IXTH 50P085
IXTT 50P085
Symbol Test Conditions Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
gfs VDS = -10 V; ID = ID25, pulse test 8 16 S
Ciss 4200 pF
Coss VGS = 0 V, VDS = -25 V, f = 1 MHz 1720 pF
Crss 750 pF
td(on) 46 ns
trVGS = -10 V, VDS = 0.5 VDSS, ID = 0.5 ID25 39 ns
td(off) RG = 4.7 Ω (External) 86 ns
tf38 ns
Qg(on) 150 nC
Qgs VGS = -10 V, VDS = 0.5 VDSS, ID = 0.5 ID25 36 nC
Qgd 70 nC
RthJC 0.42 K/W
RthCS (TO-247) 0.25 K/W
Source-Drain Diode Characteristic Values
(TJ = 25°C, unless otherwise specified)
Symbol Test Conditions min. typ. max.
ISVGS = 0 -25 A
ISM Repetitive; pulse width limited by TJM -200 A
VSD IF = IS, VGS = 0 V, -3 V
Pulse test, t ≤ 300 µs, duty cycle d ≤ 2 %
trr IF = IS, di/dt = 100 A/µs, VR = -50 V 180 ns
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYS MOSFETs and IGBTs are covered by 4,835,592 4,931,844 5,049,961 5,237,481 6,162,665 6,404,065 B1 6,683,344 6,727,585
one or moreof the following U.S. patents: 4,850,072 5,017,508 5,063,307 5,381,025 6,259,123 B1 6,534,343 6,710,405B2 6,759,692
4,881,106 5,034,796 5,187,117 5,486,715 6,306,728 B1 6,583,505 6,710,463 6771478 B2
Dim. Millimeter Inches
Min. Max. Min. Max.
A 4.7 5.3 .185 .209
A12.2 2.54 .087 .102
A22.2 2.6 .059 .098
b 1.0 1.4 .040 .055
b11.65 2.13 .065 .084
b22.87 3.12 .113 .123
C .4 .8 .016 .031
D 20.80 21.46 .819 .845
E 15.75 16.26 .610 .640
e 5.20 5.72 0.205 0.225
L 19.81 20.32 .780 .800
L1 4.50 .177
∅P 3.55 3.65 .140 .144
Q 5.89 6.40 0.232 0.252
R 4.32 5.49 .170 .216
S 6.15 BSC 242 BSC
TO-247 (IXTH) Outline
Terminals: 1 - Gate 2 - Drain
3 - Source Tab - Drain
1 2 3
TO-268 (IXTT) Outline
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