse width vs external capacitance, constant K vs power supply voltage
characteristics of the HD74HC123A.
Table 4 JEDEC SP of Multivibrators
Product part no. Output pulse width
74HC123 tWQ = 0.45 · (Rext) · (Cext)
123A* tWQ = 1.0 · (Rext) · (Cext)
74HC221* tWQ = 0.7 · (Rext) · (Cext)
221A tWQ = 1.0 · (Rext) · (Cext)
74HC423 tWQ = 0.45 · (Rext) · (Cext)
423A* tWQ = 1.0 · (Rext) · (Cext)
74HC4538* tWQ = 0.7 · (Rext) · (Cext)
Note: *Presently under mass production at Hitachi.
Application Note
49
Output pulse width tWQ (s)
0.001 µ0.01 µ0.1 µ1.0 µ
External capacitance Cext (F)
0.0001 µ0.00001 µ
100 n
1 µ
10 µ
100 µ
1 m
10 m
100 m Ta = 25°C
VCC = 5 V Rext = 1000 k
100 k
10 k
1 k
Figure 21 Output Pulse Width vs External Capacitance and Resistance
Constant K
64
Supply voltage VCC (V)
20
0.8
1.0
1.2
1.4
Cext = 0.001 µF
Rext = 10 k
Cext = 1 µF
Note: In order to prevent any malfunctions due to noise, connect a high-frequency performance
capacitor between VCC and GND, and keep the wiring between the external components and
Cext, Rext/Cext pins as short as possible.
Figure 22 Constant K vs Supply Voltage
Application Note
50
9. Interfacing
Hitachi’s high-speed CMOS logic has two types of input voltage levels, 74HC and 74HCT.
The 74HC has a CMOS-type input level and the 74HCT has a TTL-type input level.
Interfacing from high-speed CMOS logic to LS-TTL
Since the output level of high-speed CMOS logic is of CMOS, the use of an interfacing circuit is not
necessary.
This is the same case for a microcomputer and memory IC with TTL input levels.
VOH = 4.13V min > VIH = 2.0V min
VOL = 0.37V max < VIL = 0.8V max
VCC
GND
LS TTL74HC or 74HCT
Figure 23 Interfacing HS-CMOS to LS-TTL
Interfacing from LS-TTL to high-speed CMOS logic (74HCT type)
An interfacing circuit is not necessary.
This is the same case for a microcomputer and memory IC with TTL output levels.
VOH = 2.7V min > VIH = 2.0V min
VOL = 0.4V max < VIL = 0.8V max
VCC
GND
LS TTL 74HCT
Figure 24 Interfacing LS-TTL to 74HCT
Interfacing from LS-TTL to high-speed CMOS logic (74HC type)
A pull-up resistor should be added as shown in Figure 25.
The output voltage of LS-TTL (VOH) is 2.7 V (min), where as the input voltage of 74HC (VIH) is 3.15 V
(min.).
Application Note
51
This implies that LS-TTL cannot drive 74HC types directly.
This is the same case for a microcomputer and memory ICs with TTL output levels.
VOH = 2.7V min < VIH = 3.15V min
VOL = 0.4V max < VIL = 1.35V max
VCC
GND
LS TTL 74HC
R
Pull-up resistor
Figure 25 Interfacing LS-TTL to 74HC
Interfacing from LS-TTL with 3-state output to high-speed CMOS logic.
A pull-up or pull-down resistor should be added as shown in Figure 26.
When the output of a LS-TTL is in the high-impedance state, the input of the high-speed CMOS becomes
unstable.
This is the same case for all devices with a tri-state output structure.
VCC
GND
LS TTL with
3-state output 74HC
74HCT
Figure 26 Interfacing LS-TTL with 3-state Output to 74HC or 74HCT
Application Note
52
10. Surface Mount Package
10.1 Mounting small outline packages (SOP, TSSOP)
The explanation on the mounting of SOPs describes the characteristics and reliabilities of the small IC
package.
(1) Dip Soldering
Initially, the package is temporarily fixed on to the board by an adhesive.
Adhesive agent applied
Adhesive agent Cured
Residual flux removed
SOP attached
Adhesive
agent PCB
SOP
Direction of movement
Finished product
Wave solder
(solder vessel
for surface
mounting)
Dip soldering
Assembly completed
Electrode
Figure 27 Process Flow for Dip Soldering SOP
With the component side of the board downward, the package is then passed through molten solder. Figure
27 depicts the process flow for dip soldering SOP. As compared with reflow methods, this method exerts
an extremely high thermal stress on the semiconductor chips. The adverse effects from this thermal should
be avoided by providing a preheating zone to lessen the thermal shock and by minimizing the soldering
time. Figure 28 shows a typical temperature profile for dip soldering.
The dip soldering temperature is 260˚C maximum at a period of 10 seconds maximum (2 to 4 seconds is
recommended).
Application Note
53
Natural or
forced air
cooling
Solder melting point
Time
PCB surface temperature
Cooling
Dipping
Preheating 1 to 3 min
2 to 4 sec
80 to 150°C
T(max) = 260°C
Temperature
Figure 28 Temperature Profile of Dip Soldering
(2) Reflow Soldering
Reflow soldering is the basic method of mounting the SOP on to a board.
The solder composition to be used is Sn63/Pb37 or Sn62/Pb36/Ag2 with a melting point of 183˚C to
193˚C.
A recommended pasty flux is solder cream SP210-2 by Tamura Kaken. A pasty flux and organic solvent
are also used during the process.
Be careful to reflow solder at a low temperature for short periods of time. The recommended conditions
are shown below. The allowable board temperature is 230˚C maximum and the maximum heating time is
15 sec.
(3) Footprint dimension vs solderability
The failure rate of soldering is affected by footprint dimensions. Figure 29 shows the soldering failure with
the footprint dimension.
The recommended dimensions are within the safety zone of this figure.
When reflow sordering SOPs, the recommended thickness of a footprint is 0.2 mm min.
Application Note
54
Displacement
Safety
Bridge formed by solder
Lack of solder
Width of footprint W (mm)
Length of footprint L (mm)
0.1
0.6
0.7
0.8
0.9
1.0
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
1.9
2.0
0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0
W
L
e1
SOP
Foot print
Notes: 1. Pin pitch = 1.27 mm
2. Recommended spacings between footprint centers.
e1 = 7.62 mm (SOP-14, 16)
e1 = 9.53 mm (SOP-20)
3. Both W and L are footprint dimensions based on the lead direction of the SOP.
Figure 29 Recommended Dimension of Footprint
(4) Thermal Resistance of SOP
Figure 30 shows the derating curves for SOPs of high-speed CMOS logic, and Table 6 lists the thermal
resistance (θj-a) for SOPs.
Application Note
55
25 30 35 40 45 50 55 60 65 70 75 80 85
Operating Ambient Temperature Ta (°C)
Maximnm continuous dissipation Pt (mW)
Derating curve of 14/16-pin SOP
1136
1000
961
785
681
576
500
468 at Tj (max) = 150 °C
at Tj (max) = 100 °C
No.
(1)
(2)
(3)
Wind
velocity Derating
factor
0m/s
1m/s
3m/s
6.3mW/°C
7.7mW/°C
9.1mW/°C
No.
(1)
(2)
(3)
Wind
velocity Derating
factor
0m/s
1m/s
3m/s
6.7mW/°C
9.1mW/°C
10.5mW/°C
25 30 35 40 45 50 55 60 65 70 75 80 85
Operatin
g
Ambient Temperature Ta
(
°C
)
Maximnm continuous dissipation Pt (mW)
Derating curve of 20-pin SOP
1312
1000
1137
835
767
682
500
502 at Tj (max) = 150 °C
at Tj (max) = 100 °C
(3)
(1)
(2)
(2)
(3)
(3)
(1)
(2)
(3)
(2)
(1)
(1)
Note: When Ta is below 25˚C, PT becomes the same value as at Ta = 25˚C being independent of Ta.
The data above was measured by using the VBE method on a glass-epoxy board (40×40×1.0
mm) with wiring density of 10%.
Careful considerations are required for input and load conditions, Ta, cooling, etc., during actual
use.
Figure 30 Derating Curves of SOP
Application Note
56
Table 6 Thermal Resistance of SOPs
Maximum continuous dissipation Ta = 25˚C
Number of
pins Wind velocity Derating factor Thermal
resistance Tj(max) = 150˚C Tj(max) = 100˚C
14 0 m/s 6.3 mW/˚C 160 ˚C/W 785 mW 468 mW
16 1 m/s 7.7 mW/˚C 130 ˚C/W 961 mW 576 mW
3 m/s 9.1 mW/˚C 110 ˚C/W 1136 mW 681 mW
20 0 m/s 6.7 mW/˚C 150 ˚C/W 835 mW 502 mW
1 m/s 9.1 mW/˚C 110 ˚C/W 1137 mW 682 mW
3 m/s 10.5 mW/˚C 95 ˚C/W 1312 mW 787 mW
(5) Thermal Resistance of TSSOP
Figure 31 shows the derating curve of TSSOP with HD74BC/AC/HC devices, table 7 shows the thermal
resistance (θj-a) and figure 32 shows the mounting method.
Derating Curves of Thin Small Outline Package
(14, 16, 20 and 24 Pins) at Tj (max) = 100°C
1000
500
300
25 30 35 40 45 50 55 60 65 70 75 80 85
Operatin
g
Temperature Ta
(
°C
)
Operatin
g
Temperature Ta
(
°C
)
1000
500
757
862
25 30 35 40 45 50 55 60 65 70 75 80 85
Tolerable Power Dissipation P
T (mW)
Tolerable Power Dissipation P
T (mW)
24 pin
20 pin
Derating Curves of Thin Small Outline Package
(14, 16, 20 and 24 Pins) at Tj (max) = 150°C
0
454
517
24 pin
20 pin
14/16 pin
14/16 pin
0
Note: Fore the ambient temperature less than 25˚C, the power dissipation at 25˚C is applied. The data
above are measured by VBE method mounting on glass epoxy board (40 × 40 × 1.6 mm) with
10% of wiring density. In the actual application, using conditions, ambient temperature and
forced air-cooling conditions should be sufficiently examined.
Figure 31 Derating Curve of TSSOP
Application Note
57
Table 7 Thermal Resistance of TSSOP Package
Tolerable power dissipation
Number of
pins Wind velocity Derating factor Thermal
resistance at Tj(max) = 150˚C at Tj(max) = 100˚C
14 0 m/s 4.0 mW/˚C 250˚C/W 500 mW 300 mW
16
20 0 m/s 6.1 mW/˚C 165˚C/W 757 mW 454 mW
24 0 m/s 6.9 mW/˚C 145˚C/W 862 mW 517 mW
(6) TSSOP Solder Mounting
235°C
max 10sec max
140 to 160°C
60sec 1 to 4°C/sec
1 to 5°C/sec
Surface Temperature of Package
Time
Infrared-ray Reflow
Recommended Conditions
215°C30sec max
140 to 160°C
60sec
1 to 5°C/sec
Surface Temperature of Package
Time
Vapor-phase Reflow
Recommended Conditions
Recommended:For the whole heating on solder mounting, infrared-ray reflow and vapor-phase reflow are
recommended. (Solder-dipping is not recommended.)
Figure 32 Mounting Method of TSSOP
Application Note
58
(7) Marking on Package
(a) Small outline Package (EIAJ) 14, 16, 20 pins
YMWC
BC A
HD74BC Series
YMWC
AC
HD74AC Series
YMWC
HC
HD74HC Series
Lot No.
Type No.
(b) Small outline Package (JEDEC) 14, 16, 20 pins
YMWC
BC A
HD74BC Series
YMWC
AC
HD74AC Series
YMWC
HC
HD74HC Series
Lot No.
Type No.
Note: Meaning of marking on package example device name:
HD74BC245AT
Y: Year code (the last digit of year)
M: Month code
W: Week code
C: Control code
Type No.: delete HD74 and package code (T) from device name
(c) Thin Shrink Small outline Package 14, 16, 20 pins
YMWC
A
BC
HD74BC Series
YMWC CA
HD74AC Series
YMWC
HC
HD74HC Series
Lot No.
Type No.
• 14, 16, 20 pins
Note: Meaning of marking on package example device name:
HD74BC245AT
Y: Year code (the last digit of year)
M: Month code
W: Week code
C: Control code
Type No.: delete HD74 and package code (T) from device name