CL10C200JB81PNC - Samsung [Electro-Mechanics]

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Supplier : Samsung electro-mechanics  Samsung P/N : CL10C200JB81PNC

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Product : Multi-layer Ceramic Capacitor 

Description : CAP, 20㎊, 50V, ±5%, C0G, 0603

 AEC-Q 200 Specified

CL 10 C200 J B 8 1 P N C

① ② ③ ④ ⑤ ⑥ ⑦ ⑧⑨⑩⑪

①Series Samsung Multi-layer Ceramic Capacitor

②Size 0603 (inch code) L: 1.6 ± 0.1 mm W: ± 0.1 mm

③Dielectric C0G ⑧Inner electrode Ni

④Capacitance 20 ㎊Termination Cu

⑤Capacitance ±5 % Plating Sn 100% (Pb Free)

tolerance ⑨Product Automotive

⑥Rated Voltage 50 V ⑩Grade code Standard

⑦Thickness 0.8 ± 0.1 mm ⑪Packaging Cardboard Type, 7" reel

(4,000ea)

B. Reliability Test and Judgement condition

High Temperature

Unpowered, 1000hrs@T

150

℃

0.8

Specification of Automotive MLCC

A. Samsung Part Number

earance : No abnormal exterior a

earance

Performance Test condition

High

Temperature

Unpowered,

1000hrs@T 150

℃

Exposure Capacitance Change : Measurement at 24±2hrs after test conclusion

within ±2.5% or ±0.25㎊ whichever is larger

Q : 800 min

IR : More than 10,000㏁ or 500㏁×㎌

Whichever is Smaller

Temperature Cycling 1000Cycles

Capacitance Change : Measurement at 24±2hrs after test conclusion

within ±2.5% or ±0.25㎊ whichever is larger 1 cycle condition :

Q : 800 min -55+0/-3℃(15±3min) -> Room Temp(1min.)

IR : More than 10,000㏁ or 500㏁×㎌ -> 125+3/-0℃(15±3min) -> Room Temp(1min.)

Whichever is Smaller

Destructive Physical No Defects or abnormalities Per EIA 469

Analysis

Moisture Resistance 10Cycles, t=24hrs/cycle

Capacitance Change : Heat (25~65℃) and humidity (80~98%), Unpowered

within ±2.5% or ±0.25㎊ whichever is larger measurement at 24±2hrs after test conclusion

Q : 325 min

IR : More than 10,000㏁ or 500㏁×㎌

Whichever is Smaller

Humidity Bias 1000hrs 85℃/85%RH, Rated Voltate and 1.3~1.5V,

Capacitance Change : Add 100kohm resistor

within ±2.5% or ±0.25㎊ whichever is larger Measurement at 24±2hrs after test conclusion

Q : 166.67 min The charge/discharge current is less than 50mA.

IR : More than 500㏁ or 25㏁×㎌

Whichever is Smaller

High Temperature 1000hrs @ TA=125℃, 200% Rated Voltage,

Operating Life Capacitance Change : Measurement at 24±2hrs after test conclusion

within ±3.0% or ±0.3

㎊

whichever is lar

er The char

e/dischar

e current is less than 50mA.

pp pp

Appearance : No abnormal exterior appearance

㎊

Q : 325 min

IR : More than 10,000㏁ or 500㏁×㎌

Whichever is Smaller

External Visual No abnormal exterior appearance Visual inspection

Physical Dimensions Within the specified dimensions Using The calipers

Mechanical Shock Three shocks in each direction should be applied along

Capacitance Change : 3 mutually perpendicular axes of the test specimen (18 shocks)

within ±2.5% or ±0.25㎊ whichever is larger

Q, IR : initial spec.

Vibration 5g's for 20min., 12cycles each of 3 orientations,

Capacitance Change : Use 8"×5" PCB 0.031" Th ick 7 secure points on one long side

within ±2.5% or ±0.25㎊ whichever is larger and 2 secure points at corners of opposite sides. Parts mounted

Q, IR : initial spec. within 2" from any secure point. Test from 10~2000㎐.

Resistance to Solder pot : 260±5℃, 10±1sec.

Solder Heat Capacitance Change :

within ±2.5% or ±0.25㎊ whichever is larger

Q, IR : initial spec.

Thermal Shock -55℃/+125℃.

Capacitance Change : Note: Number of cycles required-300,

within ±2.5% or ±0.25㎊ whichever is larger Maximum transfer time-20 sec, Dwell time-15min. Air-Air

Q, IR : initial spec.

ESD AEC-Q200-002

Capacitance Change :

within ±2.5% or ±0.25㎊ whichever is larger

Q, IR : initial spec.

Solderability 95% of the terminations is to be soldered a) Preheat at 155℃ for 4 hours, Immerse in solder for 5s at 245±5℃

evenly and continuously b) Steam aging for 8 hours, Immerse in solder for 5s at 245±5℃

Peakvalue

Appearance : No abnormal exterior appearance

0.5ms Half sine 4.7m/sec.

Appearance : No abnormal exterior appearance

Duration Wave

Appearance : No abnormal exterior appearance

1,500G

Test condition

Velocity

Performance

c) Steam aging for 8 hours, Immerse in solder for 120s at 260±5℃

solder : a solution ethanol and rosin

Electrical Capacitance : Within specified tolerance The Capacitance /Q should be measured at 25℃,

Characterization Q : 800 max. 1㎒±10%, 0.5~5Vrms

IR(25℃) : More than 100,000㏁ or 1,000㏁×㎌I.R. should be measured with a DC voltage not exceeding

IR(125℃) : More than10,000㏁ or 100㏁×㎌Rated Voltage @25℃, @125℃ for 60~120 sec.

Whichever is Smaller Dielectric Strength : 250% of the rated voltage for 1~5 seconds

Dielectric Strength

Board Flex Bending to the limit (3㎜) for 5 seconds

Capacitance Change :

within ±5.0% or ±0.5㎊ whichever is larger

Terminal 10N, for 60±1 sec.

Strength(SMD) Capacitance Change :

within ±2.5% or ±0.25㎊ whichever is larger

Beam Load Destruction value should not be exceed Beam speed

Chip Length < 2.5㎜0.5±0.05㎜/sec

a) Chip Thickness > 0.5㎜ : 20N

b) Chip Thickness ≤ 0.5㎜ : 8N

Temperature C0G

Characteristics

(From -55℃ to 125℃, Capacitance change should be within ±30PPM/℃)

C. Recommended Soldering method :

Reflow ( Reflow Peak Temperature : 260+0/-5℃, 10sec. Max )

Meet IPC/JEDEC J-STD-020 D Standard

* For the more detail Specification, Please refer to the Samsung MLCC catalogue.

Appearance : No abnormal exterior appearance